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CN-120334645-B - Electronic component aging test equipment

CN120334645BCN 120334645 BCN120334645 BCN 120334645BCN-120334645-B

Abstract

The invention relates to the technical field of electronic element testing, in particular to electronic element aging test equipment, which comprises a supporting seat and a test workbench, wherein a centrifugal rotating mechanism is arranged on the supporting seat, the test workbench is connected to the centrifugal rotating mechanism, a plurality of test stations are arranged on the test workbench, a plurality of connecting terminals are arranged on a single test station, the heights of the lower ends of the connecting terminals positioned on the same side are sequentially decreased, the lower ends of the connecting terminals of the plurality of test stations positioned on the same side and the lower ends of the connecting terminals positioned on the same side are electrically connected with a test electric column, the centrifugal rotating mechanism drives the test workbench to centrifugally rotate, the gravity acceleration environment in aviation flight can be simulated, the connecting terminals with decreased heights can be connected with the plurality of test electric columns in a penetrating manner, and the electronic element aging test equipment is combined with centrifugal rotation dynamic test, multi-pin synchronous test and heat dissipation optimization, so that the efficiency and the accuracy of the electronic element aging test are remarkably improved.

Inventors

  • MIAO FANGFANG
  • Mi Shanggang
  • HE YUTING

Assignees

  • 无锡景鑫电子科技有限公司

Dates

Publication Date
20260508
Application Date
20250529

Claims (8)

  1. 1. An electronic component aging test device comprises two supporting seats (1) and a test workbench (2) arranged between the two supporting seats (1); The device is characterized in that two support seats (1) are provided with centrifugal rotating mechanisms (4), two ends of a test workbench (2) are connected to the centrifugal rotating mechanisms (4), and the centrifugal rotating mechanisms (4) drive the test workbench (2) to centrifugally rotate so as to simulate a gravity acceleration environment in the aviation flight process; The two centrifugal rotating mechanisms (4) comprise rotating shafts (41) and eccentric wheels (42) sleeved on the rotating shafts (41), the rotating shafts (41) are arranged on the supporting seat (1) through rotating connectors, and the test workbench (2) is movably connected to the eccentric wheels (42) through pin shafts; one of the supporting seats (1) is provided with a driving motor (5), and the output end of the driving motor (5) is connected with a rotating shaft (41) of a centrifugal rotating mechanism (4) at a corresponding position; The other support seat (1) is provided with a collecting ring (6), and the test electric column (3) is rotationally connected with test equipment through the collecting ring (6); a plurality of test stations (21) are arranged on the test workbench (2), a plurality of connecting terminals (9) are arranged on each test station (21), and the heights of the lower ends of the connecting terminals (9) positioned on the same side are sequentially decreased; the lower ends of the connecting terminals (9) of the plurality of test stations (21) which are positioned on the same side and the lower ends of the connecting terminals are positioned at the same height are electrically connected with a test electric column (3) in a penetrating way, and the single test electric column (3) correspondingly controls one test item.
  2. 2. The device for testing the aging of the electronic component according to claim 1, wherein a wiring hole (24) is formed in one end of the test workbench (2) close to the collecting ring (6), and wires connected to the test electric column (3) are connected out through the wiring hole (24).
  3. 3. The burn-in equipment for electronic components according to claim 1, wherein the test table (2) is provided with a linear pad (7), the pad (7) simultaneously penetrates through a plurality of test stations (21), and the package body of the electronic component is placed on the pad (7).
  4. 4. The electronic component aging test equipment according to claim 3, wherein the upper end of the base plate (7) is matched with a plurality of square pressing plates (8), the pressing plates (8) are simultaneously pressed against the upper ends of the plurality of electronic component packaging main bodies, and the base plate (7) and the pressing plates (8) are detachably connected through bolts.
  5. 5. The electronic component burn-in equipment according to claim 4, wherein the backing plate (7) and the pressing plate (8) are made of ceramic materials having heat conduction and insulation properties.
  6. 6. The burn-in equipment for electronic components according to claim 1, wherein the test bench (2) is provided with a through hole (22) at an upper end region corresponding to the connection terminal (9), and pins of the electronic components are inserted into the connection terminal (9) through the through hole (22).
  7. 7. The electronic component burn-in equipment according to claim 1, wherein a convex portion (91) is provided at one side of the lower end of each of the connection terminals (9), the directions of the convex portions (91) provided at the lower ends of the adjacent two connection terminals (9) are opposite, and the test electric column (3) is connected to the convex portion (91) in a penetrating manner.
  8. 8. The electronic component burn-in equipment according to claim 7, wherein a plurality of bosses (23) are provided in the test table (2), and the bosses (23) are supported at the lower ends of the connection terminals (9).

Description

Electronic component aging test equipment Technical Field The invention relates to the technical field of electronic element testing, in particular to electronic element aging testing equipment. Background Electronic components (electronic component) are the basic units that make up an electronic circuit, typically packaged separately and having two or more leads or metal contacts, that are interconnected by soldering (e.g., printed circuit boards) or the like to perform a particular function (e.g., amplification, oscillation, etc.). With the development of electronic technology, the requirements on the stability and reliability of electronic components are also higher and higher, and especially the products applied in the aerospace industry. The defects and hidden dangers of the internal electrodes of the components can be exposed in advance through the high-temperature electrical aging test of the electronic component product, so that the finished product can withstand the test of time, and the electronic component product has important significance for improving the stability and reliability of the product. In order to simulate the effect of aging of internal elements of an electronic product caused by various factors (such as temperature change, electric stress influence and the like) in the long-term operation process of the electronic product in an actual use environment, the aging test device can apply a certain electric stress to the electronic product so as to accelerate the aging process of the product and evaluate the performance of the product in a short time. The published Chinese patent with the publication number of CN106405274B discloses an electronic component aging testing device which comprises a carrier plate and a side guide plate. By using the electronic element aging test device, the electronic element is not required to be welded on a PCB (printed circuit board) for aging test, the electronic element is only required to be placed in the mounting groove, the electronic element is respectively and electrically connected with two end electrodes of the electronic element through the side conductive pins and the middle conductive plate, and then the electronic element is connected with an external power supply for current aging test. The non-welding aging test is realized through the loading plate, the side guide plate, the conductive pins and the middle conductive plate, the side conductive pins and the middle conductive plate are respectively connected with electrodes at two ends of the electronic element to support batch test, and the upper guide plate is provided with the conductive pins which can be connected with the middle electrode to support voltage test. However, the technical scheme provided by the disclosed invention still has the following limitations: 1. For electronic elements of products applied to aerospace industry, the dynamic gravity acceleration environment in aviation flight cannot be simulated, so that deviation exists between test conditions and actual working conditions, and the authenticity of an aging test is affected; 2. The single test can only aim at a single project, and in the actual test process, the test duration of the single project is about four hours, and the multi-pin element needs to be repeatedly operated, which is time-consuming and has low efficiency. Disclosure of Invention In view of the above-mentioned shortcomings of the prior art, the invention aims to provide an electronic component aging test device, which is characterized in that a centrifugal rotating mechanism is arranged on a supporting seat, a driving motor is used for driving the centrifugal rotating mechanism to drive a test workbench to centrifugally rotate, a dynamic gravity acceleration environment in aviation flight is simulated, the gravity acceleration condition can be adjusted as required in the simulation process by adjusting the output rotating speed of the driving motor, the reality of aging test is improved, a plurality of connecting terminals with decreasing heights are respectively arranged on two sides of the same test station, test electric columns which are respectively connected with the connecting terminals in a penetrating manner can independently control different test items, so that multi-pin synchronous test is realized, the efficiency is improved remarkably, the decreasing height design of the connecting terminals can avoid interference among the plurality of test electric columns, the test structure layout is optimized, the electronic components of the plurality of the test stations which are positioned on the same side and the lower end of the test station are positioned on the same height can be synchronously measured, the consistency of mass electronic component test is improved, and the electronic component aging test device can not simulate the dynamic gravity environment in aviation flight in the prior art and the single time and only aim at the low agi