CN-121299562-B - Radio frequency chip test error compensation method

CN121299562BCN 121299562 BCN121299562 BCN 121299562BCN-121299562-B

Abstract

The invention discloses a radio frequency chip test error compensation method, which relates to the technical field of electric parameter measurement and radio frequency measurement, and the radio frequency chip test error compensation method provided by the invention realizes on-line estimation of contact characteristics by arranging temperature acquisition at the near end of a test fixture and taking the temperature as exogenous input and matching with extended Kalman filtering taking an equivalent contact network as a state quantity and taking S parameter/impedance according to frequency points as observed quantity; and in contrast to off-line compensation which relies on a fixed model, the invention introduces covariance self-adaption driven by residual error and enhancement updating triggered by abrupt change, can dynamically adjust filtering weight along with temperature change rate and drift accumulation, and remarkably improves timeliness and adaptability.

Inventors

SUN QIN
TENG HAO
SANG ZUOJUN
LI JIANGUO

Assignees

北京中发芯测科技有限公司

Dates

Publication Date: 20260508
Application Date: 20251124

Claims (10)

1. The method for compensating the test error of the radio frequency chip is applied to online compensation of the contact characteristic drift of the test fixture in a high-temperature environment and is characterized by comprising the following steps of: a) Acquiring temperature data arranged near a tested end of a test fixture and original measurement data output by a measurement device, wherein the original measurement data comprises S parameters or impedance data acquired according to frequency points; b) Constructing a state space model taking an equivalent contact network parameter of a test fixture as a state quantity, taking temperature as exogenous input, taking the original measurement data as observed quantity, and operating an extended Kalman filter to obtain contact network parameter estimation according to frequency points, wherein the equivalent contact network parameter represents the comprehensive characterization of series loss and parallel drainage at two sides of a contact interface in a frequency domain; c) Based on the contact network parameter estimation, performing de-embedding processing on the original measurement data in a network parameter domain to obtain a compensated measurement result, wherein the de-embedding processing is to convert a measured S parameter into a network parameter suitable for cascade system calculation, construct inverse cascade of a contact network by using the contact network parameter estimation, convert the result back to a target output domain and output the result under uniform reference impedance; d) Steps a) to c) are cyclically performed during the test to track dynamic changes in contact characteristics and output real-time compensation results.
2. The method of claim 1, wherein the temperature data is obtained from a temperature sensor integrated in the test fixture at a location near the port under test, the temperature sensor being synchronized with a time reference of the measurement device.
3. The method of claim 2, wherein the state quantity of the state space model includes an equivalent parameter reflecting a contact effect, the observed quantity includes S-parameter or impedance data of the port under test, and the temperature is used as a exogenous input affecting state evolution or for process noise scheduling.
4. A method for compensating test errors of a radio frequency chip as claimed in claim 3, characterized in that the extended kalman filtering is performed in parallel or sequentially with predetermined frequency points or by performing low-order frequency parameterization on equivalent contact parameters for adapting the observation of a plurality of frequency points simultaneously.
5. The method of claim 4, wherein the de-embedding comprises: and converting the measured S parameter into a network parameter suitable for cascade system calculation, estimating and constructing inverse cascade of the contact network by utilizing the contact network parameter, converting the result back to a target output domain and outputting the result under the unified reference impedance.
6. The method of claim 5, wherein the observed noise covariance is adjusted online using residual statistics based on a sliding window, and the process noise covariance is adaptively updated based on a temperature change rate or a temperature variance.
7. The method of claim 6, wherein triggering an enhanced update when the residual exceeds a threshold, a sudden temperature change, or a long term drift accumulation reaches a threshold includes extending a window, increasing process noise, or calling a pre-stored multi-temperature calibration factor.
8. The method of claim 7, wherein the performing a consistency check on the compensated result includes checking a cross-band smoothness constraint, an inter-port energy conservation constraint, or consistency with a measured result of a built-in reference, and maintaining a last valid output and marking an alarm when the checking fails.
9. A computer device comprising a memory and a processor, said memory storing a computer program, characterized in that the processor implements the steps of a method for compensating for test errors of a radio frequency chip according to any of claims 1-8 when executing said computer program.
10. A computer readable storage medium having stored thereon a computer program, wherein the computer program when executed by a processor implements the steps of a radio frequency chip test error compensation method according to any of claims 1 to 8.

Description

Radio frequency chip test error compensation method Technical Field The invention relates to the technical field of electric parameter measurement and radio frequency measurement, in particular to a radio frequency chip test error compensation method. Background In the process of testing the radio frequency chip, the test fixture is used as a key interface between the chip and the measuring equipment, the contact state and parasitic parameters of the test fixture directly influence the accuracy of signal transmission, the contact impedance of the fixture and the parasitic resistance/inductance/capacitance of the fixture drift along with the temperature under high-temperature working conditions (such as industrial and automobile electronic application), meanwhile, the temperature dependence characteristics of a connecting cable and a switching structure are overlapped to introduce amplitude-phase errors, and the factors can cause the deviation of S parameters and impedance measuring results so as to influence the judgment consistency of the device performance. In the prior art, an off-line compensation method based on historical data is mostly adopted, such as an error model related to temperature is established through data enhancement and curve fitting, or a temperature sensor is arranged on a clamp and is corrected according to a static calibration coefficient, the method can reduce measurement deviation caused by temperature in a certain range, but generally depends on preset model parameters, has insufficient response to dynamic factors such as rapid temperature fluctuation, micro-change of contact state and the like, and is easy to generate compensation lag and accumulated error in long-time or wide-temperature-zone test, so that measurement stability is reduced. Therefore, for the temperature dependence of the test fixture and the measurement link under the conditions of high temperature and temperature variation, a technical scheme capable of improving the compensation timeliness and adaptability is still needed to improve the stability and consistency of the radio frequency measurement result under the severe environment. Disclosure of Invention The present invention has been made in view of the above-described problems occurring in the prior art. The invention provides a radio frequency chip test error compensation method which solves the problem that the existing off-line compensation hysteresis is difficult to adapt to the contact impedance drift of a high-temperature-induced clamp. In order to solve the technical problems, the invention provides the following technical scheme: In a first aspect, an embodiment of the present invention provides a method for compensating a test error of a radio frequency chip, which is applied to online compensation of contact characteristic drift of a test fixture in a high temperature environment, and includes: a) Acquiring temperature data arranged near a tested end of a test fixture and original measurement data output by a measurement device, wherein the original measurement data comprises S parameters or impedance data acquired according to frequency points; b) Constructing a state space model taking the equivalent contact network parameters of the test fixture as state quantity, taking temperature as exogenous input, taking the original measurement data as observed quantity, and running an extended Kalman filter to obtain the contact network parameter estimation according to frequency points; c) Based on the contact network parameter estimation, performing de-embedding processing on the original measurement data in a network parameter domain to obtain a compensated measurement result; d) Steps a) to c) are cyclically performed during the test to track dynamic changes in contact characteristics and output real-time compensation results. As a preferable scheme of the radio frequency chip test error compensation method, temperature data is obtained by a temperature sensor integrated at a position of a test fixture and close to a tested port, and the temperature sensor is synchronous with a time reference of a measuring device. As an optimal scheme of the radio frequency chip test error compensation method, the state quantity of the state space model comprises equivalent parameters reflecting contact effect, the observed quantity comprises S parameters or impedance data of a tested port, and the temperature is used as exogenous input influencing state evolution or used for process noise scheduling. As a preferable scheme of the radio frequency chip test error compensation method, the extended Kalman filtering is performed in parallel or sequentially according to a preset frequency point, or low-order frequency parameterization is performed on equivalent contact parameters so as to adapt to observation of a plurality of frequency points simultaneously. As a preferable scheme of the radio frequency chip test error compensation method, the de-embedding comprises th