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CN-121994360-A - Infrared radiation temperature measurement system

CN121994360ACN 121994360 ACN121994360 ACN 121994360ACN-121994360-A

Abstract

The invention provides an infrared radiation temperature measurement system which comprises a processor, an electric heater, a thermocouple and an optical infrared processing unit, wherein the electric heater, the thermocouple and the optical infrared processing unit are respectively connected with the processor, the optical infrared processing unit is used for calculating the temperature of the surface of a measured object according to the emissivity of each wave band of the measured object in the process of infrared radiation temperature measurement of the measured object, generating an infrared image and the temperature of the surface of the measured object, and the processor is used for calculating the corrected surface temperature of the measured object by adopting an infrared temperature measurement correction model which is trained and fitted in advance according to the infrared image and the temperature of the measured object. According to the technical scheme, the processor calculates the corrected surface temperature of the measured object by adopting an infrared temperature measurement correction model according to the infrared image and the temperature of the measured object. The accuracy of the temperature of the measured object is improved.

Inventors

  • SUN HAORAN
  • YANG REN
  • Zhao ningbo
  • XIA JUNHONG

Assignees

  • 哈尔滨工程大学

Dates

Publication Date
20260508
Application Date
20260122

Claims (10)

  1. 1. An infrared radiation thermometry system, comprising: The processor is respectively connected with the electric heater, the thermocouple and the optical infrared processing unit; The electric heater is used for heating the measured object under the control of the processor in the process of measuring the temperature of the infrared radiation of the measured object; The thermocouple is used for collecting the temperature of the surface of the measured object in real time and sending the collected temperature to the processor and the optical infrared processing unit; The optical infrared processing unit is used for calculating the temperature of the surface of the measured object according to the emissivity of each wave band of the measured object and generating an infrared image and the temperature of the surface of the measured object; The processor is used for calculating the corrected surface temperature of the measured object by adopting a pre-trained and fitted infrared temperature measurement correction model according to the infrared image and the temperature of the measured object.
  2. 2. The infrared radiation thermometry system of claim 1, wherein the infrared thermometry correction model is a primary function, wherein an argument of the primary function is an actually measured object temperature value, and an argument of the function is a corrected surface temperature; training and fitting the infrared temperature measurement correction model, comprising: Adjusting the slope and intercept of the infrared temperature measurement correction model for multiple rounds; in each round, inputting the actually measured temperature value of the measured object into the infrared temperature measurement correction model to obtain corrected surface temperature; If the difference value between the corrected surface temperature of the output of the primary function and the actually measured temperature value of the measured object is larger than or equal to a preset difference value threshold value, the slope and intercept of the infrared temperature measurement correction model are adjusted; And stopping adjusting the slope and the intercept until the difference between the corrected surface temperature of the output of the primary function and the actually measured object temperature value is smaller than a preset difference threshold value, and ending training.
  3. 3. The infrared radiation thermometry system of claim 1, further comprising a reference blackbody furnace coupled to the processor; the reference blackbody furnace is used for assisting the processor in determining the emissivity of each wave band of the measured object; Before infrared radiation temperature measurement of a measured object, the processor is used for carrying out an emissivity determination experiment on the measured object so as to determine the emissivity of each wave band of the measured object, and specifically comprises the following steps: In the emissivity determination experiment, receiving the temperature of the measured object measured by the thermocouple; receiving spectral radiation characteristic data of the measured object sent by the optical infrared processing unit; And determining the emissivity of each wave band of the measured object according to the temperature and spectral radiation characteristic data of the reference blackbody furnace and the temperature and spectral radiation characteristic data of the measured object by adopting a spectrometry.
  4. 4. The infrared radiation thermometry system of claim 3, The processor is also used for calibrating before infrared radiation temperature measurement so as to improve calculation accuracy.
  5. 5. The infrared radiation thermometry system of claim 1, further comprising an ambient humidity sensor and an ambient temperature sensor; The environment humidity sensor and the environment temperature sensor are used for measuring the humidity and the temperature of the infrared radiation temperature measuring environment of the measured object in the infrared radiation temperature measuring process of the measured object, and sending the measured humidity and temperature to the processor; and the processor is used for adjusting the output power of the heater according to the temperature data so as to keep the temperature of the infrared radiation temperature measuring environment of the measured object constant.
  6. 6. The infrared radiation thermometry system of claim 1, wherein the processor is further configured to obtain a start abscissa, a start ordinate, an end abscissa, and an end ordinate; determining a display area of the infrared image of the measured object according to the starting point abscissa, the starting point ordinate, the ending point abscissa and the ending point ordinate; According to the infrared temperature of the display area of the infrared image of the measured object, calculating to obtain the real temperature of the display area of the infrared image of the measured object by adopting the temperature measurement correction model; And generating a temperature distribution diagram and a temperature contour diagram of a display area of the infrared image of the measured object according to the real temperature.
  7. 7. The infrared radiation thermometry system of claim 1, wherein the optical infrared processing unit is configured to acquire an image of the object under test; determining the temperature of the measured object according to the emissivity of each wave band of the measured object; and generating an infrared image of the measured object according to the image and the temperature of the measured object.
  8. 8. The infrared radiation thermometry system of claim 4, wherein, The processor is also used for calibrating the measured object before infrared radiation temperature measurement, and specifically comprises the following steps: Controlling a heater to heat the surface of the measured object at a plurality of different powers so as to realize that the temperature of the surface of the measured object is a plurality of temperature data; At each temperature data, calibration is performed.
  9. 9. The infrared radiation thermometry system of claim 7, wherein the calibrating comprises, at each temperature data: acquiring the temperature of the surface of the measured object measured by the thermocouple under any one temperature data; adjusting the reflectance value of the material of the measured object to adjust the corrected surface temperature of the measured object; And determining to end calibration in response to the difference between the corrected surface temperature of the measured object and the temperature of the surface of the measured object measured by the thermocouple being less than a predetermined temperature difference threshold.
  10. 10. The infrared radiation thermometry system of claim 1, further comprising a thermal insulation layer; The heat preservation layer is arranged around the measured object to improve the thermostability of the infrared radiation temperature measuring environment of the measured object.

Description

Infrared radiation temperature measurement system Technical Field The invention relates to the technical field of infrared radiation temperature measurement, in particular to an infrared radiation temperature measurement system. Background Accurate measurement of the temperature field on the surface of the turbine blade is important to the research of the cold effect test of the turbine blade. In the field of gas turbine testing, temperature measuring methods commonly adopted in the related art, such as a film thermocouple measuring method, a pressure sensitive paint measuring method, a transient liquid crystal temperature measuring method and an infrared radiation temperature measuring method, are adopted. In the related art, the accuracy of temperature measurement is relatively low. Disclosure of Invention The following presents a simplified summary of the invention in order to provide a basic understanding of some aspects of the invention. It should be understood that this summary is not an exhaustive overview of the invention. It is not intended to identify key or critical elements of the invention or to delineate the scope of the invention. Its purpose is to present some concepts in a simplified form as a prelude to the more detailed description that is discussed later. In view of the above, the invention provides an infrared radiation temperature measurement system to at least solve the problem of low accuracy of temperature measurement in the prior art. According to one aspect of the present invention, there is provided an infrared radiation thermometry system comprising: The processor is respectively connected with the electric heater, the thermocouple and the optical infrared processing unit; The electric heater is used for heating the measured object under the control of the processor in the process of measuring the temperature of the infrared radiation of the measured object; The thermocouple is used for collecting the temperature of the surface of the measured object in real time and sending the collected temperature to the processor and the optical infrared processing unit; The optical infrared processing unit is used for calculating the temperature of the surface of the measured object according to the emissivity of each wave band of the measured object and generating an infrared image and the temperature of the surface of the measured object; The processor is used for calculating the corrected surface temperature of the measured object by adopting a pre-trained and fitted infrared temperature measurement correction model according to the infrared image and the temperature of the measured object. In some embodiments, the infrared thermometry correction model is a primary function, wherein an independent variable of the primary function is an actually measured object temperature value, and a dependent variable of the function is a corrected surface temperature; training and fitting the infrared temperature measurement correction model, comprising: Adjusting the slope and intercept of the infrared temperature measurement correction model for multiple rounds; in each round, inputting the actually measured temperature value of the measured object into the infrared temperature measurement correction model to obtain corrected surface temperature; If the difference value between the corrected surface temperature of the output of the primary function and the actually measured temperature value of the measured object is larger than or equal to a preset difference value threshold value, the slope and intercept of the infrared temperature measurement correction model are adjusted; And stopping adjusting the slope and the intercept until the difference between the corrected surface temperature of the output of the primary function and the actually measured object temperature value is smaller than a preset difference threshold value, and ending training. In some embodiments, further comprising a reference blackbody furnace coupled to the processor; the reference blackbody furnace is used for assisting the processor in determining the emissivity of each wave band of the measured object; Before infrared radiation temperature measurement of a measured object, the processor is used for carrying out an emissivity determination experiment on the measured object so as to determine the emissivity of each wave band of the measured object, and specifically comprises the following steps: In the emissivity determination experiment, receiving the temperature of the measured object measured by the thermocouple; receiving spectral radiation characteristic data of the measured object sent by the optical infrared processing unit; And determining the emissivity of each wave band of the measured object according to the temperature and spectral radiation characteristic data of the reference blackbody furnace and the temperature and spectral radiation characteristic data of the measured object by adopting a spectrometry. In so