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CN-115980017-B - Realize multi-functional probe test auxiliary device of normal position microcosmic electric field

CN115980017BCN 115980017 BCN115980017 BCN 115980017BCN-115980017-B

Abstract

The invention discloses a probe test auxiliary device for realizing the multifunction of an in-situ microcosmic electric field. The device comprises a hexagonal box-shaped main body, U-shaped probe baffles and a main body base, wherein each side wall of the hexagonal box-shaped main body is provided with a U-shaped window, the U-shaped probe baffles are inserted into the U-shaped windows, each U-shaped probe baffle is provided with a pair of sealing sheets, gaps formed at the corresponding positions of the sealing sheets serve as inlets and outlets of probes, an objective sealing sliding piece is arranged on a top cover of the hexagonal box-shaped main body, an objective can vertically move through a central hole of the objective sealing sliding piece, and a sealing cavity is formed by the hexagonal box-shaped main body, the U-shaped probe baffles, the objective sealing sliding piece and the objective. The device can realize that a plurality of probes can be inserted into any position of a micrometer sample to apply voltage or current, and can be used with a micro-Raman spectrometer to collect Raman spectrograms of the sample in situ and analyze microstructure changes of the sample.

Inventors

  • LIU MEIRONG
  • LIU HAIJUN
  • Feng Rongjuan

Assignees

  • 中国科学院化学研究所

Dates

Publication Date
20260512
Application Date
20230116

Claims (10)

  1. 1. A probe test auxiliary device comprises an upper hexagonal box-shaped main body and a U-shaped probe baffle; the hexagonal box-shaped main body is a hexagonal prismatic cavity, the middle upper part of each side wall of the cavity is provided with a U-shaped window, the U-shaped probe baffle is inserted into the U-shaped window and moves in the U-shaped window along the horizontal direction, a pair of attached sealing sheets are arranged at the vertical central line of each U-shaped probe baffle, and a gap formed at the attached position of each pair of sealing sheets is used as an access of an external equipment probe; The top cover of the cavity is of a concave hexagonal ring structure, an objective sealing sliding piece with a central hole is arranged in the center of the top cover, and the objective vertically moves in the objective sealing sliding piece through the central hole; the objective lens and the objective lens sealing sliding piece, the sealing gasket, the U-shaped probe baffle plate, the sealing piece and the hexagonal box-shaped main body form a sealing cavity; A main body base is arranged below the cavity; An X-axis micrometer and a Y-axis micrometer are arranged outside the side wall of the main body base, and the X-axis micrometer and the Y-axis micrometer extend to the inside of the main body base respectively; a sample table base is arranged in the main body base.
  2. 2. The probe test auxiliary device according to claim 1, wherein the hexagonal box-shaped body has a side length of 60-100mm and a height of 40-70mm; the length of the U-shaped window is 40-70mm, and the height is 20-40mm; The height of the inlet and the outlet is 20-30mm; the length of the main body base is 150-300mm, and the height of the main body base is 40-70mm.
  3. 3. The probe test auxiliary device according to claim 1 or 2, wherein a groove is formed at the edge of the U-shaped window, and the U-shaped probe baffle is inserted into the U-shaped window through the groove and moves in the horizontal direction; the length of the groove is 10-20mm, and the depth is 3-6mm.
  4. 4. The probe test auxiliary device according to any one of claims 1 to 3, wherein the U-shaped probe baffle is made of metal aluminum; The sealing piece is made of rubber.
  5. 5. The probe test auxiliary device according to any one of claims 1 to 4, wherein the objective lens sealing slider has an inverted truncated cone structure with a center hole; The outer diameter of the upper surface of the objective sealing sliding piece is 50-65mm, the inner diameter is 25-30mm, and the height is 10-20mm.
  6. 6. The probe test auxiliary device according to any one of claims 1 to 5, wherein an X-axis micrometer fixing plate, an X-axis micrometer sliding fitting and a dovetail groove base X are arranged in the main body base; The X-axis micrometer fixing plate is used for fixing the X-axis micrometer, and the X-axis micrometer moves the sample in the X direction through the X-axis micrometer fixing plate, the dovetail groove base body and the X-axis micrometer sliding accessory in sequence, wherein the moving range is more than or equal to 5mm; A Y-axis micrometer fixing plate, a Y-axis micrometer sliding accessory and a dovetail groove matrix Y are arranged in the main body base; the Y-axis micrometer fixing plate is used for fixing the Y-axis micrometer; The Y-axis micrometer moves in the Y direction through the Y-axis micrometer fixing plate, the dovetail groove base body and the Y-axis micrometer sliding accessory in sequence, and the moving range is more than or equal to 5mm.
  7. 7. The probe test auxiliary device according to any one of claims 1 to 6, wherein an electrical connection assembly is provided in the main body base, the electrical connection assembly including an electrical connection socket, a sealed electrical connector and a wire; the electric connection seat is arranged at the bottom in the main body base; The sealed electrical connector is arranged at the lower part of the side wall in the main body base; the lead is used for connecting the sample with the electrical connection seat, the sealed electrical connector and an external high-precision power supply.
  8. 8. The probe test auxiliary device according to any one of claims 1 to 7, wherein a gas input assembly connected with an external gas supply device is arranged on the side wall of the main body base, and the gas input assembly comprises an atmosphere gas hole and a1 minute 4 gas conduit; The 4 air outlets of the 1-minute 4 gas conduit are fixed near the sample stage base through the gas guide pipe fixing base.
  9. 9. The probe test auxiliary device according to any one of claims 1 to 8, wherein the sample stage base is provided with a high temperature element.
  10. 10. Use of a probe test aid according to any one of claims 1 to 9 in situ microscopic electric field analysis in combination with a microscope.

Description

Realize multi-functional probe test auxiliary device of normal position microcosmic electric field Technical Field The invention relates to a probe test auxiliary device for realizing the multifunction of an in-situ microcosmic electric field, and belongs to the field of manufacturing of analysis test equipment. Background The electric field can influence the molecular orientation, phase change, thermal effect, virus capture and the like of the sample, and further influence the change of the Raman spectrum. The Raman spectrum under the microscopic electric field can be used for analyzing the change or phase change of molecular orientation of a field effect transistor, a semiconductor, a ceramic sample and the like, can also be used for researching Surface Enhanced Raman (SERS), and is particularly suitable for researching graphene materials. Taking graphene as an example, a static potential difference is manufactured between the graphene and a grid electrode, the Fermi level position of the graphene can be adjusted by adjusting the grid voltage, the electron phonon coupling degree is actively adjusted, the Raman spectrum characteristics of the graphene can be changed, and the graphene doping can be reversible and controllable. The grid voltage can be converted into doping concentration through a formula, and excessive charges (defects) can cause expansion (contraction) of crystal lattices, so that the influence of external doping and electric field effect doping on the concentration of graphene carriers can be qualitatively and quantitatively utilized by utilizing the Raman spectrum characteristic change of graphene, and a necessary means is provided for functional design and functional regulation of carbon materials. However, there is no commercial probe station specially used for the micro-raman instrument in the market at present, and the specifications and the dimensions of the existing probe station in the market are not suitable for being arranged on the existing micro-confocal laser-raman spectrometer, and the requirements of scientific researchers cannot be completely met in function. Disclosure of Invention The invention aims to provide a probe test auxiliary device. The probe test auxiliary device can realize that a plurality of probes can be inserted into any position of a micrometer-scale sample to apply voltage or current, and can be used with a micro-Raman spectrometer to collect Raman spectrograms of the sample in situ and analyze microstructure changes of the sample. In order to achieve the above purpose, the present invention adopts the following technical scheme: a probe test auxiliary device comprises an upper hexagonal box-shaped main body and a U-shaped probe baffle; the hexagonal box-shaped main body is a hexagonal prismatic cavity, the middle upper part of each side wall of the cavity is provided with a U-shaped window, the U-shaped probe baffle is inserted into the U-shaped window and moves in the U-shaped window along the horizontal direction, a pair of attached sealing sheets are arranged at the vertical central line of each U-shaped probe baffle, and a gap formed at the attached position of each pair of sealing sheets is used as an access of an external equipment probe; The top cover of the cavity is of a concave hexagonal ring structure, an objective sealing sliding piece with a central hole is arranged in the center of the top cover, and the objective vertically moves in the objective sealing sliding piece through the central hole; the objective lens and the objective lens sealing sliding piece, the sealing gasket, the U-shaped probe baffle plate, the sealing piece and the hexagonal box-shaped main body form a sealing cavity; A main body base is arranged below the cavity; An X-axis micrometer and a Y-axis micrometer are arranged outside the side wall of the main body base, and the X-axis micrometer and the Y-axis micrometer extend to the inside of the main body base respectively; The main body base is internally provided with a sample table base, and samples can be placed in the sample table base. The side length of the hexagonal box-shaped main body is 60-100mm, and the height is 40-70mm. The length of the U-shaped window is 40-70mm, which is 2/3 of the side length of the cavity, and the height of the U-shaped window is 20-40mm, which is 1/2 of the height of the cavity. The height of the inlet and the outlet is 20-30mm. The length of the main body base is 150-300mm, and the height of the main body base is 40-70mm. The U-shaped probe baffle is inserted into the U-shaped window through the groove and moves horizontally, the length of the groove is 10-20mm, and the depth of the groove is 3-6mm. The U-shaped probe baffle is made of metal aluminum, and the sealing piece is made of rubber. The objective sealing sliding piece is of an inverted truncated cone structure with a central hole, the outer diameter of the upper surface of the objective sealing sliding piece is 50-65mm, the in