CN-121324801-B - Data line testing system and method supporting fast charge mode switching

CN121324801BCN 121324801 BCN121324801 BCN 121324801BCN-121324801-B

Abstract

The invention relates to the technical field of data linearity energy test, in particular to a data line test system and method supporting fast charge mode switching. The method comprises the steps of obtaining voltage data in a data line testing process, evaluating complexity of voltage change in an initial testing process based on relative change of voltage before and after handshake in the initial testing process and fluctuation characteristics of the voltage data in the handshake process, judging whether a charging protocol is successfully matched according to change conditions of the voltage data, evaluating voltage conformity degree of each charging stage according to difference between the voltage data and preset voltage and fluctuation characteristics of the voltage data in each charging stage in a secondary testing process if the charging protocol is successfully matched, and obtaining change factors of each charging stage in each charging protocol by combining the relative change of the voltage before and after handshake and the fluctuation characteristics of the voltage data in the handshake process. The invention improves the credibility of the data line performance test result.

Inventors

SHEN WEI
SONG XIAODONG
FENG GUOLIANG
AO YAN

Assignees

东莞市立时电子有限公司

Dates

Publication Date: 20260512
Application Date: 20251204

Claims (8)

1. A data line test method supporting fast charge mode switching is characterized by comprising the following steps: acquiring voltage data in a data line test process, wherein the test process comprises an initial test process and a secondary test process; Based on the relative change condition of voltage before and after handshaking in the initial test process and the fluctuation characteristic of voltage data in the handshaking process, evaluating the complexity of the voltage change in the initial test process; if the charging protocols are successfully matched, respectively evaluating the voltage coincidence degree of each charging stage according to the difference between the voltage data and the preset voltage and the fluctuation characteristic of the voltage data of each charging stage in the secondary test process; evaluating the performance of the data line according to the change factors of all charging stages under different charging protocols; the evaluating the complexity of the initial test procedure voltage variation includes: respectively calculating a first ratio of voltage after handshake to voltage before handshake in an initial test process and a first variance of data in a differential sequence corresponding to a voltage data sequence, wherein the voltage data sequence is obtained by arranging voltage data in the handshake process in the initial test process according to a time sequence; obtaining the complexity of the voltage change of the initial testing process according to the first ratio and the first variance, wherein the complexity of the voltage change of the initial testing process is as follows: Wherein, the Representing the complexity of the voltage change during the initial test, The voltage after the hand-grip is indicated, Representing the voltage before the handshake, s representing the first variance; The normalization function is represented as a function of the normalization, Representing a first ratio; Combining the relative change condition of the voltages before and after the handshake at each charging stage under each charging protocol, the fluctuation characteristic of the voltage data in the handshake process and the voltage coincidence degree, obtaining the change factors of each charging stage under each charging protocol, wherein the method comprises the following steps: evaluating the complexity of the voltage change of each charging stage under each charging protocol according to the relative change condition of the voltage before and after the handshake of each charging stage under each charging protocol and the fluctuation characteristics of the voltage data in the handshake process; And taking the product of the complexity of the voltage change of each charging stage under each charging protocol and the corresponding voltage conformity degree as a change factor of each charging stage.
2. The method for testing a data line supporting fast charge mode switching according to claim 1, wherein the determining whether the charge protocol is successfully matched based on the complexity of the initial test process and the change condition of the voltage data comprises: Sequentially judging whether each moment after handshake in the initial test process meets a preset condition according to the time sequence, and taking the first moment meeting the preset condition as a stable moment; the method comprises the steps of acquiring a first voltage data sequence, wherein the preset condition is that a normalization result of a mean value of data in a differential sequence corresponding to the first voltage data sequence is smaller than a preset difference threshold value, and the acquisition of the first voltage data sequence comprises the step of marking the voltage data sequence formed by voltage data at all moments in a local time period at each moment as the first voltage data sequence; Combining the time interval between the handshake and the stabilization moment and the complexity of the initial test process to obtain matching accuracy; and judging whether the charging protocol is successfully matched or not based on the matching accuracy.
3. The method for testing a data line supporting fast charge mode switching according to claim 2, wherein the step of judging whether the charging protocol is successfully matched based on the matching accuracy comprises judging that the charging protocol is successfully matched if the matching accuracy is greater than a matching threshold value, and judging that the charging protocol is not successfully matched if the matching accuracy is less than or equal to the matching threshold value.
4. The method for testing a data line supporting fast charge mode switching according to claim 1, wherein the evaluating the voltage coincidence degree of each charging stage according to the difference between the voltage data and the preset voltage of each charging stage under each charging protocol in the secondary test and the fluctuation characteristic of the voltage data comprises: for any charging phase: Calculating a first difference between the average value of all the voltage data in any charging stage and a preset voltage; And evaluating the voltage coincidence degree of any charging stage according to the first difference and the fluctuation degree of all voltage data of any charging stage.
5. The method for testing the data line supporting the fast charge mode switching according to claim 1, wherein the evaluating the performance of the data line according to the change factors of all the charging stages under different charging protocols comprises: For any charging protocol, taking the ratio between the maximum value and the average value of the variation factors of all charging stages under any charging protocol as a corresponding switching stable value under any charging protocol; Obtaining performance evaluation coefficients of the data lines based on the overall distribution conditions of the corresponding switching stable values under all charging protocols; and judging whether the performance of the data line is qualified or not according to the performance evaluation coefficient.
6. The method for testing a data line supporting fast charge mode switching according to claim 5, wherein determining whether the performance of the data line is acceptable according to the performance evaluation coefficient comprises: if the performance evaluation coefficient is larger than a preset performance threshold, judging that the performance of the data line is qualified; and if the performance evaluation coefficient is smaller than or equal to a preset performance threshold, judging that the performance of the data line is unqualified.
7. The method for testing a data line supporting fast charge mode switching according to claim 1, wherein if the charging protocol is not successfully matched, determining that the performance of the data line is not acceptable.
8. A data line testing system supporting fast charge mode switching for implementing the method of claim 1, the system comprising: The data acquisition module is used for acquiring voltage data in a data line test process, wherein the test process comprises an initial test process and a secondary test process; The initial evaluation module is used for evaluating the complexity of the voltage change in the initial test process based on the relative change condition of the voltage before and after the handshake in the initial test process and the fluctuation characteristic of the voltage data in the handshake process; The change factor determining module is used for respectively evaluating the voltage coincidence degree of each charging stage according to the difference between the voltage data and the preset voltage of each charging stage in each charging protocol in the secondary test process and the fluctuation characteristic of the voltage data if the charging protocols are successfully matched; and the secondary evaluation module is used for evaluating the performance of the data line according to the change factors of all the charging stages under different charging protocols.

Description

Data line testing system and method supporting fast charge mode switching Technical Field The invention relates to the technical field of data linearity energy test, in particular to a data line test system and method supporting fast charge mode switching. Background With the popularization of portable electronic devices such as smart phones, tablet computers, notebook computers and the like, the requirements of users on the charging speed are increasingly increased, and high-speed charging is realized by increasing voltage, current or dynamically adjusting power, and the core realization process of the portable electronic device is not only dependent on a charger and the device, but also closely related to a data line connecting the charger and the device. The data line is internally required to communicate with the charger and the equipment through a specific electronic tag chip, and the corresponding quick charging mode is negotiated and activated. The traditional data line testing method mainly focuses on basic electrical performance (such as on-resistance and current bearing capacity) and physical durability, and cannot effectively detect whether the data line can correctly identify, switch and stably support various quick-charge protocols. In the existing method, the test on the data line is mainly focused on basic electrical performance and physical connection reliability, such as a direct current resistance and voltage drop test method, and the voltage drop at two ends of the data line is measured by applying constant current to calculate the conductor resistance, so as to evaluate the current carrying capacity and the electric energy transmission efficiency. The single protocol static test is difficult to simulate a complex scene of multi-protocol dynamic switching in actual use, instantaneous electric parameter change in the mode switching process cannot be accurately captured, and requirements of product research, development, verification and mass production quality control are difficult to meet, so that the reliability of a data line performance test result is low. Disclosure of Invention In order to solve the problem of low reliability of performance test results in the conventional method for testing the performance of a data line, the invention aims to provide a data line test system and a data line test method supporting fast charge mode switching, and the adopted technical scheme is as follows: In a first aspect, the present invention provides a data line testing method supporting fast charge mode switching, the method comprising the steps of: acquiring voltage data in a data line test process, wherein the test process comprises an initial test process and a secondary test process; Based on the relative change condition of voltage before and after handshaking in the initial test process and the fluctuation characteristic of voltage data in the handshaking process, evaluating the complexity of the voltage change in the initial test process; if the charging protocols are successfully matched, respectively evaluating the voltage coincidence degree of each charging stage according to the difference between the voltage data and the preset voltage and the fluctuation characteristic of the voltage data of each charging stage in the secondary test process; And evaluating the performance of the data line according to the change factors of all charging stages under different charging protocols. Preferably, the evaluating the complexity of the voltage change in the initial test process based on the relative change condition of the voltage before and after the handshake in the initial test process and the fluctuation characteristic of the voltage data in the handshake process includes: respectively calculating a first ratio of voltage after handshake to voltage before handshake in an initial test process and a first variance of data in a differential sequence corresponding to a voltage data sequence, wherein the voltage data sequence is obtained by arranging voltage data in the handshake process in the initial test process according to a time sequence; And obtaining the complexity of the voltage change of the initial test process according to the first ratio and the first variance. Preferably, the determining whether the charging protocol is successfully matched based on the complexity of the initial testing process and the change condition of the voltage data includes: Sequentially judging whether each moment after handshake in the initial test process meets a preset condition according to the time sequence, and taking the first moment meeting the preset condition as a stable moment; the method comprises the steps of acquiring a first voltage data sequence, wherein the preset condition is that a normalization result of a mean value of data in a differential sequence corresponding to the first voltage data sequence is smaller than a preset difference threshold value, and the acquisition of the first v