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CN-121984860-A - Test scheme optimization method and system suitable for SerDes receiving end

CN121984860ACN 121984860 ACN121984860 ACN 121984860ACN-121984860-A

Abstract

The invention discloses a test scheme optimization method and a test scheme optimization system suitable for a SerDes receiving end, which relate to the field of receiving end test scheme optimization, wherein the method comprises the steps of acquiring a plurality of groups of initial RX parameter configurations based on a simulation circuit; the method comprises the steps of carrying out error rate boundary scanning on each group of initial RX parameter configurations through a Eyescan circuit built in a SerDes to obtain corresponding eye diagram quality indexes, selecting optimal configurations from a plurality of groups of initial RX parameter configurations based on the eye diagram quality indexes to serve as coarse adjustment results, carrying out fine adjustment on a plurality of RX parameters based on the coarse adjustment results, searching the neighborhood of each parameter through independent traversal to determine fine adjustment optimal values, generating final RX parameter configurations according to the fine adjustment optimal values, and writing the final RX parameter configurations into a SerDes register. The method solves the problems that the receiving end cannot accurately compensate signals in real time, so that the cost is high and the RX parameter test efficiency is low.

Inventors

  • DING JIANSONG
  • Du Yaxiong
  • WANG HONGPENG

Assignees

  • 上海博茵微电子有限公司

Dates

Publication Date
20260505
Application Date
20260123

Claims (9)

  1. 1. The method for optimizing the test scheme suitable for the SerDes receiving end is characterized by comprising the following steps of: acquiring a plurality of groups of initial RX parameter configurations based on a simulation circuit; performing error rate boundary scanning on each group of initial RX parameter configuration through Eyescan circuits built in SerDes to obtain corresponding eye diagram quality indexes, wherein the eye diagram quality indexes are eye diagram boundary areas under specific error rates; based on the eye pattern quality index, selecting an optimal configuration from the multiple groups of initial RX parameter configurations as a rough adjustment result; Taking the rough adjustment result as a reference, carrying out fine adjustment on a plurality of RX parameters, and determining a fine adjustment optimal value by independently traversing and searching the neighborhood of each parameter; and generating a final RX parameter configuration according to the fine-tuning optimal value, and writing the final RX parameter configuration into a SerDes register.
  2. 2. The method of claim 1, wherein said performing, by a Eyescan circuit built in SerDes, bit error rate measurements on each set of initial RX parameter configurations to obtain a corresponding eye quality indicator comprises: setting an upper limit of the sampling number and an upper limit of the error number in the SerDes as bit error rate measurement thresholds; The control Eyescan circuit adjusts sampling phase and voltage offset in a stepping manner in the X-axis and Y-axis directions, and traverses and locates four boundary points of a signal eye diagram; and calculating a quality index representing the size of the eye pattern based on the offset values of the four traversed boundary points.
  3. 3. The method of claim 2, wherein the controlling Eyescan circuit adjusts the sampling phase and voltage offset in a stepwise manner in the X-axis and Y-axis directions, traversing and locating four boundary points of the signal eye, comprising: initializing voltage and clock offset values corresponding to the left, right, upper and lower directions of an eye diagram; Sequentially selecting one direction, and adjusting the offset of the direction by a fixed step length from zero; And detecting the error rate of the offset point after each step of adjustment, and recording the current offset value as a boundary point of the direction when the accumulated error number reaches the upper limit of the error number.
  4. 4. The method of claim 1, wherein selecting an optimal configuration from the plurality of sets of initial RX parameter configurations as a coarse tuning result based on the eye quality indicator comprises: Sequentially writing each set of initial RX parameter configuration into a SerDes register; Measuring and calculating, for each set of configurations, an eye diagram size thereof by the Eyescan circuit; comparing all the eye sizes, and taking the configuration with the largest eye size as a rough adjustment result.
  5. 5. The method of claim 1, wherein fine-tuning the plurality of RX parameters based on the coarse tuning result, and determining the fine-tuning optimum value by searching the neighborhood of each parameter by independent traversal, comprises: reading each parameter value in the coarse adjustment result as a fine adjustment initial value; traversing a range of values near the initial value for a parameter to be fine-tuned; During the traversal, after changing the parameter value each time, measuring the current eye diagram size through the Eyescan circuit; The parameter value to be fine-tuned is adjusted back to the initial value, and the traversal process is repeated for the next parameter until fine tuning of all selected parameters is completed; The parameter value that maximizes the eye size globally throughout the fine tuning process is retained as the fine tuning optimum value.
  6. 6. The method according to claim 1, wherein the method further comprises: Recording the RX parameter configuration and the corresponding eye pattern quality index in the coarse adjustment and fine adjustment processes; Based on the recorded data, correlation and trend of variation between RX parameters are analyzed for performance analysis or model calibration of SerDes receiver circuit.
  7. 7. The method of claim 6, wherein said analyzing correlations and trends between RX parameters based on the recorded data comprises: preprocessing the recorded RX parameter configuration and the corresponding eye pattern quality index data, and removing abnormal data points; Calculating correlation coefficients between each RX parameter and the eye pattern quality index, and determining the correlation strength between the parameters; Modeling the parameter variation trend based on a neural network, and predicting the adjustment direction of output parameters under different working conditions; and establishing a parameter relevance model, and quantifying the interaction influence degree among the parameters.
  8. 8. The method of claim 1, wherein the method enables coarse and fine control by external software that interacts with the SerDes hardware through a register interface.
  9. 9. A test plan optimization system adapted for use in a SerDes receiver for performing the method of any of claims 1-8, the system comprising: the parameter configuration acquisition module is used for acquiring a plurality of groups of initial RX parameter configurations based on the simulation analog circuit; The error rate boundary scanning module is used for carrying out error rate boundary scanning on each group of initial RX parameter configuration through a Eyescan circuit built in the SerDes to obtain a corresponding eye diagram quality index, wherein the eye diagram quality index is the eye diagram boundary area under a specific error rate; The optimal configuration selection module is used for selecting optimal configuration from the multiple groups of initial RX parameter configurations based on the eye pattern quality index to serve as a rough adjustment result; the optimal value parameter fine adjustment module is used for carrying out fine adjustment on a plurality of RX parameters by taking the coarse adjustment result as a reference, and determining a fine adjustment optimal value by independently traversing and searching the neighborhood of each parameter; And the parameter configuration storage module is used for generating final RX parameter configuration according to the fine-tuning optimal value and writing the final RX parameter configuration into a SerDes register.

Description

Test scheme optimization method and system suitable for SerDes receiving end Technical Field The invention relates to the field of optimization of a receiving end test scheme, in particular to a test scheme optimization method and a test scheme optimization system suitable for a SerDes receiving end. Background SerDes is a mainstream time division multiplexing, point-to-point serial communication technology, and uses the channel capacity of the transmission medium to increase the transmission speed of signals, thereby reducing the communication cost. The parameter adjustment of the existing SerDes receiving end has larger deviation from the actual silicon behavior, and the receiving end cannot accurately compensate signals in real time after the signals pass through a complex channel environment, so that the extremely low error rate of a protocol cannot be guaranteed, the cost is higher, and the RX parameter testing efficiency is lower. In view of the foregoing, a method for improving the receiving end compensation signal, satisfying the protocol error rate, and improving the RX parameter testing efficiency is needed. Disclosure of Invention The application provides a test scheme optimization method and a test scheme optimization system suitable for a SerDes receiving end, and aims to solve the problems that in the prior art, the receiving end cannot accurately compensate signals in real time, the extremely low error rate of a protocol cannot be guaranteed, the cost is high, and RX parameter test efficiency is low. In view of the above problems, the present application provides a test solution optimizing method and system suitable for a SerDes receiving terminal. In a first aspect, the present application provides a method for optimizing a test solution applicable to a SerDes receiving end, including: acquiring a plurality of groups of initial RX parameter configurations based on a simulation circuit; performing error rate boundary scanning on each group of initial RX parameter configuration through Eyescan circuits built in SerDes to obtain corresponding eye diagram quality indexes, wherein the eye diagram quality indexes are eye diagram boundary areas under specific error rates; based on the eye pattern quality index, selecting an optimal configuration from the multiple groups of initial RX parameter configurations as a rough adjustment result; Taking the rough adjustment result as a reference, carrying out fine adjustment on a plurality of RX parameters, and determining a fine adjustment optimal value by independently traversing and searching the neighborhood of each parameter; and generating a final RX parameter configuration according to the fine-tuning optimal value, and writing the final RX parameter configuration into a SerDes register. In a second aspect, the present application provides a test solution optimizing system suitable for a SerDes receiving end, including: the parameter configuration acquisition module is used for acquiring a plurality of groups of initial RX parameter configurations based on the simulation analog circuit; The error rate boundary scanning module is used for carrying out error rate boundary scanning on each group of initial RX parameter configuration through a Eyescan circuit built in the SerDes to obtain a corresponding eye diagram quality index, wherein the eye diagram quality index is the eye diagram boundary area under a specific error rate; The optimal configuration selection module is used for selecting optimal configuration from the multiple groups of initial RX parameter configurations based on the eye pattern quality index to serve as a rough adjustment result; the optimal value parameter fine adjustment module is used for carrying out fine adjustment on a plurality of RX parameters by taking the coarse adjustment result as a reference, and determining a fine adjustment optimal value by independently traversing and searching the neighborhood of each parameter; And the parameter configuration storage module is used for generating final RX parameter configuration according to the fine-tuning optimal value and writing the final RX parameter configuration into a SerDes register. One or more technical schemes provided by the application have at least the following technical effects or advantages: The application firstly collects a plurality of groups of initial RX parameter configurations based on the simulation circuit, provides multiple data supports for subsequent hardware tests, and avoids relying on single configuration. And carrying out error rate boundary scanning on each group of initial RX parameter configuration through Eyescan circuits built in SerDes to obtain corresponding eye pattern quality indexes. And the configuration performance is quantified through the eye pattern quality index, so that data support is provided for subsequent optimization, and the dependence of external test equipment is avoided. Then, based on the eye pattern quality index, sele