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CN-115421991-B - Method and system for testing server memory

CN115421991BCN 115421991 BCN115421991 BCN 115421991BCN-115421991-B

Abstract

The invention provides a method and a system for testing a server memory, wherein the method comprises the steps of formulating a layout scheme of the server memory test based on a first condition and a second condition, and deploying a test area according to the layout scheme, wherein the first condition comprises the air inlet/outlet quantity of the test area, and the second condition comprises the space pressure value of the test area. According to the method and the system for testing the memory of the server, disclosed by the invention, the space for testing the memory is laid out through the inlet/outlet quantity and the space pressure value of the test area, so that hot air backflow is avoided, the heat energy of the test area of the server can be rapidly dissipated, the cooling requirement of the memory test of the server is met, hot spots are eliminated, and the temperature problem of the memory test area of the server is solved.

Inventors

  • CHEN QINGFENG

Assignees

  • 长鑫存储技术有限公司

Dates

Publication Date
20260508
Application Date
20220920

Claims (9)

  1. 1. The method for testing the memory of the server is characterized by comprising the following steps: a layout scheme of the server memory test is formulated based on the first condition and the second condition; the test area is deployed according to the layout scheme, wherein, The first condition comprises the inlet/outlet air quantity of the test area, and the second condition comprises the space pressure value of the test area; the layout scheme comprises the placement positions and/or the placement quantity of the server cabinet, the cooling module and the ventilation floor, wherein the server cabinet, the cooling module and the ventilation floor are deployed in the test area, and the server cabinet comprises: Setting every two server cabinets into a group, wherein the two server cabinets are arranged back to back at intervals, and the server cabinets on the same sides are arranged in parallel in a lamination manner; The top and the side parts of the server cabinets are respectively provided with a shade and a side plate, and the back surfaces of the server cabinets, the shades and the side plates form a closed space; An exhaust module is arranged on the shade to exhaust the hot air in the closed space; The air inflow comprises a cooling module air inflow CFM i2 , a ventilation floor air inflow CFM i1 , a server cabinet air inflow CFM i3 and a side plate air inflow CFM i4 , and the air output comprises a closed space air output CFM out ; The first condition satisfies CFM i1 +CFM i2 >CFM out >CFM i3 +CFM i4 .
  2. 2. The method for testing the memory of a server according to claim 1, wherein, The space pressure value comprises space pressure Pa 1 below the ventilation floor, space pressure Pa 2 above the ventilation floor and air pressure Pa 3 in the closed space; The first condition satisfies Pa 1 ≥Pa 2 >Pa 3 .
  3. 3. The server memory testing method of claim 1, wherein deploying the cooling module and the ventilation floor comprises: The ventilation floors comprise a first ventilation floor and a second ventilation floor; The cooling module and the first ventilation floor are both arranged in front of the server cabinet, and the cooling module and the first ventilation floor are oppositely arranged; the second ventilation floor is arranged on one side of the side plate far away from the closed space.
  4. 4. The method for testing the memory of a server according to claim 1, wherein, If the number of the server cabinets is singular, a partition board is arranged at the position opposite to the server cabinet which is arranged singly, so that the closed space is formed.
  5. 5. A server memory test system is characterized in that the system comprises a layout unit and a deployment unit, The layout unit is used for formulating a layout scheme of the server memory test based on the first condition and the second condition; a deployment unit connected with the layout unit for deploying the test area according to the layout scheme, wherein, The first condition comprises the air inlet/outlet quantity of the test area, the second condition comprises the space pressure value of the test area, the deployment unit is used for deploying the test area according to the layout scheme, the test area comprises a server cabinet, a cooling module and a ventilation floor, the test area further comprises a shade, a side plate and an exhaust module communicated with the shade, Every two server cabinets are arranged in a group, and the two server cabinets are arranged back to back at intervals, wherein a plurality of groups of server cabinets on the same side are arranged in parallel in a laminating way; The top and the side parts of the server cabinets are respectively provided with a shade and a side plate, and the back surfaces of the server cabinets, the shades and the side plates form a closed space; The air inflow comprises a cooling module air inflow CFM i2 , a ventilation floor air inflow CFM i1 , a server cabinet air inflow CFM i3 and a side plate air inflow CFM i4 , and the air output comprises a closed space air output CFM out ; The first condition satisfies CFM i1 +CFM i2 >CFM out >CFM i3 +CFM i4 .
  6. 6. The server memory testing system of claim 5, wherein, The space pressure value comprises space pressure Pa 1 below the ventilation floor, space pressure Pa 2 above the ventilation floor and air pressure Pa 3 in the closed space; The first condition satisfies Pa 1 ≥Pa 2 >Pa 3 .
  7. 7. The server memory testing system of claim 5, wherein, The ventilation floors comprise a first ventilation floor and a second ventilation floor; The cooling module and the first ventilation floor are both arranged in front of the server cabinet, and the cooling module and the first ventilation floor are oppositely arranged; the second ventilation floor is arranged on one side of the side plate far away from the closed space.
  8. 8. A computer-readable storage medium having a computer program stored thereon, characterized in that, The computer program, when executed by a processor, implements the server memory testing method of any one of claims 1-4.
  9. 9. An electronic device comprising a processor and a memory, The memory configured to store executable instructions of the processor, the processor configured to perform the server memory testing method of any one of claims 1-4 via execution of the executable instructions.

Description

Method and system for testing server memory Technical Field The invention belongs to the technical field of computer servers, and particularly relates to a method and a system for testing a memory of a server. Background The server memory test is mainly divided into ATE test and system level test, wherein most of the system level test is performed by mass-produced servers in the market, and in order to reduce test time and enhance test coverage, most of the system level test is performed by additionally increasing temperature and adjusting voltage. When the high-temperature test is carried out, some manufacturers choose to use the closed type incubator for the test, but when the closed type incubator is used for the test, the whole server is required to be placed in the box body, the temperature limitation of the whole server is limited, and the temperature cannot be set too high (about 55-65 ℃). When the temperature and voltage are additionally increased for testing conditions in the traditional server memory test, more heat energy is generated, hot air is not good due to air flow and can not be scattered around the server, and the fan of the temperature control unbalanced server is reduced in heat radiation capacity due to the fact that the temperature of the fan is increased due to the fact that the temperature of the fan is sucked in air caused by external temperature change, so that huge noise is generated when the fan continuously runs at high speed. Disclosure of Invention In view of the above problems, the present invention provides a method for testing a server memory, which includes: a layout scheme of the server memory test is formulated based on the first condition and the second condition; the test area is deployed according to the layout scheme, wherein, The first condition includes an inlet/outlet amount of the test zone and the second condition includes a space pressure value of the test zone. Further, the server cabinet, the cooling module and the ventilation floor are deployed in the test area, and the layout scheme comprises the placement positions and/or the placement quantity of the server cabinet, the cooling module and the ventilation floor. Further, deploying the server cabinet includes: Setting every two server cabinets into a group, wherein the two server cabinets are arranged back to back at intervals, and the server cabinets on the same sides are arranged in parallel in a lamination manner; The top and the side parts of the server cabinets are respectively provided with a shade and a side plate, and the back surfaces of the server cabinets, the shades and the side plates form a closed space; and an exhaust module is arranged on the shade to exhaust the hot air in the closed space. Further, the air inflow comprises a cooling module air inflow CFM i2, a ventilation floor air inflow CFM i1, a server cabinet air inflow CFM i3 and a side plate air inflow CFM i4, and the air output comprises a closed space air output CFM out; The first condition satisfies CFM i1+CFMi2>CFMout>CFMi3+CFMi4. Further, the space pressure value comprises space pressure Pa 1 below the ventilation floor, space pressure Pa 2 above the ventilation floor and air pressure Pa 3 in the closed space; The first condition satisfies Pa 1≥Pa2>Pa3. Further, deploying the cooling module and the ventilation floor includes: The ventilation floors comprise a first ventilation floor and a second ventilation floor; The cooling module and the first ventilation floor are both arranged in front of the server cabinet, and the cooling module and the first ventilation floor are oppositely arranged; the second ventilation floor is arranged on one side of the side plate far away from the closed space. Further, if the number of the server cabinets is singular, a partition board is arranged at a position opposite to the server cabinet disposed by one single server cabinet, so as to form the closed space. The present disclosure also provides a server memory testing system, the system comprising a layout unit and a deployment unit, The layout unit is used for formulating a layout scheme of the server memory test based on the first condition and the second condition; a deployment unit connected with the layout unit for deploying the test area according to the layout scheme, wherein, The first condition includes an inlet/outlet amount of the test zone and the second condition includes a space pressure value of the test zone. Further, the test area deployed by the deployment unit according to the layout scheme comprises a server cabinet, a cooling module and a ventilation floor. Further, the test area also comprises a shade, a side plate and an exhaust module communicated with the shade, Every two server cabinets are arranged in a group, and the two server cabinets are arranged back to back at intervals, wherein a plurality of groups of server cabinets on the same side are arranged in parallel in a laminating way; The top and the side parts of