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CN-121995130-A - Electronic device and test data application method of fingerprint sensing module thereof

CN121995130ACN 121995130 ACN121995130 ACN 121995130ACN-121995130-A

Abstract

The disclosure provides an electronic device and a test data application method of a fingerprint sensing module thereof. The method comprises the following steps. And recording general test data of the fingerprint sensing module. The universal test data is generated based on a test procedure performed on the fingerprint sensing module of each of the plurality of tested electronic devices. Recording special test data of the fingerprint sensing module. The dedicated test data is generated based on a test procedure performed on a fingerprint sensing module of the electronic device. When an assembly event occurs with respect to the fingerprint sensing module, application test data is selected from among dedicated test data and generic test data. The test data is used for the fingerprint sensing module to execute a fingerprint registration process or a fingerprint verification process. Therefore, the adaptability and stability of the fingerprint sensing module under different devices and assembly conditions can be enhanced.

Inventors

  • ZHENG WENDA

Assignees

  • 神盾股份有限公司

Dates

Publication Date
20260508
Application Date
20250828
Priority Date
20241103

Claims (11)

  1. 1. A method of applying test data of a fingerprint sensing module, adapted for an electronic device comprising a fingerprint sensing module, the method comprising: Recording universal test data of the fingerprint sensing module, wherein the universal test data is generated based on a test program of the fingerprint sensing module of each of a plurality of tested electronic devices; Recording dedicated test data of the fingerprint sensing module, wherein the dedicated test data is generated based on the test procedure performed on the fingerprint sensing module of the electronic device, and Selecting application test data from among the dedicated test data and the generic test data when an assembly event occurs with respect to the fingerprint sensing module; Wherein the application test data is used for the fingerprint sensing module to execute a fingerprint registration procedure or a fingerprint verification procedure.
  2. 2. The method of claim 1, wherein the step of selecting the application test data from among the dedicated test data and the generic test data when the assembly event related to the fingerprint sensing module occurs comprises: Updating the dedicated test data of the fingerprint sensing module by executing the test program with the fingerprint sensing module when the assembly event related to the fingerprint sensing module occurs, and The application test data is selected from among the updated dedicated test data and the generic test data.
  3. 3. The method of claim 1 or 2, wherein before the step of selecting the application test data from among the dedicated test data and the generic test data when the assembly event related to the fingerprint sensing module occurs, the method further comprises: acquiring the special test data of the fingerprint sensing module by using the fingerprint sensing module to execute the test program in the first assembly period of the fingerprint sensing module, and Before the assembly event related to the fingerprint sensing module occurs, the fingerprint registration procedure and the fingerprint verification procedure are performed through the fingerprint sensing module according to the dedicated test data.
  4. 4. A method of applying test data to a fingerprint sensing module according to claim 3, wherein the step of performing the fingerprint registration procedure and the fingerprint authentication procedure through the fingerprint sensing module according to the application test data comprises: the first registered fingerprint data acquired based on the application-specific test data is updated to the second registered fingerprint data acquired based on the application-specific test data.
  5. 5. The method of claim 1, wherein the step of selecting the application test data from among the dedicated test data and the generic test data when the assembly event related to the fingerprint sensing module occurs comprises: receiving user instructions via a user operation interface when the assembly event related to the fingerprint sensing module occurs, and And selecting the application test data from the special test data and the general test data according to the user instruction.
  6. 6. The method of claim 1, wherein the step of selecting the application test data from among the dedicated test data and the generic test data when the assembly event related to the fingerprint sensing module occurs comprises: Judging whether the fingerprint sensing module detects a test head within a predetermined period of time when the assembling event related to the fingerprint sensing module occurs, and And when the fingerprint sensing module does not detect the test head within the preset time period, selecting the universal test data as the application test data.
  7. 7. The method of claim 6, wherein selecting the application test data from among the dedicated test data and the generic test data when the assembly event related to the fingerprint sensing module occurs further comprises: when the fingerprint sensing module detects the test head within the preset time period, the special test data of the fingerprint sensing module is updated by using the fingerprint sensing module to execute the test program, and The updated dedicated test data is selected as the application test data.
  8. 8. The method of claim 1, wherein the universal test data is a statistical result of test data of fingerprint sensing modules of the plurality of tested electronic devices.
  9. 9. The method of claim 1, wherein the step of executing the fingerprint registration program and the fingerprint verification program through the fingerprint sensing module according to the application test data comprises: determining fingerprint image processing parameters based on the application test data, and And executing the fingerprint registration program and the fingerprint verification program based on the fingerprint image processing parameters through the fingerprint sensing module.
  10. 10. The method of claim 9, wherein the step of executing the fingerprint registration program and the fingerprint verification program through the fingerprint sensing module according to the application test data comprises: determining a threshold parameter for the fingerprint registration procedure or the fingerprint verification procedure as a first value when the application test data is the dedicated test data, and When the application test data is the universal test data, determining the threshold parameter for the fingerprint registration procedure or the fingerprint verification procedure as a second value.
  11. 11. An electronic device, comprising: A storage device; fingerprint sensing module, and A processor connecting the storage device and the fingerprint sensing module configured to: Recording universal test data of the fingerprint sensing module, wherein the universal test data is generated based on a test program of the fingerprint sensing module of each of a plurality of tested electronic devices; is generated based on the test procedure performed on the fingerprint sensing module of the electronic device, and When an assembly event occurs with respect to the fingerprint sensing module, application test data is selected from among the dedicated test data and the generic test data, Wherein the application test data is used for the fingerprint sensing module to execute a fingerprint registration procedure or a fingerprint verification procedure.

Description

Electronic device and test data application method of fingerprint sensing module thereof Technical Field The disclosure relates to a method for testing a fingerprint sensing module, and more particularly to an electronic device and a method for applying test data of the fingerprint sensing module. Background In recent years, fingerprint identification technology is widely applied to various electronic devices to provide a high-security identity verification function. At present, when the fingerprint sensing module is assembled to the electronic device, the fingerprint sensing module is required to be tested through a plurality of test heads so as to obtain corresponding test data. The test data is typically used to confirm the quality of the fingerprint sensing module and to establish corresponding fingerprint background data or to perform assembly calibration based thereon. However, in the current practice, different test heads need to be repeatedly switched to complete multiple tests, and the test process is tedious and time-consuming. Furthermore, when the fingerprint sensing module is reassembled to the electronic device for device repair or replacement, the repair site may not be equipped with a dedicated test head or the repair personnel may lack the ability to perform the complete test procedure. In this case, fingerprint background data cannot be reconstructed correctly, which results in reduced fingerprint identification accuracy, and thus affects overall user experience and system security. Disclosure of Invention The present disclosure provides an electronic device and a method for applying test data of a fingerprint sensing module thereof, which can effectively solve the above-mentioned problems. The embodiment of the disclosure provides a test data application method of a fingerprint sensing module, which is suitable for an electronic device comprising the fingerprint sensing module and comprises the following steps. And recording general test data of the fingerprint sensing module. The universal test data is generated based on a test procedure performed on the fingerprint sensing module of each of the plurality of tested electronic devices. Recording special test data of the fingerprint sensing module. The dedicated test data is generated based on a test procedure performed on a fingerprint sensing module of the electronic device. When an assembly event occurs with respect to the fingerprint sensing module, application test data is selected from among dedicated test data and generic test data. The test data is used for the fingerprint sensing module to execute a fingerprint registration process or a fingerprint verification process. An embodiment of the disclosure provides an electronic device, which includes a storage device, a fingerprint sensing module, and a processor. The processor is connected with the storage device and the fingerprint sensing module and is configured to execute the following operations. And recording general test data of the fingerprint sensing module. The universal test data is generated based on a test procedure performed on the fingerprint sensing module of each of the plurality of tested electronic devices. Recording special test data of the fingerprint sensing module. The dedicated test data is generated based on a test procedure performed on a fingerprint sensing module of the electronic device. When an assembly event occurs with respect to the fingerprint sensing module, application test data is selected from among dedicated test data and generic test data. The test data is used for the fingerprint sensing module to execute a fingerprint registration process or a fingerprint verification process. Based on the above, in the embodiments of the disclosure, the general test data and the specific test data of the fingerprint sensing module are recorded in the electronic device. The universal test data is generated based on test data of a plurality of tested electronic devices. The special test data is test data obtained by the electronic device executing the test program. When the assembly event related to the fingerprint sensing module occurs, application test data can be flexibly selected from the special test data and the general test data according to actual situation requirements, and a fingerprint registration program and a fingerprint verification program are executed according to the application test data. Therefore, stable fingerprint identification efficiency can be maintained under the condition of lacking a complete test environment or test equipment, and the usability and system stability of the fingerprint sensing module after installation are ensured. In addition, the adaptability and stability of the fingerprint sensing module under different devices and assembly conditions can be enhanced. Drawings FIG. 1 is a block diagram of an electronic device according to an embodiment of the disclosure; FIG. 2 is a flowchart of a method for applying test data o