CN-121990183-A - Conductive film adjusting system, conductive film adjusting method and pulse type space electric thruster

CN121990183ACN 121990183 ACN121990183 ACN 121990183ACN-121990183-A

Abstract

The invention provides a conductive film adjusting system, a conductive film adjusting method and a pulse type space electric thruster, wherein the conductive film adjusting system comprises a resistance measuring module, a control module, a power processing unit and a high-voltage pulse unit, the resistance measuring module detects the resistance value of a conductive film, the control module determines whether the thickness of the conductive film is in a set thickness range or not based on the comparison result of the resistance value of the conductive film and a preset resistance value range, the control module is further used for controlling the high-voltage pulse unit to ablate the conductive film when the resistance value of the conductive film is smaller than a set lower limit resistance value, and the control module is further used for controlling the power processing unit to discharge through a cathode and an anode when the resistance value of the conductive film is larger than a set upper limit resistance value so as to realize film deposition increase. When the resistance value is not in the preset resistance value range, the thickness of the conductive film is adjusted through the power processing unit and the high-voltage pulse unit, so that the failure of the thruster caused by thickness factors is avoided, and the service life of the thruster is prolonged.

Inventors

HE ZHEN
ZHANG RUI
XI WENXIONG
PENG TAO
ZHU HUI
Gan Jiaxuan
ZHAO YINGJIE
Hao Huikun
ZHAO YANYAN

Assignees

山东协和学院
株洲鸿星科技有限公司
中南大学

Dates

Publication Date: 20260508
Application Date: 20260324

Claims (10)

1. A conductive film regulating system is characterized by being applied to a pulse space electric thruster, wherein a conductive film exists on the surface of an insulator between a cathode and an anode of the pulse space electric thruster; The conductive film regulating system comprises a resistance measuring module, a control module, a power processing unit and a high-voltage pulse unit; The control module is respectively connected with the resistance measurement module, the power processing unit and the high-voltage pulse unit, wherein the resistance measurement module is electrically connected with the conductive film, the high-voltage pulse unit is electrically connected with the conductive film, and the power processing unit is electrically connected with the cathode and the anode; the resistance measurement module is connected with the control module and is used for detecting the resistance value of the conductive film and outputting the resistance value to the control module; the control module is used for determining whether the thickness of the conductive film is in a set thickness range or not based on a comparison result of the resistance value of the conductive film and a preset resistance value range; The control module is used for outputting a first power instruction to the high-voltage pulse unit when the resistance value of the conductive film is smaller than a set lower limit resistance value, and outputting a high-voltage pulse corresponding to the first power instruction when the high-voltage pulse unit receives the first power instruction, wherein the high-voltage pulse is used for ablating the conductive film; The control module is further used for outputting a second power instruction to the power processing unit when the resistance value of the conductive film is larger than the set upper limit resistance value, and the power processing unit is used for outputting discharge power corresponding to the second power instruction through the cathode and the anode when receiving the second power instruction, so that film deposition is increased.
2. The conductive film conditioning system as set forth in claim 1, wherein the resistance measurement module comprises a resistance measurement circuit and a plurality of conductive detection lines; the plurality of conductive detection lines are connected with a plurality of measurement nodes on the conductive film in a one-to-one correspondence manner; The input end of the resistance measurement circuit is respectively connected with the plurality of conductive detection lines, and the output end of the resistance measurement circuit is connected with the control module; The resistance measuring circuit is used for respectively detecting the resistance value between every two adjacent measuring nodes and outputting the resistance value to the control module; The control module is used for determining whether the resistance value of the conductive film between the plurality of adjacent two measurement nodes accords with a preset resistance value range according to the resistance values between the plurality of adjacent two measurement nodes.
3. The conductive film monitoring system as recited in claim 2, wherein the distances between adjacent ones of the measurement nodes are equal.
4. The conductive film conditioning system as set forth in claim 2, wherein said high voltage pulse units are electrically connected to said plurality of conductive detection lines, respectively; The control module is further configured to output a corresponding first power instruction to the high-voltage pulse unit when determining that the resistance value of the conductive film between the two adjacent measurement nodes is smaller than the set lower limit resistance value based on the preset resistance range and the resistance value between the two adjacent measurement nodes; And the high-voltage pulse unit is used for outputting high-voltage pulses corresponding to the first power command through connecting the corresponding conductive detection lines of the two measuring nodes after receiving the first power command.
5. The conductive film conditioning system as claimed in any one of claims 1 to 4, wherein the preset resistance value ranges from 20Ω to 1mΩ.
6. A conductive film adjusting method, characterized in that the conductive film adjusting method is applied to the control module in the conductive film adjusting system according to any one of claims 1 to 5, the conductive film adjusting method comprising: Acquiring the resistance value of a conductive film on the surface of an insulator between a cathode and an anode of the pulse space electric thruster; Comparing the resistance value of the conductive film with a preset resistance value range; outputting a high-voltage pulse to the conductive film when the resistance value of the conductive film is smaller than the set lower limit resistance value; Or when the resistance value of the conductive film is larger than the set upper limit resistance value, the power processing unit discharges the cathode and the anode of the pulse space electric thruster with larger power to realize the increase of the deposition of the conductive film.
7. The method of conditioning a conductive film according to claim 6, wherein the surface of the conductive film is provided with a plurality of measurement nodes; the method for obtaining the resistance value of the conductive film on the surface of the insulator between the cathode and the anode of the pulse space electric thruster comprises the following steps: The resistance value between every two adjacent measuring nodes is detected through a plurality of measuring nodes arranged on the conductive film.
8. The method of claim 7, wherein if there is a resistance value between two adjacent measurement nodes greater than a preset resistance value range, a larger power discharge is performed to the cathode and the anode of the pulsed space electric thruster until the resistance value between all the two adjacent measurement nodes is less than a preset maximum resistance value; If the resistance value between two adjacent measuring nodes is smaller than a preset resistance value range, outputting high-voltage pulses through the two adjacent measuring nodes until the resistance value between the two adjacent measuring nodes is in the preset resistance value range; If the resistance value between the plurality of adjacent two measuring nodes is smaller than a preset resistance value range, sequentially passing through the plurality of adjacent two measuring nodes, and outputting high-voltage pulses to the conductive film until the resistance value between the adjacent two measuring nodes is in the preset resistance value range; and when the resistance value between two adjacent measuring nodes of the conductive film is in a preset resistance value range, normally discharging through the cathode and the anode of the pulse space electric thruster.
9. The method of adjusting a conductive film according to claim 6, wherein a discharge voltage value at which the power processing unit discharges to the cathode and the anode of the pulsed space electric thruster is adjusted based on a resistance value of the conductive film.
10. A pulsed space electric thruster comprising an electrically conductive film conditioning system according to any one of claims 1 to 5.

Description

Conductive film adjusting system, conductive film adjusting method and pulse type space electric thruster Technical Field The invention relates to the technical field of conductive film adjusting systems, conductive film adjusting methods and pulse space electric thrusters. Background In the innovation process of the Micro-nano satellite propulsion technology, compared with the traditional electric propulsion technology (such as a Hall thruster which needs 100W-10kW of power), the vacuum pulse type space electric thruster (Vacuum Arc Thruster, VAT) or the Micro-cathode pulse type space electric thruster (Micro-Cathode Arc Thruster, μCAT) has obvious advantages in the aspect of power adaptability, and can realize μN.s-level single pulse impulse and ultra-low power consumption operation (W level) through the pulse arc ablation principle. However, the service life upper limit (about 10 times of pulse 5 times) caused by the cathode material ablation rate severely restricts the application prospect of the cube star in the tasks of long-term scientific observation (such as greenhouse gas remote sensing) and constellation networking (such as Internet of things communication) and the like. Therefore, the problem of the service life extension of the thruster becomes an important point of research. The core mechanism of the limited service life of VAT or μcat is derived from the abnormal evolution of the ceramic insulator conductive film between its electrodes. During sustained arc discharge, charged particle bombardment can cause the ceramic insulator surface to form a conductive metal deposit, known as a conductive film. The formation of the conductive film can significantly change the electric field distribution, and causes two failure modes, namely an interelectrode short circuit when the conductive film is too thick and completely blocks the discharge process, and an open circuit between a cathode and an anode when the conductive film is too thin, so that initial plasma cannot be generated. Disclosure of Invention The invention mainly aims to provide a conductive film adjusting system, a conductive film adjusting method and a pulse space electric thruster, which aim to prolong the service life of the thruster. In order to achieve the above object, the conductive film adjusting system provided by the invention is applied to a pulsed space electric thruster, wherein a conductive film exists on the surface of an insulator between a cathode and an anode of the pulsed space electric thruster; The conductive film regulating system comprises a resistance measuring module, a control module, a power processing unit and a high-voltage pulse unit; The control module is respectively connected with the resistance measurement module, the power processing unit and the high-voltage pulse unit, wherein the resistance measurement module is electrically connected with the conductive film, the high-voltage pulse unit is electrically connected with the conductive film, and the power processing unit is electrically connected with the cathode and the anode; the resistance measurement module is connected with the control module and is used for detecting the resistance value of the conductive film and outputting the resistance value to the control module; the control module is used for determining whether the thickness of the conductive film is in a set thickness range or not based on a comparison result of the resistance value of the conductive film and a preset resistance value range; The control module is used for outputting a first power instruction to the high-voltage pulse unit when the thickness corresponding to the resistance value of the conductive film is larger than the set upper limit value of the thickness, and outputting a high-voltage pulse corresponding to the first power instruction when the high-voltage pulse unit receives the first power instruction, wherein the high-voltage pulse is used for ablating the conductive film to reduce the thickness of the conductive film; The control module is further used for outputting a second power instruction to the power processing unit when the thickness corresponding to the resistance value of the conductive film is smaller than the lower limit value of the set thickness, and the power processing unit is used for outputting discharge power corresponding to the second power instruction through the cathode and the anode when receiving the second power instruction, so that film deposition is increased to increase the thickness of the conductive film. Optionally, the resistance measurement module comprises a resistance measurement circuit and a plurality of conductive detection lines; the plurality of conductive detection lines are connected with a plurality of measurement nodes on the conductive film in a one-to-one correspondence manner; The input end of the resistance measurement circuit is respectively connected with the plurality of conductive detection lines, and the output end