CN-121500213-B - Probe deviation compensation method and device, electronic equipment and storage medium

CN121500213BCN 121500213 BCN121500213 BCN 121500213BCN-121500213-B

Abstract

The invention relates to the technical field of flying probe testing, and discloses a probe deviation compensation method, a device, electronic equipment and a storage medium, wherein the method comprises the steps of collecting probe tip coordinates corresponding to different angles of a probe after replacement of the probe in the flying probe testing; the method includes the steps of calculating an eccentric parameter of a probe based on a needle point coordinate, calculating a target rotation angle of the probe based on the eccentric parameter and a camera view center coordinate, calculating a total compensation displacement based on the camera view center coordinate, the needle point center point coordinate and the target rotation angle, and controlling the probe based on the target rotation angle and the total compensation displacement. According to the method, after the probe is replaced, the target rotation angle and the total compensation displacement are calculated respectively by detecting the probe tip coordinates, so that the probe is compensated according to the target rotation angle and the total compensation displacement, manual adjustment is not needed, and the calibration efficiency of probe compensation and the precision of flying probe testing are improved.

Inventors

ZHU ZHINING
XU DANDAN
Shen Ludi

Assignees

南京测源科技有限公司

Dates

Publication Date: 20260505
Application Date: 20260113

Claims (9)

1. A method of compensating for probe bias, the method comprising: After the probe of the flying probe test is replaced, collecting the coordinates of the needle tip corresponding to different angles of the replaced probe; calculating an eccentric parameter of the probe based on the needle point coordinates, wherein the eccentric parameter at least comprises an eccentric direction angle and an eccentric amount; calculating a target rotation angle of the probe based on the eccentric parameter and the camera view center coordinate; calculating total compensation displacement based on the camera view center coordinates, the needle point center point coordinates and the target rotation angle; controlling the probe based on the target rotation angle and the total compensation displacement amount; The calculating the total compensation displacement based on the camera view center coordinate, the needle point center point coordinate and the target rotation angle includes: calculating a basic alignment compensation amount based on the camera view center coordinate and the needle tip center point coordinate; Calculating a rotation angle correlation compensation amount based on the sine value of the probe length and the target rotation angle; Determining a reverse gap compensation amount based on a movement direction of the probe; If the difference value between the ambient temperature and the preset temperature is larger than the preset temperature threshold value, calculating a temperature compensation amount based on the ambient temperature, the preset temperature, the probe movement range and the preset temperature coefficient; And superposing the basic alignment compensation quantity, the rotation angle correlation compensation quantity, the reverse gap compensation quantity and the temperature compensation quantity to obtain the total compensation displacement quantity.
2. The probe deviation compensation method according to claim 1, wherein the collecting the coordinates of the tip corresponding to the different angles of the replaced probe includes: controlling the replaced probe to rotate to at least one target angle; and collecting the needle point coordinates of the replaced probe needle point at each target angle.
3. The probe bias compensation method according to claim 1, wherein the calculating the eccentric parameter of the probe based on the tip coordinates includes: Fitting the motion track of the probe based on the needle point coordinates to calculate the eccentric amount and the eccentric direction angle based on the circle center coordinates of the motion track and the needle point coordinates.
4. The probe bias compensation method according to claim 3, wherein the calculating the target rotation angle of the probe based on the eccentric parameter and the camera view center coordinates includes: comparing the eccentric amount in the eccentric parameter with a preset eccentric threshold value to determine a calculation strategy of a target rotation angle based on a comparison result; if the eccentric amount is smaller than or equal to a preset eccentric threshold value, calculating a target rotation angle based on the eccentric direction angle; And if the eccentric amount is larger than a preset eccentric threshold value, calculating a target rotation angle based on the eccentric direction angle, the camera view center coordinate and the circle center coordinate of the motion track.
5. The probe deviation compensation method according to claim 1, wherein the controlling the probe based on the target rotation angle and the total compensation displacement amount includes: Controlling the probe to rotate to the target rotation angle, and acquiring the actual rotation angle of the probe after the probe rotates to the target rotation angle; And if the deviation between the actual rotation angle and the target rotation angle is smaller than a preset angle threshold, controlling the probe to move the total compensation displacement.
6. The probe bias compensation method according to claim 1, wherein after the control of the probe based on the target rotation angle and the total compensation displacement amount, the method further comprises: acquiring a probe tip image; identifying tip center point coordinates in the probe tip image; and verifying the probe position based on the camera view center coordinates and the needle tip center point coordinates.
7. A probe compensation apparatus, the apparatus comprising: The coordinate acquisition module is used for acquiring the needle point coordinates corresponding to different angles of the replaced probe after the probe of the flying probe test is replaced; The eccentric parameter calculation module is used for calculating the eccentric parameter of the probe based on the needle point coordinates, and the eccentric parameter at least comprises an eccentric direction angle and an eccentric amount; The rotation angle calculation module is used for calculating the target rotation angle of the probe based on the eccentric parameter and the camera view center coordinate; the displacement amount calculating module is used for calculating the total compensation displacement amount based on the camera view center coordinate, the needle point center point coordinate and the target rotation angle; a probe control module for controlling the probe based on the target rotation angle and the total compensation displacement amount; The displacement amount calculation module includes: A first calculation unit for calculating a base alignment compensation amount based on the camera view center coordinate and the needle tip center point coordinate; A first compensation amount calculating unit for calculating a rotation angle-associated compensation amount based on a sine value of the probe length and the target rotation angle; A second compensation amount calculation unit for determining a reverse gap compensation amount based on the movement direction of the probe; The temperature compensation amount calculating unit is used for calculating the temperature compensation amount based on the environment temperature, the preset temperature, the probe movement range and the preset temperature coefficient if the difference value between the environment temperature and the preset temperature is larger than the preset temperature threshold value; and the total compensation amount calculating unit is used for superposing the basic alignment compensation amount, the rotation angle correlation compensation amount, the reverse gap compensation amount and the temperature compensation amount to obtain the total compensation displacement amount.
8. An electronic device, comprising: A memory and a processor, the memory and the processor being communicatively connected to each other, the memory having stored therein computer instructions, the processor executing the computer instructions to perform the probe bias compensation method of any one of claims 1 to 6.
9. A computer-readable storage medium having stored thereon computer instructions for causing a computer to execute the probe bias compensation method according to any one of claims 1 to 6.

Description

Probe deviation compensation method and device, electronic equipment and storage medium Technical Field The invention relates to the technical field of flying probe testing, in particular to a probe deviation compensation method, a probe deviation compensation device, electronic equipment and a storage medium. Background The flying probe test is an advanced circuit board detection technology, and a precise probe which can move under program control is used for replacing a traditional fixed test needle bed to directly contact with a test point on a circuit board so as to measure electrical performance. In the flying probe testing equipment, the problem of positioning deviation caused by the eccentric installation of the probe and the morphological difference of the needle tip is common after the probe of the flying probe test is replaced. In the related art, manual calibration is usually relied on, the efficiency of the method is low, and the coupling deviation of the rotation angle and the axial position is difficult to synchronously eliminate, so that the needle point cannot be accurately matched with the center of the field of view of the camera, and the accuracy and the reliability of the flying probe test are affected. Disclosure of Invention In view of the above, the present invention provides a probe deviation compensation method, apparatus, electronic device and storage medium, so as to solve the problem of deviation after probe replacement in flying probe test. In a first aspect, the present invention provides a probe bias compensation method, the method comprising: After the probe of the flying probe test is replaced, collecting the coordinates of the needle tip corresponding to different angles of the replaced probe; calculating an eccentric parameter of the probe based on the needle point coordinates, wherein the eccentric parameter at least comprises an eccentric direction angle and an eccentric amount; calculating a target rotation angle of the probe based on the eccentric parameter and the camera view center coordinate; calculating total compensation displacement based on the camera view center coordinates, the needle point center point coordinates and the target rotation angle; The probe is controlled based on the target rotation angle and the total compensation displacement amount. In an alternative embodiment, the collecting the coordinates of the needle tip corresponding to the different angles of the replaced probe includes: controlling the replaced probe to rotate to at least one target angle; and collecting the needle point coordinates of the replaced probe needle point at each target angle. In an alternative embodiment, the calculating the eccentricity parameter of the probe based on the tip coordinates includes: Fitting the motion track of the probe based on the needle point coordinates to calculate the eccentric amount and the eccentric direction angle based on the circle center coordinates of the motion track and the needle point coordinates. In an alternative embodiment, the calculating the target rotation angle of the probe based on the eccentricity parameter and camera view center coordinates includes: comparing the eccentric amount in the eccentric parameter with a preset eccentric threshold value to determine a calculation strategy of a target rotation angle based on a comparison result; if the eccentric amount is smaller than or equal to a preset eccentric threshold value, calculating a target rotation angle based on the eccentric direction angle; And if the eccentric amount is larger than a preset eccentric threshold value, calculating a target rotation angle based on the eccentric direction angle, the camera view center coordinate and the circle center coordinate of the motion track. In an alternative embodiment, the calculating the total compensation displacement based on the camera view center coordinate, the needle tip center point coordinate, and the target rotation angle includes: calculating a basic alignment compensation amount based on the camera view center coordinate and the needle tip center point coordinate; Calculating a rotation angle correlation compensation amount based on the sine value of the probe length and the target rotation angle; Determining a reverse gap compensation amount based on a movement direction of the probe; If the difference value between the ambient temperature and the preset temperature is larger than the preset temperature threshold value, calculating a temperature compensation amount based on the ambient temperature, the preset temperature, the probe movement range and the preset temperature coefficient; And superposing the basic alignment compensation quantity, the rotation angle correlation compensation quantity, the reverse gap compensation quantity and the temperature compensation quantity to obtain the total compensation displacement quantity. In an alternative embodiment, the controlling the probe based on the target rotation angl