CN-114689192-B - Temperature probe with improved response time

CN114689192BCN 114689192 BCN114689192 BCN 114689192BCN-114689192-B

Abstract

The temperature probe includes a sheath, a temperature sensitive element, and an insert. The sheath has a sidewall defining an interior space. The temperature sensitive element is disposed within the interior space of the sidewall and has an electrical characteristic that varies with temperature. An insert formed of silicon carbide is operatively interposed between the sidewall and the temperature sensitive element. A method of manufacturing a temperature probe is also provided. A temperature sensing system employing the temperature probe is also provided.

Inventors

Jack M. cavalno
Nathan S. Loya

Assignees

罗斯蒙特公司

Dates

Publication Date: 20260505
Application Date: 20211230
Priority Date: 20201230

Claims (6)

1.A temperature measurement system, comprising: a cannula having a distal end and a cylindrical sidewall extending from the distal end; an RTD temperature probe having a metal sheath disposed within the sleeve; A silicon carbide insert positioned within the sleeve and disposed about the temperature probe, and Wherein, the RTD temperature probe includes: the metal sheath having a sidewall defining an interior space; An RTD element disposed within the interior space of the sidewall, the RTD element having a temperature-dependent resistance, an An insert operably interposed between the sidewall and the RTD element, the insert formed of silicon carbide.
2. The temperature measurement system of claim 1, wherein the RTD element is a thin film RTD element.
3. The temperature measurement system of claim 2, further comprising an insulating powder disposed in a space between the rectangular surface of the thin film RTD element and the inner diameter of the silicon carbide insert.
4. The temperature measurement system of claim 1, wherein the RTD element is a wound RTD element.
5. The temperature measurement system of claim 1, wherein the temperature probe is a thermocouple probe.
6. The temperature measurement system of claim 1, wherein an end cap of the temperature probe is disposed in contact with the distal end of the cannula.

Description

Temperature probe with improved response time Technical Field The present disclosure relates to temperature probes, and in particular to temperature probes with improved response times. Background Temperature probes are used in a variety of industries and environments to provide an indication of the temperature of a substance or surface, such as a process fluid flowing in a process fluid conduit (e.g., piping). The temperature probe typically includes an outer sheath formed of metal, ceramic, or glass and protecting temperature sensitive elements located within the sheath from shock and exposure to process fluids, etc. Non-conductive powders such as magnesium oxide (MgO) or ceramics (e.g., alumina-Al 2O3) are commonly used to fill the space between the inner surface of the jacket and the temperature sensitive element. Temperature probes have a variety of design considerations that must be considered to suit a particular application. These considerations include accuracy, thermal operating range, and response time. Fast response times are a very important consideration in many high precision industries, such as pharmaceutical, food and beverage production, and monitoring of cargo transportation. Providing a temperature probe with an improved response time would allow the use of such a temperature probe in more applications, especially applications requiring a fast response time. Disclosure of Invention The temperature probe includes a sheath, a temperature sensitive element, and an insert. The sheath has a sidewall defining an interior space. The temperature sensitive element is disposed within the interior space of the sidewall and has an electrical characteristic that varies with temperature. An insert formed of silicon carbide is operatively interposed between the sidewall and the temperature sensitive element. A method of manufacturing a temperature probe is also provided. A temperature sensing system employing the temperature probe is also provided. Drawings FIG. 1 is a schematic diagram of a portion of an RTD-based temperature probe according to the prior art. Fig. 2A and 2B are schematic cross-sectional views of portions of an RTD-based temperature probe according to the related art. FIG. 3 is a schematic perspective view of a thermal insert for an RTD-based temperature probe according to an embodiment of the present invention. Fig. 4 is a schematic view of a thermal insert disposed within a stainless steel sheath according to an embodiment of the invention. FIG. 5 is a schematic diagram of an RTD-based temperature probe according to an embodiment of the present invention. Fig. 6A and 6B are schematic cross-sectional views of portions of an RTD-based temperature probe according to embodiments of the present invention. FIG. 7 is a flowchart of a method of manufacturing an RTD-based temperature probe according to an embodiment of the present invention. Fig. 8 is a schematic view of a thermal insert applied to a sleeve according to an embodiment of the present invention. Detailed Description FIG. 1 is a schematic diagram of a portion of an RTD-based temperature probe according to the prior art. Probe 100 generally includes an RTD element 102 disposed within a metal sheath 104 having a metal tip 106. The side wall 108 and the end 106 together form an end assembly of the temperature probe 100. The end assembly is welded or otherwise coupled to the jacket sidewall 110 at weld 112. An insulating powder, such as magnesium oxide (MgO), is disposed within sheath 104 and generally maintains the position of RTD element 102 within sheath 104. RTD element 102 may be formed according to any suitable RTD element formation process, such as thin film technology or wire winding technology. In either case, a circuit is provided that is formed from a metal having a resistance that generally changes in response to temperature changes. Examples of such metals include platinum, copper and nickel. Two or more conductors 116, 118 extend through the insulating powder 114 and couple the element 102 to appropriate measurement circuitry (not shown). Fig. 2A and 2B are cross-sectional views of an RTD-based temperature probe according to the related art. As shown in FIG. 2A, rectangular RTD element 120 is located within MgO powder 114 within sheath 104. Rectangular RTD element 120 may be formed according to a thin film deposition technique in which metal is sputtered or otherwise deposited on a non-conductive substrate such as silicon. In FIG. 2B, a circular wound RTD sensor element 122 is positioned within MgO powder 114 within sheath 104. In each case, to detect the temperature from the surface or environment outside of sheath 104, heat energy must flow through metal sheath 104 (which metal sheath 104 may be made of stainless steel or Inconel (Inconel) alloy) and through MgO powder 114 to produce a detectable temperature change in the RTD element. It will be appreciated that thermal energy may flow in either direction depending on