CN-121994705-A - Multi-edge detection equipment for panel

CN121994705ACN 121994705 ACN121994705 ACN 121994705ACN-121994705-A

Abstract

The invention provides panel polygonal detection equipment, which relates to the technical field of display panel detection, and aims to realize integrated detection of three defects of a panel polygonal terminal area, an indentation and an IC by matching a specific sequence of detecting the left terminal area by 180 degrees clockwise and 90 degrees anticlockwise by a preferential right terminal area with the design of a crack detection area, an indentation detection area and an IC detection area, simultaneously, by means of parallel bearing of multiple platforms and cooperative transportation of three arms, and combining an acceleration-deceleration-uniform speed detection motion mode, the time consumption of single panel detection is greatly shortened, the production beat is obviously improved to adapt to the high-efficiency requirement of a panel mass production line, on precision control, hardware reduces vibration by a marble base and the accurate positioning of a calibration part, and software realizes concentric calibration of a camera by Mark calibration, ensures detection precision in a multi-dimensional manner, reduces false leakage detection so as to reduce the outflow risk of defective products.

Inventors

LI WENWEI
CHU HUI
WANG KANGFENG
HUA ZHIPENG
YU YANGYANG
LIU WU
QIAN ZHENDONG
YU LONG
YU XIONG

Assignees

浙江鼎晶科技有限公司

Dates

Publication Date: 20260508
Application Date: 20251111

Claims (10)

1. A panel multilateral detection device is characterized by comprising a conveying mechanism, a platform assembly and a detection area; The detection area at least comprises an IC detection area and an indentation detection area, wherein the IC detection area comprises an IC detection mechanism, and the indentation detection area comprises an indentation detection mechanism (8); The detection end of the IC detection mechanism and the detection end of the indentation detection mechanism (8) are arranged opposite to each other, and the detection platform is positioned between the detection end of the IC detection mechanism and the detection end of the indentation detection mechanism (8) during detection; The Mark detection device comprises an IC detection mechanism, an indentation detection mechanism (8) and a calibration plate (612), and is characterized in that Mark marks are arranged on the calibration plate (612), the detection end of the IC detection mechanism and the detection end of the indentation detection mechanism (8) move to the position where the calibration plate (612) is located, the detection end of the IC detection mechanism and the detection end of the indentation detection mechanism (8) respectively acquire images of the Mark marks, the images acquired by the Mark marks and the detection end of the IC detection mechanism, the current position of the detection end of the indentation detection mechanism (8) and the Mark deviation value are respectively and independently compensated, and the detection end of the IC detection mechanism and the detection end of the indentation detection mechanism (8) are concentrically arranged.
2. The panel polygon detection apparatus according to claim 1, wherein Mark marks are provided on both upper and lower surfaces of the calibration plate (612), and the calibration plate (612) is located therebetween when the detection end of the IC detection mechanism and the detection end of the indentation detection mechanism (8) move in synchronization with each other at the position where the calibration plate (612) is located.
3. The panel polygon detection apparatus as claimed in claim 2, wherein the front projections of the Mark marks on both the upper and lower surfaces of the calibration plate (612) are completely coincident.
4. A panel polygon detection apparatus as claimed in any one of claims 1 to 3, characterized in that the detection end of the IC detection means and the detection end of the indentation detection means (8) are moved synchronously to the position of the calibration plate (612).
5. The panel polygon detection apparatus according to claim 4, wherein the IC detection mechanism and the indentation detection mechanism (8) are synchronized to switch between the calibration section (61) or the detection stage correspondingly provided.
6. The panel polygon detection apparatus according to claim 1, wherein the detection zone further comprises a crack detection zone, the crack detection zone being provided with crack detection means (7), the detection platform being arranged in one-to-one or many-to-one number with the crack detection means (7).
7. The panel multi-edge inspection apparatus according to claim 6, further comprising a gantry, wherein the conveying mechanism includes a plurality of independently moving conveying arms that reciprocate on the gantry to convey the panel to be inspected.
8. The panel polygon detection apparatus according to claim 7, wherein the IC detection mechanism comprises an IR camera and an infrared light source, the crack detection mechanism (7) comprises an ITO detection device and a high-brightness white light source, and the indentation detection mechanism (8) comprises a line scan camera and a blue light source.
9. The panel polygon detection apparatus according to any one of claims 6 to 8, wherein the detection motion process of the IC detection mechanism, the indentation detection mechanism (8), and the crack detection mechanism (7) includes an acceleration zone including an acceleration start point and an acceleration end point, a deceleration zone including a deceleration end point, and a uniform velocity zone including a uniform velocity end point, the IC detection mechanism, the indentation detection mechanism (8), and the crack detection mechanism (7) make a high-speed linear motion from the acceleration start point within the acceleration zone, enter the deceleration zone after reaching the acceleration end point, make a deceleration linear motion to the deceleration end point, and reach a set detection speed, and then detect at the detection speed within the uniform velocity zone until the uniform velocity end point.
10. The panel multi-edge inspection apparatus according to claim 9, wherein when the panel to be inspected includes a plurality of terminal areas, the right terminal area (200) is preferentially inspected, and then the inspection platform is rotated 180 degrees clockwise to inspect the left terminal area (201), and rotated 90 degrees counterclockwise to inspect the S-edge terminal area (202).

Description

Multi-edge detection equipment for panel Technical Field The application relates to the technical field of display panel detection, in particular to a panel polygon detection device. Background The display panel is used as a core component of terminal products such as smart phones, vehicle-mounted displays, AR/VR and the like, and the quality of the display panel directly determines the performance and user experience of the terminal equipment. Along with rapid iteration of novel display technologies such as MiniLED and flexible OLED, the complexity of the panel production process is continuously improved, and severe requirements are put forward on the detection precision and efficiency of key defects such as terminal area cracks, surface indentations, IC chip lamination and the like. Under the background of continuous expansion of display industry, high-precision multi-defect synchronous detection equipment has become a core demand direction of industry technology upgrading, and the technical level of the equipment directly influences the yield and the productivity release efficiency of panel production. One of the technical bottlenecks faced in the current panel terminal area detection is that, as shown in fig. 5, the terminal area includes a multi-area structure such as right, left and S sides, and the traditional equipment adopts a single-stage single detection mode, and the whole area defect coverage can be completed only through multiple carrying and transposition operations, so that the detection beat is difficult to match with the high-efficiency productivity requirement of the modern panel production line, and becomes a key bottleneck for restricting the overall efficiency improvement of the production line. Secondly, the integration of multi-defect detection is insufficient, the detection principle difference of cracks, indentations and IC defects is obvious, the corresponding detection module has obvious adaptation problems in structural design, operation logic and signal transmission modes, three types of detection functions are difficult to integrate into the same equipment in the prior art, enterprises need to respectively configure a plurality of special detection equipment, the equipment purchasing and site occupation cost is greatly increased, the transportation of the panel among different equipment is realized through manual work or an additional conveying mechanism, the detection period is further prolonged, and the damage risk of the panel in the transportation process is also improved. Therefore, the development of the panel multilateral detection equipment and the detection method with high synchronism, multi-region adaptability and precision stability becomes a key technical direction for breaking through the technical bottleneck of the detection of the current display panel and supporting the industrialization landing of the novel display technology. Disclosure of Invention The invention provides panel multilateral detection equipment, which aims to solve the technical problems that in the prior art, cracks, indentations and IC (integrated circuit) detection of a plurality of polygonal terminal areas cannot be carried out, the production beat is low, and the precision is insufficient. In order to solve the problems, the invention adopts the following technical scheme: The invention provides a panel multilateral detection device, which comprises a conveying mechanism, a platform assembly and a detection zone, wherein the platform assembly is arranged on the conveying mechanism; the detection area at least comprises an IC detection area and an indentation detection area, wherein the IC detection area comprises an IC detection mechanism, and the indentation detection area comprises an indentation detection mechanism; The detection platform is positioned between the detection end of the IC detection mechanism and the detection end of the indentation detection mechanism during detection; The Mark detection device comprises an IC detection mechanism, an indentation detection mechanism, a Mark detection plate, a Mark detection plate, an IC detection mechanism and an indentation detection mechanism, wherein the Mark detection plate is arranged on the Mark detection plate, the detection end of the IC detection mechanism and the detection end of the indentation detection mechanism move to the position where the Mark detection plate is located, the detection end of the IC detection mechanism and the detection end of the indentation detection mechanism respectively acquire images of the Mark identification, the images acquired by the detection end of the IC detection mechanism and the detection end of the indentation detection mechanism are processed and analyzed respectively, and the current positions of the detection end of the IC detection mechanism, the detection end of the indentation detection mechanism and the Mark identification deviation value are respectively and independently compens