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CN-116068450-B - Test method and test system

CN116068450BCN 116068450 BCN116068450 BCN 116068450BCN-116068450-B

Abstract

The present disclosure relates to a test method and a test system. A testing method includes such steps as generating a multi-frequency signal by a signal generator, transmitting it to an input end of a device to be tested, measuring the input end of the device to be tested and an output end of the device to be tested by a spectrum analyzer to obtain the complex input ripple intensities and complex output ripple intensities of the corresponding complex frequency points, and generating the complex power supply rejection ratio of the corresponding complex frequency points by a controller according to the input ripple intensities and the output ripple intensities.

Inventors

  • GUO YINAN
  • HUANG MINGCHONG

Assignees

  • 瑞昱半导体股份有限公司

Dates

Publication Date
20260505
Application Date
20211102

Claims (7)

  1. 1. A method of testing, comprising: generating a multi-frequency signal by a signal generator; transmitting the multi-frequency signal to an input terminal of a device to be tested by the signal generator; measuring the input end of the device to be measured and an output end of the device to be measured by a spectrum analyzer to obtain complex input ripple intensity and complex output ripple intensity corresponding to the complex frequency points, respectively, and A control device generates a plurality of power supply rejection ratios corresponding to the frequency points according to the input ripple intensities and the output ripple intensities, Wherein the test method further comprises performing one of the following operations: The control device is used for controlling a switching device to couple the spectrum analyzer to the input end and measuring the input end by the spectrum analyzer to obtain the input ripple intensities corresponding to the frequency points, wherein after the spectrum analyzer measures the input ripple intensities, the control device is further used for controlling the switching device to couple the spectrum analyzer to the output end and the spectrum analyzer measures the output end to obtain the output ripple intensities corresponding to the frequency points, or The control device is used for controlling the switching device to couple the spectrum analyzer to the output end, and measuring the output end by the spectrum analyzer to obtain the output ripple intensities corresponding to the frequency points, wherein after the spectrum analyzer measures the output ripple intensities, the control device is further used for controlling the switching device to couple the spectrum analyzer to the input end, and the spectrum analyzer measures the input end to obtain the input ripple intensities corresponding to the frequency points.
  2. 2. A test system, comprising: a signal generator for generating a multi-frequency signal and transmitting the multi-frequency signal to an input terminal of a device to be tested; A spectrum analyzer, coupled to the device under test and configured to measure multiple frequency points of the input end of the device under test and an output end of the device under test to obtain a complex input ripple intensity and a complex output ripple intensity corresponding to the complex frequency points; a control device coupled to the spectrum analyzer for generating a plurality of power supply rejection ratios corresponding to the frequency points according to the input ripple intensities and the output ripple intensities, and A switching device, wherein the test system satisfies one of: The control device is used for controlling the switching device to couple the spectrum analyzer to the input end, and the spectrum analyzer measures the input end to obtain the input ripple intensities corresponding to the frequency points, wherein after the spectrum analyzer measures the input ripple intensities, the control device is further used for controlling the switching device to couple the spectrum analyzer to the output end, and the spectrum analyzer measures the output end to obtain the output ripple intensities corresponding to the frequency points, or The control device is used for controlling the switching device to couple the spectrum analyzer to the output end, and the spectrum analyzer measures the output end to obtain the output ripple intensities corresponding to the frequency points, wherein after the spectrum analyzer measures the output ripple intensities, the control device is further used for controlling the switching device to couple the spectrum analyzer to the input end, and the spectrum analyzer measures the input end to obtain the input ripple intensities corresponding to the frequency points.
  3. 3. The test system of claim 2, wherein the device under test is a power chip.
  4. 4. The test system of claim 2, wherein the control device is further configured to subtract a corresponding output ripple intensity of a corresponding one of the frequency bins from a corresponding input ripple intensity of the corresponding frequency bin to generate a corresponding one of the power rejection ratios.
  5. 5. The test system of claim 2, wherein the signal generator is further configured to superimpose a plurality of sine waves to generate the multi-frequency signal, wherein the sine waves correspond to the frequency points, respectively.
  6. 6. The test system of claim 2, wherein the signal generator is further configured to perform an inverse fourier transform process to generate the multi-frequency signal.
  7. 7. The test system of claim 2, wherein the signal generator is further configured to transmit a combination of the multi-frequency signal and a dc signal to the input of the device under test.

Description

Test method and test system Technical Field The present disclosure relates to a testing technique. And more particularly to a test method and test system capable of performing a test rapidly. Background The power supply rejection ratio (power supply rejection ratio, PSRR) is an important parameter for determining the extent of input ripple (ripple) rejection of the power supply circuit. In some related art, an oscilloscope is used to measure in the time domain. However, oscilloscopes can only measure voltages on the order of millivolts, and therefore have a limited range of power supply rejection ratios (e.g., 40 db to 50 db) that oscilloscopes can measure. Based on this, if the power supply rejection ratio of the device under test exceeds the range (e.g., 60 db), the oscilloscope cannot accurately measure the power supply rejection ratio of the device under test. Disclosure of Invention Some embodiments of the present disclosure relate to a test method. The testing method comprises the following steps of generating a multi-frequency signal by a signal generator, transmitting the multi-frequency signal to an input end of a device to be tested by the signal generator, measuring the input end of the device to be tested and an output end of the device to be tested by a spectrum analyzer to obtain complex input ripple intensities and complex output ripple intensities corresponding to complex frequency points, and generating complex power supply rejection ratios corresponding to the frequency points by a control device according to the input ripple intensities and the output ripple intensities. Some embodiments of the present disclosure relate to a test system. The test system comprises a signal generator, a spectrum analyzer and a control device. The signal generator is used for generating a multi-frequency signal and transmitting the multi-frequency signal to an input end of a device to be tested. The spectrum analyzer is coupled to the device under test and is used for measuring an input end of the device under test and an output end of the device under test respectively to obtain a complex input ripple intensity and a complex output intensity corresponding to the complex frequency points. The control device is coupled to the spectrum analyzer and used for generating a plurality of power supply rejection ratios corresponding to the frequency points according to the input ripple intensities and the output ripple intensities. In summary, the present disclosure can input multi-frequency signals to the device under test, and utilize the spectrum analyzer to measure the input end and the output end at multiple frequency points respectively, so as to rapidly measure the power supply rejection ratio of the device under test corresponding to different frequency points. In addition, since the present disclosure performs measurement in the frequency domain, the dynamic range of measurement can be improved. Drawings The foregoing and other objects, features, advantages and embodiments of the present disclosure will be apparent from the following description of the drawings in which: FIG. 1 is a schematic diagram of a test system according to some embodiments of the present disclosure; FIG. 2 is a schematic diagram of the device under test of FIG. 1, according to some embodiments of the present disclosure; FIG. 3 is a flow chart of a test method according to some embodiments of the present disclosure; FIG. 4 is a schematic diagram of an inverse Fourier transform according to some embodiments of the present disclosure; FIGS. 5A-5B are schematic diagrams illustrating input ripple intensity and output ripple intensity, respectively, according to some embodiments of the present disclosure; FIG. 6 is a schematic diagram illustrating power supply rejection ratio generation in accordance with some embodiments of the present disclosure; FIG. 7 is a detailed flow chart of an operation of FIG. 3 depicted in accordance with some embodiments of the present disclosure, an FIG. 8 is a detailed flow chart of an operation of FIG. 3 according to some embodiments of the present disclosure. Detailed Description The term "coupled" as used herein may also refer to "electrically coupled" and the term "connected" may also refer to "electrically connected". "coupled" or "connected" may also mean that two or more elements cooperate or interact with each other. Reference is made to fig. 1. FIG. 1 is a schematic diagram of a test system 100 according to some embodiments of the present disclosure. The test system 100 is used to test a DUT to quickly generate a power supply rejection ratio (power supply rejection ratio) of the DUT. In some embodiments, the DUT may be a power chip and the test system 100 may test the power chip to quickly generate the power rejection ratio of the power chip. For example, as shown in fig. 1, the test system 100 includes a control BUS, a signal generator 110, a spectrum analyzer 120, a control device 130, a dc meter 14