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CN-116312716-B - System and method for testing memory device and computer readable storage medium

CN116312716BCN 116312716 BCN116312716 BCN 116312716BCN-116312716-B

Abstract

A method of testing a memory device includes the following steps. A plurality of commands conforming to the specifications of the memory device are used. Performing a random decision on the plurality of commands to generate a plurality of different patterns, causing at least one test device to test the memory device according to the plurality of different patterns, wherein each of the plurality of different patterns comprises a sequence of one or more commands randomly selected from the plurality of commands. By means of the technical scheme of the invention, the method can automatically generate different modes meeting the specification of the memory device, thereby effectively and completely testing the memory device.

Inventors

  • ZHANG BOXUN

Assignees

  • 南亚科技股份有限公司

Dates

Publication Date
20260505
Application Date
20220217
Priority Date
20211213

Claims (14)

  1. 1. A system for testing a memory device, the system comprising: a memory device for storing at least one instruction, and The processor is electrically connected with the storage device and is used for accessing and executing the at least one instruction: Using a plurality of commands conforming to the specification of the memory device; performing a random decision on the plurality of commands to generate a plurality of different modes, wherein each of the plurality of different modes includes a sequence of one or more commands randomly selected from the plurality of commands; classifying the plurality of different patterns into a plurality of groups having a plurality of different test preferences; selecting one or more groups from the plurality of groups, and One or more patterns are randomly selected from the one or more groups for permutation and combination to generate at least one combined sequence, and at least one testing device is made to test the memory device according to the at least one combined sequence.
  2. 2. The system of claim 1, wherein the memory device stores the specification including definitions of the plurality of commands, a plurality of timings, and an operating environment, the processor accessing and executing the at least one instruction: using the plurality of commands and the plurality of timings according to the specification of the memory device, and The random decision is performed on the plurality of commands and the plurality of timings to establish the plurality of different modes, wherein each of the plurality of different modes includes the sequence of one or more commands randomly selected from the plurality of commands and one or more timings randomly selected from the plurality of timings.
  3. 3. The system of claim 1, wherein the processor accesses and executes the at least one instruction: Analyzing the respective test preferences of each of the plurality of different modes based on the characteristics of the one or more commands in each of the plurality of different modes, and Classifying the plurality of different patterns into the plurality of groups according to the respective test preferences of each of the plurality of different patterns, such that the plurality of groups have the plurality of different test preferences, respectively.
  4. 4. The system of claim 1, wherein the memory device stores a list to record the plurality of groups, the processor accessing and executing the at least one instruction: When a new group is generated, the new group is added to a list.
  5. 5. The system of claim 1, wherein the processor accesses and executes the at least one instruction: The random decision is re-performed based on the changed conditions to generate a plurality of different new patterns.
  6. 6. A method of testing a memory device, the method comprising the steps of: Using a plurality of commands conforming to the specification of the memory device; performing a random decision on the plurality of commands to generate a plurality of different modes, wherein each of the plurality of different modes includes a sequence of one or more commands randomly selected from the plurality of commands; classifying the plurality of different patterns into a plurality of groups having a plurality of different test preferences; selecting one or more groups from the plurality of groups, and One or more patterns are randomly selected from the one or more groups for permutation and combination to generate at least one combined sequence, and at least one testing device is made to test the memory device according to the at least one combined sequence.
  7. 7. The method of claim 6, wherein using the plurality of commands that meet the specification of the memory device comprises: Preloading the specification including definitions of the plurality of commands, the plurality of timings, and the operating environment, and Using the plurality of commands and the plurality of timings according to the specification of the memory device, Wherein performing the random decision on the plurality of commands to generate the plurality of different patterns comprises: The random decision is performed on the plurality of commands and the plurality of timings to establish the plurality of different modes, wherein each of the plurality of different modes includes the sequence of one or more commands randomly selected from the plurality of commands and one or more timings randomly selected from the plurality of timings.
  8. 8. The method of claim 6, wherein classifying the plurality of different patterns into the plurality of groups having the plurality of different test preferences comprises: Analyzing the respective test preferences of each of the plurality of different modes based on the characteristics of the one or more commands in each of the plurality of different modes, and Classifying the plurality of different patterns into the plurality of groups according to the respective test preferences of each of the plurality of different patterns, such that the plurality of groups have the plurality of different test preferences, respectively.
  9. 9. The method as recited in claim 6, further comprising: storing a list to record the plurality of groups, and When a new group is generated, the new group is added to a list.
  10. 10. The method as recited in claim 6, further comprising: The random decision is re-performed based on the changed conditions to generate a plurality of different new patterns.
  11. 11. A computer readable storage medium storing a plurality of instructions for causing a computer to perform a method of testing a memory device, the method comprising the steps of: Using a plurality of commands conforming to the specification of the memory device; Performing a random decision on the plurality of commands to generate a plurality of different modes, causing at least one test device to test the memory device according to the plurality of different modes, wherein each of the plurality of different modes includes a sequence of one or more commands randomly selected from the plurality of commands; classifying the plurality of different patterns into a plurality of groups having a plurality of different test preferences; selecting one or more groups from the plurality of groups, and One or more patterns are randomly selected from the one or more groups for permutation and combination to generate at least one combined sequence, and at least one testing device is made to test the memory device according to the at least one combined sequence.
  12. 12. The computer-readable storage medium of claim 11, wherein the step of using the plurality of commands that meet the specification of the memory device comprises: Preloading the specification including definitions of the plurality of commands, the plurality of timings, and the operating environment, and Using the plurality of commands and the plurality of timings according to the specification of the memory device, Wherein performing the random decision on the plurality of commands to generate the plurality of different patterns comprises: The random decision is performed on the plurality of commands and the plurality of timings to establish the plurality of different modes, wherein each of the plurality of different modes includes the sequence of one or more commands randomly selected from the plurality of commands and one or more timings randomly selected from the plurality of timings.
  13. 13. The computer-readable storage medium of claim 11, wherein classifying the plurality of different patterns into the plurality of groups having the plurality of different test preferences comprises: Analyzing the respective test preferences of each of the plurality of different modes based on the characteristics of the one or more commands in each of the plurality of different modes, and Classifying the plurality of different patterns into the plurality of groups according to the respective test preferences of each of the plurality of different patterns, such that the plurality of groups have the plurality of different test preferences, respectively.
  14. 14. The computer readable storage medium of claim 11, wherein the method further comprises: storing a list to record the plurality of groups, and When a new group is generated, the new group is added to a list.

Description

System and method for testing memory device and computer readable storage medium Technical Field The present invention relates generally to a system and method, and more particularly to a system and method for testing a memory device. Background A Dynamic Random Access Memory (DRAM) is a random access semiconductor memory that stores each bit of data in a memory cell. The pattern is now used to analyze whether the DRAM is good enough. Basically, regardless of the tester, the mode is initially planned manually. The mode depends on the mind of the person. The structure of the manual programming mode is generally simple, and thus the manual programming mode is insufficient to effectively and completely test the DRAM. In order to solve the above problems, the related art has not been thoroughly solved, but has not been developed in a suitable manner for a long time. Therefore, how to solve the above problems more efficiently is one of the important research and development problems at present, and it is also an urgent need for improvement in the related art. Disclosure of Invention The present invention provides a system and method for testing a memory device and a computer readable storage medium, which improve the problems of the prior art. In an embodiment of the invention, a system for testing a memory device includes a memory device and a processor electrically connected to the memory device. The memory device is used for storing at least one instruction, the processor is used for accessing and executing the at least one instruction, a plurality of commands conforming to the specification of the memory device are used, random decisions are performed on the plurality of commands to generate a plurality of different modes, and at least one testing device is used for testing the memory device according to the plurality of different modes, wherein each of the plurality of different modes comprises a sequence of one or more commands randomly selected from the plurality of commands. In one embodiment of the present invention, a memory device stores a specification including a plurality of commands, a plurality of timings, and a definition of an operating environment, a processor accesses and executes at least one instruction using the plurality of commands and the plurality of timings according to the specification of the memory device, performs a random decision on the plurality of commands and the plurality of timings to establish a plurality of different modes, wherein each of the plurality of different modes includes a sequence of one or more commands randomly selected from the plurality of commands and one or more timings randomly selected from the plurality of timings. In one embodiment of the invention, a processor accesses and executes at least one instruction to sort a plurality of different patterns into a plurality of groups having a plurality of different test preferences. In one embodiment of the invention, a processor accesses and executes at least one instruction to analyze respective test preferences for each of a plurality of different modes based on characteristics of one or more commands in each of the plurality of different modes, and to sort the plurality of different modes into a plurality of groups according to the respective test preferences for each of the plurality of different modes, such that the plurality of groups have a plurality of different test preferences, respectively. In one embodiment of the present invention, a processor accesses and executes at least one instruction to select one or more groups from a plurality of groups, randomly select one or more patterns from the one or more groups to be arranged and combined to generate at least one combined sequence, and cause at least one test device to test a memory device according to the at least one combined sequence. In one embodiment of the present invention, the storage device stores a list to record a plurality of groups, and the processor accesses and executes at least one instruction to add a new group to the list when the new group is generated. In one embodiment of the invention, the processor accesses and executes at least one instruction to re-execute the random decisions based on the changed conditions to generate a plurality of different new patterns. In one embodiment of the present invention, a method of testing a memory device includes using a plurality of commands conforming to a specification of the memory device, performing a random decision on the plurality of commands to generate a plurality of different modes, causing at least one test device to test the memory device according to the plurality of different modes, wherein each of the plurality of different modes includes a sequence of one or more commands randomly selected from the plurality of commands. In one embodiment of the present invention, the step of using a plurality of commands conforming to the specification of the memory device includes preloadi