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CN-121994914-A - Eddy current array probe debugging device capable of adjusting distance

CN121994914ACN 121994914 ACN121994914 ACN 121994914ACN-121994914-A

Abstract

The invention provides an eddy current array probe debugging device capable of adjusting the distance, which belongs to the technical field of nondestructive testing device testing, and aims to solve the problem that the coil position parameters of the existing eddy current array probe cannot be adjusted in the development process, wherein the eddy current array probe debugging device capable of adjusting the distance comprises a fixed guide shaft (1) and a line distance adjusting guide shaft (2) which are arranged at intervals left and right, a plurality of first sliding blocks (3) are arranged on the fixed guide shaft (1), a plurality of second sliding blocks (4) are arranged on the line distance adjusting guide shaft (2), and the plurality of second sliding blocks (4) can correspondingly move left and right along with the line distance adjusting guide shaft (2); the distances between all adjacent two first sliding blocks (3) and adjacent two second sliding blocks (4) can be correspondingly adjusted synchronously. Therefore, the influence of the coil spacing and the line spacing change on the detection effect can be rapidly verified, and the development efficiency of the eddy current array probe is improved.

Inventors

  • ZHAO HONG
  • SONG CHENG
  • WANG JINCHAO
  • ZHANG LIN

Assignees

  • 中国特种设备检测研究院

Dates

Publication Date
20260508
Application Date
20260205

Claims (10)

  1. 1. The eddy current array probe debugging device capable of adjusting the distance is characterized by comprising a fixed guide shaft (1) and a line-space adjusting guide shaft (2) which are arranged at intervals left and right, wherein the fixed guide shaft (1) and the line-space adjusting guide shaft (2) extend along the front-rear direction, a plurality of first sliding blocks (3) are arranged on the fixed guide shaft (1), a plurality of second sliding blocks (4) are arranged on the line-space adjusting guide shaft (2), the first sliding blocks (3) and the second sliding blocks (4) can move along the front-rear direction, the plurality of first sliding blocks (3) and the plurality of second sliding blocks (4) are arranged at intervals along the front-rear direction, the distance between every two adjacent first sliding blocks (3) is the same, the distance between every two adjacent second sliding blocks (4) is the same, the distance between every two adjacent first sliding blocks (3) is equal to the distance between every two adjacent second sliding blocks (4), and the two adjacent first sliding blocks (3) are connected with a connecting rod (41) through a first connecting mechanism (31) and a connecting rod (41) through a connecting rod (5); In the process of moving the row spacing adjusting guide shaft (2) left and right relative to the fixed guide shaft (1), the second sliding blocks (4) can correspondingly move left and right along with the row spacing adjusting guide shaft (2), and in the process of adjusting the front-back distance between the two first sliding blocks (3), the distances between all the two adjacent first sliding blocks (3) and the two adjacent second sliding blocks (4) can be correspondingly adjusted synchronously.
  2. 2. The pitch-adjustable eddy current array probe debugging device according to claim 1, further comprising a first movable guide shaft (6), wherein the first movable guide shaft (6) and the fixed guide shaft (1) are arranged at a left-right parallel interval, the first movable guide shaft (6) can move left and right relative to the fixed guide shaft (1), the first link mechanism (31) comprises a first front link (311), a left slider (312) and a first rear link (313), the left slider (312) is arranged on the first movable guide shaft (6), and the left slider (312) can move back and forth.
  3. 3. The pitch-adjustable eddy current array probe adjusting device according to claim 2, wherein in one first link mechanism (31), one end of a first front link (311) is connected to a front first slider (3) of two adjacent first sliders (3) through a first right rotation shaft (314), one end of a first rear link (313) is connected to a rear first slider (3) of two adjacent first sliders (3) through a first right rotation shaft (314), the other end of the first front link (311) and the other end of the first rear link (313) are both connected to a left slider (312) through a first left rotation shaft (315), and both the first right rotation shaft (314) and the first left rotation shaft (315) extend in the up-down direction.
  4. 4. The pitch-adjustable eddy current array probe adjusting device according to claim 3, further comprising a second movable guide shaft (7), wherein the second movable guide shaft (7) and the pitch-adjustable guide shaft (2) are arranged at right-left parallel intervals, the second movable guide shaft (7) can move left and right relative to the pitch-adjustable guide shaft (2), the second link mechanism (41) comprises a second front link (411), a right slider (412) and a second rear link (413), the right slider (412) is arranged on the second movable guide shaft (7), and the right slider (412) can also move back and forth.
  5. 5. The pitch-adjustable eddy current array probe adjusting device according to claim 4, wherein in one second link mechanism (41), one end of a second front link (411) is connected to a second slider (4) in front of two adjacent second sliders (4) through a second left rotating shaft (414), one end of a second rear link (413) is connected to a second slider (4) in rear of two adjacent second sliders (4) through a second left rotating shaft (414), the other end of the second front link (411) and the other end of the second rear link (413) are both connected to a right slider (412) through a second right rotating shaft (415), and both the second left rotating shaft (414) and the second right rotating shaft (415) extend in the up-down direction.
  6. 6. The pitch-adjustable eddy current array probe debugging device according to claim 5, wherein the first sliding blocks (3) and the second sliding blocks (4) are uniformly and alternately arranged along the front-back direction, the first sliding block (3) at the foremost end or the rearmost end is fixedly connected with the fixed guide shaft (1), the first right rotating shaft (314) and the first sliding block (3) are fixedly connected up and down, the second left rotating shaft (414) and the second sliding block (4) are fixedly connected up and down, the lower end of each first sliding block (3) is fixedly connected with a first coil mounting seat (32), and the lower end of each second sliding block (4) is fixedly connected with a second coil mounting seat (42).
  7. 7. The device for debugging the pitch-adjustable eddy current array probe according to claim 6, further comprising an outer fixing frame (8), wherein the outer fixing frame (8) is of a rectangular structure, the outer fixing frame (8) comprises two outer cross beams (81) and two outer connecting rods (82), the two outer cross beams (81) are arranged at intervals in a front-back parallel mode, the two outer connecting rods (82) are arranged at intervals in a left-right parallel mode, the front end and the rear end of the fixed guide shaft (1) are respectively connected and fixed with the two outer cross beams (81), the fixed guide shaft (1), the line pitch-adjusting guide shaft (2), the first movable guide shaft (6) and the second movable guide shaft (7) are located between the two outer connecting rods (82) along the left-right direction, the transverse transmission piece (5) is of a strip-shaped structure, the transverse transmission piece (5) extends along the left-right direction, the sliding groove (51) is arranged on the transverse transmission piece (5) and extends along the left-right direction, the third sliding block (84) is arranged on the outer connecting rods (82), and the front end and the right end of the third sliding block (84) can be connected with the right end of the transverse transmission piece (415) in a sliding mode, and the front end and the right end of the third sliding block (84) can be connected with the right rotary shaft (84) in a sliding mode.
  8. 8. The pitch-adjustable eddy current array probe debugging device according to claim 7, wherein the line pitch adjusting guide shaft (2) penetrates through two outer cross beams (81), line pitch positioning knobs (21) are arranged at the front end and the rear end of the line pitch adjusting guide shaft (2), the line pitch positioning knobs (21) are in threaded connection with the line pitch adjusting guide shaft (2), coil line pitch measurement scales (83) are arranged on the outer cross beams (81), the positions of the coil line pitch measurement scales (83) correspond to the positions of the line pitch adjusting guide shaft (2), and when the line pitch positioning knobs (21) are screwed, the line pitch positioning knobs (21) can be abutted or separated from the outer cross beams (81).
  9. 9. The pitch-adjustable eddy current array probe adjustment device according to claim 6, further comprising an outer cover plate (85), wherein the fixed guide shaft (1) and the line pitch adjustment guide shaft (2) are parallel to the outer cover plate (85), and the outer cover plate (85) is located above the fixed guide shaft (1), the line pitch adjustment guide shaft (2), the first movable guide shaft (6) and the second movable guide shaft (7).
  10. 10. The device for debugging the eddy current array probe capable of adjusting the distance according to claim 9, wherein two first right rotating shafts (314) penetrate through the outer cover plate (85), a first sliding block (3) is arranged between the two first right rotating shafts (314), coil distance positioning knobs (11) are arranged at the upper ends of the two first right rotating shafts (314), the coil distance positioning knobs (11) are in threaded connection with the first right rotating shafts (314), coil distance measuring scales (86) are arranged on the outer cover plate (85), the positions of the coil distance measuring scales (86) correspond to the positions of the two first right rotating shafts (314), and when the coil distance positioning knobs (11) are screwed, the coil distance positioning knobs (11) can be abutted or separated from the outer cover plate (85).

Description

Eddy current array probe debugging device capable of adjusting distance Technical Field The invention relates to the technical field of nondestructive testing device testing, in particular to an eddy current array probe debugging device capable of adjusting the distance. Background The eddy current detection method is a common nondestructive detection method, and is mainly used for detecting surface or near-surface defects of conductive materials, a eddy current field is generated by exciting a coil, and a detection coil detects the change of the eddy current field, so that the defect detection is achieved. The eddy current detection probe mainly comprises a far-field eddy current probe, a conventional eddy current probe, an eddy current array probe and the like, and the detection principle is basically the same, wherein the eddy current array probe adopts a micro coil array form, and has higher detection sensitivity and detection efficiency. The coils of the common eddy current array probe (Eddy Current Array) are printed with flexible PCB or wound with coils, the excitation receiving sequence of the eddy current array probe 9 is set by a program, the structures of the eddy current array probe 9 and the coils 91 inside the eddy current array probe are as shown in figure 1, and the coils 91 are arranged according to fixed coil spacing A and row spacing B. The coiled eddy current array probe has a good detection effect and is widely applied. In the research and development work of the eddy current array probe, the eddy current array probe needs to be flexibly designed according to different detected workpiece materials and detection process requirements, and more requirements are provided for the design work of the probe. For example, it is necessary to calculate parameters of the probe (number of turns of coil, outer diameter, coil pitch, line pitch, etc.) in combination with simulation work of the probe, and then trial production of the probe is performed to verify an actual detection effect. After the eddy current array probe is manufactured in trial, the position of each coil is fixed, the position parameters (coil spacing and line spacing) of the coils cannot be changed, if the position parameters of the coils are to be adjusted, the eddy current array probe sample is required to be manufactured again, and the trial manufacturing and verification efficiency is low. Disclosure of Invention In order to solve the problem that the coil position parameters of the eddy current array probe cannot be adjusted in the development process, the invention provides the eddy current array probe debugging device capable of adjusting the distance, which can be used for rapidly installing and winding or printing PCB coils, adjusting the coil distance and the line distance of the coils, rapidly verifying the influence of the coil distance and the line distance change on the detection effect, and improving the development efficiency of the eddy current array probe. The technical scheme adopted by the embodiment of the invention for solving the technical problems is as follows: The utility model provides an eddy current array probe debugging device that can adjust interval, including controlling fixed guiding axle and the line interval regulation guiding axle that the interval set up, fixed guiding axle and line interval regulation guiding axle all extend along the fore-and-aft direction, be provided with a plurality of first sliders on the fixed guiding axle, be provided with a plurality of second sliders on the line interval regulation guiding axle, first slider and second slider all can follow the fore-and-aft direction and remove, a plurality of first sliders and a plurality of second sliders all follow the fore-and-aft direction interval arrangement, the distance between all adjacent two first sliders is the same, the distance between all adjacent two second sliders is the same, distance between adjacent two first sliders is equal to distance between two adjacent two second sliders, connect through first link mechanism between two adjacent first sliders, first link mechanism is connected with second link mechanism through horizontal driving medium, a plurality of second sliders can be along with the line interval regulation guiding axle the corresponding in-and-right direction interval in-process of moving about the fixed guiding axle, a plurality of second sliders can be along with the corresponding distance between two adjacent two second sliders of left and right sides adjustment, in the corresponding distance between two adjacent two second sliders can be adjusted. The embodiment of the invention has the beneficial effects that: Through installing the eddy current array coil unit that waits to test on the device, can be quick accomplish the regulation of coil interval and coil line interval, combine the simulation design work of eddy current array probe, verify the detection effect of probe fast, save the experimen