CN-121986473-A - Supplemental flat field correction determination for infrared imaging systems and methods

Abstract

Techniques are provided for facilitating auxiliary flat field correction (SFFC) determination for infrared imaging systems and methods. In one example, a method includes capturing, by a Focal Plane Array (FPA) of an imaging system, a first set of images of a first reference object in a scene while the first reference object is at a temperature associated with a second reference object while the first set of images is captured. The method further includes capturing, by the FPA, a second set of images of a second reference object. The method further includes determining SFFC a value based on the first set of images and the second set of images. Related devices and systems are also provided.

Inventors

• J KOSTRZEWA

Assignees

• 泰立戴恩菲力尔商业系统公司

Dates

Publication Date

20260505

Application Date

20240819

Priority Date

20230824

Claims (20)

1. 1. A method, comprising: capturing a first set of images of a first reference object in a scene by a Focal Plane Array (FPA) of an imaging system while the first reference object is at a temperature associated with a second reference object while the first set of images is captured; capturing a second set of images of the second reference object through the FPA, and A Supplemental Flat Field Correction (SFFC) value is determined based on the first set of images and the second set of images.
2. 2. The method of claim 1, further comprising: Determining a first average image based on the first set of images; determining a second average image based on the second set of images, and A difference is determined based on the first average image and the second average image, wherein the SFFC values are based on the difference.
3. 3. The method of claim 1, further comprising: Capturing an image through the FPA, and A corrected image is generated based on the SFFC values and the image.
4. 4. A method according to claim 3, further comprising: determining a scaling factor associated with the image, and A scaled SFFC map is generated by applying the scaling factor to the SFFC values, wherein the corrected image is based on the scaled SFFC map and the image.
5. 5. The method of claim 1, further comprising: Monitoring one or more temperature characteristics associated with a component of the imaging system after at least a portion of the imaging system is energized, and Based at least on the one or more temperature characteristics, determining whether the portion of the imaging system has reached a steady state, Wherein capturing the first set of images and capturing the second set of images are performed after the portion of the imaging system is determined to have reached a steady state.
6. 6. The method of claim 5, wherein the component comprises the FPA, wherein the one or more temperature characteristics comprise a temperature of the FPA and/or a rate of change of temperature of the FPA, and wherein capturing the second set of images comprises capturing the second set of images while the first reference object is at a temperature associated with the second reference object at the time the second set of images was captured.
7. 7. The method of claim 1, further comprising storing the SFFC values in a memory device of the imaging system, wherein the first set of images is associated with FFC values associated with an optical path from the scene to the FPA, wherein the second set of images is associated with FFC values associated with an optical path from the second reference object to the FPA, and wherein the SFFC values are associated with reduced radiometric errors relative to SFFC values determined if the first set of images and/or the second set of images were captured while the first reference object was at room temperature ambient temperature.
8. 8. The method of claim 1, wherein the second reference object comprises an internal structure of the imaging system, and wherein the internal structure is selectively located between the FPA and the scene.
9. 9. The method of claim 8, wherein the internal structure comprises a shutter of the imaging system.
10. 10. An imaging system, comprising: A Focal Plane Array (FPA) configured to: Capturing a first set of images of a first reference object in a scene while the first reference object is at a temperature associated with a second reference object when the first set of images is captured, and Capturing a second set of images of the second reference object, and Logic configured to determine a Supplemental Flat Field Correction (SFFC) value based on the first set of images and the second set of images.
11. 11. The imaging system of claim 10, wherein the logic device is configured to determine a difference based on the first set of images and the second set of images, wherein the SFFC value is based on the difference, wherein the second reference object is a shutter, and wherein the imaging system further comprises the shutter.
12. 12. The imaging system of claim 10, wherein: The FPA is further configured to capture an image; the FPA includes a plurality of microbolometers, and The logic device is further configured to generate a corrected image based on the SFFC values and the image.
13. 13. The imaging system of claim 10, wherein the logic device is further configured to: Receiving one or more temperature characteristics associated with a component of the imaging system after at least a portion of the imaging system is powered on, and Based at least on the one or more temperature characteristics, determining whether the portion of the imaging system has reached a steady state, Wherein the logic device is configured to capture the first set of images and the second set of images after the portion of the imaging system is determined to have reached a steady state.
14. 14. The imaging system of claim 13, further comprising: a memory device configured to store SFFC values, and A temperature sensor configured to determine the one or more temperature characteristics and transmit the one or more temperature characteristics to the logic device, wherein the SFFC values are associated with reduced radiometric errors relative to SFFC values determined if the first set of images and/or the second set of images were captured by the FPA while the first reference object was at room temperature ambient temperature.
15. 15. A method, comprising: Capturing, by a Focal Plane Array (FPA) of an imaging system, a first set of images of a first reference object in a scene; Capturing a second set of images of a second reference object through the FPA while the second reference object is at a temperature associated with the FPA while the second set of images is being captured, and A Supplemental Flat Field Correction (SFFC) value is determined based on the first set of images and the second set of images.
16. 16. The method of claim 15, further comprising: Determining a first average image based on the first set of images; determining a second average image based on the second set of images, and A difference is determined based on the first average image and the second average image, wherein the SFFC values are based on the difference, and wherein capturing the first set of images is performed immediately after the imaging system is powered on.
17. 17. The method of claim 15, further comprising: Capturing an image through the FPA; determining a scaling factor associated with the image; generating a scaled SFFC map by applying the scaling factor to the SFFC values, and A corrected image is generated based on the scaled SFFC map and the image, wherein the SFFC value is associated with a reduced radiometric error relative to SFFC values determined if the second set of images were captured by the FPA while the first reference object was at room temperature ambient temperature.
18. 18. The method of claim 15, wherein capturing the first set of images is performed while the first reference object is at room temperature ambient temperature.
19. 19. The method of claim 15, further comprising: Monitoring one or more temperature characteristics associated with a component of the imaging system after at least a portion of the imaging system is energized, and Based at least on the one or more temperature characteristics, determining whether the portion of the imaging system has reached a steady state, Wherein capturing the first set of images is performed before the portion of the imaging system is determined to have reached steady state and capturing the second set of images is performed after the portion of the imaging system is determined to have reached steady state.
20. 20. The method of claim 19, wherein the first reference object is the second reference object, wherein the component comprises the FPA, and wherein the one or more temperature characteristics comprise a temperature of the FPA and/or a rate of change of temperature of the FPA.

Description

Supplemental flat field correction determination for infrared imaging systems and methods Cross Reference to Related Applications The present application claims priority and interest from U.S. provisional patent application No. 63/578,560, filed on month 8 of 2023, entitled "supplemental flat field correction determination (SUPPLEMENTAL FLAT FIELD CORRECTION DETERMINATION FOR INFRARED IMAGING SYSTEMS AND METHODS) for infrared imaging systems and METHODS," which is incorporated herein by reference in its entirety. Technical Field One or more embodiments relate generally to imaging, and more particularly, for example, to Supplemental Flat Field Correction (SFFC) determination for infrared imaging systems and methods. Background The imaging system may include an array of detectors arranged in rows and columns, each detector as a pixel to generate a portion of a two-dimensional image. For example, individual detectors in the detector array capture correlated pixel values. Image detectors are of a wide variety, such as visible light image detectors, infrared image detectors, or other types of image detectors, which may be arranged in an image detector array to capture images. As an example, a plurality of sensors may be disposed in an image detector array to detect Electromagnetic (EM) radiation of a desired wavelength. In some cases, for example for infrared imaging, readout of image data captured by a detector may be performed by a readout integrated circuit (ROIC) in a time division multiplexed manner. The read-out image data may be transferred to other circuitry, for example for processing, storage and/or display. In some cases, the combination of the detector array and the ROIC may be referred to as a Focal Plane Array (FPA). Advances in process technology for FPA and image processing have resulted in increased capabilities and complexity of the resulting imaging systems. Disclosure of Invention In one or more embodiments, a method includes capturing, by an FPA of an imaging system, a first set of images of a first reference object in a scene while the first reference object is at a temperature associated with a second reference object while the first set of images is captured. The method further includes capturing, by the FPA, a second set of images of a second reference object. The method further includes determining SFFC a value based on the first set of images and the second set of images. In one or more embodiments, an imaging system includes an FPA configured to capture a first set of images of a first reference object in a scene while the first reference object is at a temperature associated with a second reference object while the first set of images is captured. The FPA is further configured to capture a second set of images of a second reference object. The imaging system also includes logic configured to determine SFFC a value based on the first set of images and the second set of images. In one or more embodiments, a method includes capturing, by an FPA of an imaging system, a first set of images of a first reference object in a scene. The method also includes capturing, by the FPA, a second set of images of a second reference object while the second reference object is at a temperature associated with the FPA when the second set of images is captured. The method further includes determining SFFC a value based on the first set of images and the second set of images. The scope of the disclosure is defined by the claims, which are incorporated into this section by reference. A more complete understanding of embodiments of the present disclosure will be afforded to those skilled in the art, as well as a realization of additional advantages thereof, by a consideration of the following detailed description of one or more embodiments. Reference will be made to the accompanying drawings, which will first be briefly described. Drawings FIG. 1 illustrates an infrared camera in accordance with one or more embodiments of the present disclosure; FIGS. 2 and 3 illustrate a flowchart of an example process for determining SFFC values in accordance with one or more embodiments of the present disclosure; FIG. 4 illustrates a flowchart of an example process for applying SFFC values to captured image data, in accordance with one or more embodiments of the present disclosure; FIGS. 5 and 6 illustrate example display screens with dialog boxes displayed thereon for facilitating calibration of an infrared camera in accordance with one or more embodiments of the present disclosure; FIG. 7 illustrates a block diagram of an example imaging system in accordance with one or more embodiments of the present disclosure; FIG. 8 illustrates a block diagram of an example image sensor assembly, in accordance with one or more embodiments of the present disclosure. The embodiments of the present disclosure and the advantages thereof are best understood by referring to the following detailed description. It should be noted that the