CN-121409409-B - Imaging spectrometer adjustment method

CN121409409BCN 121409409 BCN121409409 BCN 121409409BCN-121409409-B

Abstract

The invention relates to the technical field of imaging spectrometers, and discloses an imaging spectrometer adjustment method which comprises the steps of installing an auxiliary adjustment slit assembly at the installation position of the slit assembly of the spectrometer; the method comprises the steps of carrying out coarse adjustment on a detector through a first adjusting device to obtain a first position range meeting a first coarse adjustment condition, gradually adjusting the position of the detector in the first position range through the first adjusting device, respectively using monochromatic light sources to illuminate auxiliary adjustment slit components with light beams of different wave bands after adjusting the position of the detector each time to form slit images on the detector, respectively determining the spectral resolution of the current detector position in a first preset view field according to the response value of the slit images of the first preset view field of the detector when each wave band is illuminated, and determining the curing position of the detector based on the spectral resolution of each wave band in the first preset view field.

Inventors

XU JIAHAO
WANG YUEMING
QU HONGSONG

Assignees

国科大杭州高等研究院

Dates

Publication Date: 20260505
Application Date: 20251229

Claims (7)

1. An imaging spectrometer tuning method, comprising: Installing the auxiliary adjustment slit assembly at the installation position of the spectrometer slit assembly; coarse-tuning the detector through a first adjusting device to obtain a first position range meeting a first coarse-tuning condition; the position of the detector is gradually adjusted in a first position range through a first adjusting device, after the position of the detector is adjusted each time, the auxiliary adjustment slit component is respectively illuminated by light beams with different wave bands by using a monochromatic light source, and a slit image is formed on the detector; When each wave band is illuminated, determining the spectral resolution of the current detector position in a first preset view field according to the response value of the slit image of the first preset view field of the detector; Determining the curing position of the detector based on the spectral resolution of each band in the first preset field of view; when each wave band is illuminated, determining the spectral resolution of the current detector position in a first preset view field according to the response value of the slit image of the first preset view field of the detector, wherein the method comprises the following steps: Sequentially increasing the output wavelength of a monochromatic light source in the adjusting range of the current wave band, and reading the response value of the slit image of the first preset view field of the detector in the current wave band; Recording to obtain a first maximum value when the response value of the slit image reaches the maximum value, adjusting the output wavelength of the monochromatic light source, and recording the first output wavelength and the second output wavelength of the monochromatic light source when the response value of the slit image respectively reaches a first preset response value in the process of reducing and increasing the output wavelength, wherein the first preset response value is 0.5 times of the first maximum value; subtracting the first output wavelength from the second output wavelength to obtain the spectral resolution of the first preset field of view of the current detector position; the first preset view field comprises a central view field and two edge view fields; Coarse tuning is performed on the detector through a first adjusting device to obtain a first position range satisfying a first coarse tuning condition, including: illuminating the auxiliary adjustment slit assembly by using a multi-color light source, and respectively forming stripe images with alternate brightness and darkness covering each preset wave band at the positions of a central view field and two edge view fields of the detector; The position of the detector is adjusted gradually through the first adjusting device, the modulation transfer functions of the fringe images of the central view field and the two edge view fields of the detector in each preset wave band are calculated after the position of the detector is adjusted each time, and a first position range enabling the modulation transfer functions of the fringe images of the central view field and the two edge view fields corresponding to each preset wave band to meet a first rough adjustment condition is obtained.
2. The imaging spectrometer tuning method of claim 1, wherein determining the cure location of the detector based on the spectral resolution of each band in the first preset field of view comprises: Judging whether the error between the spectral resolution of each wave band in each view field and a first target value obtained when the detector is at each position is smaller than a first judgment threshold value; And calculating the resolution average value of the spectral resolutions of all wave bands in all view fields at all positions of the detector with the error smaller than the first judgment threshold value, and taking the position of the detector when the resolution average value is minimum as the curing position of the detector.
3. The imaging spectrometer tuning method of claim 1, wherein after determining the cure location of the detector based on the spectral resolution of each band in the first preset field of view, comprising: Replacing the auxiliary adjustment slit assembly with a spectrometer slit assembly; Coarse adjustment is carried out on the object telescope through a second adjusting device, so that a second position range meeting a second coarse adjustment condition is obtained; Sequentially adjusting the position of the object telescope in a second position range through a second adjusting device, and after the position of the object telescope is adjusted each time, respectively illuminating an incident light pipe through star point-shaped targets by using monochromatic light sources with light beams of different wave bands to form star point images on a detector; When each wave band is illuminated, determining the spectral resolution of the current object telescope position in a second preset view field according to the response value of the star point image of the second preset view field of the object telescope; and determining the curing position of the object telescope based on the spectral resolution of each wave band in the second preset field of view.
4. The method of adjusting an imaging spectrometer according to claim 3, wherein determining the spectral resolution of the current object telescope position in a second preset field of view according to the response value of the star point image of the second preset field of view of the object telescope during illumination of each band comprises: Sequentially increasing the output wavelength of a monochromatic light source in the adjusting range of the current wave band, and reading the response value of the star point image of the second preset view field of the detector in the current wave band; Recording to obtain a second maximum value when the response value of the star point image reaches the maximum value, adjusting the output wavelength of the monochromatic light source, and recording a third output wavelength and a fourth output wavelength of the monochromatic light source when the response value of the star point image respectively reaches a second preset response value in the process of reducing and increasing the output wavelength, wherein the second preset response value is 0.5 times of the second maximum value; subtracting the third output wavelength from the fourth output wavelength to obtain the spectral resolution of the second preset field of view of the current object telescope position.
5. The imaging spectrometer tuning method of claim 3 or 4, wherein the second preset field of view comprises-1 full field of view, a center field of view, and +1 full field of view.
6. The imaging spectrometer tuning method of claim 5, wherein determining the cure position of the object telescope based on the spectral resolution of each band in the second preset field of view comprises: Judging whether the error between the spectral resolution of each wave band obtained when the object telescope is at each position and the second target value in each view field is smaller than a second judging threshold value or not; And calculating the resolution mean value of the spectral resolutions of all wave bands in all view fields at all positions of the object telescope with the error smaller than the second judgment threshold value, and taking the position of the object telescope with the smallest resolution mean value as the solidification position of the object telescope.
7. The method of tuning an imaging spectrometer of claim 6, wherein coarsely tuning the object telescope by the second tuning device to obtain a second range of positions that satisfies a second coarse tuning condition, comprising: using a multi-color light source to illuminate an incident light pipe through a stripe-shaped target, and forming stripe images with alternate brightness and darkness covering each preset wave band on a corresponding view field of the detector; The position of the object telescope is adjusted successively through the second adjusting device, and after the position of the object telescope is adjusted each time, the imaging spectrometer is rotated through the turntable, so that the fringe image sequentially passes through the-1 full view field, the central view field and the +1 full view field, the modulation transfer functions of the fringe image of the-1 full view field, the central view field and the +1 full view field in each preset wave band are obtained through calculation, and the second position range enabling the modulation transfer functions of the fringe image of the-1 full view field, the central view field and the +1 full view field in each preset wave band to meet the second rough adjustment condition is obtained.

Description

Imaging spectrometer adjustment method Technical Field The invention relates to the technical field of imaging spectrometers, in particular to an imaging spectrometer adjustment method. Background The imaging spectrometer has the advantages of high spectral resolution, integrated spectrum and the like, and is widely applied to remote sensing and scientific detection. The tuning method of imaging spectrometers generally varies due to differences in the design of the spectrometer, tuning equipment limitations, and tuning personnel. The common adjustment method generally utilizes a collimator and a stripe target to simulate an infinitely long object, the infinitely long object is imaged on a slit through an object telescope, the infinitely long object is imaged on a detector after being dispersed through a spectrometer, the relative positions of the object telescope, the slit and the detector are adjusted by utilizing the stripe sharpness of an output object on the detector, and after multiple iterations, a position meeting the requirement is found according to experience. In the related scheme, mercury lamps, lasers or narrow-band filters are generally used for observing the sharpness of monochromatic images of certain specific wave bands in the assembling and adjusting process, so that whether the detector is assembled and adjusted in place or not is judged qualitatively according to experience, and the spectral resolution cannot be measured rapidly and quantitatively in the assembling and adjusting process, so that real-time adjustment and control are realized, the spectral resolution cannot be optimized quantitatively, and the assembling and adjusting precision is required to be improved. Disclosure of Invention The invention provides an imaging spectrometer adjustment method, which aims to solve the technical problem of insufficient adjustment precision of an imaging spectrometer. In a first aspect, the present invention provides an imaging spectrometer tuning method, including: Installing the auxiliary adjustment slit assembly at the installation position of the spectrometer slit assembly; coarse-tuning the detector through a first adjusting device to obtain a first position range meeting a first coarse-tuning condition; The position of the detector is gradually adjusted in a first position range through a first adjusting device, after the position of the detector is adjusted each time, a monochromatic light source is used for respectively illuminating an auxiliary adjustment slit assembly by light beams with different wave bands, and a slit image is formed on the detector; when each wave band is illuminated, determining the spectral resolution of the current detector position in the first preset view field according to the response value of the slit image of the first preset view field of the detector; the curing position of the detector is determined based on the spectral resolution of each band in the first preset field of view. In an alternative embodiment, determining the spectral resolution of the current detector position in the first preset field of view according to the response value of the slit image of the first preset field of view of the detector during illumination of each band, respectively, includes: sequentially increasing the output wavelength of a monochromatic light source in the adjusting range of the current wave band, and reading the response value of the slit image of the first preset view field of the detector in the current wave band; Recording to obtain a first maximum value when the response value of the slit image reaches the maximum value, adjusting the output wavelength of the monochromatic light source, and recording the first output wavelength and the second output wavelength of the monochromatic light source when the response value of the slit image respectively reaches a first preset response value in the process of reducing and increasing the output wavelength, wherein the first preset response value is 0.5 times of the first maximum value; Subtracting the first output wavelength from the second output wavelength yields the spectral resolution of the first preset field of view of the current detector position. In an alternative embodiment, the first preset field of view comprises a central field of view and two edge fields of view. In an alternative embodiment, determining the cure position of the detector based on the spectral resolution of each band in the first predetermined field of view comprises: Judging whether the error between the spectral resolution of each wave band in each view field and a first target value obtained when the detector is at each position is smaller than a first judgment threshold value; and calculating the resolution mean value of the spectral resolutions of all wave bands in all view fields at all positions of the detector with the error smaller than the first judgment threshold value, and taking the position of the detector when the reso