CN-121979704-A - Equivalent activation energy determination method and device for electronic equipment, computer equipment and storage medium

CN121979704ACN 121979704 ACN121979704 ACN 121979704ACN-121979704-A

Abstract

The application relates to an equivalent activation energy determining method and device for electronic equipment, computer equipment and storage medium. The method comprises the steps of obtaining standard activation energy of each component in the electronic equipment, environment temperature of the electronic equipment under the condition of normal operation of the electronic equipment and failure rate of each component under the environment temperature, determining a logarithmic acceleration ratio of the electronic equipment according to each failure rate, each standard activation energy, the environment temperature and preset temperature corresponding to a temperature acceleration test, and determining equivalent activation energy of the electronic equipment based on the logarithmic acceleration ratio, the environment temperature and the preset temperature, so that the equivalent activation energy of the electronic equipment level can be calculated based on the known failure rate and activation energy of the components, the accuracy of the electronic equipment level activation energy is improved, and compared with the existing fitting estimation method, a large amount of time and resources can be saved, and a data basis is provided for reliability estimation of the electronic equipment.

Inventors

GAO CHUNYU
XIE LIMEI
QIAO LINA
CHEN ZESHENG
PAN YALING
LIN LIANSHI

Assignees

中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室））

Dates

Publication Date: 20260505
Application Date: 20260408

Claims (10)

1. A method for determining equivalent activation energy of an electronic device, the method comprising: acquiring standard activation energy of each component in electronic equipment, the environment temperature of the electronic equipment under the condition of normal operation of the electronic equipment and failure rate of each component under the environment temperature; determining a logarithmic acceleration ratio of the electronic equipment according to the failure rate, the standard activation energy, the ambient temperature and the preset temperature corresponding to the temperature acceleration test; And determining the equivalent activation energy of the electronic equipment based on the logarithmic speed-up ratio, the ambient temperature and the preset temperature.
2. The method of claim 1, wherein determining the logarithmic acceleration ratio of the electronic device based on each failure rate, each standard activation energy, the ambient temperature, and a preset temperature corresponding to a temperature acceleration test comprises: For each component, determining an acceleration parameter corresponding to the component according to the failure rate of the component, the standard activation energy of the component, the ambient temperature and the preset temperature; determining a first summation result of acceleration parameters corresponding to each component and a second summation result of failure rate of each component; the log acceleration ratio is determined from a log of a first ratio of the first summation result to the second summation result.
3. The method according to claim 2, wherein the determining the acceleration parameter corresponding to the component according to the failure rate of the component, the standard activation energy of the component, the ambient temperature, and the preset temperature includes: determining a second ratio of the standard activation energy to a boltzmann constant, and determining a difference between the inverse of the ambient temperature and the inverse of the preset temperature; Determining a function value of an exponential function based on a natural constant by taking a first product result of the second ratio and the difference value as an index; and determining the product of the function value and the failure rate as an acceleration parameter corresponding to the component.
4. A method according to any of claims 1-3, wherein said determining an equivalent activation energy of the electronic device based on the log acceleration ratio, the ambient temperature and a preset temperature comprises: Determining a temperature conversion coefficient according to the ambient temperature and the preset temperature; And determining the equivalent activation energy of the electronic equipment based on the logarithmic speed-up ratio and the temperature conversion coefficient.
5. The method of claim 4, wherein said determining a temperature conversion coefficient based on said ambient temperature and said preset temperature comprises: and determining a second product result between a difference value and a Boltzmann constant as the temperature conversion coefficient, wherein the difference value is a difference value between the inverse of the environment temperature and the inverse of the preset temperature.
6. A method according to any one of claims 1-3, wherein the method further comprises: And determining a temperature acceleration factor of the electronic equipment according to the equivalent activation energy of the electronic equipment.
7. The method of claim 6, wherein determining a temperature acceleration factor of the electronic device based on the equivalent activation energy of the electronic device comprises: Determining a temperature step acceleration factor according to the equivalent activation energy of the electronic equipment; Determining a high-temperature duration in a single acceleration cycle corresponding to a temperature acceleration test according to the temperature step acceleration factor, and determining a cycle duration of the single acceleration cycle according to the high-temperature duration, a preset low-temperature duration and a preset temperature change duration; Determining the cycle times of the temperature acceleration test based on a temperature cycle acceleration factor, and determining the test duration of the acceleration test according to the cycle times and the cycle duration of the single acceleration cycle; And determining the temperature acceleration factor of the electronic equipment according to the ratio of the preset standard test duration to the test duration.
8. An equivalent activation energy determination apparatus for an electronic device, the apparatus comprising: The electronic equipment comprises an acquisition module, a control module and a control module, wherein the acquisition module is used for acquiring standard activation energy of each component in the electronic equipment, the environment temperature of the electronic equipment under the condition of normal operation of the electronic equipment and the failure rate of each component under the environment temperature; The first determining module is used for determining the logarithmic acceleration ratio of the electronic equipment according to the failure rate, the standard activation energy, the environment temperature and the preset temperature corresponding to the temperature acceleration test; And the second determining module is used for determining the equivalent activation energy of the electronic equipment based on the logarithmic speed-up ratio, the ambient temperature and the preset temperature.
9. A computer device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor implements the steps of the method of any of claims 1 to 7 when the computer program is executed.
10. A computer readable storage medium, on which a computer program is stored, characterized in that the computer program, when being executed by a processor, implements the steps of the method of any of claims 1 to 7.

Description

Equivalent activation energy determination method and device for electronic equipment, computer equipment and storage medium Technical Field The present application relates to the field of reliability evaluation technologies, and in particular, to a method and apparatus for determining equivalent activation energy of an electronic device, a computer device, and a storage medium. Background In the process of evaluating the reliability of the electronic equipment, a temperature acceleration model is required to be used for predicting the service life and verifying the reliability of the electronic equipment. The alennis model is the most common temperature acceleration model, and when the temperature acceleration model is used, parameters of the temperature acceleration model need to be determined, and the parameters may be activation energy of electronic equipment or activation energy of components in the electronic equipment. However, in the related art, the activation energy of the electronic device can be estimated only based on the experimental data fitting the activation energy of the electronic device or the empirical value based on engineering experience, and thus, the activation energy of the electronic device obtained based on the prior art has a problem of low accuracy. Disclosure of Invention Based on this, it is necessary to provide an equivalent activation energy determining method, apparatus, computer device and storage medium for an electronic device in view of the above technical problems. In a first aspect, the application provides an equivalent activation energy determination method for an electronic device. The method comprises the following steps: Acquiring standard activation energy of each component in the electronic equipment, the environment temperature of the electronic equipment under the condition of normal operation of the electronic equipment and the failure rate of each component under the environment temperature; Determining a logarithmic acceleration ratio of the electronic device according to each failure rate, each standard activation energy, the ambient temperature and a preset temperature corresponding to a temperature acceleration test; And determining the equivalent activation energy of the electronic equipment based on the logarithmic speed-up ratio, the ambient temperature and the preset temperature. In one embodiment, the determining the logarithmic acceleration ratio of the electronic device according to each failure rate, each standard activation energy, the ambient temperature, and the preset temperature corresponding to the temperature acceleration test includes: Determining acceleration parameters corresponding to the components according to the failure rate of the components, the standard activation energy of the components, the ambient temperature and the preset temperature for each component; Determining a first summation result of acceleration parameters corresponding to the components and a second summation result of failure rates of the components; the log acceleration ratio is determined from a log of a first ratio of the first summation result to the second summation result. In one embodiment, determining the acceleration parameter corresponding to the component according to the failure rate of the component, the standard activation energy of the component, the ambient temperature and the preset temperature includes: Determining a second ratio of the standard activation energy to the boltzmann constant, and determining a difference between the inverse of the ambient temperature and the inverse of the preset temperature; determining a function value of an exponential function based on a natural constant by taking a first product result of the second ratio and the difference value as an index; and determining the product of the function value and the failure rate as an acceleration parameter corresponding to the component. In one embodiment, the determining the equivalent activation energy of the electronic device based on the logarithmic speed-up ratio, the ambient temperature, and the preset temperature includes: determining a temperature conversion coefficient according to the ambient temperature and the preset temperature; an equivalent activation energy of the electronic device is determined based on the log acceleration ratio and the temperature conversion coefficient. In one embodiment, the determining the temperature conversion coefficient according to the ambient temperature and the preset temperature includes: and determining a second product result between a difference value and a Boltzmann constant as the temperature conversion coefficient, wherein the difference value is a difference value between the reciprocal of the environment temperature and the reciprocal of the preset temperature. In one embodiment, the method further comprises: and determining a temperature acceleration factor of the electronic equipment according to the equivalent acti