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CN-115904832-B - Memory testing method, system, equipment and readable storage medium

CN115904832BCN 115904832 BCN115904832 BCN 115904832BCN-115904832-B

Abstract

The invention belongs to the field of computers, and particularly relates to a memory testing method, a system, equipment and a medium, wherein the method comprises the steps of configuring a target machine based on a corresponding memory testing strategy, performing multi-round restarting test on a memory on the target machine based on the memory testing strategy, acquiring test data output by the target machine in each round of restarting test in real time, comparing the test data with preset data and/or test data of other rounds, and determining a memory testing result according to a comparison result. According to the memory testing method provided by the invention, the testing efficiency in the memory RTM test in the server field can be effectively improved, the manual participation is almost completely unnecessary under the condition of no abnormality, the testing manpower is effectively saved, meanwhile, errors caused by repeated data collection in the manpower test are avoided, and omission of manual test is avoided. The time cost is saved, the test is more flexible, and the traditional RMT test method can be effectively replaced.

Inventors

  • WANG YUNHONG

Assignees

  • 苏州浪潮智能科技有限公司

Dates

Publication Date
20260505
Application Date
20221014

Claims (7)

  1. 1. A memory testing method, comprising: Configuring a target machine based on a corresponding memory test strategy, and performing multi-round restarting test on a memory on the target machine based on the memory test strategy, wherein the memory test strategy comprises Borad Copies, DIMM SHIFTS and Repeats parameters; Acquiring test data output by a target machine in each round of restarting test in real time, comparing the test data with preset data and/or test data of other rounds, and determining a memory test result according to the comparison result; The multi-round restarting test for the memory on the target machine based on the memory test strategy comprises the following steps: in response to completion of any one round of restarting test, replacing the insertion method of the corresponding memory by modifying the mapping relation of the memory slots in the BIOS; Responding to the completion of the restart test of the preset round, and replacing the position in the memory slot of the corresponding memory of the target machine to perform the next round of restart test; responding to the comparison result that an abnormality occurs, determining the numbers of the abnormal memory and the corresponding memory slot and recording the current test data corresponding to the abnormal memory; Performing a next round of restarting test by replacing the position in the memory slot of the corresponding memory of the target machine, and collecting test data corresponding to the abnormal memory and test data corresponding to a new memory on the abnormal memory slot; Comparing the test data corresponding to the abnormal memory with the test data corresponding to the memory collected by the next round of restarting test and the test data corresponding to the new memory on the abnormal memory slot; And determining the memory switching mode of the subsequent restarting test based on the comparison of the three test data.
  2. 2. The method of claim 1, wherein determining a memory switch mode for a subsequent restart test based on the comparison of the three test data comprises: And responding to the fact that the current corresponding test data of the abnormal memory is different from the test data of the abnormal memory collected by the next round of restarting test, and the test data of the abnormal memory collected by the next round of restarting test is identical to the preset data, replacing the insertion method of the corresponding memory by adopting a mode of modifying the mapping relation of the memory slot in the BIOS for the subsequent restarting test, and storing the test data of different memories by using the serial numbers of the memories.
  3. 3. The method of claim 1, wherein determining a memory switch mode for a subsequent restart test based on the comparison of the three test data further comprises: And responding to the fact that the test data of the memory slot corresponding to the abnormal memory in the next round of restarting test is different from the test data corresponding to the new memory in the current round of testing, and the test data of the abnormal memory collected by the next round of restarting test is different from the preset data, and performing the subsequent restarting test in a mode of replacing the position of the corresponding memory in the memory slot of the target machine for the subsequent restarting test.
  4. 4. The method of claim 1, wherein determining a memory switch mode for a subsequent restart test based on the comparison of the three test data further comprises: And responding to the fact that the test data corresponding to the new memory in the next round of restarting test exists in the memory slot corresponding to the abnormal memory is the same as the test data corresponding to the current round of testing in the new memory, and the test data of the abnormal memory collected by the next round of restarting test is different from the preset data, replacing the insertion method of the corresponding memory in the mode of modifying the mapping relation of the memory slot in the BIOS for the subsequent restarting test, and storing the test data of different memories according to the serial numbers of the memories.
  5. 5. A memory test system, comprising: the test configuration module is configured to configure a target machine based on a corresponding memory test strategy, and perform multi-round restarting test on a memory on the target machine based on the memory test strategy, wherein the memory test strategy comprises Borad Copies, DIMM SHIFTS and Repeats parameters; The test module is configured to acquire test data output by the target machine in real time during restarting test of each round, compare the test data with preset data and/or test data of other rounds, and determine a memory test result according to the comparison result; The test configuration module is further configured to respond to completion of any round of restart test by changing the mapping relation of the memory slots in the BIOS to replace the corresponding memory, respond to completion of the restart test of a preset round, replace the corresponding memory in the memory slots of the target machine to perform the next round of restart test, respond to the comparison result to determine the abnormal memory and the serial number of the corresponding memory slot and record the current test data corresponding to the abnormal memory, perform the next round of restart test by replacing the corresponding memory in the memory slots of the target machine, collect the test data corresponding to the abnormal memory and the test data corresponding to the new memory in the abnormal memory slot, compare the test data corresponding to the abnormal memory with the test data corresponding to the memory collected by the next round of restart test and the test data corresponding to the new memory in the abnormal memory slot, and determine the memory switching mode of the subsequent restart test based on comparison of the three test data.
  6. 6. A computer device, comprising: at least one processor, and A memory storing computer instructions executable on the processor, which when executed by the processor, perform the steps of the method of any one of claims 1-4.
  7. 7. A computer readable storage medium storing a computer program which, when executed by a processor, implements the steps of the method of any one of claims 1-4.

Description

Memory testing method, system, equipment and readable storage medium Technical Field The invention belongs to the field of computers, and particularly relates to a memory testing method, a memory testing system, memory testing equipment and a readable storage medium. Background Server memory testing is a necessary test for verifying the stability of a server platform and a memory, in the conventional memory testing, there are two types of 2X5 or 3X5 standard for the Margin test of the platform memory according to the current EAGLE STREAM (Intel (r) proposed server solution), 50 or 45 sets of data are to be collected, and currently RMT BIOS needs to be manually configured. The method has the advantages of being capable of achieving flexible testing, saving trouble and accurately delivering time of a test result, and being capable of achieving automatic data collection and storage modes, and being capable of achieving the effects of being capable of achieving flexible testing, saving trouble and accurately delivering time of the test result due to the fact that 50 groups of data are collected manually, the manpower investment of 25 hours is required, the time required is long, the flexibility is poor, the operation steps are complicated, missing items and hidden items are likely to exist due to the fact that RMT BIOS is configured manually. Disclosure of Invention In order to solve the above problems, the present invention provides a memory testing method, comprising: Configuring a target machine based on a corresponding memory test strategy, and performing multi-round restarting test on a memory on the target machine based on the memory test strategy; and acquiring test data output by the target machine in each round of restarting test in real time, comparing the test data with preset data and/or test data of other rounds, and determining the result of the memory test according to the comparison result. In some embodiments of the present invention, performing a multi-round restart test on the memory on the target machine based on the memory test policy includes: And in response to completion of any one round of restarting test, replacing the insertion method of the corresponding memory by modifying the mapping relation of the memory slots in the BIOS. In some embodiments of the present invention, performing a multi-round restart test on the memory on the target machine based on the memory test policy further includes: And in response to the completion of the restart test of the preset round, replacing the position in the memory slot of the corresponding memory of the target machine to perform the next round of restart test. In some embodiments of the present invention, performing a multi-round restart test on the memory on the target machine based on the memory test policy further includes: responding to the comparison result that an abnormality occurs, determining the numbers of the abnormal memory and the corresponding memory slot and recording the current test data corresponding to the abnormal memory; Performing a next round of restarting test by replacing the position in the memory slot of the corresponding memory of the target machine, and collecting test data corresponding to the abnormal memory and test data corresponding to a new memory on the abnormal memory slot; Comparing the test data corresponding to the abnormal memory with the test data corresponding to the memory collected by the next round of restarting test and the test data corresponding to the new memory on the abnormal memory slot; And determining the memory switching mode of the subsequent restarting test based on the comparison of the three test data. In some embodiments of the present invention, determining a memory switching manner of a subsequent restart test based on comparison of the three types of test data includes: And responding to the fact that the current corresponding test data of the abnormal memory is different from the test data of the abnormal memory collected by the next round of restarting test, and the test data of the abnormal memory collected by the next round of restarting test is identical to the preset data, replacing the insertion method of the corresponding memory by adopting a mode of modifying the mapping relation of the memory slot in the BIOS for the subsequent restarting test, and storing the test data of different memories by using the serial numbers of the memories. In some embodiments of the present invention, determining the memory switching manner of the subsequent restart test based on the comparison of the three kinds of test data further includes: And responding to the fact that the test data of the memory slot corresponding to the abnormal memory in the next round of test is different from the test data corresponding to the new memory in the current round of test, and the test data of the abnormal memory collected by the next round of restart test is different from the preset data, and performin