CN-121995135-A - Method, device, equipment, system and storage medium for testing electronic device

CN121995135ACN 121995135 ACN121995135 ACN 121995135ACN-121995135-A

Abstract

The application provides a method, a device, equipment, a system and a storage medium for testing an electronic device. The method comprises the steps of obtaining a test requirement of a target device, wherein the test requirement comprises an identification of the target device or an identification of a workstation to which the target device belongs, obtaining corresponding target test cases from a case storage platform pre-storing a plurality of different device test cases, obtaining corresponding target test parameters from a parameter storage platform pre-storing a plurality of different device test parameters, generating a target test task according to the target test cases and the target test parameters, and executing a test on the target device. The method can reduce the independent development of special test programs for electronic devices with different models and versions, realize the multiplexing of test cases and test parameters through the centralized resource management platform, quickly adapt product iteration, reduce development and maintenance cost, obviously improve the overall test efficiency of the electronic devices, and meet the requirements of large-scale production and multi-model quick adaptation.

Inventors

WU WEI
LI DAN
LI BEI
YAN QIAN
SHU ZHAOQIANG

Assignees

深圳市卓驭科技有限公司

Dates

Publication Date: 20260508
Application Date: 20260105

Claims (10)

1. A method of testing an electronic device, applied to a test apparatus, the method comprising: Acquiring a test requirement of a target device, wherein the test requirement comprises an identifier of the target device or an identifier of a workstation to which the target device belongs; obtaining a target test case corresponding to the test requirement from a case storage platform, wherein the case storage platform stores test cases of a plurality of different devices; Obtaining target test parameters corresponding to the test requirements from a parameter storage platform, wherein the parameter storage platform stores test parameters of a plurality of different devices; generating a target test task according to the target test case and the target test parameters; And testing the target device according to the target test task.
2. The method of claim 1, wherein the number of target test cases is a plurality, and the generating a target test task according to the target test cases and the target test parameters comprises: assembling a plurality of target test cases according to a preset service execution sequence to obtain a target test sleeve; and filling the values of the target test parameters into the corresponding parameters in the target test sleeve to generate the target test task.
3. The method according to claim 1 or 2, wherein if the number of target devices is at least one, the testing the target devices according to the target test task includes: loading the target test tasks to the corresponding executors of each target device respectively; And responding to the start test operation of any target device, controlling an actuator corresponding to the target device to execute a target test task, and testing the target device.
4. A method according to claim 3, characterized in that the method further comprises: Obtaining test data, wherein the test data comprises a test result of the at least one target device; converting the format of the test data into a preset structure through a standardized data interface to obtain standardized test data after format conversion; and synchronizing the standardized test data to an external system for storage, wherein the external system comprises at least one of a production execution system, a local database and a remote cloud storage.
5. The method according to claim 1 or 2, characterized in that the method further comprises: In the process of testing the target device according to the target test task, accessing a plurality of test infrastructures required by the target test task through a device control abstract interface, and coordinating the plurality of test infrastructures through a resource manager.
6. The method according to claim 1 or 2, characterized in that the method further comprises: monitoring the execution state of the target test task in the process of testing the target device according to the target test task; when the execution state is abnormal execution, triggering an abnormal alarm and recording an abnormal log.
7. A test apparatus for an electronic device, the apparatus comprising: the basic building layer is used for realizing the drive encapsulation of the bottom hardware equipment and providing a hardware interface for the field layer; The field layer is used for carrying out functional encapsulation aiming at the service requirements of different target devices based on the hardware interface provided by the foundation layer, generating a reusable service function module and providing a callable service interface for the export layer; The export layer is used for collecting the service interfaces provided by the domain layer, generating a function set and providing a calling entry for the application layer and the framework layer; The application layer is used for carrying out classification management on the target test cases and realizing the service logic of the specific test cases based on the call entry provided by the export layer; A frame layer for performing the method of testing an electronic device according to any one of claims 1 to 6.
8. A test device is characterized by comprising a memory and a processor; The memory stores computer-executable instructions; the processor executing computer-executable instructions stored in the memory, causing the processor to perform the method of testing an electronic device as claimed in any one of claims 1-6.
9. A test system for electronic devices is characterized by comprising a cloud test resource management center and the test equipment of claim 8, The cloud test resource management center comprises a use case storage platform and a parameter storage platform, wherein test cases of a plurality of different devices are stored in the use case storage platform, and test parameters of the plurality of different devices are stored in the parameter storage platform.
10. A computer readable storage medium, characterized in that the computer readable storage medium has stored therein computer executable instructions which, when executed by a processor, are adapted to carry out a method of testing an electronic device according to any of claims 1-6.

Description

Method, device, equipment, system and storage medium for testing electronic device Technical Field The present application relates to the field of product testing technologies, and in particular, to a method, an apparatus, a device, a system, and a storage medium for testing an electronic device. Background Under the rapid development background of intelligent driving technology, electronic devices such as cameras, inertial measurement units, laser radars, domain controllers and the like have become key components for manufacturing the whole vehicle, and higher requirements are put on the quality and efficiency of production test of the electronic devices. To ensure stability, accuracy and consistency of the product before shipping, manufacturing enterprises often need to perform production testing on the electronic devices. In the related art, it is generally necessary to develop a dedicated test program for any one of electronic devices and configure dedicated test parameters and test cases to test the device. However, with the rapid iteration of the intelligent driving technology, the product types are continuously abundant, and the update period of products with different models and different functional versions is continuously shortened. Disclosure of Invention The application provides a method, a device, equipment, a system and a storage medium for testing an electronic device, which are used for improving the overall test efficiency of the electronic device. In a first aspect, the present application provides a method for testing an electronic device, applied to a testing apparatus, the method comprising: Acquiring a test requirement of a target device, wherein the test requirement comprises an identifier of the target device or an identifier of a workstation to which the target device belongs; obtaining a target test case corresponding to the test requirement from a case storage platform, wherein the case storage platform stores test cases of a plurality of different devices; Obtaining target test parameters corresponding to the test requirements from a parameter storage platform, wherein the parameter storage platform stores test parameters of a plurality of different devices; generating a target test task according to the target test case and the target test parameters; And testing the target device according to the target test task. In one possible implementation manner, the number of the target test cases is a plurality, and the generating a target test task according to the target test cases and the target test parameters includes: assembling a plurality of target test cases according to a preset service execution sequence to obtain a target test sleeve; and filling the values of the target test parameters into the corresponding parameters in the target test sleeve to generate the target test task. In one possible implementation manner, if the number of the target devices is at least one, the testing the target devices according to the target test task includes: loading the target test tasks to the corresponding executors of each target device respectively; And responding to the start test operation of any target device, controlling an actuator corresponding to the target device to execute a target test task, and testing the target device. In one possible embodiment, the method further comprises: Obtaining test data, wherein the test data comprises a test result of the at least one target device; converting the format of the test data into a preset structure through a standardized data interface to obtain standardized test data after format conversion; and synchronizing the standardized test data to an external system for storage, wherein the external system comprises at least one of a production execution system, a local database and a remote cloud storage. In one possible embodiment, the method further comprises: In the process of testing the target device according to the target test task, accessing a plurality of test infrastructures required by the target test task through a device control abstract interface, and coordinating the plurality of test infrastructures through a resource manager. In one possible embodiment, the method further comprises: monitoring the execution state of the target test task in the process of testing the target device according to the target test task; when the execution state is abnormal execution, triggering an abnormal alarm and recording an abnormal log. In a second aspect, the present application provides a test apparatus for an electronic device, the apparatus comprising: the basic building layer is used for realizing the drive encapsulation of the bottom hardware equipment and providing a hardware interface for the field layer; The field layer is used for carrying out functional encapsulation aiming at the service requirements of different target devices based on the hardware interface provided by the foundation layer, generating a reusable service functio