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CN-115902316-B - Multi-channel vacuum calibration head for integrated circuit test system

CN115902316BCN 115902316 BCN115902316 BCN 115902316BCN-115902316-B

Abstract

The invention discloses a multi-channel vacuum calibration head for an integrated circuit testing system, which comprises a shell and a signal adapter plate arranged in the shell, wherein a closed cavity is formed by the inner wall of the shell and the signal adapter plate, the inner wall of the shell is matched with the outer wall of a single digital channel of the integrated circuit testing system, an air extraction hole connected with an external air extraction device is formed in the inner wall of one side of the shell and is used for forming a vacuum environment, meanwhile, the signal adapter plate is powered to be contacted with the digital channel pogoping of the integrated circuit testing system, a plurality of contacts are arranged on one end face of the signal adapter plate, the number and the positions of the contacts are determined according to the number and the distribution positions of the single digital channel pogoping of the integrated circuit testing system, and a transmission cable is arranged on the other end face of the signal adapter plate. The invention has high adaptability, can meet the multi-channel calibration requirement of the integrated circuit test system which is updated at any time, and can effectively improve the accuracy of the calibration structure.

Inventors

  • DING CHAO
  • LIU YANG

Assignees

  • 中国船舶集团有限公司第七〇九研究所

Dates

Publication Date
20260505
Application Date
20221205

Claims (7)

  1. 1. A multi-channel vacuum calibration head for an integrated circuit testing system is characterized by comprising a shell with an opening at one end and a signal adapter plate arranged in the shell, A plurality of contacts are arranged on one end face of the signal adapter plate, the number and the positions of the contacts are determined according to the number and the distribution positions of single digital channels pogoping of the integrated circuit test system, and a transmission cable is arranged on the other end face of the signal adapter plate and used for transmitting signals on the contacts to the integrated circuit test system calibration device through the channel switching device; The inner wall of the shell is fixed with the signal adapter plate by adopting a rubber ring to form a closed cavity, the inner wall of the shell is matched with the outer wall of a single digital channel of the integrated circuit testing system, the bottom of the shell is provided with the rubber ring for sealing the digital channel, and an air extraction hole connected with an external air extraction device is formed in the inner wall of one side of the shell and used for forming a vacuum environment, and meanwhile, the signal adapter plate is powered to enable all contacts on the signal adapter plate to be in one-to-one corresponding contact with all pogoping in the digital channel of the integrated circuit testing system.
  2. 2. The multi-channel vacuum calibration head for an integrated circuit testing system according to claim 1, wherein a limiting plate is disposed on an inner wall of the other side of the housing for reducing an impact force when the signal adapter plate contacts the digital channel pogoping of the integrated circuit testing system.
  3. 3. The multi-channel vacuum calibration head for an integrated circuit test system according to claim 1 or 2, wherein 68 contacts are provided on an end surface of the signal transfer plate, and the 68 contacts are arranged in a distribution of 4 rows and 17 positions per row.
  4. 4. The multi-channel vacuum calibration head for an integrated circuit testing system of claim 3, wherein a plurality of springs are further provided on an end surface of the signal adapter plate, the plurality of springs are disposed at gaps between contacts on the end surface, and the springs are configured to reduce an impact force when the signal adapter plate contacts the digital channel pogoping of the integrated circuit testing system.
  5. 5. A multi-channel vacuum calibration head for an integrated circuit test system as recited in claim 3 wherein the mechanical dimensions of the signal patch panel are 4.7cm x 1.2cm x 0.2cm.
  6. 6. A multi-channel calibration system for an integrated circuit test system, comprising an integrated circuit test system calibration device, a channel switching device, an air extraction device, and a plurality of calibration heads for multi-channel calibration in a vacuum environment of an integrated circuit test system according to any one of claims 1 to 5, wherein the number of the calibration heads is the same as the number of digital channels of the integrated circuit test system.
  7. 7. A calibration method based on the multi-channel calibration system for an integrated circuit test system of claim 6, comprising the steps of: (1) The method comprises the steps of configuring the number of calibration heads according to the number of digital channels in an integrated circuit test system, correspondingly covering all the calibration heads on all the digital channels in the integrated circuit test system, and forming a closed cavity between a shell in each calibration head and the corresponding covered digital channels by adopting a rubber ring; (2) Air extraction holes in all the calibration heads are extracted by using an air extraction device, so that a vacuum environment is formed between the signal adapter plates in each calibration head and the corresponding digital channels, and the signal adapter plates in each calibration head are contacted with the corresponding digital channels pogoping, and signal transmission is completed; (3) The control channel switching device reads the signals of the designated digital channels led out from the calibration head, and the calibration of all the digital channels is completed one by one in sequence.

Description

Multi-channel vacuum calibration head for integrated circuit test system Technical Field The invention belongs to the technical field of integrated circuit test system metering, and particularly relates to a multichannel vacuum calibration head for an integrated circuit test system. Background The integrated circuit used in the tasks of weapon equipment or key models mainly guarantees the performance and quality of the integrated circuit through the integrated circuit testing system, so the integrated circuit testing system has a vital role in accurately metering the integrated circuit as guaranteeing equipment of modern weapon equipment. Currently, in order to calibrate multiple channels of an integrated circuit test system, a calibration board is usually used to connect with pogpin of the integrated circuit, the calibration board is large in size, different test systems can design different calibration boards due to assembly resources and different manufacturers, the design cannot be changed, and meanwhile, the calibration boards have certain requirements on storage space and conditions, including drying, dust-free, constant temperature and humidity and the like. Along with the increase of the test demands of integrated circuits, the integration level of the test system and the number of digital channels are updated and increased, and the method based on the calibration plate cannot flexibly meet the multi-channel calibration demands of the integrated circuit test system with configuration updated at any time due to the defects of long manufacturing time, high cost, low suitability, severe storage environment and the like of the calibration plate. In addition, because the air environment of the contact surface of the current calibration plate and the digital channel pogpin of the integrated circuit test system cannot be stable and unchanged, laboratory environments of different integrated circuit test systems have slight differences, and the accuracy of the calibration result can be influenced by dust concentration, humidity and the like in the air. Disclosure of Invention Aiming at the defects of the prior art, the invention aims to provide a multichannel vacuum calibration head for an integrated circuit test system, which has high adaptability, can meet the multichannel calibration requirement of the integrated circuit test system updated at any time, and can effectively improve the accuracy of a calibration structure. To achieve the above object, in a first aspect, the present invention provides a multi-channel vacuum calibration head for an integrated circuit testing system, comprising a housing having an opening at one end and a signal patch panel disposed in the housing, wherein, A plurality of contacts are arranged on one end face of the signal adapter plate, the number and the positions of the contacts are determined according to the number and the distribution positions of single digital channels pogoping of the integrated circuit test system, and a transmission cable is arranged on the other end face of the signal adapter plate and used for transmitting signals on the contacts to the integrated circuit test system calibration device through the channel switching device; The inner wall of the shell is fixed with the signal adapter plate by adopting a rubber ring to form a closed cavity, the inner wall of the shell is matched with the outer wall of a single digital channel of the integrated circuit testing system, the bottom of the shell is provided with the rubber ring for sealing the digital channel, and an air extraction hole connected with an external air extraction device is formed in the inner wall of one side of the shell and used for forming a vacuum environment, and meanwhile, the signal adapter plate is powered to enable all contacts on the signal adapter plate to be in one-to-one corresponding contact with all pogoping in the digital channel of the integrated circuit testing system. The multi-channel vacuum calibration head for the integrated circuit test system provided by the invention is characterized in that the signal adapter plate in the calibration head is contacted with the pogo pins of the digital channels of the integrated circuit test system, the abrasion to the pogo pins can be effectively reduced by adopting the point-to-surface contact mode, the calibration can be completed by changing the number of the calibration head according to the number of the digital channels based on the design, the suitability and sustainable upgrading capability of the calibration device can be effectively improved without customizing the calibration plate again, and in addition, when the calibration head is contacted with the digital channels pogo pins of the integrated circuit test system, the pneumatic mode is adopted, so that the stress uniformity between contact point surfaces can be ensured, the contact point can be effectively ensured to be in a vacuum state, and the accuracy of the calib