CN-121989315-A - Class cutting method, electronic equipment and class cutting system

CN121989315ACN 121989315 ACN121989315 ACN 121989315ACN-121989315-A

Abstract

The invention relates to a class cutting method, electronic equipment and a class cutting system. The method comprises the steps of obtaining first defect information of an original wide film, wherein the first defect information is used for indicating the position of each defect in the original wide film, spraying a corresponding seal type on each defect position of the original wide film according to the first defect information, cutting the original wide film into a plurality of narrow film materials with preset widths through a cutting knife, judging whether the defect number of the defect of each narrow film material is smaller than a preset defect number threshold value according to the first defect information, taking the corresponding narrow film material as an abnormal roll when the defect number is smaller than the preset defect number threshold value, and taking the corresponding narrow film material as a normal roll when the defect number is not smaller than the abnormal roll, wherein the normal roll is used for producing a coil. By means of defect detection and classification before manual inspection, invalid skip cutting of defective film materials is avoided, inspection efficiency is improved, and possibility of human errors is reduced.

Inventors

LI JIE
XIE JIA
ZHAI PANPAN
YAN BINGHUA
SHI MINGZHI
GUO YUCHENG
ZHANG JUNMING

Assignees

恒美光电股份有限公司

Dates

Publication Date: 20260508
Application Date: 20241104

Claims (10)

1. A method of cutting a class, the method comprising: Acquiring first defect information of an original wide film material, wherein the first defect information is used for indicating the position of each defect in the original wide film material; According to the first defect information, spraying and printing a corresponding chapter type at each defect position of the original wide film material; Cutting the original wide film material into a plurality of narrow film materials with preset widths through a cutter, and judging whether the defect number of defects of each narrow film material is smaller than a preset defect number threshold value according to the first defect information; When the defect number is not smaller than the preset defect number threshold value, the corresponding narrow film material is used as an abnormal roll which is used for cutting into sheets and performing manual inspection, and when the defect number is smaller than the preset defect number threshold value, the corresponding narrow film material is used as a normal roll which is used for producing coiled materials.
2. The method of claim 1, wherein the first defect information is further used to indicate a defect type and grade of each defect in the original wide web, and wherein when the number of defects is less than a predetermined defect count threshold, the method further comprises: Performing chapter jump cutting on the normal roll according to a preset jump cutting rule according to the defect grade and the position of each defect in the normal roll to obtain a target sheet and a defect sheet; When the defect number is not smaller than the preset defect number threshold value, the method further comprises cutting the abnormal roll into sheets, and using the sheets after the cutting into sheets for manual inspection.
3. The method according to claim 2, wherein the original wide film material includes a protective film, a TAC film, a polarizing film and a release film laminated and laminated in this order, the protective film, the TAC film and the polarizing film being used as original reverse film materials, and the method further includes: Tearing and separating the release film from the original reverse film material aiming at a target sheet, and winding the separated release film by using a winding device; attaching the separated original reflecting film material to glass, and taking the glass attached with the original reflecting film material as target glass; Acquiring second defect information of the target glass, and judging the defect condition of the target glass according to the second defect information; And when the second defect information indicates that the target glass is abnormal glass, performing material separation and downflow on the target glass.
4. A method of cutting out classes according to claim 3, wherein the preset skip-cut rule comprises: Aiming at the defects of each narrow film material meeting the preset defect grade requirement, determining a jump-cut distance according to the position relation between the chapter type corresponding to the defects and the tail end of the previous sheet, wherein the jump-cut distance is used for indicating the position of chapter type jump-cut on the narrow film material.
5. The method of classifying as set forth in claim 4, wherein when the second defect information indicates that the target glass is an abnormal glass, the method further includes: judging whether the duty ratio of the abnormal glass in the target glass is smaller than a preset duty ratio or not; and when the preset defect level requirement is not smaller than the preset duty ratio, updating the preset defect level requirement, wherein the updated preset defect level requirement is lower than the preset defect level requirement before updating.
6. An electronic device comprising a memory storing a computer program and at least one processor configured to implement the method of any one of claims 1 to 5 when the computer program is executed.
7. The cutting and classifying system is characterized by comprising the electronic equipment as claimed in claim 6, and further comprising an optical inspection jet printing device, a slitting device, a chapter type recognition device and a polarized film skip cutting control device which are sequentially arranged according to stations; the optical inspection jet printing device is used for detecting the position of each defect of the original wide film material and taking the position as first defect information, and performing seal type jet printing on the position of each defect according to the first defect information; The slitting device is used for converting the original wide film material into a plurality of narrow film materials with preset widths through a cutter; The seal type recognition device is used for recognizing the seal type of each defect on each narrow film material; The polarizing film skip-cutting control device is used for skip-cutting the narrow film material serving as a normal roll according to the first defect information.
8. The system according to claim 7, wherein the optical inspection jet printing apparatus includes an original film optical inspection machine for detecting a position of each defect of the original wide film material and for performing, as the first defect information, seal-type jet printing at the position of each defect based on the first defect information, and a jet printing unit.
9. The slit type system of claim 8, wherein the original film optical inspection machine comprises a pass-through optical system, an orthogonal optical system, and a reflective optical system, each for detecting a different type of defect in the original wide web.
10. The cutoff classification system in accordance with claim 7 further comprising a glass optical inspection machine for acquiring second defect information of the target glass.

Description

Class cutting method, electronic equipment and class cutting system Technical Field The invention relates to the technical field of optical film detection and classification, in particular to a classification cutting method, electronic equipment and a classification cutting system. Background The polarizing film is formed by laminating a PVA film with a TAC film after washing, dyeing and extending, coating and laminating a release film through a coating station, and finally laminating a protective film. Polarizing films are now widely used in various types of optical display instruments and 3C products. In the production process of the polarizing film, the film needs to be attached for many times, the bubble defects are easy to form, and the environment and the foreign matter defects existing in the film can seriously affect the imaging quality of the polarizer. In the related art, the defects can be detected by adopting an optical inspection machine, and the defects are marked by adopting a jet printing device, so that the defects can be detected by personnel or detected by a chapter type identification device. That is, the polarizing film industry at present mainly adopts a method that after the film material with the mark is divided into sheets, the sheets with the seal type are manually detected and sorted out, and defective products are detected according to specifications, so that the problem of low detection efficiency exists. In view of the foregoing, aiming at the efficiency problem of optical film detection, there is an urgent need for a high-efficiency dicing method, electronic device and dicing system. Disclosure of Invention The application provides a method for cutting and classifying, electronic equipment and a system for cutting and classifying, which are used for solving the technical problem of low efficiency of film detection, The application provides a class cutting method, which comprises the following steps: Acquiring first defect information of an original wide film material, wherein the first defect information is used for indicating the position of each defect in the original wide film material; According to the first defect information, spraying and printing a corresponding chapter type at each defect position of the original wide film material; Cutting the original wide film material into a plurality of narrow film materials with preset widths through a cutter, and judging whether the defect number of defects of each narrow film material is smaller than a preset defect number threshold value according to the first defect information; When the defect number is not smaller than the preset defect number threshold value, the corresponding narrow film material is used as an abnormal roll which is used for cutting into sheets and performing manual inspection, and when the defect number is smaller than the preset defect number threshold value, the corresponding narrow film material is used as a normal roll which is used for producing coiled materials. As a further improvement of the present application, the first defect information is further used for indicating a defect type and grade of each defect in the original wide film, and when the defect number is smaller than a preset defect number threshold, the method further comprises: Performing chapter jump cutting on the normal roll according to a preset jump cutting rule according to the defect grade and the position of each defect in the normal roll to obtain a target sheet and a defect sheet; When the defect number is not smaller than the preset defect number threshold value, the method further comprises cutting the abnormal roll into sheets, and using the sheets after the cutting into sheets for manual inspection. As a further improvement of the application, the original wide film material comprises a protective film, a TAC film, a polaroid film and a release film which are laminated and laminated in sequence, wherein the protective film, the TAC film and the polaroid film are used as original reverse film materials, and the method further comprises the following steps: Tearing and separating the release film from the original reverse film material aiming at a target sheet, and winding the separated release film by using a winding device; attaching the separated original reflective film material to glass, and taking the glass attached with the reflective film material as target glass; Acquiring second defect information of the target glass, and judging the defect condition of the target glass according to the second defect information; And when the second defect information indicates that the target glass is abnormal glass, performing material separation and downflow on the target glass. As a further improvement of the present application, the preset skip rule includes: Aiming at the defects of each narrow film material meeting the preset defect grade requirement, determining a jump-cut distance according to the position relation betw