Search

CN-116148572-B - Optical device test fixture

CN116148572BCN 116148572 BCN116148572 BCN 116148572BCN-116148572-B

Abstract

The invention aims to provide the optical device testing jig which is simple in structure, convenient to take and place products and free from damaging the products. The invention comprises a box body, a needle block module and a positioning module, wherein the needle block module and the positioning module are arranged on the box body, the positioning module comprises a positioning block and a pressing block, the pressing block is in rotary fit with the positioning block, a product to be tested is placed on the positioning block, the pressing block is pressed on the product to be tested, and the acting end of the needle block module is contacted with the signal end of the product to be tested after the needle block module and the positioning block are detachably connected. The invention is applied to the technical field of electronic product testing.

Inventors

  • Yang Lieran
  • LIANG ZURONG
  • LIANG KE
  • WU CHANGLIN

Assignees

  • 珠海市运泰利自动化设备有限公司

Dates

Publication Date
20260512
Application Date
20230125

Claims (8)

  1. 1. The optical device testing jig comprises a box body, a needle block module (1) and a positioning module (2), wherein the needle block module (1) and the positioning module (2) are arranged on the box body, and the optical device testing jig is characterized in that the positioning module (2) comprises a positioning block (3) and a pressing block (4), the pressing block (4) is in rotary fit on the positioning block (3), a product (5) to be tested is placed on the positioning block (3), the pressing block (4) is pressed on the product (5) to be tested, and the action end of the needle block module (1) is in contact with the signal end of the product (5) to be tested after the needle block module (1) and the positioning block (3) are detachably connected; The positioning block (3) is provided with a positioning groove (6) and a first magnet (7), the head of the product (5) to be tested is adapted to the positioning groove (6), and the tail of the product (5) to be tested is magnetically attracted to the first magnet (7); the positioning block (3) is also provided with a plurality of second magnets (8), and the pressing block (4) is magnetically attracted on the second magnets (8).
  2. 2. The optical device testing jig according to claim 1, wherein the needle block module (1) comprises a carrier body (9), a mounting block (10) and a needle block assembly (11), the mounting block (10) is arranged on the carrier body (9), the needle block assembly (11) is arranged on the mounting block (10), and an acting end of the needle block assembly (11) is in contact with a signal end of a product (5) to be tested.
  3. 3. The optical device testing jig according to claim 2, wherein the pin block assembly (11) comprises a first pin block (12), a second pin block (13), a PCB soft board (14) and a plurality of probes (15), a plurality of transfer copper columns (16) are arranged on the carrier main body (9), the first pin block (12) is arranged on the mounting block (10), the second pin block (13) is arranged on the first pin block (12), the probes (15) sequentially penetrate through the second pin block (13) and the first pin block (12) and then are connected with one end of the PCB soft board (14), the heads of the probes (15) are exposed out of the outer side of the second pin block (13), the heads of the probes (15) are in contact with signal ends of products (5) to be tested, and the other ends of the probes (15) are connected with the plurality of transfer copper columns (16).
  4. 4. The optical device testing jig according to claim 2, wherein a plurality of third magnets (17) are arranged on the mounting block (10) and the carrier main body (9), a plurality of fourth magnets (18) are arranged on the positioning block (3), and the third magnets (17) and the fourth magnets (18) are mutually magnetically attracted.
  5. 5. The optical device testing jig according to claim 2, wherein the mounting block (10) is provided with a plurality of first positioning holes (19), the positioning block (3) is provided with a plurality of first positioning pins (20), and the first positioning pins (20) are adapted to the first positioning holes (19).
  6. 6. The optical device testing jig according to claim 2, wherein the box body comprises an upper cover (21) and a lower cover (22), one side of the upper cover (21) is hinged to one side of the lower cover (22) through a plurality of torsion springs (23), a clamping protrusion (24) is arranged on the other side of the upper cover (21), a buckle (25) is rotatably arranged on the other side of the lower cover (22), the buckle (25) is connected with the lower cover (22) through a plurality of springs (26), and the clamping protrusion (24) is matched with the buckle (25).
  7. 7. The optical device testing jig according to claim 6, wherein a plurality of elastic pressing rods (27) and a plurality of inclined pressing blocks (28) are arranged on the lower end face of the upper cover (21), a plurality of inclined planes (29) are arranged on the positioning block (3), the elastic pressing rods (27) are pressed on the carrier main body (9), and the inclined pressing blocks (28) are pressed on the inclined planes (29).
  8. 8. The fixture for testing optical devices of claim 6, wherein the carrier body (9) is provided with a plurality of second positioning holes (30), the upper end surface of the lower cover (22) is provided with a plurality of second positioning pins (31), and the second positioning pins (31) are adapted to the second positioning holes (30).

Description

Optical device test fixture Technical Field The invention is applied to the technical field of electronic product testing, and particularly relates to an optical device testing jig. Background In the optical component test, the product needs to be positioned, supplied with power and led out, and the optical component product has the characteristics of small size, special structure, higher appearance requirement, sensitivity to the change of the test position and the like. Therefore, the product carrier is required to have high positioning precision and convenient taking and placing, and the product is not easy to damage. But the existing test carrier mostly adopts product profiling groove positioning and fixing products, the scheme positioning accuracy excessively depends on the profiling groove part machining accuracy, the part machining difficulty is high, the profiling groove size is close to the product size, the product is inconvenient to take and place, the product is easy to scratch in the process of taking and placing the product, the optical product has higher requirements on appearance, and scratch will have larger influence on the test result. The prior patent document with the publication number of CN209821238U proposes a PCBA soft and hard combined board test fixture, which comprises a needle plate component and a carrier plate component connected below the needle plate component, wherein the needle plate component is provided with a probe restraint block for restraining a probe, the probe penetrates through the probe restraint block to be electrically connected with a detection point of a product to be tested, the carrier plate component comprises a universal fixed plate and a product placement plate detachably mounted on the universal fixed plate, and a tool imitation groove which is adapted to the shape of the product to be tested is formed in the product placement plate. Therefore, the test fixture adopts the tool-shaped groove to position the product, but the processing difficulty of the tool-shaped groove is higher, and the product is inconvenient to take and place and is extremely easy to damage. If an optical device testing jig which is simple in structure and convenient to take and place products and does not damage the products can be designed, the problem can be well solved. Disclosure of Invention The invention aims to solve the technical problem of overcoming the defects of the prior art and providing the optical device testing jig which has a simple structure, is convenient for taking and placing products and does not damage the products. The invention adopts the technical scheme that the device comprises a box body, a needle block module and a positioning module, wherein the needle block module and the positioning module are arranged on the box body, the positioning module comprises a positioning block and a pressing block, the pressing block is in rotary fit with the positioning block, a product to be tested is placed on the positioning block, the pressing block is pressed on the product to be tested, and the acting end of the needle block module is contacted with the signal end of the product to be tested after the needle block module and the positioning block are detachably connected. Further, a positioning groove and a first magnet are arranged on the positioning block, the head of the product to be tested is adapted to the positioning groove, and the tail of the product to be tested is magnetically attracted to the first magnet. Further, a plurality of second magnets are further arranged on the positioning block, and the pressing block is magnetically attracted to the second magnets. Further, the needle block module comprises a carrier main body, a mounting block and a needle block assembly, wherein the mounting block is arranged on the carrier main body, the needle block assembly is arranged on the mounting block, and the acting end of the needle block assembly is contacted with the signal end of a product to be tested. Further, the needle block assembly comprises a first needle block, a second needle block, a PCB soft board and a plurality of probes, a plurality of transfer copper columns are arranged on the carrier main body, the first needle block is arranged on the mounting block, the second needle block is arranged on the first needle block, the probes sequentially penetrate through the second needle block and the first needle block and then are connected with one end of the PCB soft board, the heads of the probes are exposed out of the second needle block, the heads of the probes are in contact with signal ends of products to be tested, and the other ends of the PCB soft board are connected with the plurality of transfer copper columns. Further, the mounting block and the carrier main body are provided with a plurality of third magnets, the positioning block is provided with a plurality of fourth magnets, and the third magnets and the fourth magnets are mutually magne