Search

CN-121978593-A - Interface test circuit, judging method and test equipment

CN121978593ACN 121978593 ACN121978593 ACN 121978593ACN-121978593-A

Abstract

The application discloses an interface test circuit, a judging method and test equipment, and relates to the field of interface test. The connection module is connected with the pin to be tested of the Type-C interface. The switch module conducts or cuts off the test path of each pin to be tested. And the test module performs functional test on each pin to be tested to obtain a test result. And the control module determines whether all the pins to be tested are tested successfully according to the test result and sends the test result to the equipment to be tested for display. Based on the scheme of the application, all pins of the Type-C interface can be tested, so that the phenomenon of functional failure of the pins which are not tested is avoided. Meanwhile, whether all pins to be tested are tested successfully or not is determined and sent to the equipment to be tested for display, so that the problems of missing detection and false detection can be prevented, the observation of testers can be facilitated, and the testing efficiency is high.

Inventors

  • DU HUI
  • LI ZHENYU
  • WANG WANTAO
  • Qing Deqi

Assignees

  • 荣耀终端股份有限公司

Dates

Publication Date
20260505
Application Date
20241030

Claims (16)

  1. 1. The interface test circuit is characterized by being used for carrying out interface test on equipment to be tested provided with a Type-C interface, and comprises a connection module, a switch module, a test module and a control module; The first end of the connecting module is connected with the first end of the control module, and the connecting module is used for being connected with pins to be tested of the Type-C interface, wherein the pins to be tested comprise all pins of the Type-C interface; The first end of the switch module is connected with the second end of the control module, and the second end of the switch module is connected with the second end of the connection module; the first end of the test module is connected with the third end of the control module, and the second end of the test module is connected with the third end of the switch module; The control module is used for controlling the connection module to be connected with the pins to be tested, controlling the switch module to be turned on and turned off, determining whether all the pins to be tested are tested successfully according to the test result and sending the test result to the equipment to be tested for display.
  2. 2. The interface test circuit of claim 1, wherein the test module comprises an open circuit test unit, a first end of the open circuit test unit being connected to the third end of the control module, a second end of the open circuit test unit being connected to the third end of the switch module, the open circuit test unit being configured to perform an open circuit test on the pin under test.
  3. 3. The interface test circuit of claim 2, wherein the open circuit test comprises applying a high level signal to the signal line of the pin under test, indicating that the pin under test is in an open circuit state when the level of the pin under test is pulled high, and indicating that the pin under test is in an open circuit state when the level of the pin under test is not pulled high.
  4. 4. An interface test circuit according to any one of claims 1-3, wherein the test module comprises a short circuit test unit, a first end of the short circuit test unit being connected to the third end of the control module, a second end of the short circuit test unit being connected to the third end of the switch module, the short circuit test unit being adapted to short circuit the pin under test.
  5. 5. The interface test circuit of claim 4, wherein the short circuit test comprises applying a high signal to the signal line of the pin under test and detecting the state of the other signal line, indicating that the pin under test is in an un-shorted state when the other signal line is not accidentally pulled up, and indicating that the pin under test is in a shorted state when the other signal line is accidentally pulled up.
  6. 6. The interface test circuit of any one of claims 1-5, further comprising a protection module, wherein a first end of the protection module is connected to a second end of the connection module, and a second end of the protection module is connected to a second end of the switch module, and wherein the protection module is configured to perform over-current protection when a current of the connection module exceeds a preset current.
  7. 7. The interface test circuit of any one of claims 1-5, wherein the control module is further configured to control the test module to continue testing the next pin under test until testing is completed for all the pins under test when the test result of the pin under test is successful, and to output the pin under test that fails in testing when the test result of the pin under test is failed.
  8. 8. The interface test circuit of any one of claims 1-5, wherein the control module is further configured to control the switch module to sequentially turn on or off all specified pins corresponding to the specified function when performing the specified function test on the Type-C interface, and to control the test module to perform the function test on each of the specified pins.
  9. 9. The interface test circuit of claim 8 wherein the designated function comprises one or more of a fast charge function, a headset function, a DP function, or an OTG function.
  10. 10. The interface test circuit of any one of claims 1-5, wherein the control module includes an interface test mode and a storage mode, the interface test mode and the storage mode being alternately performed, wherein the interface test is performed on the Type-C interface when the control module is in the interface test mode, and wherein the test result of the Type-C interface is stored when the control module is in the storage mode.
  11. 11. An interface test device comprising the interface test circuit of any one of claims 1-10 and a memory chip for storing test results of the interface test circuit.
  12. 12. A method for determining a test result based on the interface test circuit according to any one of claims 1 to 10, characterized in that the method for determining a test result comprises: Reading a text format file of a test result; Analyzing the text format file of the test result to obtain test results of all pins to be tested; And displaying the pins to be tested which are failed in test when some of the test results of all the pins to be tested are failed in test, and displaying a test success interface when the test results of all the pins to be tested are successful.
  13. 13. The method of determining as claimed in claim 12, wherein the reading the text format file of the test result includes: Creating a file name of the text format file; Creating a file input stream based on the file name and defining an encoding format of the file input stream; Reading data of the text format file of the test result according to the file input stream; When the last bit of the file input stream is marked, adding the data of the text format file to the file input stream; Combining data in the file input stream into a character string list; closing the file input stream.
  14. 14. The method of determining as claimed in claim 12, wherein said parsing the text format file of the test result to obtain all the pin test results to be tested comprises: reading the content of the text format file of the test result; Dividing the content of the text format file to obtain a plurality of data segments; Analyzing each data segment to obtain a key value pair; extracting key information from the key value pair; And obtaining the test results of all the pins to be tested from the key information.
  15. 15. An electronic device, the electronic device comprising: one or more processors, and memory; the memory is coupled to the one or more processors, the memory for storing computer program code comprising computer instructions that the one or more processors invoke to cause the electronic device to perform the method of any of claims 12-14.
  16. 16. A computer readable storage medium comprising instructions that, when executed on an electronic device, cause the electronic device to perform the method of any of claims 12-14.

Description

Interface test circuit, judging method and test equipment Technical Field The present application relates to the field of interface testing technologies, and in particular, to an interface testing circuit, a judging method, and a testing device. Background With the continuous development of society, electronic devices have become an integral part of people's daily lives, such as mobile phones, tablet computers, or the like. Currently, many electronic devices employ a universal serial bus (universal serial bus, USB Type-C) interface to support multiple functions. For example, a variety of charging protocol functions for electronic devices, OTG (on the go) functions, earphone functions, and a Display Port (DP) function, etc. The Type-C interface is an interface with the same double-sided function structure, and the front side and the back side are not required to be distinguished. In the manufacturing process of electronic devices, it is often necessary to test whether the Type-C interface of the electronic device is good in various functions and pins. However, the conventional interface test equipment generally only tests one side of the Type-C interface, so that the function failure phenomenon easily occurs on the other side which is not tested. Meanwhile, the conventional interface test circuit generally displays test results directly on interface test equipment, needs to be checked manually one by one, is easy to have the problems of missed detection and false detection, and has lower test efficiency. Therefore, a new solution is needed to solve the above-mentioned problems. Disclosure of Invention The application provides an interface test circuit, a judging method and test equipment, which can test all pins of a Type-C interface, so that the phenomenon of functional failure of the pins which are not tested is avoided. Meanwhile, whether all pins to be tested are tested successfully or not is determined and sent to the equipment to be tested for display, so that the problems of missing detection and false detection can be prevented, the observation of testers can be facilitated, and the testing efficiency is high. In order to achieve the above purpose, the application adopts the following technical scheme: In a first aspect, an interface test circuit is provided, which is configured to perform an interface test on a device to be tested provided with a Type-C interface, where the interface test circuit includes a connection module, a switch module, a test module, and a control module. The first end of the connection module is connected with the first end of the control module. The connection module is used for being connected with pins to be tested of the Type-C interface, and the pins to be tested comprise all pins of the Type-C interface. The first end of the switch module is connected with the second end of the control module, and the second end of the switch module is connected with the second end of the connection module. The switch module is used for switching on or switching off the test path of each pin to be tested. The first end of the test module is connected with the third end of the control module, and the second end of the test module is connected with the third end of the switch module. The test module is used for carrying out functional test on each pin to be tested to obtain a test result. The control module is used for controlling the connection module to be connected with the pins to be tested, controlling the switch module to be turned on and off, determining whether all the pins to be tested are tested successfully according to the test result and sending the test result to the equipment to be tested for display. In the embodiment of the application, the connection module is used for being connected with the pins to be tested of the Type-C interface, and the pins to be tested comprise all the pins of the Type-C interface. The switch module is used for controlling the on-off of the test path of each pin to be tested, and the test module is used for carrying out functional test on each pin to be tested to obtain a test result, so that all pins of the Type-C interface are tested, and the phenomenon of functional failure of the pins which are not tested is effectively avoided. The control module is used for determining whether all pins to be tested are tested successfully according to the test result and sending the pins to be tested to the equipment to be tested for display, so that the problems of missing detection and false detection can be prevented, the test personnel can conveniently watch the pins, and the test efficiency is high. With reference to the first aspect, in some implementations of the first aspect, the test module includes an open circuit test unit, a first end of the open circuit test unit is connected to the third end of the control module, a second end of the open circuit test unit is connected to the third end of the switch module, and the open circuit test unit is