CN-121978513-A - Core particle, test control method, chip and electronic equipment

Abstract

The embodiment of the application provides a core particle, a test control method, a chip and electronic equipment, wherein the core particle comprises a scanning isolation circuit, the scanning isolation circuit comprises a first scanning chain, a first multiplexer and a second multiplexer, the first scanning chain comprises a plurality of first triggers, the plurality of first triggers comprise at least one first functional trigger and a first test trigger, the first functional triggers are connected with a core particle interconnection interface, receive core particle interconnection data transmitted by the core particle interconnection interface, the core particle is communicated with the interconnection core particle through the core particle interconnection interface, the first test trigger is used for registering the test data of the core particle, the first multiplexer is connected with the core particle interconnection interface and the output end of the first test trigger and is used for selecting and outputting the core particle interconnection data transmitted by the core particle interconnection interface in a functional mode of the core particle, and the test mode is scanned in the core particle and the test data corresponding to the first test trigger is selected and outputted. The core particle provided by the embodiment of the application can realize accurate test of the core particle.

Inventors

• Zhan Lichang
• ZHANG XINBIAO
• ZENG HUI

Assignees

• 海光信息技术股份有限公司

Dates

Publication Date

20260505

Application Date

20241030

Claims (17)

1. 1. The core particle is characterized by comprising a scanning isolation circuit, wherein the scanning isolation circuit comprises: The first scan chain comprises a plurality of first triggers, the plurality of first triggers comprise at least one first functional trigger and a first test trigger, the first functional triggers are connected with a core particle interconnection interface, core particle interconnection data transmitted by the core particle interconnection interface are received, the core particles are communicated with interconnection core particles through the core particle interconnection interface, and the first test trigger is used for registering the test data of the core particles; The first multiplexer is connected with the core grain interconnection interface and the output end of the first test trigger and is used for selecting and outputting the core grain interconnection data transmitted by the core grain interconnection interface in the functional mode of the core grain and selecting and outputting the test data corresponding to the first test trigger in the internal scanning test mode of the core grain.
2. 2. The pellet of claim 1, wherein the plurality of first flip-flops are configured to stage-wise transfer test data of the pellet internal scan test by a shift operation until the test data is transferred to the first flip-flops in an internal scan test mode of the pellet; The output end of the last first trigger in the plurality of first triggers is connected with the scanning input end of the next first trigger so as to transmit the test data of the internal scanning test of the core particle to the next first trigger, wherein the test data of the core particle comprises the test data of the internal scanning test of the core particle.
3. 3. The pellet of claim 2, further comprising an internal logic module coupled to the output of the first functional trigger and the output of the first multiplexer; The internal logic module is used for receiving the core grain interconnection data transmitted by the first functional trigger and the core grain interconnection data output by the first multiplexer in the functional mode of the core grain, and receiving the test data of the core grain internal scanning test output by the first multiplexer in the internal scanning test mode of the core grain.
4. 4. The core particle of claim 1, wherein the data input terminal of the first test trigger is connected to the core particle interconnection interface for receiving the test data of the core particle interconnection test transmitted by the core particle interconnection interface in the core particle interconnection test mode, and the test data of the core particle interconnection test is shifted and output through the output terminal of the first test trigger to output the result of the core particle interconnection test.
5. 5. The core particle of any of claims 1-4, wherein said scan isolation circuit further comprises a second scan chain, said second scan chain comprising a plurality of second flip-flops, said plurality of second flip-flops comprising at least one second functional flip-flop and a second test flip-flop; the second functional trigger is connected with a core particle interconnection interface and transmits core particle interconnection data to the core particle interconnection interface; The second test flip-flop is used at least for registering test data of the die interconnect test.
6. 6. The die of claim 5, wherein the plurality of second flip-flops are configured to stage-wise transfer test data for the die interconnect test through a shift operation until the transfer to a second test flip-flop, wherein an output of a previous second flip-flop is coupled to a scan input of a next second flip-flop to transfer the test data for the die interconnect test to the next second flip-flop.
7. 7. The die of claim 6, wherein the scan isolation circuit further comprises a second multiplexer, wherein the second multiplexer is coupled to the second test flip-flop and to the internal logic module of the die for selectively outputting die interconnect data transferred by the internal logic module and to the die interconnect interface in a functional mode of the die, and selectively outputting test data of a die interconnect test registered by the second test flip-flop and to the die interconnect interface in a die interconnect test mode.
8. 8. The core particle of claim 1, wherein the first test flip-flop is further configured to register isolated data, wherein the isolated data is transferred from the plurality of first flip-flops in stages by a shift operation until transferred to the first test flip-flop; the first multiplexer is further configured to select, in response to an isolation control signal, isolation data registered by the first test trigger to output, so as to isolate the die interconnection interface.
9. 9. The die of claim 8, wherein the first multiplexer to select the first test flip-flop registered data for output in response to an isolation control signal to isolate a die interconnect interface comprises: And when the result of the core grain interconnection test is that the interconnection between the core grains is invalid, selecting the isolation data registered by the first test trigger for outputting so as to isolate the core grain interconnection interface.
10. 10. The pellet of claim 9, further comprising a control circuit, wherein the control circuit comprises: And the OR gate unit is connected with the control end of the first multiplexer and used for providing the isolation control signal for the first multiplexer.
11. 11. The pellet of claim 10, wherein the control circuit further comprises: the first test storage unit is used for providing at least first test information; the second test storage unit is used for providing at least second test information; The device comprises a first test storage unit, a second test storage unit, a third multiplexer and a core particle interconnection test, wherein the first multiplexer is used for selecting target test information from first test information provided by the first test storage unit and second test information provided by the second test storage unit, and forming test data of the core particle based on the selected target test information, and the formed test data of the core particle is divided into test data of a scanning test in the core particle and test data of the core particle interconnection test.
12. 12. The core particle of claim 11, wherein the OR gate unit is further coupled to the first test memory unit and the second test memory unit to generate the isolation signal, and wherein the OR gate unit further generates a selection signal of the third multiplexer and transmits the selection signal to a control terminal of the third multiplexer to control the third multiplexer to select the target test information from the first test information and the second test information.
13. 13. The core particle of claim 12, wherein the first test storage unit is a static test storage unit, the information stored in the static test storage unit being fixed; the second test storage unit is a dynamic test storage unit, and the information stored in the dynamic test storage unit is dynamically adjustable; The first test information comprises first test data, a first source selection signal and first isolation data, wherein the first source selection signal is a selection signal stored in the first test storage unit and used for selecting an input source of the scanning isolation circuit; The second test information comprises second test data, a second source selection signal and a second isolation signal, wherein the second source selection signal is a selection signal stored in the second test storage unit and used for selecting an input source of the scanning isolation circuit.
14. 14. The core particle of claim 5, further comprising a clock circuit, the clock circuit comprising: An internal clock unit for providing an internal clock signal of the core particle; A clock signal switching unit for switching the internal clock signal provided by the internal clock unit; and a fourth multiplexer for selecting a target clock signal from the internal clock signal and the clock signal provided by the interconnected core as the clock signal used by the first scan chain and/or the second scan chain in the core.
15. 15. A test control method applied to the core particle of any one of claims 1 to 14, the method comprising: Detecting a current mode of the core particle; If the current mode is a functional mode of the core particle, selecting and outputting core particle interconnection data transmitted by a core particle interconnection interface, wherein the core particle is communicated with the interconnection core particle through the core particle interconnection interface; And selecting and outputting test data corresponding to a first test trigger of the core particle in an internal scanning test mode of the core particle, wherein the current mode is the first test trigger of the core particle, and the first test trigger is a trigger for testing the core particle, which is arranged on a first scanning chain of the core particle.
16. 16. A chip comprising a plurality of core particles, the core particles being as claimed in any one of claims 1 to 14.
17. 17. An electronic device comprising the chip of claim 16.

Description

Core particle, test control method, chip and electronic equipment Technical Field The embodiment of the application relates to the technical field of computers, in particular to a core particle, a test control method, a chip and electronic equipment. Background The packaging technology can interconnect a plurality of core particles to form a chip, is an important means for realizing the improvement of the chip performance and the function integration, and is widely applied in the chip manufacturing process. In order to ensure the performance of the chip adopting the packaging technology, the core particle needs to be tested, so how to provide a technical scheme to realize the accurate test of the core particle becomes a technical problem to be solved by those skilled in the art. Disclosure of Invention In view of the above, the embodiments of the present application provide a core particle, a test control method, a chip, and an electronic device, which can implement accurate testing of the core particle. In order to achieve the above purpose, the embodiment of the present application provides the following technical solutions. In a first aspect, an embodiment of the present application provides a core particle, including a scan isolation circuit, where the scan isolation circuit includes: The first scan chain comprises a plurality of first triggers, the plurality of first triggers comprise at least one first functional trigger and a first test trigger, the first functional triggers are connected with a core particle interconnection interface, core particle interconnection data transmitted by the core particle interconnection interface are received, the core particles are communicated with interconnection core particles through the core particle interconnection interface, and the first test trigger is used for registering the test data of the core particles; The first multiplexer is connected with the core grain interconnection interface and the output end of the first test trigger and is used for selecting and outputting the core grain interconnection data transmitted by the core grain interconnection interface in the functional mode of the core grain and selecting and outputting the test data corresponding to the first test trigger in the internal scanning test mode of the core grain. Optionally, the plurality of first triggers are configured to transmit test data of the internal scan test of the core particle step by step through a shift operation in an internal scan test mode of the core particle until the test data is transmitted to the first test triggers; The output end of the last first trigger in the plurality of first triggers is connected with the scanning input end of the next first trigger so as to transmit the test data of the internal scanning test of the core particle to the next first trigger, wherein the test data of the core particle comprises the test data of the internal scanning test of the core particle. Optionally, the core particle further comprises an internal logic module, wherein the internal logic module is connected with the output end of the first functional trigger and the output end of the first multiplexer; The internal logic module is used for receiving the core grain interconnection data transmitted by the first functional trigger and the core grain interconnection data output by the first multiplexer in the functional mode of the core grain, and receiving the test data of the core grain internal scanning test output by the first multiplexer in the internal scanning test mode of the core grain. Optionally, the data input end of the first test trigger is connected with the core particle interconnection interface and is used for receiving the test data of the core particle interconnection test transmitted by the core particle interconnection interface in the core particle interconnection test mode, and the test data of the core particle interconnection test is output through the output end shift of the first test trigger so as to output the result of the core particle interconnection test. Optionally, the scan isolation circuit further comprises a second scan chain, wherein the second scan chain comprises a plurality of second triggers, and the plurality of second triggers comprise at least one second functional trigger and a second test trigger; the second functional trigger is connected with a core particle interconnection interface and transmits core particle interconnection data to the core particle interconnection interface; The second test flip-flop is used at least for registering test data of the die interconnect test. Optionally, the plurality of second triggers are used for transmitting the test data of the core particle interconnection test step by step through a shift operation until the test data are transmitted to the second test triggers, wherein the output end of the last second trigger is connected with the scanning input end of the next second trigger so as