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CN-121979331-A - Test system, temperature control method and control device thereof

CN121979331ACN 121979331 ACN121979331 ACN 121979331ACN-121979331-A

Abstract

The application relates to a test system, a temperature control method thereof and a control device thereof. The temperature control method comprises the steps of obtaining a test set temperature and a preset temperature threshold value of a test station, determining that a control valve is in an open state or a cut-off state based on the test set temperature and the preset temperature threshold value of the test station, obtaining a test actual temperature of the test station, a first set temperature of a first station and a first actual temperature when the control valve is in the open state, obtaining a test heating duty cycle and a test duty cycle threshold value of a test heating module if the test actual temperature reaches the test set temperature and the first actual temperature reaches the first set temperature, and adjusting the control valve to enable the test heating duty cycle to be larger than or equal to the test duty cycle threshold value if the test heating duty cycle is smaller than the test duty cycle threshold value, and enabling the test station and the first station to enter a working state if the test heating duty cycle is larger than or equal to the test duty cycle threshold value.

Inventors

  • CAI NIANQUN
  • HUANG TAIPING
  • GE HONGFEI

Assignees

  • 杭州长川科技股份有限公司

Dates

Publication Date
20260505
Application Date
20251231

Claims (13)

  1. 1. The temperature control method of the test system comprises a test station (a 2), a first station (a 1), a test temperature control unit (20) and a first temperature control unit (10) which are used for controlling the temperature of the test station (a 2) and the temperature of the first station (a 1), wherein the test temperature control unit (20) comprises a test refrigerating module (21) and a test heating module (400), the first temperature control unit (10) comprises a first refrigerating module (11), a return air cooling module (30) is arranged between the test refrigerating module (21) and the first refrigerating module (11), the return air cooling module (30) comprises a first cooling flow path (31), a control valve (A3) and a heat exchanger (33) which are arranged on the first cooling flow path (31), an input end and an output end of the first cooling flow path (31) are respectively communicated with a refrigerant output end and a refrigerant input end of the first refrigerating module (11), and the first cooling flow path (31) is used for cooling the test refrigerating module (21) through the heat exchanger (33), and the return air cooling module (23) is characterized by comprising the following steps of cooling the test refrigerating module (23) by the heat exchange method: Acquiring a test set temperature (SV) and a preset temperature threshold (T3) of a test station (a 2), and determining that the control valve (A3) is in an open state or a cut-off state based on the test set temperature (SV) and the preset temperature threshold (T3) of the test station (a 2); Acquiring a test actual temperature (T2) of the test station (a 2), a first set temperature (SV 1) of the first station (a 1) and a first actual temperature (T1) when the control valve (A3) is in an open state; If the test actual temperature (T2) reaches the test set temperature (SV) and the first actual temperature (T1) reaches the first set temperature (SV 1), obtaining a test heating duty cycle (c 2) and a test duty cycle threshold (c 3) of the test heating module (400); if the test heating duty cycle (c 2) is smaller than the test duty cycle threshold (c 3), adjusting the control valve (A3) so that the test heating duty cycle (c 2) is larger than or equal to the test duty cycle threshold (c 3); If the test heating duty cycle (c 2) is greater than or equal to a test duty cycle threshold (c 3), the test station (a 2) and the first station (a 1) enter a working state; and in the working state, the testing station (a 2) tests the components to be tested, and the first station (a 1) preheats or returns the components to be tested.
  2. 2. The temperature control method of a test system according to claim 1, wherein the step of adjusting the control valve (A3) so that the test heating duty cycle (c 2) is equal to or greater than the test duty cycle threshold (c 3) if the test heating duty cycle (c 2) is smaller than the test duty cycle threshold (c 3) comprises: acquiring an actual return air temperature of the test refrigeration module (21) and a preset return air temperature corresponding to the test duty cycle threshold (c 3); If the actual return air temperature is greater than the preset return air temperature, the opening of the control valve (A3) is gradually increased in a first set step length until the actual return air temperature is less than the preset return air temperature.
  3. 3. The temperature control method of a test system according to claim 2, wherein a return air superheat degree and a superheat degree threshold value of the first refrigeration module (11) are obtained, and when the return air superheat degree of the first refrigeration module (11) is smaller than the superheat degree threshold value, the opening degree of the control valve (A3) is gradually reduced by a second set step length until the return air superheat degree of the first refrigeration module (11) is greater than or equal to the superheat degree threshold value; Or acquiring the air return temperature and the air return temperature threshold value of the first refrigeration module (11), and when the air return temperature of the first refrigeration module (11) is smaller than the air return temperature threshold value, gradually reducing the opening of the control valve (A3) with a second set step length until the air return temperature of the first refrigeration module (11) is larger than or equal to the air return temperature threshold value.
  4. 4. The temperature control method of a test system according to claim 1, characterized in that said step of determining whether said control valve (A3) is in an open state or in a shut-off state based on a test set temperature of said test station (a 2) and said preset temperature threshold (T3) further comprises: Acquiring a test heating duty cycle (c 2) and a test duty cycle threshold (c 3) of the test heating module (400), and if the test heating duty cycle (c 2) is smaller than the test duty cycle threshold (c 3), enabling the return air superheat degree corresponding to the test refrigerating module (21) and the first refrigerating module (11) to meet respective preset superheat degree ranges in a preset adjusting mode; The preset adjusting mode comprises the step-by-step adjustment of the set temperatures corresponding to the test refrigeration module (21) and the first refrigeration module (11) in a preset temperature range by a third set step length, or the step-by-step increase of the opening of the first return air cooling valve (A1) of the first refrigeration module (11) by a fourth set step length.
  5. 5. The temperature control method of a test system according to claim 4, wherein, when the control valve (A3) is in an open state, the step of enabling the return air superheat degree of the test refrigeration module (21) corresponding to the first refrigeration module (11) to meet respective preset superheat degree ranges in a preset adjustment manner further includes: acquiring an actual return air temperature of the test refrigeration module (21) and a preset return air temperature corresponding to the test duty cycle threshold (c 3); If the actual return air temperature is greater than the preset return air temperature, the opening of the control valve (A3) is gradually increased in a first set step length until the actual return air temperature is less than the preset return air temperature.
  6. 6. The temperature control method of a test system according to claim 5, wherein the opening of the control valve (A3) is increased stepwise in a first set step size until the actual return air temperature is smaller than the preset return air temperature, further comprising: Acquiring the actual temperature, the set temperature and the preset temperature fluctuation range of each of the test refrigeration module (21) and the first refrigeration module (11); If the difference value between the actual temperature and the set temperature of the test refrigeration module (21) and the difference value between the actual temperature and the set temperature of the first refrigeration module (11) are all located in the preset temperature fluctuation range, the return air superheat degree corresponding to the test refrigeration module (21) and the first refrigeration module (11) is enabled to meet the respective preset superheat degree range in the preset adjustment mode.
  7. 7. The temperature control method of a test system according to claim 4, wherein the first temperature control unit (10) further includes a first heating module (100), and the step of enabling the return air superheat degree of the test refrigeration module (21) and the first refrigeration module (11) corresponding to each other to satisfy the respective preset superheat degree range in a preset adjustment manner further includes, when the control valve (A3) is in a cut-off state: Acquiring a first heating duty cycle (c 1) and a first duty cycle threshold (c 4) of the first heating module (100); And if the first heating duty ratio (c 1) is smaller than the first duty ratio threshold (c 4) or the test heating duty ratio (c 2) is smaller than the test duty ratio threshold (c 3), enabling the return air superheat degree corresponding to the test refrigeration module (21) and the first refrigeration module (11) to meet respective preset superheat degree ranges in the preset adjustment mode.
  8. 8. The method according to claim 4, wherein the specific step of enabling the return air superheat degree of the test refrigeration module (21) corresponding to the first refrigeration module (11) to meet the respective preset superheat degree range in a preset adjustment manner comprises: acquiring the return air superheat degree and the preset superheat degree range of the test refrigeration module (21) corresponding to the first refrigeration module (11); if the return air superheat degrees of the test refrigeration module (21) and the first refrigeration module (11) are respectively in the corresponding preset superheat degree range, ending the step; Otherwise, the set temperatures corresponding to the test refrigeration module (21) and the first refrigeration module (11) are adjusted step by step in the preset temperature range by the third set step, or the opening of the first return air cooling valve (A1) of the first refrigeration module (11) is increased step by the fourth set step.
  9. 9. The temperature control method of a test system according to claim 8, wherein the preset superheat range includes a lower superheat value (h 1), and if the return air superheat of the first refrigeration module (11) is less than or equal to the lower superheat value (h 1), the set temperature of the test refrigeration module (21) is unchanged, and the set temperature of the first refrigeration module (11) is gradually reduced by the third set step until the return air superheat of the first refrigeration module (11) is greater than the lower superheat value (h 1); If the air return superheat degree of the test refrigeration module (21) is smaller than or equal to the lower superheat degree limit value (h 1), the set temperature of the first refrigeration module (11) is unchanged, and the set temperature of the test refrigeration module (21) is gradually reduced by the third set step length until the air return superheat degree of the test refrigeration module (21) is larger than the lower superheat degree limit value (h 1).
  10. 10. The temperature control method of a test system according to claim 8, wherein the preset superheat range includes a superheat upper limit value (h 2), and if the return air superheat of the test refrigeration module (21) is greater than or equal to the superheat upper limit value (h 2), the set temperature of the first refrigeration module (11) is unchanged, and the set temperature of the test refrigeration module (21) is gradually increased by the third set step until the return air superheat of the test refrigeration module (21) is less than the superheat upper limit value (h 2); If the superheat degree of the return air of the first refrigeration module (11) is greater than or equal to the upper limit value (h 2) of the superheat degree, the set temperature of the test refrigeration module (21) is unchanged, and the set temperature of the first refrigeration module (11) is gradually increased by the third set step length until the superheat degree of the return air of the first refrigeration module (11) is smaller than the upper limit value (h 2) of the superheat degree.
  11. 11. The temperature control method of a test system according to claim 10, wherein the step of increasing the set temperature of the first refrigeration module (11) stepwise by the third set step further comprises: If the superheat degree of the return air of the first refrigeration module (11) is greater than or equal to the upper limit value (h 2) of the superheat degree, the set temperature of the test refrigeration module (21) is unchanged, and the opening degree of the first return air cooling valve (A1) is increased step by step in a fifth set step length until the superheat degree of the return air of the first refrigeration module (11) is smaller than the upper limit value (h 2) of the superheat degree.
  12. 12. A control apparatus, characterized by comprising: The system comprises a test heating module (400), an acquisition module, a test control module and a control module, wherein the acquisition module is used for acquiring a test set temperature (SV) and a preset temperature threshold (T3) of a test station (a 2), acquiring a test actual temperature (T2) of the test station (a 2), a first set temperature (SV 1) and a first actual temperature (T1) of a first station (a 1), and acquiring a test heating duty cycle (c 2) and a test duty cycle threshold (c 3) of the test heating module (400); The device comprises a judging module, a control valve (A3), a test heating module (400) and a control valve (C3), wherein the judging module is used for comparing the acquired test set temperature (SV) of the test station (a 2) with a preset temperature threshold (T3) and determining the state of the control valve (A3) according to a comparison result, comparing the acquired test actual temperature (T2) of the test station (a 2) and the first actual temperature (T1) of the first station (a 1) with the test set temperature (SV) and the first set temperature (SV 1) respectively and determining whether the test heating duty ratio (c 2) and the test duty ratio threshold (c 3) of the test heating module (400) need to be acquired according to a comparison result, comparing the acquired test heating duty ratio (c 2) and the test duty ratio threshold (c 3) of the test heating module (400) and determining whether the test station (a 2) and the first station (a 1) enter into a working state according to a comparison result And the control module is used for controlling the control valve (A3) to adjust the opening.
  13. 13. A test system, characterized by comprising a test temperature control unit (20), a first temperature control unit (10) and a test unit, wherein the test temperature control unit (20) and the first temperature control unit (10) are used for respectively performing temperature control on the test station (a 2) and the first station (a 1) by applying the temperature control method according to any one of claims 1 to 11, and the test unit is used for testing components to be tested located at the test station (a 2).

Description

Test system, temperature control method and control device thereof Technical Field The application relates to the technical field of temperature control, in particular to a testing system, a temperature control method and a temperature control device thereof. Background With the continuous development of integrated circuits, the application fields of the integrated circuits are also increasing. Chips in some special fields, such as automotive electronics, avionics, military electronics and the like, have high requirements on the reliability and stability of the chip in severe environments such as high temperature or low temperature. When a customer performs high-low temperature test in the FT (FINAL TEST) stage, the capability requirement on the test equipment for building a high-low temperature test environment is higher and higher. In the prior art, a temperature control system is required to strictly control the temperature of a component to be detected in a detection process of detection equipment of a precision component (for example, a chip), such as a sorting machine, so as to meet detection requirements. In the detection device, there may be a plurality of stations for temperature management, for the sorting machine, including a testing station and other secondary temperature control stations such as a pre-temperature station, a return Wen Gongwei, etc. Each station is provided with a similar refrigeration unit, and the refrigeration unit continuously conveys low-temperature refrigerants to the components to be tested for cooling. In order to prevent the normal operation of the compressor from being influenced by the too high temperature of the refrigerant in the air return pipeline of the compressor, a cooling function of the air return inside the refrigerant machine is generally adopted, namely, a bypass branch of a thermostatic valve is additionally arranged between a liquid outlet pipe of the condenser and an air return end of the evaporator to cool the air return pipeline of the refrigerant, so that the problems of air suction, overheating and the like of the compressor are prevented. However, when the internal return air cooling function of the refrigerant machine is started, the refrigerating effect of the refrigerant machine can be weakened to a certain extent, the refrigerating requirement of components cannot be met, and the temperature operation of various station temperature control in the test system is not facilitated. Disclosure of Invention In view of the foregoing, it is desirable to provide a test system, a temperature control method thereof, and a control device. In one aspect, the application provides a temperature control method of a test system, the test system comprises a test station, a first station, a test temperature control unit and a first temperature control unit, wherein the test temperature control unit is used for respectively controlling the temperature of the test station and the temperature of the first station, the test temperature control unit comprises a test refrigeration module and a test heating module, the first temperature control unit comprises the first refrigeration module, an air return cooling module is arranged between the test refrigeration module and the first refrigeration module, the air return cooling module comprises a first cooling flow path, a control valve and a heat exchanger, the control valve and the heat exchanger are arranged on the first cooling flow path, the input end and the output end of the first cooling flow path are respectively communicated with the refrigerant output end and the refrigerant input end of the first refrigeration module, and the first cooling flow path exchanges heat with a compressor air return pipeline of the test refrigeration module through the heat exchanger, the temperature control method is characterized by comprising the following steps: Acquiring a test set temperature and a preset temperature threshold value of a test station, and determining that the control valve is in an open state or a cut-off state based on the test set temperature and the preset temperature threshold value of the test station; acquiring the actual test temperature of the test station, the first set temperature of the first station and the first actual temperature when the control valve is in an open state; If the test actual temperature reaches the test set temperature and the first actual temperature reaches the first set temperature, obtaining a test heating duty cycle and a test duty cycle threshold of the test heating module; if the test heating duty cycle is smaller than the test duty cycle threshold, adjusting the control valve to enable the test heating duty cycle to be larger than or equal to the test duty cycle threshold; If the test heating duty ratio is greater than or equal to a test duty ratio threshold, the test station and the first station enter a working state; and in the working state, the testing station tests t