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BR-122020006492-B1 - X-RAY INSPECTION SYSTEM FOR SCANNING AN OBJECT

BR122020006492B1BR 122020006492 B1BR122020006492 B1BR 122020006492B1BR-122020006492-B1

Abstract

This specification describes a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, wherein each detector array contains multiple non-pixelated detectors such that at least a portion of the non-pixelated detectors are oriented towards both of the two X-ray sources.

Inventors

  • EDWARD JAMES MORTON

Assignees

  • RAPISCAN SYSTEMS, INC

Dates

Publication Date
20260310
Application Date
20130131
Priority Date
20120203

Claims (6)

  1. 1. X-ray inspection system (400) for scanning an object (495, 825), the inspection system comprises: at least two X-ray sources (405, 406, 407) configured to simultaneously emit rotating X-ray beams (810, 830) to irradiate the object, wherein each of said X-ray beams defines a transmission path; a detector array (720) comprising at least one transmission detector (835) positioned between at least two backscatter detectors (821, 822), wherein each of said backscatter detectors is configured to detect backscattered X-rays (815) emitted by a first X-ray source (805) positioned on a first side of the object and wherein the transmission detector is configured to detect transmitted X-rays emitted by a second X-ray source positioned on an opposite side of the object; and at least one controller (497) for controlling each of the X-ray sources to simultaneously scan the object in a coordinated manner, characterized in that each of the at least two X-ray sources has a rotary encoder (1025) adapted to determine an absolute angle of rotation of the X-ray beams, wherein the controller is adapted to receive velocity data comprising an object velocity and, based on said velocity data, adjust at least one of a collimator rotation speed of each of the at least two X-ray sources, a data acquisition rate, or an X-ray tube current of the at least two X-ray sources, based on said velocity data, and wherein the system is configured to detect gamma rays by switching off the X-ray sources and switching the detectors from a current integration mode to a pulse counting mode.
  2. 2. X-ray inspection system (400), according to claim 1, characterized in that the detector array comprises at least two rectangular profile backscatter detectors (821, 822) and a square profile transmission detector (835) positioned between said at least two rectangular profile backscatter detectors.
  3. 3. X-ray inspection system (400), according to claim 1, characterized in that the detector array comprises a transmission detector (835) positioned between two backscatter detectors (821, 822) and in that the detectors are positioned within a single plane facing the object being scanned and the transmission detector has a smaller exposed surface area than each of the backscatter detectors.
  4. 4. X-ray inspection system (400), according to any one of claims 1 to 3, characterized in that it further comprises a pair of fixed collimators (840) positioned between the transmission detector and one of said at least two backscatter detectors.
  5. 5. X-ray inspection system (400), according to any one of claims 1 to 3, characterized in that each of the X-ray sources comprises an extended anode X-ray tube (1005), a rotary collimator assembly (1010), a bearing (1015), a drive motor (1020), and a rotary encoder (1025).
  6. 6. X-ray inspection system (400), according to any one of claims 1 to 3, characterized in that each of the X-ray sources comprises: an extended anode X-ray tube (1005) coupled with a cooling circuit, the anode being at ground potential; a rotating collimator assembly (1010) comprising at least one collimating ring with grooves cut at predefined angles around a collimator circumference, the length of each groove being greater than the width and axis of rotation of the groove, and the width of the grooves defining an intrinsic spatial resolution of the X-ray inspection system in the scanning direction; a bearing (1015) for supporting a weight of the collimator assembly and transferring a drive shaft from the collimator assembly to a drive motor; and a secondary collimator assembly for improving spatial resolution in a perpendicular scanning direction.

Description

CROSS-REFERENCE [001] This application is based on Provisional Patent Application No. US 61/594,625, filed February 3, 2012 for priority. The aforementioned application is incorporated herein by reference. FIELD OF THE INVENTION [002] This specification refers generally to the field of X-ray imaging systems for security scanning and more specifically to multi-view X-ray scanning systems that advantageously combine backscatter and transmission imaging. FUNDAMENTALS [003] With the proliferation of terrorism and commercial smuggling, there is an imminent need for systems that can effectively and efficiently track cars, buses, larger vehicles and cargo to detect unknown threats and illegal substances. [004] In the past, many technologies have been evaluated for use in security inspection, and X-ray imaging has frequently been identified as a reasonable technique for such purposes. Several known X-ray scanning systems have been deployed for screening cars, buses, and other vehicles. These systems include backscatter and transmission X-ray scanning systems. These prior art X-ray systems provide scanning from a very limited number of orientations, usually one and potentially two. For example, a transmission X-ray system may be configured in a side shooter or top shooter configuration. Backscatter systems may be available in a single-sided configuration or, occasionally, in a three-sided configuration. [005] Therefore, there is a need in the state of the art for a multi-view imaging system that can have an arbitrary number of views, and typically more than one. There is also a need in the art for a modular multi-view system that results in high-performance detection at very low doses using a combination of backscatter and transmission imaging methodologies. SUMMARY OF THE INVENTION [006] The present specification describes, in one embodiment, an X-ray inspection system comprising an X-ray source configured to emit an X-ray beam; and a detector array comprising a plurality of non-pixelated detectors, wherein at least a portion of said non-pixelated detectors are not oriented towards the X-ray source. [007] In another embodiment, the present specification describes an X-ray inspection system comprising at least two X-ray sources, wherein each X-ray source is configured to emit an X-ray beam; and at least two detector arrays, wherein each detector array comprises a plurality of non-pixelated detectors, wherein at least a portion of said non-pixelated detectors are oriented towards the two X-ray sources. [008] In yet another embodiment, the present specification describes a multi-view X-ray inspection system having a three-view configuration comprising three X-ray sources, wherein each X-ray source rotates and is configured to emit a rotating X-ray pencil beam; and at least two detector arrays, wherein each detector array comprises a plurality of non-pixelated detectors, wherein at least a portion of said non-pixelated detectors are oriented towards the two X-ray sources. [009] In one embodiment, the X-ray beam is a pencil beam and each X-ray source rotates along a rotation angle, and the X-ray inspection system has an intrinsic spatial resolution wherein said intrinsic spatial resolution is determined by a certain degree of collimation of the X-ray beam and not by a degree of pixelation of X-ray scan data. Furthermore, in one embodiment, a single detector is exposed to a single X-ray beam from one of said X-ray sources at a given point in time, and each detector defines a plane wherein said plane is offset from each plane defined by each X-ray source. In one embodiment, each detector has a rectangular shape. [0010] In another embodiment of the present invention, the X-ray inspection system comprises at least one X-ray source configured to emit an X-ray beam; and a detector array comprising at least two rectangular profile backscatter detectors and one square profile transmission detector positioned between said at least two rectangular profile backscatter detectors. [0011] In yet another embodiment, the present specification describes an X-ray inspection system comprising at least one X-ray source configured to emit an X-ray beam; and a detector array comprising at least two rectangular profile backscatter detectors, a square profile transmission detector positioned between said at least two rectangular profile backscatter detectors, and a pair of fixed collimators positioned between the square profile transmission detector and one of said at least two rectangular profile backscatter detectors. [0012] In one embodiment, an X-ray inspection system comprising a control system, wherein, when said X-ray inspection system is activated to detect gamma rays, said control system turns off the X-ray source and switches a detector data processing mode from current integration mode to pulse counting mode, is disclosed. [0013] In another embodiment, the present invention describes an X-ray inspection system having at least one X-