CN-121989490-A - In-line terahertz measurement device and method for manufacturing dry electrode film

Abstract

Embodiments of the present disclosure relate to an in-line terahertz measurement device for dry electrode film fabrication and a method thereof. A system and method for processing a dry electrode film includes a roller system, a terahertz measurement device, and a dry electrode powder mixture dispenser. The measurement device may include a terahertz source and a terahertz sensor. This terahertz source may be emitted toward the upper and lower surfaces of the dry electrode film and reflected back toward the terahertz sensor to measure the physical properties of the dry electrode film.

Inventors

• A. Zandia Tashbar
• B. Eggleston
• WANG KAIPING
• C. Elburn
• JIN SHIKAI
• K. TANAKA
• M.Pan

Assignees

• 特斯拉公司

Dates

Publication Date

20260508

Application Date

20251031

Priority Date

20241105

Claims (20)

1. 1. A system for processing a dry electrode film, comprising: A roll system comprising calender rolls; A measurement device positioned above the calender roll and including a terahertz source and a terahertz sensor, wherein the terahertz source is configured to emit terahertz radiation pulses and the terahertz sensor is configured to detect terahertz reflections of the terahertz radiation pulses, and A dry electrode powder mixture dispenser, wherein the dry electrode powder mixture dispenser is configured to dispense dry electrode material onto the calendaring roll, wherein the terahertz source is in-line with the terahertz sensor.
2. 2. The system of claim 1, further comprising an additional calender roll and an additional measurement device, wherein the additional measurement device is positioned above the additional calender roll.
3. 3. The system of claim 1 or 2, wherein the terahertz radiation pulses comprise spot size, peak width, frequency, or any combination thereof.
4. 4. The system of claim 3, wherein the spot size comprises a diameter of about 0.05-0.5 mm.
5. 5. The system of claim 3, wherein the frequency is about 0.05-5.0 THz.
6. 6. The system of claim 3, wherein the peak width is about 1-5 ps.
7. 7. The system of claim 1 or 2, wherein the terahertz sensor is configured to measure a physical property selected from the group consisting of mass density, load, uniformity, thickness, basis weight, and combinations thereof.
8. 8. The system of claim 1 or 2, wherein the terahertz sensor is configured to measure a time of flight of the terahertz radiation pulse, an intensity of the terahertz reflection, or any combination thereof.
9. 9. The system of claim 1 or 2, wherein the terahertz sensor is configured to measure an intensity of the terahertz reflection.
10. 10. The system of claim 1 or 2, further comprising a current collector distributor.
11. 11. A method of calibrating the system of claim 1 or 2, comprising: placing a dry electrode film over the calender roll, wherein the dry electrode film comprises indicia and a film region downstream of the indicia, and wherein the film region comprises a first major surface and a second major surface opposite the first major surface; emitting a marker terahertz radiation pulse from a terahertz source to the marker to form a marker reflection; detecting the marker reflection using the terahertz sensor; Transmitting the terahertz radiation pulses from the terahertz source to the film region at a first point in time to form a first terahertz reflection from the first major surface and a second terahertz reflection from the second major surface; Detecting the first terahertz reflection at a second point in time using the terahertz sensor and the second terahertz reflection at a third point in time using the terahertz sensor, and The membrane region is sampled.
12. 12. A method of treating a dry electrode film, comprising: Placing a dry electrode film over a calender roll, wherein the dry electrode film includes a first major surface and a second major surface opposite the first major surface; Rotating the calender roll to form a moving dry electrode film; Transmitting a terahertz radiation pulse to the moving dry electrode film at a first point in time to form a first terahertz reflection from the first major surface and a second terahertz reflection from the second major surface, and The first terahertz reflection is detected by a terahertz sensor at a second point in time and the second terahertz reflection is detected by a terahertz sensor at a third point in time.
13. 13. The method of claim 12, further comprising quantifying a difference between the first point in time and the second point in time to determine a first major surface time of flight, and quantifying a difference between the first point in time and the third point in time to determine a second major surface time of flight.
14. 14. The method of claim 12 or 13, further comprising determining an intensity of the terahertz radiation pulse at the first point in time, determining an intensity of the first terahertz reflection at the second point in time, and determining an intensity of the second terahertz reflection at the third point in time.
15. 15. The method of claim 12 or 13, wherein emitting the terahertz radiation pulse comprises projecting a spot size, a peak width, a frequency, or any combination thereof.
16. 16. The method of claim 15, wherein the spot size comprises a diameter of about 0.05-0.5 mm.
17. 17. The method of claim 16, wherein the frequency is at least 0.05 terahertz to no more than 5.0 terahertz.
18. 18. The method of claim 16, wherein the peak width is at least 1.0 picoseconds to no more than 5 picoseconds.
19. 19. The method of claim 12 or 13, wherein detecting comprises determining a physical property selected from the group consisting of mass density, loading, uniformity, thickness, basis weight, and combinations thereof.
20. 20. The method of claim 12 or 13, further comprising placing a current collector over the dry electrode film.

Description

In-line terahertz measurement device and method for manufacturing dry electrode film Incorporation by reference of any priority application The present application claims priority from U.S. patent application Ser. No.18/937,956, filed on 5/11/2024, entitled "INLINE TERAHERTZ MEASUREMENT DEVICE FOR DRY ELECTRODE FILM MANUFACTURING, AND METHODS THEREOF (in-line terahertz measurement apparatus for dry electrode film manufacture and method THEREOF), the entire contents of which are incorporated herein by reference for all purposes. Technical Field The present disclosure relates to systems for manufacturing dry electrode films and methods of processing the same. In particular, the method involves using a terahertz source and sensor to process and calibrate a system for processing dry electrode films. Background Dry electrode films for energy storage devices incorporate a binder material in combination with an active electrode material. Dry electrode films are prepared by calendaring powder mixtures without the use of solvents, which results in unique manufacturing processes and potential assembly challenges. For example, although the properties of an electrode film prepared by a wet solvent can be controlled by a slurry deposition process, a dry electrode film is formed on a calender roll and then deposited on a current collector to form an electrode. As such, other methods and systems that are specifically directed to controlling properties of dry electrode films may be helpful. Disclosure of Invention In order to summarize the invention and the advantages achieved over the prior art, certain objects and advantages of the invention have been described herein. Not all such objects or advantages may be realized in any particular embodiment of the invention. Thus, for example, those skilled in the art will recognize that the invention may be embodied or carried out in a manner that achieves or optimizes one advantage or group of advantages as taught herein without necessarily achieving other objects or advantages as may be taught or suggested herein. In some aspects, a system for processing a dry electrode film is described, the system comprising a roller system comprising a calender roller, a measurement device positioned above the calender roller and comprising a terahertz source and a terahertz sensor, wherein the terahertz source is configured to emit a terahertz radiation pulse and the terahertz sensor is configured to detect terahertz reflection of the terahertz radiation pulse, and a dry electrode powder mixture dispenser, wherein the dry electrode powder mixture dispenser is configured to dispense dry electrode material onto the calender roller, wherein the terahertz source is in-line with the terahertz sensor. In some embodiments, the system further comprises an additional calender roll and an additional measurement device, wherein the additional measurement device is positioned above the additional calender roll. In some embodiments, the terahertz radiation pulses include spot size, peak width, frequency, or any combination thereof. In some embodiments, the spot size comprises a diameter of about 0.05-0.5 mm. In some embodiments, the frequency is about 0.05-5.0 THz. In some embodiments, the peak width is about 1 to about 5 ps. In some embodiments, the terahertz sensor is configured to measure a physical property selected from the group consisting of mass density, load, uniformity, thickness, basis weight, and combinations thereof. In some embodiments, the terahertz sensor is configured to measure a time of flight of the terahertz radiation pulse, an intensity of the terahertz reflection, or any combination thereof. In some embodiments, the terahertz sensor is configured to measure the intensity of the terahertz reflection. In some embodiments, the system further comprises a current collector dispenser. In some aspects, a method of calibrating a system is described. The method includes placing a dry electrode film over a calender roll, wherein the dry electrode film includes a mark and a film region downstream of the mark, and wherein the film region includes a first major surface and a second major surface opposite the first major surface, emitting a pulse of marked terahertz radiation from a terahertz source toward the mark to form a mark reflection, detecting the mark reflection using a terahertz sensor, emitting a pulse of terahertz radiation from the terahertz source toward the film region at a first point in time to form a first terahertz reflection from the first major surface and a second terahertz reflection from the second major surface, detecting the first terahertz reflection at a second point in time using a terahertz sensor, and detecting the second terahertz reflection at a third point in time using the terahertz sensor, and sampling the film region. In some aspects, a method of treating a dry electrode film is described. The method includes placing a dry electrode film over a calender roll