CN-121994126-A - Optical measurement method and device and electronic equipment

Abstract

The disclosure relates to an optical measurement method and device and electronic equipment, which comprise the steps of obtaining a first light spot in an initial state, obtaining a second light spot in a measurement state, wherein the first light spot and the second light spot are formed by incident light provided by the same light source, the first light spot and the second light spot at least comprise three vertexes, determining a transformation matrix between the first light spot and the second light spot, restraining a rotation dimension and a scaling dimension of the transformation matrix to obtain a restrained transformation matrix, and determining a position change amount between the first light spot and the second light spot based on the restrained transformation matrix, wherein the position change amount is used for determining an optical measurement result. By using the method disclosed by the invention, even if the light spot is blocked, the position change quantity of the light spot can be accurately determined, and the accuracy, reliability and efficiency of a measurement result can be improved.

Inventors

• Request for anonymity
• Request for anonymity

Assignees

• 芯视界（北京）科技有限公司

Dates

Publication Date

20260508

Application Date

20241104

Claims (10)

1. 1. An optical measurement method, comprising: Acquiring a first light spot in an initial state; Acquiring a second light spot in a measurement state, wherein the first light spot and the second light spot are formed by incident light provided by the same light source, and the first light spot and the second light spot at least comprise three vertexes; determining a transformation matrix between the first light spot and the second light spot; Constraining the rotation dimension and the scaling dimension of the transformation matrix to obtain a constrained transformation matrix; And determining a position change amount between the first light spot and the second light spot based on the constrained transformation matrix, wherein the position change amount is used for determining an optical measurement result.
2. 2. The method of claim 1, wherein the determining a transformation matrix between the first spot and the second spot comprises: determining at least three first feature points and first feature descriptors corresponding to the first feature points based on the first light spots; determining at least three second feature points and second feature descriptors corresponding to the second feature points based on the second light spots; Matching each first feature descriptor with each second feature descriptor, and determining a feature point pair formed by the first feature point and the second feature point; the transformation matrix is determined based on each of the pairs of feature points.
3. 3. The method of claim 2, wherein matching the first feature descriptor with the second feature descriptor, determining a feature point pair consisting of the first feature point and the second feature point, comprises: determining first similarity of each first feature descriptor and each second feature descriptor, wherein a single similarity corresponds to one first feature point and the first feature descriptor corresponding to the first feature point, and corresponds to one second feature point and the second feature descriptor corresponding to the second feature point; And under the condition that the first similarity is larger than a first similarity threshold value, determining a first characteristic point and a second characteristic point corresponding to the first similarity as a characteristic point pair.
4. 4. A method according to claim 3, characterized in that the method further comprises: determining a nearest second feature point and a next-adjacent second feature point of each first feature point based on the first similarity; Determining the nearest neighbor distance and the next neighbor distance of each first feature point respectively based on each first feature point and the corresponding nearest neighbor second feature point and the next-nearest neighbor second feature point; in the case where the ratio of the nearest neighbor distance to the next nearest neighbor distance is smaller than a distance threshold, a first feature point and a second feature point for determining the nearest neighbor distance are taken as a pair of available feature points.
5. 5. The method according to claim 1, wherein the initial state includes a first initial state, the first initial state being a state in which a first incident light passes through a first standard object, the measurement state includes a first measurement state, the first measurement state being a state in which the first incident light passes through an object to be measured, the positional change amount includes a first positional change amount between spots formed by the first incident light in the first initial state and the first measurement state, respectively, the measurement result being a target value of a first target parameter of the object to be measured, the method further comprising: Obtaining a mapping response relation of the first target parameter, wherein the mapping response relation is used for representing the position variation corresponding to the first target parameter under different values; and determining the target value based on the mapping response relation and the first position change quantity.
6. 6. The method of claim 5, wherein the initial state comprises a second initial state, the second initial state being a state in which a second incident light passes through the first standard object, the measurement state comprising a second measurement state, the second measurement state being a state in which the second incident light passes through a second standard object, the obtaining the mapping response relationship of the first target parameter comprising: acquiring second target parameters of a plurality of second standard objects; Determining second position variation amounts corresponding to the second standard objects respectively, wherein the second position variation amounts are second position variation amounts between light spots formed by the second incident light in the first initial state and the second initial state respectively; And determining the mapping response relation based on the plurality of second position variation amounts and second target parameters respectively corresponding to the plurality of second position variation amounts.
7. 7. The method of claim 1, wherein the initial state comprises a third initial state, the third initial state being emission of a third incident light at a first time, the measurement state comprising a third measurement state, the third measurement state being emission of the third incident light at a second time, the amount of positional change comprising a third amount of positional change between spots of the third incident light formed in the third initial state, the third measurement state, respectively, the measurement result being an accuracy of a device that emits the third incident light, the method further comprising: determining the third position variation amount statistical data based on a plurality of the third position variation amounts; determining the accuracy according to the third position variation statistic data; and debugging the equipment under the condition that the accuracy does not meet the first condition until the accuracy meets the first condition.
8. 8. The method of any one of claims 1-7, wherein the first and second spots are cross-shaped in shape.
9. 9. An optical measurement device, comprising: a first light spot acquisition unit configured to acquire a first light spot including the initial state; A second light spot acquisition unit configured to acquire a second light spot including a measurement state, the first light spot and the second light spot being formed by incident light provided by the same light source, and each of the first light spot and the second light spot including at least three vertices; A transformation matrix acquisition unit configured to determine a transformation matrix between the first light spot and the second light spot; The transformation matrix constraint unit is used for constraining the rotation dimension and the scaling dimension of the transformation matrix to obtain a constrained transformation matrix; And the position change amount determining unit is used for determining the position change amount between the first light spot and the second light spot based on the constrained transformation matrix, and the position change amount is used for determining a measurement result.
10. 10. An electronic device, comprising: A processor; A memory for storing processor-executable instructions; Wherein the processor is configured to implement the method of any one of claims 1 to 8 when executing the instructions stored by the memory.

Description

Optical measurement method and device and electronic equipment Technical Field The disclosure relates to the technical field of measurement, and in particular relates to an optical measurement method and device and electronic equipment. Background Spot position change generally refers to a phenomenon that a focal point or a spot position of a light beam changes due to the influence of certain factors (such as movement of an optical element, etc.) during the propagation of the light beam under certain conditions. By determining the position change of the light spot, the measurement result can be determined under different scenes. However, the accuracy of the existing measurement results is to be improved, and particularly under the condition that light spots are partially blocked, accurate measurement results are more difficult to obtain. Disclosure of Invention In view of this, the present disclosure proposes an optical measurement scheme. According to one aspect of the disclosure, an optical measurement method is provided, and the method comprises the steps of obtaining a first light spot in an initial state, obtaining a second light spot in a measurement state, wherein the first light spot and the second light spot are formed by incident light provided by the same light source, the first light spot and the second light spot at least comprise three vertexes, determining a transformation matrix between the first light spot and the second light spot, constraining a rotation dimension and a scaling dimension of the transformation matrix to obtain a constrained transformation matrix, and determining a position change amount between the first light spot and the second light spot based on the constrained transformation matrix, wherein the position change amount is used for determining an optical measurement result. In one possible implementation manner, the determining the transformation matrix between the first light spot and the second light spot comprises determining at least three first feature points and first feature descriptors corresponding to each first feature point based on the first light spot, determining at least three second feature points and second feature descriptors corresponding to each second feature point based on the second light spot, matching each first feature descriptor with each second feature descriptor, determining a feature point pair formed by the first feature point and the second feature point, and determining the transformation matrix based on each feature point pair. In one possible implementation manner, the first feature descriptor and the second feature descriptor are matched, a feature point pair formed by the first feature point and the second feature point is determined, wherein the feature point pair comprises a first similarity of each first feature descriptor and each second feature descriptor, a single similarity corresponds to one first feature point and the first feature descriptor corresponding to the first feature point, and corresponds to one second feature point and the second feature descriptor corresponding to the second feature point, and the first feature point and the second feature point corresponding to the first similarity are determined to be the feature point pair when the first similarity is larger than a first similarity threshold. In one possible implementation manner, the method further comprises determining a nearest second feature point and a next-adjacent second feature point of each first feature point based on the first similarity, determining a nearest neighbor distance and a next-adjacent distance of each first feature point based on each first feature point and the corresponding nearest second feature point and the next-adjacent second feature point respectively, and taking the first feature point and the second feature point for determining the nearest neighbor distance as an available feature point pair when the ratio of the nearest neighbor distance to the next-adjacent distance is smaller than a distance threshold. In one possible implementation manner, the initial state includes a first initial state, the first initial state is a state that a first incident light passes through a first standard object, the measurement state includes a first measurement state, the first measurement state is a state that the first incident light passes through an object to be measured, the position change amount includes first position change amounts between light spots formed by the first incident light in the first initial state and the first measurement state respectively, the measurement result is a target value of a first target parameter of the object to be measured, the method further includes obtaining a mapping response relation of the first target parameter, wherein the mapping response relation is a position change amount corresponding to the first target parameter used for representing different values, and the target value is determined bas