CN-116034276-B - Analysis work support device and analysis work support software

CN116034276BCN 116034276 BCN116034276 BCN 116034276BCN-116034276-B

Abstract

An apparatus (4) for assisting an analysis operation for executing a protocol in which a predetermined sample is arranged in each of all or a part of predetermined sample arrangement sections provided in a plurality of sample arrangement sections of a sample storage member, the apparatus (4) comprising a storage section (41) in which a plurality of protocols are stored, a display section (6), a protocol selection input reception section (42) for receiving an input for selecting a protocol, a sample position display section (43) for displaying, on the display section, a position of the sample arrangement section and information of the sample corresponding to the protocol input to the protocol selection input reception section, a display item selection section (653) for receiving a selection of one or both of the position information of the sample arrangement section and the information of the sample, and a display switching section (44) for switching a display performed by the sample position display section according to the selection performed by the display item selection section.

Inventors

Okuboshu
Oshikawa Kaoru
YUKO KOBAYASHI
Takainaka Yoshiki
HARUKI Kohei

Assignees

株式会社岛津制作所

Dates

Publication Date: 20260505
Application Date: 20210426
Priority Date: 20200901

Claims (6)

1. An analysis job support device for supporting an analysis job for performing measurement by disposing a predetermined sample in each of all or a part of predetermined sample disposing sections provided in a plurality of sample disposing sections of a sample housing member mounted to the analysis device, the analysis job support device comprising: A storage unit that stores a plurality of protocols, and information on a sample used in each of the plurality of protocols and information on a position of a sample placement unit where the sample is to be placed; A display unit; a protocol selection input receiving unit that receives an input for selecting any one of the plurality of protocols; a sample position display unit that reads, from the storage unit, information on a sample used in the protocol input to the protocol selection input reception unit and information on a position of a sample placement unit where the sample is to be placed, and displays, when the protocol is to be executed, the position of the sample placement unit where the sample is to be placed and the information on the sample to be placed on the display unit; a display item selection unit for receiving selection of one or both of the information of the position of the sample arrangement unit and the information of the sample, and And a display switching unit that switches the display performed by the display unit by the sample position display unit in accordance with the selection performed by the display item selection unit.
2. The analysis job support device according to claim 1, wherein, The plurality of sample arrangement portions are arranged in a lattice shape, When any one of the sample arrangement parts arranged in a predetermined direction is used, the sample position display part treats all the sample arrangement parts arranged in the predetermined direction as used for processing, and displays the used sample arrangement parts and the unused sample arrangement parts in a distinguishable manner.
3. The analysis job support device according to claim 2, wherein, The sample position display unit displays information of the sample to be placed using a sample placement unit located at a predetermined corner of an unused sample placement unit as a base point.
4. The analysis job support device according to claim 1, wherein, The sample position display unit displays the sample arrangement unit so as to be distinguishable according to the type of the sample to be arranged.
5. The analysis job support device according to claim 1, wherein, When the sample to be placed includes different samples of the same type, the sample position display unit displays text information for specifying the different samples.
6. A non-transitory computer-readable storage medium storing an analysis job support program for supporting an analysis job for performing measurement by disposing a predetermined sample in each of all or a part of predetermined sample disposing sections provided in a sample housing member mounted in an analysis device, the analysis job support program being configured to cause a computer having a display section and a storage section storing information of a plurality of protocols and information of a position of the sample disposing section where the sample is to be disposed, the storage section storing information of a sample used in each of the plurality of protocols, to operate as: a protocol selection input receiving unit that receives an input for selecting any one of the plurality of protocols; a sample position display unit that reads, from the storage unit, information on a sample used in the protocol input to the protocol selection input reception unit and information on a position of a sample placement unit where the sample is to be placed, and displays, when the protocol is to be executed, the position of the sample placement unit where the sample is to be placed and the information on the sample to be placed on the display unit; a display item selection unit for receiving selection of one or both of the information of the position of the sample arrangement unit and the information of the sample, and And a display switching unit that switches the display performed by the display unit by the sample position display unit in accordance with the selection performed by the display item selection unit.

Description

Analysis work support device and analysis work support software Technical Field The present invention relates to an apparatus and computer software for assisting in analysis of a job. Background As a disease that induces dementia, alzheimer's disease is known. When Alzheimer's disease is developed, symptoms such as decreased memory and cognitive ability are gradually worsened. Thus, it is effective to find Alzheimer's disease in advance and start treatment before onset of dementia. It is known that a patient suffering from alzheimer has a substance called amyloid β accumulated in the brain (for example, non-patent document 1). Conventionally, the state of accumulation of amyloid β in the brain has been examined using Positron Emission Tomography (PET), but the time required for the examination using PET is long and expensive. Accordingly, patent document 1 proposes a method of measuring the ion intensity of each of 2 specific peptides contained in blood derived from a subject by mass spectrometry and examining the accumulation state of amyloid β based on the intensity ratio of these peptides. In this method, compared with the case of using PET, diagnosis of alzheimer's disease can be performed rapidly and inexpensively. In addition, diagnosis of Alzheimer's disease can be performed continuously and efficiently in a plurality of subjects. In the method described in patent document 1, a MALDI-TOF type mass spectrometry device is used. In a MALDI-TOF mass spectrometry device, a sample to which a matrix is added, which is disposed in a hole of a sample plate, is irradiated with laser light to generate ions (MALDI), and the ions are introduced into a time-of-flight (TOF) mass separation unit. The various ions introduced into the mass separation section fly in the TOF space at a time of flight corresponding to the respective mass-to-charge ratios, and are detected. As described above, in the method described in patent document 1, the accumulation state of β -amyloid is examined by measuring the ionic strength of each of 2 specific peptides contained in blood derived from a subject. Therefore, in order to perform an accurate inspection, it is necessary to accurately measure the position and intensity of the mass peak of the ion. That is, it is required to perform mass spectrometry on a sample with a constant mass accuracy or sensitivity at all times. In the case where a fixed mass accuracy or sensitivity is required as described above, mass spectrometry is performed in accordance with a standard procedure (SOP: standard Operation Procedure) of analysis determined in advance. Here, an example of a standard procedure in the case of performing mass spectrometry on a sample using a MALDI-TOF type mass spectrometry apparatus will be described. The sample plate used in MALDI is divided into a plurality of square-shaped independent areas, a hole for disposing a calibrator is provided in the center of each independent area, and holes for disposing a sample are provided at 4 locations around the hole for disposing a calibrator, respectively. The calibrant is a substance that generates ions of known mass to charge ratio for mass calibration. First, a first protocol for determining the intensity of the laser light most suitable for ionization of the sample is implemented. In the first protocol, a plurality of independent areas of the sample plate, which are the same as the preset candidates for the intensities of the plurality of lasers, are used, a standard sample containing a predetermined amount of a target substance is placed in wells at 4 sites of each independent area, and a calibrator is placed in wells at 1 site. In the first protocol, the same standard sample and calibrator are disposed in all independent areas. After the standard sample and calibrator are disposed, the sample plate is mounted to a mass spectrometry device. Then, a laser beam having an intensity of 1 candidate value is irradiated to the calibration material arranged in the first independent region, and the mass spectrometry device is mass-calibrated by comparing the detection result of the generated ions with the actual mass-to-charge ratio of the ions. After measuring the calibrator, the samples disposed in the 4 wells in the same independent area were similarly irradiated with laser light having the intensities of the 1 candidates, and the generated ions were detected. Then, the detection intensities of the ions obtained by the 4-time mass spectrometry are averaged, and the detection sensitivity of the laser beam to the intensities is obtained from the detection intensities of the ions of the predetermined mass-to-charge ratios. Such mass spectrometry is performed by irradiating laser light having intensities of different candidate values onto standard samples arranged in all independent regions, whereby the detection sensitivity of ions of each candidate value among candidate values for the intensity of the laser light is found, and the intensity