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CN-121298605-B - LED chip nondestructive testing device and method

CN121298605BCN 121298605 BCN121298605 BCN 121298605BCN-121298605-B

Abstract

The invention belongs to the technical field of chip detection, in particular to a nondestructive detection device and a nondestructive detection method for an LED chip, aiming at the defect that the back of the chip can not be found in the traditional mode of only detecting one side of the chip, the nondestructive detection device and the nondestructive detection method for the LED chip are proposed. The nondestructive testing device and the nondestructive testing method for the LED chip have the advantages that the turnover plate can rotate 180 degrees, the front surface and the back surface of the LED chip can be tested, and compared with the single-surface detection, the nondestructive testing device and the nondestructive testing method for the LED chip can more comprehensively find possible problems of the chip and guarantee the quality of the chip.

Inventors

  • XU PING
  • XU YABING
  • TAN JIAN

Assignees

  • 湘能华磊光电股份有限公司

Dates

Publication Date
20260505
Application Date
20251128

Claims (8)

  1. 1. The utility model provides a nondestructive test device of LED chip, includes chip detection machine (1), its characterized in that, be provided with display (2) on chip detection machine (1), the front end of chip detection machine (1) is provided with workstation (3), and workstation (3) are located the below of display (2), are provided with work board (13) on workstation (3), have seted up rectangular hole on work board (13), rectangular hole inside is provided with upset double-sided detection subassembly (16), upset double-sided detection subassembly (16) include upset board (1601), and the inside of upset board (1601) is provided with removal grip block (1603), and the top of upset board (1601) is provided with fixed plate (1602), the LED chip is located between fixed plate (1602) and the removal grip block (1603), and the top of upset board (1601) is provided with scale plate (1607); The anti-falling device comprises a working plate (13), wherein two anti-falling assemblies (14) are fixedly connected to the bottom end of the working plate (13), the anti-falling assemblies (14) comprise an inclined plate (1401), one side of the inclined plate (1401) is fixedly connected with a plurality of damping springs (1402), one end of the damping springs (1402) away from the inclined plate (1401) is fixedly connected with an inclined pad (1403), the inner side of the inclined pad (1403) is provided with a gravity sensor (1404), the bottom end of the inclined plate (1401) is fixedly connected with a bottom plate (1405), two round holes are formed in the bottom plate (1405), movable rods (1408) are respectively arranged in the round holes, one end of each movable rod (1408) close to the gravity sensor (1404) is fixedly connected with a movable plate (1406), the top end of each movable plate (1406) is fixedly connected with a damping pad (1407), one side of the bottom plate (1405) away from the movable plate (1406) is fixedly connected with a telescopic electric rod (1409), the telescopic end of the telescopic electric rod (1409) is fixedly connected with a displacement plate (1410), one side of the displacement plate (1410) close to the telescopic electric rod (1409) is fixedly connected with a connecting plate (1411), and one side of the connecting plate (1411) is fixedly connected with one side of the movable plate (1406) close to the damping plate (1406).
  2. 2. The nondestructive testing device for the LED chip according to claim 1, wherein an annular frame (1612) is fixedly connected to the lower portion of the working plate (13), a servo motor (1611) is fixedly connected to the inside of the annular frame (1612), a power output shaft of the servo motor (1611) is connected with a rotating gear (1610) through a coupling, a rotating gear (1608) is arranged above the rotating gear (1610), and the rotating gear (1610) is meshed with the rotating gear (1608) through tooth grooves.
  3. 3. The LED chip nondestructive testing device according to claim 2, wherein the rotary gear (1608) is rotatably connected with a fixing rod (1609), one end of the fixing rod (1609) far away from the rotary gear (1608) is fixedly connected with one side of the annular frame (1612), one side of the turnover plate (1601) close to the servo motor (1611) is fixedly connected with one side of the rotary gear (1608), the inner side of the bottom end of the turnover plate (1601) is rotatably connected with the outer side of the fixing rod (1609), the inner side of the bottom end of the turnover plate (1601) far away from the servo motor (1611) is provided with a supporting rod (1613), and one end of the supporting rod (1613) is fixedly connected with the bottom end of the working plate (13).
  4. 4. The device for nondestructive testing of an LED chip according to claim 3, wherein a moving rod (1606) is disposed at the bottom end of the turnover plate (1601), the moving rod (1606) is located below the scale plate (1607), the bottom end of the turnover plate (1601) far away from the moving rod (1606) is fixedly connected with a sliding groove plate (1604), the bottom ends of the moving clamping plates (1603) are movably connected to the outside of the sliding groove plate (1604) and the moving rod (1606), an electric telescopic rod (1605) is fixedly connected to the bottom end of one side of the turnover plate (1601) near the sliding groove plate (1604), and the telescopic end of the electric telescopic rod (1605) is fixedly connected to one side of the moving clamping plates (1603) near the fixed plate (1602).
  5. 5. The LED chip nondestructive testing device according to claim 4, wherein a control cabinet (4) is arranged below the chip testing machine (1), a base (5) is arranged at the bottom end of the control cabinet (4), a transverse stroke seat (8) is arranged at the top end of the workbench (3), a sliding seat (9) is arranged at the top end of the transverse stroke seat (8), a fixing frame (7) is fixedly connected to the top end of the sliding seat (9), and the front end of the fixing frame (7) is fixedly connected to one side of the detection mechanism (6).
  6. 6. The LED chip nondestructive testing device according to claim 5, wherein a driving motor (18) is arranged at the bottom end of the workbench (3), a power output shaft of the driving motor (18) is connected with a rotary threaded rod (17) through a coupling, the outer sides of two ends of the rotary threaded rod (17) are fixedly connected to the bottom end of the workbench (3), a guide rod (19) is arranged at the bottom end of the workbench (3), and movable seats (11) are arranged on the outer sides of the guide rod (19) and the rotary threaded rod (17).
  7. 7. The nondestructive testing device for the LED chip according to claim 6, wherein the workbench (3) is provided with two slots, the movable seat (11) is slidably connected inside the slots, the top end of the workbench (3) is provided with two retaining rods (10), the inner side of the top end of the movable seat (11) is movably connected to the outer side of the retaining rods (10), the top end of the movable seat (11) is fixedly connected with the symmetrical frame (12), one side opposite to the symmetrical frame (12) is fixedly connected to the outer side of the working plate (13), the top end of the workbench (3) is provided with a lifting and rotating mechanism (15), and the top end of the lifting and rotating mechanism (15) is located below the turnover plate (1601).
  8. 8. A method of using an LED chip non-destructive inspection apparatus according to claim 7, comprising the steps of: Step one, when the nondestructive detection of the LED chip is carried out, a driving motor (18) drives a working plate (13) to integrally move forwards, and the LED chip is placed in the hollow position of a turnover plate (1601) in the double-sided turnover detection assembly, so that the bottom end of the LED chip is positioned at the top end of a lifting and rotating mechanism (15); Step two, starting an electric telescopic rod (1605), driving a movable clamping plate (1603) to approach to the outer side of the LED chip, clamping two sides of the chip together with a fixed plate (1602), and displaying the moving position of the movable clamping plate (1603) on a scale plate (1607) so as to detect whether the length and the width of the LED chip meet the specification; thirdly, if the detection specification is met, the plate at the top end of the lifting rotating mechanism (15) moves downwards and rotates, the driving motor (18) drives the whole working plate (13) and the LED chip to move to the position right below the chip detection machine (1), and then the detection mechanism (6) is started to detect the surface of the chip, and the detection content is displayed on the display (2) in real time; Step four, after the front surface detection of the LED chip is finished, starting a servo motor (1611), enabling the servo motor (1611) to drive a rotary gear (1608) to rotate, enabling the turnover plate (1601) to integrally rotate 180 degrees, enabling the front surface of the chip to face downwards and the back surface to face upwards, and then starting a detection mechanism (6) again to detect the back surface of the chip; Step five, in the upset in-process, fall protection subassembly (14) of preventing of upset working plate (13) bottom can carry out real-time protection, if the LED chip takes place to drop, and the chip after falling can contact slant pad (1403) of slant board (1401) earlier and carry out preliminary shock attenuation, and gravity inductor (1404) in slant pad (1403) detect the chip and drop this moment, start flexible electric pole (1409) immediately, drive movable plate (1406) through connecting plate (1411) and remove, make the LED chip that drops finally fall on shock pad (1407) of movable plate (1406), prevent the chip damage.

Description

LED chip nondestructive testing device and method Technical Field The invention relates to the technical field of chip detection, in particular to a nondestructive testing device and method for an LED chip. Background The LED chip is a solid semiconductor device, the heart of the LED is a semiconductor wafer, one end of the wafer is attached to a bracket, the other end of the wafer is a negative electrode, and the other end of the wafer is connected with the positive electrode of a power supply, so that the whole wafer is encapsulated by epoxy resin. The traditional chip detection mode is usually only aimed at single-sided unfolding of the chip, and due to the lack of an automatic overturning mechanism, defects such as circuit damage, poor packaging and the like possibly existing on the back of the chip cannot be detected at all, and the chip is overturned manually by virtue of manpower, so that extra damage is easily caused to the chip due to improper operation in the manual overturning process. Disclosure of Invention The invention discloses a nondestructive testing device and method for an LED chip, and aims to solve the technical problem that the prior art only detects one side of the chip, the possible defects on the back of the chip cannot be found, and the overturning is needed by manpower. The invention provides an LED chip nondestructive testing device, which comprises a chip testing machine, wherein a display is arranged on the chip testing machine, a workbench is arranged at the front end of the chip testing machine and is positioned below the display, a working plate is arranged on the workbench, a rectangular hole is formed in the working plate, a turnover double-sided detection assembly is arranged in the rectangular hole, the turnover double-sided detection assembly comprises a turnover plate, a movable clamping plate is arranged in the turnover plate, a fixed plate is arranged at the top end of the turnover plate, an LED chip is positioned between the fixed plate and the movable clamping plate, and a scale plate is arranged at the top end of the turnover plate. In a preferred scheme, the below fixedly connected with annular frame of working plate, the inside fixedly connected with servo motor of annular frame, and servo motor's power take off shaft has the rotation gear through the coupling joint, and the top of rotation gear is provided with the rotation gear, meshes mutually through the tooth's socket between rotation gear and the rotation gear, the inside rotation of rotation gear is connected with the dead lever, and the dead lever is kept away from one end fixedly connected with in one side of annular frame of rotation gear, and the one side fixedly connected with of servo motor that is close to of upset board, the inboard rotation of bottom of upset board is connected in the outside of dead lever, and the inboard bottom that is provided with the bracing piece that is kept away from to the upset board, the one end fixedly connected with of bracing piece and working plate's bottom, the bottom of upset board is provided with the movable rod, and the movable rod is located the below of scale board, and the bottom fixedly connected with frid that the movable rod was kept away from to the upset board, and the one side bottom fixedly connected with electric telescopic handle that the upset board is close to the frid, the telescopic handle that the electric handle is close to one side of fixed handle. In a preferred scheme, two anti-falling assemblies of bottom fixedly connected with of working plate, anti-falling assemblies include the inclined plate, one side fixedly connected with of inclined plate a plurality of damping spring, and damping spring keeps away from the one end fixedly connected with inclined pad of inclined plate, and the inboard of inclined pad is provided with gravity inductor, the bottom fixedly connected with bottom plate of inclined plate has seted up two round holes on the bottom plate, and the inside of round hole all is provided with the movable rod, and the one end fixedly connected with movable rod that the movable rod is close to gravity inductor moves the board, and the top fixedly connected with damping pad of movable plate, one side fixedly connected with flexible electric pole of moving plate is kept away from to the bottom plate, and the flexible end fixedly connected with displacement board of flexible electric pole, one side fixedly connected with connecting plate of displacement board near flexible electric pole, one side fixedly connected with of connecting plate is close to one side of damping spring in the movable plate. In a preferred scheme, the below of chip testing machine is provided with the switch board, and the bottom of switch board is provided with the base, and the top of workstation is provided with horizontal stroke seat, and the top of horizontal stroke seat is provided with the sliding seat, and the top fixedly connected with mount of slid