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CN-121995192-A - HDMI test system, method and test equipment

CN121995192ACN 121995192 ACN121995192 ACN 121995192ACN-121995192-A

Abstract

The application relates to the technical field of electronics and discloses an HDMI test system, a method and test equipment, wherein when each first pin outputs first voltage, each first connection circuit is disconnected, so that when a control unit detects that the pin voltage of any second pin is smaller than or equal to an open circuit voltage threshold value, the open circuit abnormality of the equipment to be tested is determined, or when the ith first pin of the control unit outputs second voltage and the rest first pins output first voltage, the first connection circuit connected with the ith first pin and the second connection circuit connected with the ith second pin are conducted, so that when the control unit detects that the pin voltage of any second pin except the ith second pin is larger than a first short circuit voltage, or the pin voltage of the ith second pin is smaller than a second short circuit voltage, the equipment to be tested is determined to have short circuit abnormality.

Inventors

  • Hong Wentu

Assignees

  • 广州视源睿创电子科技有限公司
  • 广州视源电子科技股份有限公司

Dates

Publication Date
20260508
Application Date
20241105

Claims (12)

  1. 1. An HDMI test system is characterized by comprising a control unit and a line coupling unit, wherein the control unit comprises a plurality of first pins and second pins; The circuit coupling unit comprises a first connecting circuit and a second connecting circuit, each first pin corresponds to one first connecting circuit, the first connecting circuit is used for connecting the first pin with a first HDMI port of equipment to be tested, each second pin corresponds to one second connecting circuit, and the second connecting circuit is used for connecting the second pin with the first HDMI port; The control unit is connected with the line coupling unit and is used for outputting a first voltage or a second voltage to the line coupling unit and detecting the pin voltage of the second pin so as to determine whether the equipment to be tested has open circuit abnormality or short circuit abnormality; The line coupling unit is connected with the control unit and the first HDMI port and is used for: When each first pin outputs a first voltage, disconnecting each first connection circuit and conducting each second connection circuit, so that the control unit determines that the equipment to be tested has an open circuit abnormality when detecting that the pin voltage of any one second pin is smaller than or equal to an open circuit voltage threshold value; Or when the ith first pin of the control unit outputs a second voltage and the rest of the first pins output the first voltage, the first connection circuit connected with the ith first pin and the second connection circuit connected with the ith second pin are conducted, so that the control unit determines that the equipment to be tested has short circuit abnormality when detecting that the pin voltage of any one of the second pins except the ith second pin is larger than a first short circuit voltage or the pin voltage of the ith second pin is smaller than a second short circuit voltage; wherein the first short circuit voltage is greater than the second short circuit voltage.
  2. 2. The system of claim 1, wherein the system further comprises a controller configured to control the controller, The system further comprises a second HDMI port, and the line coupling unit is connected with the first HDMI port through the second HDMI port; the control unit comprises a voltage output unit which is used for outputting a first voltage or a second voltage to the line coupling unit; The first pin is any positive pin or negative pin of a zeroth channel pin, a first channel pin, a second channel pin or a clock signal pin of the voltage output unit, wherein the zeroth channel pin, the first channel pin, the second channel pin and the clock signal pin respectively comprise a positive pin and a negative pin; the line coupling unit comprises a first diode and a second diode; the positive pin of the voltage output unit is connected with the anode of a first diode, and the cathode of the first diode is connected with the positive pin of a second HDMI port; the negative pin of the voltage output unit is connected with the anode of a second diode, and the cathode of the second diode is connected with the negative pin of a second HDMI port; The first connection circuit includes a circuit between a positive pin of the voltage output unit and a positive pin of the second HDMI port, or a circuit between a negative pin of the voltage output unit and a negative pin of the second HDMI port.
  3. 3. The system of claim 2, wherein the system further comprises a controller configured to control the controller, The control unit further comprises a voltage acquisition unit, wherein the voltage acquisition unit is used for detecting the pin voltage of each second pin; The second pin is any positive pin or negative pin in a zeroth channel pin, a first channel pin, a second channel pin or a clock signal pin of the voltage acquisition unit; the line coupling unit further comprises a third diode and a fourth diode; The positive pin of the voltage acquisition unit is connected with the cathode of a third diode, and the anode of the third diode is connected with the positive pin of the second HDMI port; The negative pin of the voltage acquisition unit is connected with the cathode of a fourth diode, and the anode of the fourth diode is connected with the negative pin of the second HDMI port; The second connection circuit comprises a circuit between a positive pin of the voltage acquisition unit and a positive pin of the second HDMI port, or a circuit between a negative pin of the voltage acquisition unit and a negative pin of the second HDMI port.
  4. 4. The system of claim 3, wherein the voltage output unit further comprises a third pin comprising a consumer electronics control pin, an audio return channel pin, a clock line pin, a data line pin, or a hot plug detect pin; When the HDMI test system is used for carrying out open circuit detection on the device to be tested: the power pin of the control unit is connected with the power pin of the first HDMI port, and the control unit is further used for providing a third voltage for the equipment to be tested so as to enable the equipment to be tested to be in a power-on state, wherein the third voltage is larger than the first voltage, and the third voltage is larger than the second voltage; The voltage output unit is used for controlling each first pin and each third pin to output first voltage; The voltage acquisition unit is used for detecting the pin voltage of each second pin; The control unit is further used for determining that the circuit of the device to be tested is normal when the pin voltage of each second pin is larger than the open circuit voltage threshold value.
  5. 5. The system of claim 3, wherein the voltage acquisition unit further comprises a fourth pin comprising a consumer electronics control pin, an audio return channel pin, a clock line pin, a data line pin, or a hot plug detect pin; when the HDMI test system is used for short circuit detection of the device to be tested: the voltage output unit is used for sequentially executing a first step on each voltage output pin of the voltage output unit, wherein the voltage output pins comprise a first pin or a third pin; controlling an ith voltage output pin to output a second voltage and other voltage output pins to output a first voltage, wherein the ith voltage output pin is a voltage output pin for executing the first step currently; the voltage acquisition unit is used for detecting the pin voltage of each voltage acquisition pin, wherein the voltage acquisition pins comprise a second pin or a fourth pin, and an ith voltage acquisition pin and an ith voltage output pin are connected with the same pin of the second HDMI port; the control unit is further configured to: Determining that the equipment to be tested has a short-circuit abnormality when the pin voltage of any one of the voltage acquisition pins except the ith voltage acquisition pin is larger than the first short-circuit voltage or the pin voltage of the ith voltage acquisition pin is smaller than the second short-circuit voltage; after the first step is executed each time, when the pin voltage detected by the voltage acquisition unit meets a first condition, determining that the circuit of the equipment to be tested is normal; the first condition comprises that the pin voltage of any voltage acquisition pin except the ith voltage acquisition pin is smaller than or equal to a first short circuit voltage, and the pin voltage of the ith voltage acquisition pin is larger than or equal to a second short circuit voltage.
  6. 6. The system of any of claims 2-5, wherein the first HDMI port is an HDMI female socket and the second HDMI port is an HDMI male socket.
  7. 7. A test apparatus, comprising: the HDMI test system of any one of claims 1-6.
  8. 8. An HDMI test method applied to the HDMI test system of any one of claims 1 to 6, said method comprising: after the first HDMI port is inserted into the system, short circuit detection is carried out on the equipment to be tested, so that whether the circuit of the equipment to be tested is normal or not is determined; And when the short circuit detection result is that the circuit is normal, carrying out open circuit detection on the equipment to be tested so as to determine whether the equipment to be tested has open circuit abnormality or not.
  9. 9. The method of claim 8, wherein the control unit comprises a voltage acquisition unit and a voltage output unit, the voltage output unit comprising a plurality of voltage output pins, the voltage acquisition unit comprising a plurality of voltage acquisition pins; the voltage output pin comprises a first pin or a third pin, and the voltage acquisition pin comprises a second pin or a fourth pin; the first pin is any positive pin or negative pin in a zeroth channel pin, a first channel pin, a second channel pin or a clock signal pin of the voltage output unit; the third pin comprises a consumer electronics control pin, an audio return channel pin, a clock line pin, a data line pin or a hot plug detection pin; The second pin is any positive pin or negative pin in a zeroth channel pin, a first channel pin, a second channel pin or a clock signal pin of the voltage acquisition unit; the fourth pin includes a consumer electronics control pin, an audio return channel pin, a clock line pin, a data line pin, or a hot plug detect pin.
  10. 10. The method of claim 9, wherein the short-circuit detection of the device under test comprises: Sequentially executing a cyclic collection step on each voltage output pin; In any cycle acquisition step, when the pin voltage of any one voltage acquisition pin except the ith voltage acquisition pin is larger than the first short-circuit voltage, determining that a circuit corresponding to the voltage acquisition pin with the pin voltage larger than the first short-circuit voltage is short-circuited with the ith pin of the first HDMI port, and stopping executing the cycle acquisition step; Or in any cycle acquisition step, when the pin voltage of the ith voltage acquisition pin is smaller than the second short circuit voltage, determining that the ith pin of the first HDMI port is short-circuited to ground, and stopping executing the cycle acquisition step; in any one of the cyclic collection steps, when the detected pin voltage meets a first condition, executing the cyclic collection step on the next voltage output pin until the cyclic collection step is completed on each voltage output pin, and determining that the circuit of the equipment to be tested is normal when the pin voltage detected in each cyclic collection step meets the first condition; wherein, the cyclic collection step includes: controlling the ith voltage output pin to output a second voltage, and the rest voltage output pins to output a first voltage; the pin voltage of each voltage acquisition pin is acquired in sequence; when the pin voltage of any voltage acquisition pin except the ith voltage acquisition pin is smaller than or equal to the first short circuit voltage and the pin voltage of the ith voltage acquisition pin is larger than or equal to the second short circuit voltage, controlling the ith voltage output pin to output the first voltage; the first condition comprises that the pin voltage of any voltage acquisition pin except the ith voltage acquisition pin is smaller than or equal to a first short circuit voltage, and the pin voltage of the ith voltage acquisition pin is larger than or equal to a second short circuit voltage.
  11. 11. The method of claim 9, wherein the open circuit detection of the device under test comprises: Controlling each voltage output pin to output a first voltage; collecting the pin voltage of each second pin; when the pin voltage of each second pin is larger than the open circuit voltage threshold value, determining that the circuit of the equipment to be tested is normal; And when the pin voltage of any one second pin is smaller than or equal to the open-circuit voltage threshold value, determining that the equipment to be tested has open-circuit abnormality.
  12. 12. A test apparatus, comprising: at least one processor, and A memory communicatively coupled to the at least one processor, wherein, The memory stores instructions executable by the at least one processor to enable the at least one processor to perform the method of any one of claims 8-11.

Description

HDMI test system, method and test equipment Technical Field The embodiment of the application relates to the technical field of electronics, in particular to an HDMI test system, an HDMI test method and HDMI test equipment. Background The high definition multimedia interface (High Definition Multimedia Interface, HDMI) is a high definition digitized video and audio interface for transmitting video or audio signals. When the HDMI circuit has an open circuit or a short circuit, the definition of the transmitted video or audio signal is reduced, and the device is damaged in severe cases. Therefore, to ensure the quality of the product, the HDMI circuit of the product needs to be subjected to an open circuit test and a short circuit test. The conventional scheme generally adopts an indirect test method to perform open circuit test or short circuit test on the HDMI circuit. For example, by detecting the quality of the video or audio signal output from the HDMI circuit, it is determined whether the HDMI circuit has an open circuit or a short circuit problem. In the process of realizing the application, the inventor finds that at least the following problems exist in the prior art, namely, because of the difference of HDMI circuit structures of different products, a tester needs to change testing requirements, testing channels and testing parameters according to specific HDMI circuit configuration, the operation complexity is increased, and the testing efficiency is low. Disclosure of Invention The embodiment of the application provides an HDMI test system, an HDMI test method and HDMI test equipment, which can be used for detecting open circuits and short circuits of HDMI circuits of different products through one test system, and improving universality and test efficiency of the test system. The embodiment of the application provides the following technical scheme: In a first aspect, an embodiment of the present application provides an HDMI test system, where the HDMI test system includes a control unit and a line coupling unit, the control unit includes a plurality of first pins and second pins; The circuit coupling unit comprises a first connecting circuit and a second connecting circuit, wherein each first pin corresponds to one first connecting circuit, the first connecting circuit is used for connecting the first pin with a first HDMI port of the equipment to be tested, each second pin corresponds to one second connecting circuit, and the second connecting circuit is used for connecting the second pin with the first HDMI port; The control unit is connected with the line coupling unit and is used for outputting a first voltage or a second voltage to the line coupling unit and detecting the pin voltage of the second pin so as to determine whether the equipment to be tested has open-circuit abnormality or short-circuit abnormality; The line coupling unit is used for connecting the control unit with the first HDMI port and is used for: when each first pin outputs a first voltage, each first connection circuit is disconnected, and each second connection circuit is conducted, so that when the control unit detects that the pin voltage of any second pin is smaller than or equal to an open circuit voltage threshold value, the control unit determines that open circuit abnormality occurs in the equipment to be tested; Or when the ith first pin of the control unit outputs the second voltage and the rest first pins output the first voltage, the first connecting circuit connected with the ith first pin and the second connecting circuit connected with the ith second pin are conducted, so that the control unit determines that the equipment to be tested has short circuit abnormality when detecting that the pin voltage of any one of the second pins except the ith second pin is larger than the first short circuit voltage or the pin voltage of the ith second pin is smaller than the second short circuit voltage; Wherein the first short circuit voltage is greater than the second short circuit voltage. In a second aspect, an embodiment of the present application provides a test apparatus, including: The HDMI test system of the first aspect. In a third aspect, an embodiment of the present application provides an HDMI test method, which is applied to the HDMI test system of the first aspect, the HDMI test method including: after the first HDMI port is inserted into the system, short circuit detection is carried out on the equipment to be tested, so that whether the circuit of the equipment to be tested is normal or not is determined; And when the short circuit detection result is that the circuit is normal, carrying out open circuit detection on the equipment to be tested so as to determine whether the equipment to be tested has open circuit abnormality or not. In a fourth aspect, an embodiment of the present application provides a test apparatus, including: At least one processor, and A memory communicatively coupled to the at lea