CN-121995112-A - Switch loop resistance testing method based on ambient temperature compensation

CN121995112ACN 121995112 ACN121995112 ACN 121995112ACN-121995112-A

Abstract

The invention discloses a switch loop resistance test method based on ambient temperature compensation, which relates to the technical field of loop resistance test and comprises the steps of combining an ambient compensation index of a switch loop and an inhibition index of environmental influence, analyzing and calculating to obtain a dynamic compensation coefficient of ambient temperature, and dynamically adjusting an initial resistance value of the switch loop according to the dynamic compensation coefficient; according to the invention, the environment compensation index is calculated through a formula, the problems that the traditional method lacks an effective temperature compensation mechanism, the measurement result deviation is large and the comparability is poor under different environment temperatures are effectively solved, the quantitative judgment of the influence of the environment on the test is realized, meanwhile, the suppression current threshold value is determined under the high-degree environment interference and switching loop state, the suppression index of the environment influence is calculated by combining the suppression data such as the current data of the loop to be tested, the current output duration time, the contact surface temperature of the loop and the test lead, and the like, and the linkage consideration of the test current and the environment factors is realized.

Inventors

HOU YANQUAN
ZHANG HAOQIANG
YAO YUE
LI WEI
SUN FENGXIAN
MENG XIANGPENG
ZHANG CHUNMING
ZHAO JUNTAO
DONG HONGKAI
WANG LEI

Assignees

国网黑龙江省电力有限公司七台河供电公司

Dates

Publication Date: 20260508
Application Date: 20251215

Claims (6)

1. The switching loop resistance testing method based on the ambient temperature compensation is characterized by comprising the following steps of: Step one, connecting a test current lead and a voltage measurement lead to two ends of a switch loop to be tested respectively through an adjustable direct current constant current source, acquiring current and voltage data, and calculating an initial resistance value of the switch loop according to ohm's law; Collecting surrounding environment data of a switch circuit to be tested through an environment sensor array, analyzing and calculating to obtain an environment compensation index of the switch circuit, and dividing the surrounding environment influence degree of the switch circuit into high-degree influence and low-degree influence; Step three, establishing an influence inhibition model, testing the inhibition effect of current on the influence of environmental factors to obtain an inhibition current threshold value, acquiring inhibition data through a database, and analyzing and calculating to obtain an inhibition index of the environmental influence; and step four, analyzing and calculating by combining the environment compensation index of the switch loop and the inhibition index of the environment influence to obtain a dynamic compensation coefficient of the environment temperature, and dynamically adjusting the initial resistance value of the switch loop according to the dynamic compensation coefficient.
2. The method according to claim 1, wherein the environmental sensor array includes a temperature and humidity sensor and an air pressure sensor, the environmental data includes temperature, humidity and barometric pressure data of an environment around the switch circuit to be tested, and the inhibition data includes current in the switch circuit to be tested, current output duration and contact surface temperature data of the switch circuit to be tested and a test lead.
3. The method for testing the resistance of the switching circuit based on the ambient temperature compensation according to claim 1, wherein the calculation process of the ambient compensation index of the switching circuit is as follows: S11, acquiring temperature, humidity and barometric pressure data of the surrounding environment of a switch loop to be detected and analyzing and calculating; s12, calculating the environment compensation index of the switching loop according to the following formula : , wherein, For the temperature of the surroundings of the switching circuit to be measured, For a preset standard temperature of the environment surrounding the switching circuit, For the humidity of the environment surrounding the switching circuit to be measured, In order to achieve this, the first and second, In order to achieve this, the first and second, To be the atmospheric pressure of the surrounding environment of the switching circuit to be tested, For a preset standard atmospheric pressure of the environment surrounding the switching circuit, For the preset humidity weight coefficient, The weight coefficient is the preset atmospheric pressure; S13, acquiring a preset environment compensation lower limit threshold value And an environmental compensation upper threshold And the environment compensation index of the switch loop Comparative analysis is performed when When the method is used, the condition that the influence degree of the surrounding environment of the switch loop on the loop resistance test is low is described, the influence is divided into low-degree influences, and the initial resistance value of the switch loop is not required to be dynamically adjusted; S14, when When the method is used, the influence degree of the surrounding environment of the switch loop on the loop resistance test is high, the influence is divided into high-degree influences, further analysis on the environment inhibition condition is needed, and the initial resistance value of the switch loop is dynamically adjusted.
4. The method for testing the switch loop resistance based on the ambient temperature compensation according to claim 1 is characterized in that the process of establishing an influence inhibition model is that under the condition of the same high-degree influence of ambient factor interference and the same switch loop state, test current values with different magnitudes are introduced into a switch loop to be tested, the switch loop test resistance values corresponding to different currents are calculated, the difference value between the switch loop test resistance values and a preset standard switch loop resistance value is compared, the switch loop test resistance value with the smallest difference value is obtained, and the corresponding test current value is used as an inhibition current threshold.
5. The method for testing the resistance of the switching loop based on the ambient temperature compensation according to claim 1, wherein the calculation process of the suppression index of the environmental impact is as follows: S21, acquiring current in a switch loop to be tested, current output duration time and contact surface temperature data of the switch loop to be tested and a test lead, and analyzing and calculating; S22, calculating the inhibition index of environmental impact according to the following formula : , wherein, For the number of data samples of the current in the switching loop to be measured, Is the first The actual current in the secondary test switching loop, In order to suppress the current threshold value, For the actual current output duration time, For a preset standard current output duration, For the contact surface temperature of the switch circuit to be tested and the test lead, For the preset standard contact surface temperature, the inhibition index of the environmental influence is used for indicating the inhibition degree of the test current on the environmental factor, and the greater the numerical value of the inhibition index is, the higher the inhibition degree of the test current on the environmental factor is.
6. The method for testing the resistance of the switching loop based on the ambient temperature compensation according to claim 1, wherein the calculation process of the dynamic compensation coefficient of the ambient temperature is as follows: S31, acquiring an environment compensation index of the switch loop and an environment influence inhibition index, and analyzing and calculating; s32, calculating the dynamic compensation coefficient of the environmental temperature according to the following formula : , wherein, The upper threshold is compensated for a preset environment, The lower threshold is compensated for a preset environment, For the environmental compensation index of the highly influencing switching circuit, Is an index of inhibition of the environmental impact, For a preset weighting factor of the environmental impact, The weight coefficient is a preset weight coefficient for environmental suppression; s33, dynamically compensating coefficient of environment temperature Substituting the final accurate resistance value into a correction formula : , wherein, For the initial resistance value of the switching loop, Is a dynamic compensation coefficient for the ambient temperature.

Description

Switch loop resistance testing method based on ambient temperature compensation Technical Field The invention relates to the technical field of loop resistance testing, in particular to a switching loop resistance testing method based on ambient temperature compensation. Background In a huge architecture of a power system, the switch equipment is just like a key node of a transportation junction, and plays an important role in controlling the on-off of a circuit and guaranteeing the orderly distribution and transmission of power. The small change of the value of the switch loop resistance, which is used as a core parameter reflecting the health state of the switch equipment, contains key information of the running condition of the equipment, and is directly related to the running safety and stability of the whole power system. From the principle level, the switching loop resistor is mainly composed of the resistor of the conductor itself and the contact resistor of each connecting part. The resistance of the conductor depends on the inherent factors such as the material, length and cross-sectional area of the conductor, which are relatively stable during the long-term operation of the switch device, but gradually change due to the aging, material degradation and the like of the conductor, and the contact resistance mainly occurs at the positions of the switch contact, the connecting terminal and the like, and the size of the contact resistance is closely related to the pressure, the cleaning degree, the oxidation degree and the like of the contact surface. When the switching device is in normal operation, the resistors are in a relatively stable range, so that current can smoothly pass through the switching loop, and the stable operation of the power system is ensured. When the resistance of the switch loop is abnormally increased, loop heating and electric loss are easily caused, and equipment burning and power failure accidents can be caused when the resistance of the switch loop is seriously increased. Therefore, the accurate measurement of the switch loop resistance has important engineering significance. However, the traditional switch loop resistance measurement mostly adopts a direct current voltage drop method, but the method has obvious defects that on one hand, the change of the ambient temperature can obviously influence the conductor resistance value, the conductor resistance is increased along with the temperature rise, the traditional method does not establish an effective temperature compensation mechanism, so that the measurement results under different ambient temperatures are lack of comparability and have larger deviation, on the other hand, when the test current is large enough, the interference of the ambient factors can be effectively restrained, but the traditional method does not consider the linkage of the test current and the ambient factors, only relies on the fixed current test, and the measurement precision requirements under different scenes are difficult to consider. In view of the technical drawbacks described above, solutions are now proposed. Disclosure of Invention The invention aims to solve the problems that the traditional switch loop resistance measurement mostly adopts a direct current voltage drop method, but the method has obvious defects that on one hand, the change of the ambient temperature can obviously influence the conductor resistance value, the conductor resistance is increased along with the temperature rise, the traditional method does not establish an effective temperature compensation mechanism, so that the measurement results under different ambient temperatures are lack of comparability and have larger deviation, and on the other hand, when the test current is large enough, the interference of the environmental factors can be effectively restrained, but the traditional method does not consider the test current and the environmental factors in a linkage way, only relies on the fixed current test, and the measurement precision requirements under different scenes are difficult to consider. In order to achieve the purpose, the invention adopts the following technical scheme that the switch loop resistance testing method based on ambient temperature compensation comprises the following steps: Step one, connecting a test current lead and a voltage measurement lead to two ends of a switch loop to be tested respectively through an adjustable direct current constant current source, acquiring current and voltage data, and calculating an initial resistance value of the switch loop according to ohm's law; Collecting surrounding environment data of a switch circuit to be tested through an environment sensor array, analyzing and calculating to obtain an environment compensation index of the switch circuit, and dividing the surrounding environment influence degree of the switch circuit into high-degree influence and low-degree influence; Step three, establishing an i