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CN-121978740-A - Electronic energy spectrometer, electronic energy spectrum measuring method and system

CN121978740ACN 121978740 ACN121978740 ACN 121978740ACN-121978740-A

Abstract

The application relates to the technical field of electron energy measurement and discloses an electron energy spectrometer, an electron energy spectrum measurement method and an electron energy spectrum measurement system, wherein the electron energy spectrometer comprises a magnetic deflection unit, a scintillator fluorescent screen, an optical acquisition unit and a signal processing unit, wherein the magnetic deflection unit is used for receiving an incident electron beam to be measured, generating a magnetic field and acting on each electron to be measured in the electron beam to be measured, the scintillator fluorescent screen is arranged at the downstream of the magnetic deflection unit and is used for receiving the deflected electron to be measured, the electrons bombard the scintillator fluorescent screen and generate light spots, the optical acquisition unit is used for acquiring light spot images on the scintillator fluorescent screen, and the signal processing unit is used for processing the light spot images so as to identify the spatial position information of the light spots in the light spot images and convert the spatial position information into electronic energy data. The application has the beneficial effects of realizing unification of high resolution and high measurement efficiency and overcoming the inherent defects of signal accumulation problem and low efficiency of the scanning type magnetic spectrometer in the traditional direct measurement method under the high counting rate.

Inventors

  • SHI MINGYUAN
  • LI HAO
  • DENG LIAN
  • LIU XIAOLIANG
  • WU SIZHONG
  • LI LU

Assignees

  • 深圳技术大学

Dates

Publication Date
20260505
Application Date
20251218

Claims (10)

  1. 1. An electronic energy spectrometer is disclosed, which comprises a main body, characterized by comprising the following steps: The magnetic deflection unit is used for receiving an incident electron beam to be detected, generating a magnetic field and adding the magnetic field to each electron to be detected in the electron beam to be detected so as to deflect each electron to be detected in different tracks according to respective energy; A scintillator screen arranged downstream of the magnetic deflection unit for receiving the deflected electrons to be measured and generating light spots; An optical acquisition unit for acquiring a flare image on a scintillator screen; The signal processing unit is in communication connection with the optical acquisition unit and is used for processing the light spot image so as to identify the space position information of the light spot in the light spot image and convert the space position information into electronic energy data.
  2. 2. The electronic spectrometer of claim 1, wherein the scintillator screen is made of a plastic scintillator material, the plastic scintillator material being polyvinyltoluene or styryl plastic scintillators.
  3. 3. The electronic spectrometer of claim 1, wherein the optical acquisition unit comprises a charge coupled device sensor.
  4. 4. The electronic spectrometer of claim 1, wherein the magnetic deflection unit comprises an adjustable electromagnet for adjusting the magnetic field strength by varying the excitation current.
  5. 5. The electronic spectrometer of claim 1, wherein the signal processing unit comprises a deep learning based image processing module for denoising the spot image and accurately locating the spot center.
  6. 6. The electronic energy spectrometer of claim 5, wherein the signal processing unit further comprises a data statistics module for counting the converted electronic energy data to generate an electronic energy spectrum distribution map.
  7. 7. An electronic energy spectrum measuring method, characterized in that it is implemented by using the electronic energy spectrometer as claimed in any one of claims 1 to 6, comprising: receiving electron beams to be detected through a magnetic deflection unit, and applying magnetic field intensity to each electron to be detected so as to deflect the electron to be detected; receiving the deflected electrons to be detected through a scintillator fluorescent screen, and generating light spots corresponding to the spatial distribution of the electrons; The method comprises the steps of obtaining a facula image on a fluorescent screen of a scintillator through an optical acquisition unit and sending the facula image to a signal processing unit; Processing the light spot image through the signal processing unit, and identifying and extracting the space position information of each light spot in the light spot image; And converting the spatial position information into corresponding electronic energy data according to a preset position-energy mapping relation.
  8. 8. The electronic spectrum measuring method according to claim 7, wherein before the step of processing the spot image by the signal processing unit to identify and extract spatial position information of each spot in the spot image, further comprising: and calibrating the energy spectrometer by using a preset standard electron source, and establishing a position-energy mapping relation between the position coordinates of the light spots and the electron energy.
  9. 9. The electronic energy spectrum measuring method according to claim 8, wherein the step of calibrating the spectrometer using a predetermined standard electron source to establish a position-energy mapping relationship between the spot position coordinates and the electron energy includes: Receiving single-energy electron beams with different energies sent by the standard electron source through a magnetic deflection unit; Adjusting the magnetic field intensity of the magnetic deflection unit to enable the single-energy electron beams with different energies to bombard the fixed reference position of the scintillator fluorescent screen in sequence; And establishing a position-energy mapping relation between the spot position coordinates and the electron energy according to the corresponding magnetic field intensity, the electron energy and the corresponding relation of the fixed reference position of each single-energy electron beam.
  10. 10. An electronic energy spectrum measuring system comprising an electronic energy spectrometer as claimed in any one of claims 1 to 6, and a process control unit configured to perform the electronic energy spectrum measuring method as claimed in any one of claims 7 to 9.

Description

Electronic energy spectrometer, electronic energy spectrum measuring method and system Technical Field The invention relates to the technical field of electronic energy measurement, in particular to an electronic energy spectrometer, an electronic energy spectrum measurement method and an electronic energy spectrum measurement system. Background In nuclear science and particle physics research, an electronic spectrometer is a key device for acquiring electronic energy distribution information, and the traditional electronic spectrometer mainly adopts two principles, namely a direct measurement method based on a semiconductor or scintillator detector, which is easy to cause energy spectrum distortion and resolution reduction due to signal accumulation under high counting rate, and a scanning measurement method combining magnetic deflection with a single-point detector, which can acquire high-resolution energy spectrum, but acquires data point by point through scanning magnetic field intensity, has extremely low measurement efficiency, and is difficult to meet the requirements of rapid measurement or dynamic process monitoring, so that the prior art is difficult to realize high-efficiency and high-counting-rate tolerant electronic energy spectrum measurement under the condition of ensuring high-energy resolution. Disclosure of Invention Based on the above, it is necessary to provide an electronic energy spectrometer, an electronic energy spectrometer measuring method and an electronic energy spectrometer measuring system aiming at the existing electronic energy spectrometer problem. An electronic spectrometer, comprising: The magnetic deflection unit is used for receiving an incident electron beam to be detected, generating a magnetic field and adding the magnetic field to each electron to be detected in the electron beam to be detected so as to deflect each electron to be detected in different tracks according to respective energy; A scintillator screen arranged downstream of the magnetic deflection unit for receiving the deflected electrons to be measured and generating light spots; An optical acquisition unit for acquiring a flare image on a scintillator screen; The signal processing unit is in communication connection with the optical acquisition unit and is used for processing the light spot image so as to identify the space position information of the light spot in the light spot image and convert the space position information into electronic energy data. Further, the scintillator fluorescent screen is made of a plastic scintillator material, and the plastic scintillator material is polyvinyl toluene or styrene plastic scintillator. Further, the optical acquisition unit comprises a charge coupled device sensor. Further, the magnetic deflection unit comprises an adjustable electromagnet for adjusting the magnetic field strength by varying the excitation current. Further, the signal processing unit comprises an image processing module based on deep learning, and the image processing module is used for carrying out noise reduction on the facula image and accurately positioning the facula center. Further, the signal processing unit further comprises a data statistics module, which is used for counting the converted electronic energy data to generate an electronic energy spectrum distribution diagram. An electronic energy spectrum measuring method, which is realized by adopting the electronic energy spectrometer, comprises the following steps: receiving electron beams to be detected through a magnetic deflection unit, and applying magnetic field intensity to each electron to be detected so as to deflect the electron to be detected; receiving the deflected electrons to be detected through a scintillator fluorescent screen, and generating light spots corresponding to the spatial distribution of the electrons; The method comprises the steps of obtaining a facula image on a fluorescent screen of a scintillator through an optical acquisition unit and sending the facula image to a signal processing unit; Processing the light spot image through the signal processing unit, and identifying and extracting the space position information of each light spot in the light spot image; And converting the spatial position information into corresponding electronic energy data according to a preset position-energy mapping relation. Further, before the step of processing the light spot image by the signal processing unit and identifying and extracting the spatial position information of each light spot in the light spot image, the method further includes: and calibrating the energy spectrometer by using a preset standard electron source, and establishing a position-energy mapping relation between the position coordinates of the light spots and the electron energy. Further, the step of calibrating the spectrometer by using a preset standard electron source to establish a position-energy mapping relationship between the position