Search

CN-121596020-B - Capacitance testing mechanism and capacitance testing and sorting equipment

CN121596020BCN 121596020 BCN121596020 BCN 121596020BCN-121596020-B

Abstract

The invention discloses a capacitance testing mechanism and capacitance testing and sorting equipment, which belong to the technical field of electronic element testing. The testing wheel is rotatably arranged on the pressing seat through the testing shaft, the testing wheel is rotatably sleeved on the outer peripheral side of the testing shaft, the outer peripheral surface of the testing shaft is provided with a chip groove, the chip groove spirally extends along the axis direction of the testing shaft, the chip groove is configured to accommodate foreign matters between the testing wheel and the testing shaft, and the testing wheel is configured to drive the foreign matters between the testing wheel and the testing shaft to be conveyed along the extending direction of the chip groove and discharged from the shaft end of the testing shaft. Through the discharge foreign matter, parasitic resistance can be reduced, and the testing precision is improved, so that the patch capacitor has higher product performance, and can meet the use requirements of electrical instruments and meters, solar equipment precision measurement analyzers, portable or vehicle-mounted energy-saving detection equipment and the like.

Inventors

  • WEI BOKAI
  • GONG BO
  • LIU FENG
  • YE JINGLIN
  • ZHENG YUANSHUO

Assignees

  • 珠海市奥德维科技有限公司

Dates

Publication Date
20260512
Application Date
20260130

Claims (8)

  1. 1. A capacitance testing mechanism, comprising: a base provided with a lower electrode assembly; A test tray movably disposed on the base for loading a chip capacitor, the lower electrode assembly being located below the test tray, and The test wheel is arranged on the base through a pressing seat and is positioned above the test disc, the test wheel is rotatably arranged on the pressing seat through a test shaft, the test wheel is rotatably sleeved on the outer peripheral side of the test shaft, chip grooves are formed in the outer peripheral surface of the test shaft, and the chip grooves spirally extend along the axial direction of the test shaft; Wherein the test wheel corresponds to the position of the lower electrode assembly in the up-down direction of the test disc, the test disc can drive the patch capacitor to pass through between the test wheel and the lower electrode assembly, when the patch capacitor passes through between the test wheel and the lower electrode assembly, the upper end face of the patch capacitor is abutted against the outer peripheral face of the test wheel, the lower end face of the patch capacitor is abutted against the upper end face of the lower electrode assembly and drives the test wheel to rotate relative to the test shaft, the chip removal groove is configured to accommodate foreign matters between the test wheel and the test shaft, and the test wheel is configured to drive the foreign matters between the test wheel and the test shaft to be conveyed along the extending direction of the chip removal groove and discharged from the shaft end of the test shaft; The test shaft is provided with a matching section extending along the axis direction and mounting sections respectively connected with the two axial ends of the matching section, the test wheel is sleeved on the matching section, chip grooves are formed in the outer peripheral surface of the matching section, the press seat is provided with clamping grooves and containing grooves, the clamping grooves are respectively located at the two opposite ends of the pressing seat, one end of each elastic piece is abutted to the fixing frame, the other end of each elastic piece is abutted to the top of the first end of the corresponding pressing seat, and the test shaft is sleeved on the matching section and is detachably connected with the mounting section in a cross-section shape.
  2. 2. The capacitive testing mechanism of claim 1, wherein the mounting section is snapped into the snap-in groove, and wherein the outer surface of the mounting section has a plurality of contact surfaces with the inner surface of the snap-in groove.
  3. 3. The capacitive testing mechanism of claim 1, further comprising an elastic pressing piece, wherein one end of the elastic pressing piece is disposed on the pressing seat, and the other end of the elastic pressing piece abuts against the mounting section, so that the mounting section is clamped in the clamping groove.
  4. 4. The capacitance testing mechanism according to claim 1, wherein the thread profile of the junk slot is a triangular profile, the profile angle of the triangular profile being α, α satisfying 0 ° < α <90 °.
  5. 5. The capacitance testing mechanism of claim 4, wherein the junk slots have a tooth depth in the range of 0.15 mm to 0.25 mm to enable foreign matter to be received in the junk slots.
  6. 6. The capacitive testing mechanism of claim 5, wherein the number of turns of the spiral of the junk slot comprises at least one turn, and wherein two ends of the junk slot are respectively connected to two ends of the mating segment.
  7. 7. The capacitive testing mechanism of claim 1, wherein the pressing base and the testing wheel are provided in plurality, the pressing base and the testing wheel are arranged in a one-to-one correspondence, the plurality of pressing bases can be arranged in the fixing frame along the length direction array of the fixing frame, and the patch capacitors are arranged and loaded in the testing disc along the arrangement direction of the pressing bases.
  8. 8. A capacitance test sorting apparatus comprising a capacitance test mechanism according to any one of claims 1 to 7.

Description

Capacitance testing mechanism and capacitance testing and sorting equipment Technical Field The present invention relates to the field of electronic device testing technologies, and in particular, to a capacitance testing mechanism and a capacitance testing and sorting device. Background The patch capacitor (MLCC) is used as a key element in the electronic field, is commonly applied to electrical instruments and meters such as a power load control system, is also commonly applied to solar energy flow density and solar energy concentrator precision measurement analyzers, and can also be applied to consumer electronics (such as mobile phones, computers and the like), communication equipment (such as routers, optical modules and the like), automobile electronics (such as portable or vehicle-mounted energy-saving detection in an automobile safety system, vehicle-mounted entertainment and the like). The chip capacitor is made up of multi-layer ceramic medium and inner electrode through alternate lamination and leading out by outer electrode. By means of the unique structure, the high-speed capacitance test sorting device can realize a larger capacitance value in a limited space, has stable electrical performance, is widely applied to various electronic device circuits, has huge market demand and extremely high quality control requirement, and is a core part of high-speed capacitance test sorting devices. The main task of the high-speed capacitance testing mechanism is to accurately test the electrical performance of the patch capacitor, so that the product quality is ensured. The testing mechanism is used as a special mechanism for specially detecting the electrical performance (key indexes such as capacitance value, loss tangent, insulation resistance and the like) of the multilayer patch capacitor, and the component parts of the testing mechanism are closely matched with each other. The test disc is used for bearing and conveying the tested capacitor to ensure that the tested capacitor reaches a test position regularly and quickly, the test wheel is elastically contacted with one end of the capacitor, the capacitor can be connected with a test circuit and adapt to the size and position deviation of the capacitor, the lower electrode assembly is contacted with the other end of the capacitor, a complete test loop is jointly constructed with the test wheel, and the test instrument is used for accurately measuring various electrical performance indexes, so that the accuracy and the stability of the test instrument are critical to the accuracy of a test result. However, the copper test shaft is exposed to air for a long time, so that an extremely thin copper oxide layer is easily generated on the surface of the shaft, and meanwhile, when the mechanism operates, the capacitance test mechanism drives the test disc to rotate so as to drive the capacitance to pass tangentially along the test wheel at a specific frequency, and the test wheel is pushed to rotate for a certain angle each time, and meanwhile, the test wheel is pushed to lift upwards, so that the inner cylindrical surface of the test wheel and the outer cylindrical surface of the test shaft are impacted and rubbed. In the past, the collision between the inner cylindrical surface of the test wheel and the outer cylindrical surface of the test shaft can impact and crush the oxide layer to form tiny foreign matters, and the parasitic resistance between the test wheel and the test shaft is increased due to the accumulation of the foreign matters, so that the test precision is reduced, and meanwhile, the service life of the capacitance test mechanism is shortened due to the abrasion between the test wheel and the test shaft. Disclosure of Invention The present invention aims to solve at least one of the technical problems existing in the prior art. Therefore, the invention provides the capacitance testing mechanism which can discharge the foreign matters between the inner cylindrical surface of the testing wheel and the outer cylindrical surface of the testing shaft so as to reduce parasitic resistance, improve the capacitance testing precision and prolong the service life of the mechanism. The invention also provides capacitance test sorting equipment with the capacitance test mechanism. According to an embodiment of the first aspect of the present invention, a capacitance testing mechanism includes: a base provided with a lower electrode assembly; A test tray movably disposed on the base for loading a chip capacitor, the lower electrode assembly being located below the test tray, and The test wheel is arranged on the base through a pressing seat and is positioned above the test disc, the test wheel is rotatably arranged on the pressing seat through a test shaft, the test wheel is rotatably sleeved on the outer peripheral side of the test shaft, chip grooves are formed in the outer peripheral surface of the test shaft, and the chip grooves spirally extend along