CN-121978510-A - Analog integrated circuit testing method based on edge calculation

Abstract

The invention discloses an analog integrated circuit testing method based on edge calculation, which is executed by an edge node and comprises the steps of obtaining a step response waveform of an analog integrated circuit, extracting screening characteristics from the step response waveform, determining an abnormal level and a testing type of the screening characteristics, determining a demand level of a server for original waveform data based on the abnormal level and the testing type of the screening characteristics, and determining a sending strategy for sending the screening characteristics and the original waveform data to the server based on the demand level. The invention can reduce waiting and repeated interaction of the server and improve test judgment efficiency and test throughput.

Inventors

• ZHU PEI
• YU XIUQING

Assignees

• 深圳市华测半导体设备有限公司

Dates

Publication Date

20260505

Application Date

20260401

Claims (10)

1. 1. A method of analog integrated circuit testing based on edge computation, the method performed by an edge node, the method comprising: Acquiring a step response waveform of the analog integrated circuit; Extracting screening features from the step response waveform; Determining an abnormality level and a test type of the screening feature; determining a server demand level for the raw waveform data based on the abnormality level and test type of the screening feature, and A transmission policy to transmit the screening feature and the raw waveform data to the server is determined based on the demand level.
2. 2. The method of claim 1, wherein the screening features include peaks, setup times, and anomaly scores; Wherein the method further comprises: and generating associated descriptive information related to the screening feature, wherein the associated descriptive information comprises a test object identifier, a time stamp and a priority identifier.
3. 3. The method of claim 2, wherein the demand level comprises a first demand level and a second demand level; wherein determining a transmission policy to transmit the screening feature and the raw waveform data to the server based on the demand level comprises: If the demand level is the first demand level, sending the screening feature, the associated descriptive information and a key summary of the raw waveform data to the server; And if the demand level is the second demand level, sending the screening characteristics and the associated description information to the server, and locally storing the original waveform data at an edge node.
4. 4. A method according to claim 3, wherein the server is configured to: determining whether a determination of the analog integrated circuit can be completed based on the screening feature; Performing a decision on the analog integrated circuit if it is determined that the decision on the analog integrated circuit can be completed based on the screening feature; If it is determined that the determination of the analog integrated circuit cannot be completed based on the screening feature, continuing to determine whether a critical digest of the raw waveform data is received; and if the key abstract of the original waveform data is not received, requesting the original waveform data from the edge node based on the association description information.
5. 5. The method of claim 4, wherein the server is further configured to: If it is determined that a critical digest of the raw waveform data is received, continuing to determine whether a determination of the analog integrated circuit can be completed based on the screening feature and the critical digest of the raw waveform data; Performing a decision on the analog integrated circuit if it is determined that the decision on the analog integrated circuit can be completed based on the screening feature and a critical digest of the raw waveform data; If it is determined that the determination of the analog integrated circuit cannot be completed based on the screening feature and the critical digest of the raw waveform data, requesting the remaining data of the raw waveform data from the edge node based on the association description information.
6. 6. An edge computation based analog integrated circuit testing system, the system comprising an edge node and a server, the edge node configured to: Acquiring a step response waveform of the analog integrated circuit; Extracting screening features from the step response waveform; Determining an abnormality level and a test type of the screening feature; determining a server demand level for the raw waveform data based on the abnormality level and test type of the screening feature, and A transmission policy to transmit the screening feature and the raw waveform data to the server is determined based on the demand level.
7. 7. The system of claim 6, wherein the screening features include peaks, setup times, and anomaly scores; wherein the edge node is further configured to: and generating associated descriptive information related to the screening feature, wherein the associated descriptive information comprises a test object identifier, a time stamp and a priority identifier.
8. 8. The system of claim 7, wherein the demand level comprises a first demand level and a second demand level; wherein determining a transmission policy to transmit the screening feature and the raw waveform data to the server based on the demand level comprises: If the demand level is the first demand level, sending the screening feature, the associated descriptive information and a key summary of the raw waveform data to the server; And if the demand level is the second demand level, sending the screening characteristics and the associated description information to the server, and locally storing the original waveform data at an edge node.
9. 9. The system of claim 8, wherein the server is configured to: determining whether a determination of the analog integrated circuit can be completed based on the screening feature; Performing a decision on the analog integrated circuit if it is determined that the decision on the analog integrated circuit can be completed based on the screening feature; If it is determined that the determination of the analog integrated circuit cannot be completed based on the screening feature, continuing to determine whether a critical digest of the raw waveform data is received; and if the key abstract of the original waveform data is not received, requesting the original waveform data from the edge node based on the association description information.
10. 10. The system of claim 9, wherein the server is further configured to: If it is determined that a critical digest of the raw waveform data is received, continuing to determine whether a determination of the analog integrated circuit can be completed based on the screening feature and the critical digest of the raw waveform data; Performing a decision on the analog integrated circuit if it is determined that the decision on the analog integrated circuit can be completed based on the screening feature and a critical digest of the raw waveform data; If it is determined that the determination of the analog integrated circuit cannot be completed based on the screening feature and the critical digest of the raw waveform data, requesting the remaining data of the raw waveform data from the edge node based on the association description information.

Description

Analog integrated circuit testing method based on edge calculation Technical Field The invention relates to the technical field of data processing, in particular to an analog integrated circuit testing method based on edge calculation. Background The analog integrated circuit test is an important component in the integrated circuit test and is widely applied to performance detection and quality screening of operational amplifiers, low-dropout linear voltage regulators, analog-to-digital converters, digital-to-analog converters, power management chips and various analog front-end circuits. With the increase of complexity of the analog integrated circuit and the increase of test throughput requirements, the traditional method of intensively completing test data analysis and result judgment by the central server gradually exposes the problems of high time delay, large bandwidth occupation, insufficient expansibility and the like. For this purpose edge computation is gradually introduced into the analog integrated circuit test scenario. In the test architecture based on edge calculation, edge nodes close to the test equipment can perform preprocessing, feature extraction, compression packaging and preliminary analysis on the original waveforms, and a server is responsible for more complex model reasoning, comprehensive judgment and strategy management, so that the return quantity of the original data is reduced, and the test instantaneity is improved. In the prior art, the edge node usually extracts the characteristic data for rapid screening from the original test data and preferentially sends the characteristic data to the server, while the original key waveform with larger data quantity is usually cached, queued for compression or delayed for sending. However, in some scenarios, the server only uses the screening feature to make it difficult to accurately determine the target circuit characteristics, and further analysis is still required in combination with the corresponding original key waveforms. If the original key waveform has not been compressed or remains in the queue to be sent by the edge node, the server needs to wait for subsequent uploading or initiate a replenishment request again. Therefore, in the prior art, the screening feature data and the original key waveform data are usually separated and processed, and the uploading time sequence is mainly determined according to the data volume or the default rule, and cannot be effectively coordinated with the actual judging requirement of the server side, so that secondary waiting of the server, increase of cloud-edge interaction rounds, difficulty in completing the analysis process in one closed loop are easily caused, the whole test beat is prolonged, and the test efficiency of the analog integrated circuit is affected. Disclosure of Invention According to the invention, the step response waveform of the analog integrated circuit is obtained through the edge node, the screening characteristics are extracted, the demand level of the server for the original waveform data is determined according to the abnormal level and the test type, and then the corresponding sending strategy is selected. For high-demand scenes, the edge node sends screening features, associated description information and key summaries of the original waveform data, and for low-demand scenes, only the screening features and the associated description information are sent and the original waveform data is stored locally. Therefore, waiting and repeated interaction of the server can be reduced, and test judging efficiency and test throughput can be improved. The invention provides an analog integrated circuit testing method based on edge calculation, which is executed by an edge node and comprises the following steps: Acquiring a step response waveform of the analog integrated circuit; Extracting screening characteristics from the step response waveform; determining an abnormality level and a test type of the screening feature; Determining a level of demand of the server for the raw waveform data based on the anomaly level of the screening feature and the test type, and A transmission policy to transmit the screening feature and the raw waveform data to the server is determined based on the demand level. In a preferred embodiment, the screening features include peak, setup time, and anomaly score; Wherein the method further comprises: Association description information related to the screening feature is generated, wherein the association description information comprises a test object identifier, a time stamp and a priority identifier. In a preferred embodiment, the demand level includes a first demand level and a second demand level; Wherein determining a transmission policy to transmit the screening feature and the raw waveform data to the server based on the demand level comprises: If the demand level is the first demand level, sending screening characteristics, associated desc