CN-121677957-B - Atomic substance wave wavelength measuring device and method

CN121677957BCN 121677957 BCN121677957 BCN 121677957BCN-121677957-B

Abstract

The invention discloses an atomic substance wave wavelength measuring device, which comprises a vacuum cavity, wherein a first beam splitting light and a second beam splitting light obtained by splitting test laser pass through the vacuum cavity in a direction parallel to the height direction of the vacuum cavity, are detected by a first photoelectric detector after being combined, are irradiated with detection laser in the vacuum cavity, and are combined from the test laser split to the first beam splitting light and the second beam splitting light, and the shape enclosed by an intermediate light path is rectangular. The invention also discloses an atomic substance wave wavelength measuring method, which comprises the steps of adjusting the test laser into slit light to perform actual measurement flight time of the measured object, adjusting the test laser into continuous laser to perform actual measurement flight distance of the measured object, and obtaining actual measurement flight speed and substance wave wavelength of the measured object. The invention can improve the flying speed measurement of the measured object and is used for the accurate measurement of the wavelength of the material wave because the measuring device is not influenced by the change of the initial position of the measured object.

Inventors

Mao Yinfei
ZHAN MINGSHENG
YAO ZHANWEI
LI RUNBING
LU SIBIN
LI SHAOKANG
JIANG MIN
KE MIN
CHEN XIAOLI
WANG JIN

Assignees

中国科学院精密测量科学与技术创新研究院
合肥国家实验室

Dates

Publication Date: 20260512
Application Date: 20260210

Claims (10)

1. The atomic substance wave length measuring device comprises a vacuum cavity (C1) of an atomic interferometer, and is characterized in that the length direction of the vacuum cavity (C1) is taken as the x-axis direction, the height direction of the vacuum cavity (C1) is taken as the y-axis direction, output light of a first frequency laser and a second frequency laser passing through a beam combining device is taken as test laser (L2), the test laser (L2) is subjected to beam splitting to obtain first beam splitting light and second beam splitting light, the first beam splitting light and the second beam splitting light are respectively incident in a direction parallel to the y-axis and pass through the vacuum cavity (C1) to be combined to obtain combined beam light, the combined beam light is detected by a first photoelectric detector (PD 1), detection laser (L1) is further irradiated in the vacuum cavity (C1), and the second beam splitting light, the first beam splitting light and the detection laser (L1) in the vacuum cavity (C1) are sequentially distributed along the x-axis direction; The test laser (L2) is split into a first beam splitting light and a second beam splitting light, the first beam splitting light and the second beam splitting light are combined to obtain combined beam light, and the middle light path is enclosed to form a rectangle; Testing measured time of flight of an object under test The laser beam (L2) is split after passing through the slit, the direction from the projection to the detection of the object to be detected in the vacuum cavity (C1) is the positive direction of the x-axis, the second beam splitting light, the first beam splitting light and the detection laser (L1) sequentially perform material wave splitting, material wave combining and fluorescence excitation on the flying object to be detected, the second photoelectric detector (PD 2) is used for detecting the fluorescence signal of the object to be detected to obtain the lamb interference fringes, and then the actual measurement flying time is obtained ; Testing the measured flight distance of the object The slit is moved out, one of the first frequency laser and the second frequency laser is closed, the test laser (L2) is directly split, the first photoelectric detector (PD 1) measures the interference electric signal output by the combined light, and the measured flying distance of the measured object is obtained 。
2. An atomic substance wavelength measuring device according to claim 1, characterized in that the test laser (L2) is polarization-adjusted by means of a first half-wave plate (H1), and then split by means of a first polarization splitting prism (P1) to obtain a first split beam and a second split beam, the first split beam being transmitted through the first polarization splitting prism (P1) and the second quarter-wave plate (Q2) in sequence, and then passing through the vacuum cavity (C1) in a direction parallel to the y-axis and being incident on a fourth polarization splitting prism (P4) in a direction parallel to the y-axis, and simultaneously the second split beam being reflected by means of the first polarization splitting prism (P1), then passing through a third half-wave plate (H3) in a direction parallel to the x-axis, and being redirected by the second polarization splitting prism (P2), and also being transmitted by means of a first quarter-wave plate (Q1) in a direction parallel to the y-axis and passing through the vacuum cavity (C1), and then being reflected by means of a third polarization splitting prism (P3) to reach the fourth polarization splitting prism (P4) in a direction parallel to the x-axis, and at the point of the second polarization splitter (PD) and the second polarization splitter (PD) being combined to obtain an electrical signal (PD) at the first and second polarization splitter (PD) and the second polarization splitter (PD) being combined to the first polarization splitter (PD 1).
3. The atomic substance wave length measuring device according to claim 1, wherein the object to be measured is an atom, a molecule or an ion.
4. An atomic mass wave wavelength measurement method using an atomic mass wave wavelength measurement apparatus according to claim 1, comprising the steps of: step1, building an atomic substance wave wavelength measuring device; step 2, inputting the first frequency laser and the second frequency laser into a beam combining device, placing a slit after the beam combining device, projecting a measured object to the positive direction of the x axis in a vacuum cavity (C1) of the atomic interferometer, and measuring the actual measurement flight time of the measured object ; Step 3, stopping throwing the object to be measured, removing the slit, and measuring the parallel distance between the first beam splitting light and the second beam splitting light in the vacuum cavity (C1) by utilizing the interference electric signal output by the first photoelectric detector (PD 1) so as to obtain the actually measured flight distance of the object to be measured through the first beam splitting light and the second beam splitting light ; Step 4, measuring the flight distance by actual measurement And measured time of flight Obtaining actual measured flying speed 。
5. The atomic mass spectrometry method according to claim 4, further comprising the steps of: step5, obtaining the wavelength of the substance by the following formula Is a precise measurement of (a): , Wherein the method comprises the steps of In order to be a wavelength of a material wave, Is a constant of planck, which is set to be the planck's constant, The mass of the sample is the mass of the sample.
6. The atomic mass spectrometry method according to claim 4, wherein the step 2 comprises the steps of: step 2.1, placing a slit after the beam combining device to enable the test laser (L2) to be adjusted into slit light; Step 2.2, adjusting the corresponding ratio frequency by adjusting the intensity of the test laser (L2) So that So that the first beam-splitting light and the second beam-splitting light obtained by the test laser (L2) are equivalent to pi/2 pulse light, The interaction time of the measured object and the beam splitting light is; Step 2.3, detuning the Raman two-photon Performing linear scanning, and adjusting Raman two-photon detuning each time A measured object is thrown correspondingly once, a round of lambda-cyhalon interferometry is completed, and fluorescent signals of the corresponding measured object are collected, so that lambda-cyhalon interference fringes are obtained; Step 2.4, fitting the lambda-interference fringes based on the following formula: , Wherein the fitted independent variable is Raman two-photon detuning , Representing Raman two-photon detuning Corresponding fluorescent signal intensities; For the magnitude of the fluorescent signal intensity, For the initial phase position, The free evolution time of the measured object between the two beam splitting lasers is the value to be solved; For Raman two-photon detuning Corresponding interference phase shift, and the fitting process of the step 2.4 obtains each Raman two-photon detuning A corresponding interference phase shift; step 2.5, taking the first Raman light two-photon detuning from the fitting result The corresponding interference phase shift is noted as Taking out the first Raman light two-photon detuning Second raman optical two-photon detuning with different values Corresponding interference phase shift Solving the measured flight time of the measured object based on the following formula : , Wherein the difference in interference phase shift Comprises an integer part and a fractional part, wherein the integer part is second Raman light two-photon detuning Corresponding interference phase shift Two-photon detuning with the first raman light Corresponding interference phase shift Spaced apart from each other Is an integer multiple of (a), the decimal part is 。
7. The atomic mass spectrometry method according to claim 4, wherein the step 3 comprises the steps of: step 3.1, removing the slit, and closing one of the first frequency laser and the second frequency laser; Step 3.2, extracting the wrapping phase from the interference electric signal output from the first photodetector (PD 1) Based on wrapped phase Testing the wavelength of a laser Obtaining the actual measurement flight distance The fractional distance in (2) : , Step 3.3, scanning the frequency of the test laser (L2) according to a set rate, wherein the interference electric signal output by the first photoelectric detector (PD 1) is a time beat signal, and extracting the distance between the part of the first beam splitting light in the vacuum cavity (C1) and the part of the second beam splitting light in the vacuum cavity (C1) by the time beat signal as an approximate value of the flight distance ; Step 3.4, passing the approximate value of the flight distance Distance from decimal Obtaining the actual measurement flight distance : 。
8. The atomic mass spectrometry method according to claim 4, wherein the step 4 comprises the steps of: Step 4.1, measuring the measured flight time Corresponding measured flight distance Respectively recorded as actual flight time And corresponding measured flight distance Wherein The number of cycles is indicated and, An initial value of 1; Step 4.2, when the cycle number is Not reaching the preset cycle times When the vacuum cavity (C1) is in use, the parallel interval between the first beam splitting light and the second beam splitting light is changed, the step (2) is returned, and the cycle times are counted Adding 1; when the cycle times Up to a preset number of cycles By the difference method, all the actual flight times And corresponding measured flight distance Obtaining the measured flying speed of the object 。
9. The atomic mass spectrometry method according to claim 6, wherein the step 2.2 comprises the steps of: The method comprises the steps of shielding a first beam splitting light or a second beam splitting light outside a vacuum cavity (C1), reserving a beam of beam splitting light, scanning the intensity of test laser (L2), adjusting the intensity of the test laser (L2) each time, projecting a tested object to enable the tested object to act with the beam of beam splitting light, detecting corresponding fluorescent signals by utilizing detection laser (L1) and a second photoelectric detector (PD 2), taking the intensity of the test laser (L2) corresponding to half of the maximum fluorescent signal intensity to fix the intensity after full ratio oscillation is observed, and removing shielding of the beam splitting light.
10. The atomic mass spectrometry method according to claim 6, wherein the one-round lambda interferometry in step 2.3 comprises the steps of: Step 2.3.1, cooling and casting the measured object by an atomic interferometer, and casting the measured object in the positive direction of the x axis; step 2.3.2, the measured object sequentially passes through each beam splitting light, so that material wave beam splitting and material wave beam combining are sequentially carried out; And 2.3.3, after the substance wave is combined, exciting the detected object by using a detection laser (L1) to generate fluorescence, and detecting by using a second photoelectric detector (PD 2) to obtain a corresponding fluorescence signal.

Description

Atomic substance wave wavelength measuring device and method Technical Field The invention relates to the technical field of quantum sensing, in particular to an atomic substance wave wavelength measuring device and an atomic substance wave wavelength measuring method. The invention is suitable for the technical field of atomic interferometry. Background The atomic interferometer is a novel measuring instrument based on quantum technology, and can be used for accurately measuring inertial quantities such as rotation, gravity gradient and the like. Compared with the traditional interferometer, the atomic interferometer has the advantages of high precision, good stability, calibration and the like due to shorter material wave wavelength of atoms. The atomic interferometer with high precision can be used in the fields of geodetics, geological exploration, inertial navigation and the like. The wavelength of the atomic substance wave is an important parameter of the atomic interferometer, and accurate measurement of the wavelength of the atomic substance wave is helpful for improving the measurement accuracy of the atomic interferometer. For example, for an atomic interferometer, the wavelength of the material wave of the atom determines the rotation scale factor, and its measurement accuracy directly determines the measurement accuracy of the atomic interferometer. For atomic interferometry gravimeters and atomic interferometry gravigradiometers, the material wavelength measurement of atoms can improve the accuracy of systematic error assessment. Quantum mechanics states that the wavelength of an atomic species is inversely proportional to the atomic momentum, i.e., the product of atomic mass and flight speed. The atomic mass can reach the accuracy of 10 -11 orders of magnitude through technical means such as an ion trap and the like, and the requirement of the current atomic interferometer on the wavelength accuracy can be met. Thus, atomic matter wavelength measurement is mainly focused on accurate measurement of flight speed. The related articles and technical schemes aiming at the application background of the invention are as follows: Up to now, the measurement of the flight speed may be achieved by measuring the doppler frequency, or the flight speed may be measured by a time of flight method. Among them, the accuracy of the Doppler frequency measurement method is related to the frequency measurement accuracy, and is easily affected by factors such as optical frequency shift. In time of flight measurements, the flight velocity measurement is highly dependent on the initial position location of the atom projectile and cannot give an absolute velocity measurement. The speed measurement precision of the two methods is limited, and the requirement of the atomic interferometer on the high-precision measurement of the atomic wavelength can not be met. High-precision atomic substance wavelength measurement is still a main technical bottleneck for limiting the improvement of the measurement accuracy of a high-precision atomic interferometer. Disclosure of Invention In order to solve the problem of limited measurement precision of the existing flying speed, the invention provides an atomic substance wave wavelength measurement device and an atomic substance wave wavelength measurement method, and the atomic substance wave wavelength is measured on the basis of the flying speed measurement. In order to realize the measurement of the flying speed, the invention measures the laser distance by constructing an optical Michelson interferometer, and simultaneously measures the evolution time and the distance of atoms passing through two beams of light by utilizing a lambda-type atomic interferometer, thereby finally realizing the accurate measurement of the flying speed. The above object of the present invention is achieved by the following technical solutions: The atomic substance wave length measuring device comprises a vacuum cavity of an atomic interferometer, wherein the length direction of the vacuum cavity is taken as the x-axis direction, the height direction of the vacuum cavity is taken as the y-axis direction, output light of a first frequency laser and a second frequency laser passing through a beam combining device is taken as test laser, the test laser is subjected to beam splitting to obtain a first beam splitting light and a second beam splitting light, the first beam splitting light and the second beam splitting light are incident in a direction parallel to the y-axis and pass through the vacuum cavity to be combined to obtain combined beam light, the combined beam light is detected by a first photoelectric detector, detection laser is irradiated in the vacuum cavity, and the second beam splitting light, the first beam splitting light and the detection laser in the vacuum cavity are sequentially distributed along the x-axis direction; The test laser is split into a first beam splitting light and a second