CN-121984474-A - Crystal oscillator, device and method for single particle test

CN121984474ACN 121984474 ACN121984474 ACN 121984474ACN-121984474-A

Abstract

The embodiment of the invention discloses a crystal oscillator, a crystal oscillator device and a crystal oscillator method for single particle test. In a specific embodiment, the crystal oscillator comprises a chip to be radiated, a differential chip, a quartz oscillator, a first base and a second base, wherein the chip to be radiated is adhered to the inside of a cavity of the first base through conductive adhesive, the first base exposes the chip to be radiated, the differential chip is electrically connected with ports in the cavity of the first base through gold wire bonding, the quartz oscillator is adhered to a wafer placing platform in the cavity of the first base through conductive adhesive and is electrically connected with the chip to be radiated to form an oscillation loop, orthographic projection of the quartz oscillator in the first base is not overlapped with orthographic projection of the chip to be radiated in the first base, and the first base is adhered to the second base through conductive adhesive.

Inventors

HUI JIANPING
ZHENG WENQIANG
DUAN YOUFENG
XIA QI
LIU XIAOGUANG
ZHANG JINQUAN
ZHANG PENG
YANG JING
WANG NA

Assignees

北京无线电计量测试研究所

Dates

Publication Date: 20260505
Application Date: 20251202

Claims (10)

1. The crystal oscillator for the single particle test is characterized by comprising a chip to be radiated, a differential chip, a quartz vibrator, a first base and a second base; The chip to be radiated is adhered to the inside of the cavity of the first base through conductive adhesive, and the first base exposes the chip to be radiated; the differential chip is electrically connected with each port in the cavity of the first base through gold wire bonding; The quartz vibrator is adhered to a wafer placing platform in the cavity of the first base through conductive adhesive and is electrically connected with the chip to be radiated to form an oscillation loop, and the orthographic projection of the quartz vibrator in the first base is not overlapped with the orthographic projection of the chip to be radiated in the first base; The first base is attached to the second base through conductive adhesive.
2. A crystal oscillator for single particle testing according to claim 1, The first base is a ceramic base.
3. A crystal oscillator for single particle testing according to claim 2, The quartz oscillator is made of a quartz wafer plated with an electrode.
4. A crystal oscillator for single particle testing according to claim 3, The length of the quartz wafer ranges from 1.9nm to 2.1nm; the width of the quartz wafer ranges from 1.2nm to 1.4nm.
5. The crystal oscillator for single particle testing according to claim 4, wherein, The electrode is a rectangular electrode; the length of the rectangular electrode ranges from 0.9nm to 1.1nm; the width of the rectangular electrode ranges from 0.7nm to 0.9nm.
6. A device for single particle testing is characterized by comprising the crystal oscillator, the oscilloscope, the counter, the test fixture, the ion accelerator and the processor according to any one of claims 1-5; the test fixture is used for inserting the crystal oscillator and applying working voltage to the crystal oscillator; The oscillograph and the counter are used for monitoring a first output signal and a first working current of the crystal oscillator before the crystal oscillator is irradiated by the single particle beam; The ion accelerator is used for outputting single-particle beam and irradiating the single-particle beam on the crystal oscillator; The oscilloscope and the counter are also used for monitoring a second output signal and a second working current of the crystal oscillator when the crystal oscillator is irradiated by the single particle beam; The ion accelerator is also used for stopping outputting the single particle beam; the oscilloscope and the counter are also used for monitoring a third output signal and a third working current of the crystal oscillator after being irradiated by the single particle beam; And the processor is used for judging a single event effect according to the third output signal and the third working current.
7. The apparatus for single particle testing according to claim 6, wherein, The processor is used for judging whether the third working current has abnormal current or not and judging the single event effect locking times and the locking occurrence time according to a judging result.
8. The apparatus for single particle testing according to claim 7, wherein, The processor is used for judging whether the third output signal has an abnormal signal or not and judging the single event effect turnover times and the turnover occurrence time according to a judgment result.
9. The apparatus for single particle testing according to claim 8, wherein, The device also comprises an irradiation target chamber, a sample rack and an adapter; The crystal oscillator is placed on the sample frame; the sample rack is arranged in the irradiation target chamber; the adapter is used for realizing the data interaction between the crystal oscillator inside the irradiation target chamber and the oscilloscope, the counter and the processor outside the irradiation target chamber.
10. A method of single particle testing using the device of any one of claims 6 to 9, comprising: inserting the crystal oscillator by using the test fixture and applying working voltage to the crystal oscillator; monitoring a first output signal and a first working current of the crystal oscillator before being irradiated by the single particle beam by using the oscilloscope and the counter; Outputting a single particle beam by using the ion accelerator and irradiating the single particle beam on the crystal oscillator; Monitoring a second output signal and a second working current of the crystal oscillator when the crystal oscillator is irradiated by the single particle beam by using the oscilloscope and the counter; stopping outputting the single particle beam by using the ion accelerator; Monitoring a third output signal and a third working current of the crystal oscillator after being irradiated by the single particle beam by using the oscilloscope and the counter; And judging a single event effect by the processor according to the third output signal and the third working current.

Description

Crystal oscillator, device and method for single particle test Technical Field The invention relates to the field of crystal oscillator design and test. And more particularly to a crystal oscillator, apparatus and method for single particle testing. Background At present, the anti-single particle index is an important index for checking space devices, and is a necessary requirement for the devices working in space. The single particle resistance index of the crystal oscillator needs to be evaluated through a single particle test. The crystal vibration is used as a special device with a mixed integrated structure, and the structure is complex, so that the radiation-resistant verification is more complex than that of a common chip, and particularly, the single event effect test is more expensive and complex. The traditional crystal oscillator integrated circuit chip is integrated into the crystal oscillator, and a quartz wafer is covered on the traditional crystal oscillator integrated circuit chip, and high-energy charged particles cannot directly enter the chip when a single event effect test is carried out, so that the single event effect index of the crystal oscillator cannot be checked. The traditional crystal oscillator single particle test cannot carry out a real-time on-line monitoring system, the performance index of the crystal oscillator can be tested only after the test starts and ends, the corresponding real-time on-line monitoring system and test equipment for the crystal oscillator single particle test are not available, and real-time on-line monitoring cannot be carried out. Meanwhile, as the single particle source is usually placed in the single particle source equipment, the single particle source is far away from the outside, and the specificity of the real-time online monitoring system construction of the single particle test of the crystal oscillator is also caused. Disclosure of Invention The invention aims to provide a crystal oscillator, a crystal oscillator device and a crystal oscillator method for single particle test, which are used for solving at least one of the problems in the prior art. In order to achieve the above purpose, the invention adopts the following technical scheme: The first aspect of the invention provides a crystal oscillator for a single particle test, which comprises a chip to be radiated, a differential chip, a quartz vibrator, a first base and a second base; The chip to be radiated is adhered to the inside of the cavity of the first base through conductive adhesive, and the first base exposes the chip to be radiated; the differential chip is electrically connected with each port in the cavity of the first base through gold wire bonding; The quartz vibrator is adhered to a wafer placing platform in the cavity of the first base through conductive adhesive and is electrically connected with the chip to be radiated to form an oscillation loop, and the orthographic projection of the quartz vibrator in the first base is not overlapped with the orthographic projection of the chip to be radiated in the first base; The first base is attached to the second base through conductive adhesive. Optionally, the first base is a ceramic base. Optionally, the quartz oscillator is a quartz oscillator made of a quartz wafer plated with an electrode. Optionally, the length of the quartz wafer ranges from 1.9nm to 2.1nm; the width of the quartz wafer ranges from 1.2nm to 1.4nm. Optionally, the electrode is a rectangular electrode; the length of the rectangular electrode ranges from 0.9nm to 1.1nm; the width of the rectangular electrode ranges from 0.7nm to 0.9nm. The second aspect of the invention provides a device for single particle test, which comprises a crystal oscillator, an oscilloscope, a counter, a test fixture, an ion accelerator and a processor; the test fixture is used for inserting the crystal oscillator and applying working voltage to the crystal oscillator; The oscillograph and the counter are used for monitoring a first output signal and a first working current of the crystal oscillator before the crystal oscillator is irradiated by the single particle beam; The ion accelerator is used for outputting single-particle beam and irradiating the single-particle beam on the crystal oscillator; The oscilloscope and the counter are also used for monitoring a second output signal and a second working current of the crystal oscillator when the crystal oscillator is irradiated by the single particle beam; The ion accelerator is also used for stopping outputting the single particle beam; the oscilloscope and the counter are also used for monitoring a third output signal and a third working current of the crystal oscillator after being irradiated by the single particle beam; And the processor is used for judging a single event effect according to the third output signal and the third working current. Optionally, the processor is configured to determine whether the third working c