CN-121978444-A - Rapid testing platform and method for low-temperature filter device

CN121978444ACN 121978444 ACN121978444 ACN 121978444ACN-121978444-A

Abstract

The invention discloses a rapid test platform and a rapid test method for a low-temperature filter device, wherein the platform comprises a first container, a second container, a cold guide plate, an electrical interface, a temperature control module and the like, and the method comprises the steps of testing first total loss of a standard component; and fixing the device to be tested on the cold guide plate, connecting an electric interface, closing a vacuum container, vacuumizing to the preset vacuum degree, injecting the low-temperature medium into a second container, conducting heat through the cold guide plate, cooling down, and testing the second total loss and standing wave ratio of the standard part after the temperature sensor detects that the temperature of the cold guide plate is reduced to the preset temperature and stabilizes for the preset time. According to the invention, the testing platform comprising the vacuum container and the liquid cooling container is constructed, the non-contact heat conduction and cooling of the device and the low-temperature liquid are realized by utilizing the cold guide plate, and meanwhile, the high efficiency and stability of temperature regulation are ensured by matching with the temperature monitoring and quick temperature return components.

Inventors

SHI YONGJI
YAN YUXING
SHAO YINGYI
WANG XIWEI

Assignees

量子科技长三角产业创新中心

Dates

Publication Date: 20260505
Application Date: 20260317

Claims (11)

1. A rapid test platform for a low temperature filter device, comprising: A first container for maintaining a vacuum environment and a second container disposed within the first container for containing a cryogenic medium; The cold guide plate is arranged in the second container, and the bottom of the cold guide plate is in contact with the low-temperature liquid phase in the second container and is used for conducting cold energy to a device to be tested above the cold guide plate; The plurality of electrical interfaces are arranged on the side wall of the first container and are used for connecting the device to be tested with an external testing tool; the temperature control module is arranged on the cold guide plate and used for collecting the real-time temperature of the cold guide plate and enabling the cold guide plate to quickly return to the temperature; The rapid test platform is used for being connected with an external test tool.
2. The rapid testing platform of claim 1, further comprising an overflow protection module comprising a liquid inlet connected to the second container and an overflow outlet, the overflow outlet having a height greater than the liquid inlet, and a bypass of the liquid inlet being provided with a drain valve for draining low temperature media.
3. The rapid measurement platform of claim 1, wherein the cold plate comprises a flat plate extending into the second container with a plurality of columns that are in contact with the cryogenic medium while not in contact with the inner wall of the second container.
4. A rapid measurement platform according to claim 3, wherein the column comprises at least a vertical column and the length of the vertical column is less than the depth of the second container.
5. The rapid survey platform of claim 3, wherein the plate is oxygen-free copper material and the surface of the plate is provided with a plurality of sets of threaded holes.
6. A rapid measurement platform according to claim 3, wherein the flat plate has a side length in the range 200mm < 400mm.
7. The rapid measurement platform of claim 1, wherein the temperature control module comprises a temperature sensor and a heating block, the temperature sensor and the heating block being fixed on the cold plate.
8. The rapid measurement platform of claim 1, further comprising a vacuum assembly for maintaining a vacuum level within the first container at ∈1 x 10 -3 Pa.
9. The rapid measurement platform of claim 8, wherein the evacuation assembly comprises a bellows connected through the first container to an external vacuum pump and a purge valve.
10. The rapid measurement method of the low-temperature filter device is characterized by comprising the following steps of: Accessing the calibrated measuring tool to the rapid measuring platform according to any one of claims 1-9, and starting the vacuumizing assembly to enable the vacuum degree in the first container to meet the preset vacuum degree; injecting a low-temperature medium into the second container, conducting heat through a cold guide plate with a plurality of columns, and testing the first total loss of the standard component after the temperature sensor detects that the temperature of the cold guide plate is reduced to a preset temperature and the preset time is stabilized; Discharging a low-temperature medium, starting a heating block to enable the cold guide plate to return to normal temperature, and taking out the standard component; fixing the device to be tested on the cold guide plate, connecting an electric interface, closing a vacuum container, vacuumizing to the preset vacuum degree, injecting a low-temperature medium into a second container, conducting heat and cooling through the cold guide plate, and testing the second total loss and standing wave ratio of the device to be tested after the temperature sensor detects that the temperature of the cold guide plate is reduced to the preset temperature and the preset time is stabilized; And discharging the low-temperature medium, and starting the heating block to enable the cold guide plate to return to the normal temperature.
11. The rapid measurement method according to claim 10, wherein the processes of injecting a low-temperature medium, cooling down, discharging a liquid, and heating back to temperature are repeatedly performed in a state where the device under test remains mounted on the cold guide plate while the temperature cycle test is performed, and the second total loss and standing wave ratio change of the device under test per cycle are recorded.

Description

Rapid testing platform and method for low-temperature filter device Technical Field The invention belongs to the technical field of quantum device testing, and particularly relates to a rapid testing platform and method for a low-temperature filter device. Background In the technical field of quantum computing, a quantum low-temperature microwave device is a core component of a superconducting quantum bit microwave measurement system, and the operation stability and accuracy of the quantum computing system are directly determined by the electrical performance, superconducting characteristics and reliability of the quantum low-temperature microwave device in a low-temperature environment. Therefore, before device research and development, mass production and application, defective products need to be screened through low-temperature testing, and performance potential is estimated, so that guarantee is provided for formal testing and application in the follow-up extremely low-temperature environment such as 10 mK. On one hand, the low-temperature test of the quantum low-temperature microwave device in the related technology is to directly soak the quantum device in low-temperature liquid such as liquid nitrogen, liquid helium and the like for cooling test. Although the low-temperature environment can be realized rapidly, when the low-temperature liquid is in direct contact with the device, the physical damage to the device is caused by the problems of thermal stress, liquid impact and the like generated by instantaneous temperature difference, so that the accuracy of a test result is affected, and the actual service life of the device is shortened. Meanwhile, the contact cooling mode is difficult to realize synchronous test of batch devices, has low test efficiency, and cannot meet the screening requirement of a mass production stage. On the other hand, there are also related art that provide a very low temperature test environment directly through a dilution refrigerator. Although the dilution refrigerator can reach the extremely low temperature condition of 10mK level, the device structure is complex, the purchase and operation costs are high, the cooling process needs to be subjected to multi-stage temperature stabilization steps, the cooling process from room temperature to target low temperature often needs several hours or even days, and the test period is extremely long. In addition, the test flow of the dilution refrigerator is complicated, the dilution refrigerator is not suitable for frequent test or temperature cycle test of a large number of devices, and if the devices with obvious defects are sent to the environment test, great resource waste can be caused. Therefore, in order to solve the problems of easy damage, high testing cost, long period, lack of effective pre-screening means and the like of a low-temperature testing scheme of a quantum low-temperature microwave device in the prior art, a rapid testing platform and a rapid testing method of a low-temperature filter device are needed. Disclosure of Invention The invention aims to provide a rapid test platform and a rapid test method for a low-temperature filter device, which are used for solving the problems of easy damage, high test cost, long period and lack of effective pre-screening means of a low-temperature test scheme of a quantum low-temperature microwave device in the prior art. Therefore, in one aspect, the present invention provides a rapid test platform for a low-temperature filter device, including: A first container for maintaining a vacuum environment and a second container disposed within the first container for containing a cryogenic medium; The cold guide plate is arranged in the second container, and the bottom of the cold guide plate is in contact with the low-temperature liquid phase in the second container and is used for conducting cold energy to a device to be tested above the cold guide plate; The plurality of electrical interfaces are arranged on the side wall of the first container and are used for connecting the device to be tested with an external testing tool; the temperature control module is arranged on the cold guide plate and used for collecting the real-time temperature of the cold guide plate and enabling the cold guide plate to quickly return to the temperature; The rapid test platform is used for being connected with an external test tool. In some embodiments, the rapid measurement platform further comprises an overflow protection module, the overflow protection module comprises a liquid inlet and an overflow port connected with the second container, the height of the overflow port is greater than that of the liquid inlet, and a bypass of the liquid inlet is provided with a liquid discharge valve for discharging a low-temperature medium. In some embodiments, the cold plate includes a flat plate having a plurality of columns extending into the second container, the columns being in contact with the cryog