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CN-121979728-A - Automatic test method for retiming card

CN121979728ACN 121979728 ACN121979728 ACN 121979728ACN-121979728-A

Abstract

The invention relates to the technical field of electronic tests, in particular to a retiming card automatic test method which comprises the following steps of constructing a BSI boundary scan test system, performing coordinated control through upper computer software, forming at least one boundary scan chain by adopting the BSI boundary scan test system, and performing a test sequence automatically through the upper computer software, wherein the test sequence comprises a power supply input test, an IIC communication test, a differential signal error code test, an IO network interconnection test, a power supply on-off test and a GND connectivity test, automatically judging a PASS or FAIL based on a test result, and generating a test report, and the test report comprises pin level fault positioning information and test coverage statistics. By constructing the multilink boundary scanning system, the digital signal test, the power management and the communication protocol verification are integrated, the test precision and the test speed are remarkably improved, and the full-automatic test of RETIMER CARD is realized.

Inventors

  • ZHU CONGTAO
  • XU XINYONG

Assignees

  • 中科泓泰电子有限公司

Dates

Publication Date
20260505
Application Date
20260106

Claims (10)

  1. 1. The automatic test method for the retiming card is characterized by comprising the following steps of: Constructing a BSI boundary scan test system, performing coordinated control through upper computer software, and forming at least one boundary scan chain by adopting the BSI boundary scan test system; Automatically executing a test sequence through the upper computer software, wherein the test sequence comprises a power supply input test, an IIC communication test, a differential signal error code test, an IO network interconnection test, a power supply on-off test and a GND connectivity test; And automatically judging the PASS or the FAIL based on the test result, and generating a test report, wherein the test report comprises pin-level fault positioning information and test coverage statistics.
  2. 2. The method for automated retiming card testing according to claim 1, wherein the BSI boundary scan test system comprises a TAP master controller, an IO-S-1 tool board, a USB-IIC module, and a semi-automatic fixture, and is controlled in coordination by host software.
  3. 3. The method of claim 2, wherein the BSI boundary scan test system is based on the IEEE 1149.1/6 standard and forms at least one boundary scan chain on the retiming card under test.
  4. 4. The method of claim 3, wherein forming at least one boundary scan chain comprises: the first scanning chain consists of an OCP-140PIN-0 Dummy card and a CDFP-120PIN-0 Dummy card; the second scan chain is independently formed by a main control chip U2 of the detected RETIMER CARD.
  5. 5. The method for automated retiming card testing according to claim 4 wherein constructing a BSI boundary scan test system further comprises connecting all connector pins of RETIMER CARD via an IO-S-1 tool board and integrating an IIC bus for device communication.
  6. 6. The method for automated retiming card testing as defined in claim 5 wherein the IIC communication test comprises: Reading IIC device data on the retiming card through the USB-IIC module, wherein the IIC device comprises an FRU memory U7, a universal IIC device U3 and a temperature sensor U9; verifying the SN code, checksum and manufacturing time of the FRU memory U7; reading temperature data of the temperature sensor U9, and judging passing within a preset range of 10-40 ℃; and detecting an ACK signal of the universal IIC device U3 to confirm communication connectivity.
  7. 7. The method for automated retiming card testing as defined in claim 6, wherein the differential signal error code testing comprises: Using a PRBS error code testing module to detect the error code rate of a differential signal network of the retiming card at the speed of PCIe Gen5 or Gen2, wherein the differential signal network is positioned in a CDFP connector; and controlling the main control chip U2 to drive high and low levels through JTAG, and combining the boundary scan chain to realize signal path verification.
  8. 8. The method for automated retiming card testing according to claim 7, wherein the power on-off test comprises: Control enable pin EN of a power chip including PU25, PU57, PU86, PU30, and PU432 with JTAG signals; and monitoring the level state of the PGOOD pin of the power supply chip, and judging that the power supply chip works normally if the power supply chip is at a high level.
  9. 9. The method for automated retiming card testing according to claim 8, wherein the GND connectivity test comprises: pulling up the signal to a 3.3V power supply through a resistor network on the Dummy test card; The GND pin level of the retiming card is read one by one, and if the GND pin level is low, the GND path is judged to be positive.
  10. 10. The method of claim 2, wherein in the constructing the BSI boundary scan test system, the TAP host controller supports common instructions including IDCODE, EXTEST, SAMPLE and BYPASS and sets port values via COMPLIANCE _ PATTERNS attributes.

Description

Automatic test method for retiming card Technical Field The invention relates to the technical field of electronic testing, in particular to an automatic test method for RETIMER CARD (retiming card) retiming cards, and particularly relates to a circuit board test method for realizing high efficiency and high coverage rate by utilizing a boundary scan technology (BSI). Background RETIMER CARD is a signal enhancer for use on a PCle expansion card or motherboard that functions to re-time, regenerate and forward signals that may be attenuated after transmission over long distances. Test RETIMER CARD functions typically involve verifying the signal booster on the PCIe expansion card or motherboard to ensure that it can properly retime, regenerate, and forward signals that may be attenuated after transmission over long distances. The traditional testing method is mainly realized through the following steps: (1) Preparation work, namely confirming necessary hardware equipment including RETIMER CARD to be tested, a compatible main board or test platform, a power supply and cables and adapters required for connection, and preparation software tools including application programs or firmware update tools capable of configuring and monitoring RETIMER CARD settings. (2) Physical connection checking, namely, installing RETIMER CARD into a compatible mainboard slot and ensuring stable installation, connecting all necessary external devices such as a display, a keyboard and the like so as to facilitate operation and observation of results, and checking whether all physical connections are correct or not and ensuring that loose or wrong connections are avoided. (3) And (4) power-up checking, namely powering up the system and confirming RETIMER CARD whether the system can identify the system. This may involve entering BIOS/UEFI to view hardware information, or using specific diagnostic software to detect card status, and performing basic functional tests, initializing RETIMER CARD with software tools, testing signal paths to ensure that data can be properly transferred through RETIMER CARD, adjusting RETIMER CARD parameter settings, and retesting the quality of the transfer to find the best configuration. However, the conventional testing method has the problems of long testing time, limited coverage range, dependence on manual operation and easy error. In particular, performing a comprehensive test procedure can be very time consuming, especially when stability tests involving long runs or when repeated tests under different conditions are required to ensure reliability. Many test steps still rely on manual operations, lack automated solutions, which can lead to human error and inefficiency. Moreover, high noise is easily generated when the fan speed is high, and the test experience is affected. Disclosure of Invention In order to solve the defects of the traditional testing method, the application aims to provide the automatic testing method for the retiming card, which integrates digital signal testing, power management and communication protocol verification by constructing a multilink boundary scanning system, thereby remarkably improving the testing precision and speed and realizing the full-scale automatic testing of RETIMER CARD. In order to achieve the above purpose, the present invention provides the following technical solutions: The invention provides a method for automatically testing a retiming card, which comprises the following steps: Constructing a BSI boundary scan test system, performing coordinated control through upper computer software, and forming at least one boundary scan chain by adopting the BSI boundary scan test system; Automatically executing a test sequence through the upper computer software, wherein the test sequence comprises a power supply input test, an IIC communication test, a differential signal error code test, an IO network interconnection test, a power supply on-off test and a GND connectivity test; And automatically judging the PASS or the FAIL based on the test result, and generating a test report, wherein the test report comprises pin-level fault positioning information and test coverage statistics. As a further scheme of the invention, the BSI boundary scan test system comprises a TAP main controller, an IO-S-1 tool board, a USB-IIC module and a semi-automatic jig, and is controlled in a coordinated manner through upper computer software. As a further aspect of the present invention, the BSI boundary scan test system is based on the IEEE 1149.1/6 standard and forms at least one boundary scan chain on the retiming card under test. As a further aspect of the present invention, forming at least one boundary scan chain includes: the first scanning chain consists of an OCP-140PIN-0 Dummy card and a CDFP-120PIN-0 Dummy card; the second scan chain is independently formed by a main control chip U2 of the detected RETIMER CARD. As a further aspect of the present invention, constructing t