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CN-121432148-B - High-low temperature airflow impact tester for batch testing of chips

CN121432148BCN 121432148 BCN121432148 BCN 121432148BCN-121432148-B

Abstract

The invention relates to the technical field of chip testing, in particular to a high-low temperature airflow impact tester for testing chips in batches, which comprises an equipment main body and a roll-type placement structure, wherein the equipment main body comprises a cold and hot air supply device and a top plate, the roll-type placement structure comprises two rolls which are arranged in parallel and a strip-shaped part which is connected between the two rolls and has flexibility, the cold and hot air supply device is used for selectively providing cold air or hot air for any one roll, the two rolls are rotatably arranged on the top plate, the position between the two rolls is a chip loading and unloading station, the two rolls are of a hollow structure and are all provided with vent holes, grooves which extend along the length direction of the strip-shaped part and correspond to the vent holes, and at least two test sockets are arranged in the grooves along the length direction. The invention can promote the number of single test chips, realize batch test and improve the chip test efficiency.

Inventors

  • Huang Liangru

Assignees

  • 思拓玛试验仪器(广东)有限公司

Dates

Publication Date
20260508
Application Date
20251201

Claims (10)

  1. 1. The high-low temperature airflow impact tester for batch testing of chips is characterized by comprising an equipment main body (100) and a roll placement structure, wherein the equipment main body (100) comprises a cold and hot air supply device and a top plate (110), the roll placement structure comprises two rolls which are arranged in parallel and a flexible strip-shaped component (210) connected between the two rolls, the cold and hot air supply device is used for selectively providing cold air or hot air for any one roll, the two rolls are rotatably arranged on the top plate (110), the position between the two rolls is a chip feeding and discharging station, the two rolls are of a hollow structure and are all provided with vent holes (202), grooves (211) which extend along the length direction of the strip-shaped component (210) and correspond to the vent holes (202), and at least two test sockets (220) are arranged in the grooves (211) along the length direction.
  2. 2. The high and low temperature air flow impact tester for batch test chips according to claim 1, wherein the roll placement structure further comprises a mounting bracket (230) equipped with a pinch roller (231), and the mounting bracket (230) equipped with the pinch roller (231) is elastically connected to the top plate (110) along the radial direction of the reel by an elastic member.
  3. 3. The high and low temperature airflow impact tester for batch test chips according to claim 2, wherein two mounting brackets (230) provided with the compression wheels (231) are symmetrically arranged on two sides of the scroll, the roll placement structure further comprises two pressing plates (236) movably sleeved outside the scroll, and the pressing plates (236) are movably connected with the mounting brackets (230) through connecting rods (237).
  4. 4. The high-low temperature airflow impact tester for batch test chips of claim 2, wherein a connecting plate (232) is fixed on the top plate (110), a connecting shaft (233) is fixed on the mounting bracket (230), the free end of the connecting shaft (233) movably penetrates through the connecting plate (232) along the radial direction of the scroll, a limiting table (234) is fixed at the free end of the connecting shaft (233), the elastic element is a compression spring (235), and the compression spring (235) is positioned between the connecting plate (232) and the limiting table (234) and sleeved outside the connecting shaft (233).
  5. 5. The high and low temperature air flow impact tester for batch test chips of claim 1 wherein said strip member (210) is a rubber material.
  6. 6. The high and low temperature air flow impact tester for batch test chips according to claim 1, wherein the roll placement structure further comprises a three-way valve (240), a branch pipe (241) and a main pipe body (242), wherein an inlet of the three-way valve (240) is connected with the cold and hot air supply device through the main pipe body (242), and two outlets of the three-way valve (240) are respectively connected with the two reels through the two branch pipes (241).
  7. 7. The high and low temperature airflow impact tester for batch test chips of claim 1, wherein said hot and cold air supply means is a dual-purpose cascade refrigeration system.
  8. 8. The high and low temperature air flow impact tester for batch test chips according to claim 1, wherein the chip loading and unloading station is provided with an upper roller pair and a lower roller pair (250), and the strip-shaped component (210) passes through the space between the upper roller pair and the lower roller pair (250).
  9. 9. The high-low temperature airflow impact tester for batch testing of chips of claim 1, wherein the chip loading and unloading station is provided with an automatic loading and unloading manipulator.
  10. 10. The high and low temperature air flow impact tester for batch test chips of claim 1, wherein said two reels are each driven to rotate by a motor (260), said motor (260) being mounted on said top plate (110).

Description

High-low temperature airflow impact tester for batch testing of chips Technical Field The invention relates to the technical field of chip testing, in particular to a high-low temperature airflow impact tester for testing chips in batches. Background In the prior art, for high and low temperature reliability test of a chip, mainly adopted equipment is a heat flow instrument, and the chip to be tested is covered by a heat flow cover of the heat flow instrument for test. However, due to the limited volume of the heat flow cover, the heat flow meter is generally only suitable for testing single chips, and limits the number of chips measured once, so that the time consumption is long and the efficiency is low if the chips are subjected to batch testing. Aiming at the problems, the invention provides a high-low temperature airflow impact tester for testing chips in batches. Disclosure of Invention The invention aims to overcome the defects of the prior art and provides a high-low temperature airflow impact tester for testing chips in batches, which can test the chips in batches, has good consistency of temperature in testing environment, good testing continuity and high testing efficiency. The invention is realized by the following technical scheme: The high-low temperature airflow impact tester for testing chips in batches comprises an equipment main body and a roll placement structure, wherein the equipment main body comprises a cold and hot air supply device and a top plate, the roll placement structure comprises two rolls which are arranged in parallel and a strip-shaped part which is connected between the two rolls and has flexibility, the cold and hot air supply device is used for selectively providing cold air or hot air for any one roll, the two rolls are rotatably arranged on the top plate, the position between the two rolls is a chip feeding and discharging station, the two rolls are of a hollow structure and are all provided with vent holes, grooves which extend along the length direction of the rolls and correspond to the vent holes are formed in the strip-shaped part, and at least two test sockets are arranged in the grooves along the length direction. Optionally, the roll placement structure further comprises a mounting bracket equipped with a compression wheel, and the mounting bracket equipped with the compression wheel is elastically connected to the top plate along the radial direction of the scroll through an elastic element. Optionally, the installing support that is equipped with the pinch roller has two, two the installing support symmetry that is equipped with the pinch roller sets up the both sides of spool, the reel type place the structure still include the activity cover in the outside two clamp plates of spool, the clamp plate with pass through connecting rod swing joint between the installing support. Optionally, a connecting plate is fixed on the top plate, a connecting shaft is fixed on the mounting bracket, the free end of the connecting shaft movably passes through the connecting plate along the radial direction of the scroll, a limiting table is fixed at the free end of the connecting shaft, the elastic element is a compression spring, and the compression spring is positioned between the connecting plate and the limiting table and sleeved outside the connecting shaft. Optionally, the strap member is a rubber material. Optionally, the roll-type placement structure further comprises a three-way valve, a branch pipe and a main pipe body, wherein an inlet of the three-way valve is connected with the cold and hot air supply device through the main pipe body, and two outlets of the three-way valve are connected with the two reels through the two branch pipes respectively. Optionally, the cold and hot air supply device is a cold and hot dual-purpose cascade refrigeration system. Optionally, the chip loading and unloading station is provided with two pairs of rollers, and the strip-shaped part passes through the space between the two pairs of rollers. Optionally, an automatic feeding and discharging manipulator is arranged at the chip feeding and discharging station. Optionally, the two reels are driven to rotate by a motor, and the motor is mounted on the top plate. Compared with the prior art, the invention provides a high-low temperature airflow impact tester for testing chips in batches, which has the following beneficial effects: The invention adopts a roll-type placing structure to lead the strip-shaped component to form a spiral test channel when being wound, a plurality of test sockets for installing chips are arranged in the grooves to realize single batch test of the chips, and the strip-shaped component can realize the cyclic transfer between the two reels through the forward and reverse rotation of the reels, thereby continuously completing the feeding and discharging of the chips in multiple rounds and the test and shortening the time consumption of batch test of the chips.