CN-116298807-B - Impedance calibration device and method for multi-particle packaged chip

CN116298807BCN 116298807 BCN116298807 BCN 116298807BCN-116298807-B

Abstract

The application discloses an impedance calibration device and method of a multi-particle packaged chip, comprising a calibration resistor and a plurality of calibration modules, wherein the calibration resistor is connected with the plurality of calibration modules, the plurality of calibration modules are in one-to-one correspondence with a plurality of chip particles in the multi-particle packaged chip, the calibration modules comprise first calibration units for calibrating the corresponding chip particles by using the calibration resistor, second calibration units for calibrating the corresponding chip particles by using the first calibration units after the first calibration units are calibrated, and when the plurality of calibration modules are used for calibrating the corresponding chip particles one by one, the first calibration units of each calibration module except for the first calibration unit start to calibrate before the second calibration units finish calibration after the first calibration units of the previous calibration modules finish calibration. When the device calibrates the multi-particle packaged chip, the first calibration unit and the second calibration unit among different calibration modules can calibrate corresponding chip particles at the same time. Therefore, the scheme can shorten the impedance calibration time of the multi-particle packaged chip.

Inventors

Yue Huiyuan
LIU FEI
HUO ZONGLIANG

Assignees

中国科学院微电子研究所

Dates

Publication Date: 20260505
Application Date: 20230330

Claims (10)

1. The impedance calibration device of the multi-particle packaged chip is characterized by comprising a calibration resistor and a plurality of calibration modules, wherein the calibration resistor is connected with the plurality of calibration modules, and the plurality of calibration modules are in one-to-one correspondence with driving circuits of a plurality of chip particles in the multi-particle packaged chip; the calibration module comprises a first calibration unit and a second calibration unit, wherein the first calibration unit is used for calibrating a first driving circuit of a driving circuit corresponding to a calibration module to which the calibration resistor belongs by the calibration unit, the second calibration unit is used for connecting an output end of the first comparator with the first counter after the first calibration unit belonging to the same calibration module finishes calibration, the second calibration unit comprises a second comparator, a second counter, a first calibration circuit and a replication circuit, one input end of the second comparator is connected with the calibration level in series, one input end of the first comparator is connected with a common end of the first calibration circuit and the calibration resistor, and the other input end of the second comparator is connected with the first counter; when a plurality of calibration modules are used for calibrating the corresponding driving circuits one by one, the first calibration unit of each calibration module starts to calibrate after the first calibration unit of the previous calibration module finishes calibrating and before the second calibration unit finishes calibrating except for the first calibration module.
2. The apparatus of claim 1, wherein the impedance calibration apparatus further comprises a plurality of control modules in one-to-one correspondence with the calibration modules; The control module is used for controlling the first calibration unit and the second calibration unit of the calibration module to calibrate.
3. The apparatus according to claim 2, wherein the control module is configured to control the first calibration unit and the second calibration unit of the calibration module to perform calibration, in particular: If the control module corresponds to the first calibration module, the control module controls the first calibration unit and the second calibration unit of the first calibration module to calibrate in sequence after obtaining a calibration starting signal; If the control module corresponds to a calibration module except the first calibration module, the control module controls the first calibration unit and the second calibration unit of the corresponding calibration module to calibrate in sequence after obtaining a first end signal of the previous calibration module, wherein the first end signal represents that the first calibration unit of the previous calibration module ends calibration; And outputting a first ending signal to a latter calibration module after the corresponding first calibration unit of the calibration module finishes calibration.
4. The apparatus according to claim 1, wherein the replica circuit has the same circuit configuration as the first calibration circuit, which has the same circuit configuration as a first driving circuit, which refers to a driving circuit of the driving circuits calibrated by the first calibration unit; the first counter is used for: And outputting a first calibration signal for adjusting a first target impedance according to a comparison result of the first comparator until the resistance values of the first target impedance and the calibration resistor meet a preset first quantity relation, wherein the first target impedance refers to the impedance of the first driving circuit, the first calibration circuit and the replica circuit.
5. The apparatus according to claim 4, wherein the second calibration circuit has the same circuit configuration as a second drive circuit, which refers to a drive circuit of the drive circuits that is calibrated by the second calibration unit; The second calibration circuit is connected in series with the replica circuit of the first calibration unit of the same calibration module; the second counter is used for: Outputting a second calibration signal for adjusting a second target impedance according to a comparison result of the second comparator until the resistance values of the second target impedance and the calibration resistor meet a preset second number relation, wherein the second target impedance refers to the impedance of the second driving circuit and the second calibration circuit.
6. The apparatus of claim 5, wherein the first drive circuit is a pull-down drive circuit and the second drive circuit is a pull-up drive circuit; or the first driving circuit is a pull-up driving circuit, and the second driving circuit is a pull-down driving circuit.
7. The apparatus of claim 5, wherein the first quantitative relationship is: The resistance values of the first target impedance and the calibration resistor are equal, or the ratio of the resistance values of the first target impedance and the calibration resistor is a preset first ratio; the second quantitative relationship is: and the resistance values of the second target impedance and the calibration resistor are equal, or the ratio of the resistance values of the second target impedance and the calibration resistor is a preset second ratio.
8. The apparatus of claim 5, wherein the first counter is configured to, when outputting the first calibration signal for adjusting the first target impedance according to the comparison result of the first comparator: outputting a first calibration signal for adjusting a first target impedance according to a comparison result of the first comparator and a preset calibration algorithm; The second counter is specifically configured to, when outputting a second calibration signal for adjusting a second target impedance according to a comparison result of the second comparator: and outputting a second calibration signal for adjusting the second target impedance according to the comparison result of the second comparator and a preset calibration algorithm.
9. The apparatus of claim 1, wherein the first calibration unit of each of the calibration modules starts calibration after the first calibration unit of a previous calibration module ends calibration before the second calibration unit ends calibration, comprising: When the preset calibration mode is a first calibration mode, the first calibration unit of each calibration module starts to calibrate after the first calibration unit of the previous calibration module finishes calibration and before the second calibration unit finishes calibration; when the calibration mode is a second calibration mode, the first calibration unit of each calibration module starts calibration after the second calibration unit of a previous calibration module ends calibration.
10. An impedance calibration method for a multiparticulate packaged chip, applied to an impedance calibration device for multiparticulate packaged chips as defined in any one of claims 1 to 9, the method comprising: Calibrating the corresponding driving circuits one by utilizing a plurality of calibration modules until each driving circuit is calibrated; Wherein the first calibration unit of each calibration module, except for the first calibration module, starts calibration after the first calibration unit of the previous calibration module ends calibration and before the second calibration unit ends calibration.

Description

Impedance calibration device and method for multi-particle packaged chip Technical Field The application belongs to the technical field of chip calibration, and particularly relates to an impedance calibration device and method for a multi-particle packaged chip. Background The multi-particle packaged chip is composed of a plurality of chip particles, and each chip particle is provided with a high-speed transceiving drive interface circuit (hereinafter referred to as a drive circuit) serving as a physical interface of the chip particle. The driver circuit of the particle typically needs to meet the impedance matching requirements specified in the relevant standard, i.e. the external impedance that the driver circuit exhibits in operation should be matched to the standard impedance specified in the relevant standard. The external impedance of the driving circuit may fluctuate greatly due to factors such as the process, voltage and temperature (Process, voltage, temperature, PVT) during chip processing, so that the external impedance of the driving circuit is not matched with the standard impedance, and therefore, the impedance calibration needs to be performed on the driving circuit of each particle in the multi-particle packaged chip. The impedance calibration requires the use of off-chip calibration resistors. In the existing impedance calibration scheme, a plurality of driving circuits share one off-chip calibration resistor. Therefore, only the driving circuit of one particle can be calibrated at the same time in the calibration process, namely, the driving circuit of one particle is calibrated first, the driving circuit of the particle starts to calibrate the driving circuit of the next particle after the calibration of the driving circuit of the particle is finished, and so on. This calibration method results in longer impedance calibration times for multiparticulate packaged chips. Disclosure of Invention Therefore, the application discloses the following technical scheme: the application provides an impedance calibration device of a multi-particle packaged chip, which comprises a calibration resistor and a plurality of calibration modules, wherein the calibration resistor is connected with the plurality of calibration modules, and the plurality of calibration modules are in one-to-one correspondence with driving circuits of a plurality of chip particles in the multi-particle packaged chip; the calibration module comprises a first calibration unit for calibrating the corresponding driving circuit by using the calibration resistor, and a second calibration unit for calibrating the corresponding driving circuit by using the first calibration unit after the first calibration unit finishes calibration; when a plurality of calibration modules are used for calibrating the corresponding driving circuits one by one, the first calibration unit of each calibration module starts to calibrate after the first calibration unit of the previous calibration module finishes calibrating and before the second calibration unit finishes calibrating except for the first calibration module. Optionally, the impedance calibration device further includes a plurality of control modules corresponding to the calibration modules one to one; The control module is used for controlling the first calibration unit and the second calibration unit of the calibration module to calibrate. Optionally, the control module is specifically configured to, when controlling the first calibration unit and the second calibration unit of the calibration module to perform calibration: If the control module corresponds to the first calibration module, the control module controls the first calibration unit and the second calibration unit of the first calibration module to calibrate in sequence after obtaining a calibration starting signal; If the control module corresponds to a calibration module except the first calibration module, the control module controls the first calibration unit and the second calibration unit of the corresponding calibration module to calibrate in sequence after obtaining a first end signal of the previous calibration module, wherein the first end signal represents that the first calibration unit of the previous calibration module ends calibration; And outputting a first ending signal to a latter calibration module after the corresponding first calibration unit of the calibration module finishes calibration. Optionally, the first calibration unit includes a first comparator, a first counter, a first calibration circuit and a replica circuit; the replica circuit has the same circuit structure as the first calibration circuit, which has the same circuit structure as a first driving circuit, which refers to a driving circuit of the driving circuits calibrated by the first calibration unit; the first calibration circuit and the calibration resistor are connected in series; one input end of the first comparator is connected with a ca