CN-121981924-A - Distortion measuring method, head display device and computer readable storage medium

CN121981924ACN 121981924 ACN121981924 ACN 121981924ACN-121981924-A

Abstract

The application discloses a distortion measuring method, a head display device and a computer readable storage medium, which relate to the technical field of the head display device, and the method is applied to the head display device and comprises the steps of shooting a display image output by the head display device through a camera preset at an exit pupil frame of the head display device to obtain an exit pupil image corresponding to the display image, wherein the display image comprises a plurality of sampling points, and the exit pupil image comprises a plurality of characteristic points; obtaining distortion simulation data corresponding to a product parameter design value of head display equipment, and determining a first point-bit mapping relation between a sampling point and a characteristic point in an auxiliary mode based on the distortion simulation data; and establishing a target distortion model of the head display equipment based on the first point mapping relation. The application can efficiently and reliably establish the accurate spatial correspondence between the display content and the real shot image under the complex imaging conditions of strong distortion, low signal to noise ratio and the like, thereby realizing the construction of a distortion model with high precision and high robustness.

Inventors

CUI FENGZHI
ZHOU WENJUAN
WANG JIHUI
HAN XINYAN
HAN QIQIANG
LIANG JIANHUA
TANG YINGYING
LIU YAOCHENG

Assignees

青岛歌尔视显科技有限公司

Dates

Publication Date: 20260505
Application Date: 20251231

Claims (10)

1. A distortion measurement method, the method comprising: Shooting a display image output by head display equipment through a camera preset at an exit pupil frame of the head display equipment to obtain an exit pupil image corresponding to the display image, wherein the display image comprises a plurality of sampling points, and the exit pupil image comprises a plurality of characteristic points; Obtaining distortion simulation data corresponding to a product parameter design value of the head display equipment, and determining a first point-bit mapping relation between a sampling point and a characteristic point in an auxiliary mode based on the distortion simulation data; And establishing a target distortion model of the head display equipment based on the first point mapping relation.
2. The method of claim 1, wherein the step of assisting in determining a first point-to-bit mapping relationship between sampling points and feature points based on the distortion simulation data comprises: Performing de-distortion on the exit pupil image according to the distortion simulation data to obtain a de-distortion reference image corresponding to the exit pupil image, wherein the de-distortion reference image comprises a plurality of de-distortion feature points, and a second point location mapping relation exists between the de-distortion feature points and the feature points; Determining a third point location mapping relation between the undistorted feature points and the sampling points according to the two-dimensional coordinates of the undistorted feature points in the undistorted reference image and the two-dimensional coordinates of the sampling points in the display image; and determining a first point-bit mapping relation between the sampling point and the characteristic point according to the second point-bit mapping relation and the third point-bit mapping relation.
3. The method of claim 2, wherein the plurality of sampling points comprises at least two first sampling points and a plurality of second sampling points, wherein a first sampling point is different in shape, size, and/or color from a second sampling point, and the different first sampling points have different shapes, sizes, and/or colors; Correspondingly, the plurality of feature points comprise at least two first feature points, the plurality of de-distortion feature points comprise at least two first de-distortion feature points, wherein the first feature points are feature points corresponding to first sampling points in the exit pupil image, and the first de-distortion feature points are de-distortion feature points corresponding to the first feature points in the de-distortion reference image; the step of determining a third point location mapping relationship between the undistorted feature points and the sampling points according to the two-dimensional coordinates of each undistorted feature point in the undistorted reference image and the two-dimensional coordinates of each sampling point in the display image comprises the following steps: According to the two-dimensional coordinates of the at least two first undistorted feature points in the undistorted reference image and the two-dimensional coordinates of the at least two first sampling points in the display image, a first coordinate system conversion matrix between the undistorted reference image and the display image is obtained through calculation; Determining two-dimensional coordinates of each undistorted feature point and each sampling point under a first target coordinate system according to the first coordinate system conversion matrix, the two-dimensional coordinates of each undistorted feature point in the undistorted reference image and the two-dimensional coordinates of each sampling point in the display image; and determining a third point location mapping relation between the undistorted feature points and the sampling points according to the two-dimensional coordinates of the undistorted feature points and the sampling points under the first target coordinate system.
4. A method as claimed in claim 3, wherein the step of determining a third point location mapping relationship between the de-distorted feature points and the sampling points based on two-dimensional coordinates of the de-distorted feature points and the sampling points in the first target coordinate system comprises: Determining target de-distortion characteristic points corresponding to all sampling points according to the de-distortion characteristic points and the two-dimensional coordinates of all sampling points in a first target coordinate system, wherein the target de-distortion characteristic points are de-distortion characteristic points with the distance between the sampling points and the first target coordinate system being smaller than a first preset value; Respectively counting the number of target de-distortion characteristic points corresponding to each sampling point to obtain the number of target de-distortion characteristic points corresponding to each sampling point, and determining the sampling point with the number of the target de-distortion characteristic points as one as a target sampling point; and constructing a third point location mapping relation between the undistorted feature points and the sampling points based on the target sampling points and the corresponding target undistorted feature points.
5. The method of claim 1, wherein the step of assisting in determining a first point-to-bit mapping relationship between sampling points and feature points based on the distortion simulation data comprises: The display image is distorted according to the distortion simulation data, a distortion reference image corresponding to the display image is obtained, wherein the distortion reference image comprises a plurality of distortion sampling points, the distortion sampling points in the distortion reference image are in one-to-one correspondence with the sampling points in the display image, and a fourth point location mapping relation exists; determining a fifth point location mapping relation between the distortion sampling points and the feature points according to the two-dimensional coordinates of the distortion sampling points in the distortion reference image and the two-dimensional coordinates of the feature points in the exit pupil image; And determining a first point-bit mapping relation between the sampling point and the characteristic point according to the fourth point-bit mapping relation and the fifth point-bit mapping relation.
6. The method of claim 5, wherein the plurality of sampling points comprises at least two first sampling points and a plurality of second sampling points, wherein a first sampling point is different in shape, size, and/or color from a second sampling point, and the different first sampling points have different shapes, sizes, and/or colors; Correspondingly, the plurality of feature points comprise at least two first feature points, the plurality of distortion sampling points comprise at least two first distortion sampling points, wherein the first feature points are feature points corresponding to the first sampling points in the exit pupil image, and the first distortion sampling points are distortion sampling points corresponding to the first sampling points in the distortion reference image; The step of determining a fifth point location mapping relationship between the distorted sampling points and the feature points according to the two-dimensional coordinates of each distorted sampling point in the distorted reference image and the two-dimensional coordinates of each feature point in the exit pupil image includes: According to the two-dimensional coordinates of the at least two first distortion sampling points in the distortion reference image and the two-dimensional coordinates of the at least two first feature points in the exit pupil image, calculating to obtain a second coordinate system conversion matrix between the distortion reference image and the exit pupil image; Determining two-dimensional coordinates of each distortion sampling point and each feature point under a second target coordinate system according to the second coordinate system conversion matrix, the two-dimensional coordinates of each distortion sampling point in the distortion reference image and the two-dimensional coordinates of each feature point in the exit pupil image; And determining a fifth point position mapping relation between the distorted sampling points and the characteristic points according to the two-dimensional coordinates of each distorted sampling point and each characteristic point under the second target coordinate system.
7. The method of claim 6, wherein the step of determining a fifth point location mapping relationship between the distorted sampling points and the feature points based on two-dimensional coordinates of each distorted sampling point and each feature point in the second target coordinate system comprises: determining target distortion sampling points corresponding to the feature points according to the two-dimensional coordinates of the distortion sampling points and the feature points under a second target coordinate system, wherein the target distortion sampling points are distortion sampling points with the distance between the second target coordinate system and the feature points being smaller than a second preset value; Respectively counting the number of the characteristic points corresponding to each target distortion sampling point to obtain the number of the characteristic points corresponding to each target distortion sampling point, and determining the characteristic points corresponding to the target distortion sampling points with the number of the characteristic points being one as target characteristic points; And constructing a fifth point location mapping relation between the distorted sampling points and the characteristic points based on the target characteristic points and the corresponding target distorted sampling points.
8. The method according to any one of claims 1 to 7, wherein the step of establishing the target distortion model of the head display device based on the first point-bit mapping relationship includes: Fitting to obtain distortion parameters of the head display device through the first point-to-bit mapping relation, and dividing the plurality of sampling points into mapped sampling points and sampling points to be mapped through the first point-to-bit mapping relation, wherein the mapped sampling points are sampling points with unique corresponding characteristic points in the plurality of characteristic points, and the sampling points to be mapped are different from the mapped sampling points According to the distortion parameters and the two-dimensional coordinates of the sampling points to be mapped in the display image, calculating to obtain the corresponding two-dimensional coordinates of the sampling points to be mapped in the exit pupil image; Establishing a first distortion coordinate lookup table corresponding to the sampling point to be mapped according to the coordinates of the sampling point to be mapped in the display image and the two-dimensional coordinates corresponding to the sampling point to be mapped in the exit pupil image; Determining a second distortion coordinate lookup table corresponding to the mapped sampling points according to the first point-bit mapping relation; and integrating the first distortion coordinate lookup table and the second distortion coordinate lookup table to obtain a third distortion coordinate lookup table, and determining the third distortion coordinate lookup table as a target distortion model of the head display device.
9. A head-display device, characterized in that it is integrated with a target distortion model, which is created by the distortion measurement method according to any one of claims 1 to 8.
10. A computer-readable storage medium, on which a distortion measurement program of a head-mounted device is stored, which when executed by a processor, implements the steps of the distortion measurement method according to any one of claims 1 to 8.

Description

Distortion measuring method, head display device and computer readable storage medium Technical Field The present application relates to the field of head display devices, and in particular, to a distortion measurement method, a head display device, and a computer readable storage medium. Background The optical display quality of a head mounted display device (or simply, a head mounted device) directly affects the user's immersion and visual comfort, with optical distortion being one of the key factors affecting imaging accuracy. The excessive distortion can cause image distortion, space perception distortion and even cause uncomfortable symptoms such as dizziness, so that the actual optical distortion of the head display equipment is measured and modeled with high precision in the product development and mass production process, and the head display equipment is a precondition for realizing effective distortion correction and improving display performance. At present, in a common distortion measurement method, a calibration pattern displayed by camera shooting head display equipment is arranged at an exit pupil position, and a distortion model is fitted according to a corresponding relation between characteristic points in a shot image and original display coordinates. In actual operation, however, the display pattern tends to deform significantly due to the large distortion of the head-display optical system, especially in the edge region of the field of view, so that the characteristic points are difficult to locate, the corresponding relation is fuzzy and even wrong, and meanwhile, the image is also easily affected by factors such as lens blurring, uneven illumination or noise interference, so that the uncertainty of point matching is further aggravated, the accuracy of the finally constructed distortion model is limited, and the requirements of high-fidelity display and batch calibration are difficult to meet. Therefore, how to efficiently and reliably establish an accurate spatial correspondence between display content and an actual image under complex imaging conditions such as strong distortion, low signal to noise ratio and the like, so as to further realize high-precision and high-robustness distortion model construction, and become a technical problem to be solved in the current optical testing field of head display equipment. Disclosure of Invention The application mainly aims to provide a distortion measurement method, head display equipment and a computer readable storage medium, and aims to solve the technical problem of how to efficiently and reliably establish an accurate spatial correspondence between display content and a real shot image under complex imaging conditions of strong distortion, low signal to noise ratio and the like, thereby realizing high-precision and high-robustness distortion model construction. In order to achieve the above object, the present application proposes a distortion measuring method, the method comprising: Shooting a display image output by head display equipment through a camera preset at an exit pupil frame of the head display equipment to obtain an exit pupil image corresponding to the display image, wherein the display image comprises a plurality of sampling points, and the exit pupil image comprises a plurality of characteristic points; Obtaining distortion simulation data corresponding to a product parameter design value of the head display equipment, and determining a first point-bit mapping relation between a sampling point and a characteristic point in an auxiliary mode based on the distortion simulation data; And establishing a target distortion model of the head display equipment based on the first point mapping relation. In addition, in order to achieve the above object, the present application also proposes a head-display apparatus integrated with a target distortion model, which is established by the distortion measurement method as described above. Furthermore, to achieve the above object, the present application also proposes a computer-readable storage medium having stored thereon a computer program which, when executed by a processor, implements the steps of the distortion measurement method as described above. Furthermore, to achieve the above object, the present application also provides a computer program product comprising a computer program which, when executed by a processor, implements the steps of the distortion measurement method as described above. The embodiment of the application provides a distortion measurement method, head display equipment and a computer readable storage medium, and relates to the technical field of the head display equipment, wherein the distortion measurement method comprises the steps of shooting a display image output by the head display equipment through a camera preset at an exit pupil frame of the head display equipment to obtain an exit pupil image corresponding to the display image, wherein the displ