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CN-121995193-A - Jig plate for testing integrated circuit carrier plate, testing system and positioning rod

CN121995193ACN 121995193 ACN121995193 ACN 121995193ACN-121995193-A

Abstract

The invention relates to a jig tray for testing an integrated circuit carrier plate, which comprises a base capable of defining the axial direction of length, width and height, and two positioning rods axially extending along the length and arranged on the base, wherein at least one positioning rod can axially slide relative to the base along the width to adapt to the width of the carrier plate and can be fixed on the base so that the carrier plate is clamped by the two positioning rods, the positioning rods comprise a main step downwards formed from the edge of the top surface of the main step, the main step comprises a clamping surface and a bearing surface, the clamping surfaces of the two positioning rods face each other and at least one of the clamping surfaces is formed by an elastic buffer material, the carrier plate is clamped by the clamping surface and is supported on the bearing surface by a non-test contact area of the lower surface of the carrier plate, and a gap is reserved between the test contact area and the base.

Inventors

  • LUO YAHONG
  • CAI SHOUREN
  • TANG FUJUN

Assignees

  • 旺矽科技股份有限公司

Dates

Publication Date
20260508
Application Date
20251030
Priority Date
20250912

Claims (17)

  1. 1. The jig tray is used for clamping a carrier plate, the carrier plate comprises an upper surface and a lower surface, the lower surface comprises a test contact area and a non-test contact area, and the jig tray is characterized by comprising: A base capable of defining a longitudinal axis, a width axis and a height axis perpendicular to each other, and The two positioning rods are axially arranged on the base in an extending manner along the length, at least one of the two positioning rods is a slidable positioning rod, the slidable positioning rod can be switched between a slidable state and a fixed state, the slidable positioning rod can axially slide along the width relative to the base when in the slidable state so as to adapt to the width of the carrier plate, and the slidable positioning rod is fixed on the base when in the fixed state so as to enable the carrier plate to be clamped and fixed by the two positioning rods; Wherein each of the positioning rods includes a top surface and a bottom surface facing the height axial direction respectively, and a main step formed in a stepped shape downward from an edge of the top surface, the main step including a clamping surface adjacent to the top surface, and a bearing surface adjacent to the clamping surface, the clamping surfaces of the main steps of the two positioning rods facing each other and at least one of which is formed of an elastic buffer material, whereby the two positioning rods are configured such that the clamping surfaces of the main steps of the two positioning rods are operable to commonly clamp the carrier plate, and the bearing surfaces of the main steps of the two positioning rods are operable to commonly support the non-test contact region of the lower surface of the carrier plate with a gap between the test contact region extending axially along the length and located on the lower surface of the carrier plate and the base.
  2. 2. The jig tray for integrated circuit carrier testing of claim 1, wherein: Each positioning rod further comprises a step-shaped auxiliary step downwards formed from the bearing surface of the main step, the auxiliary step comprises an upward bearing surface, in the axial direction of the height, the bearing surface of the main step is positioned between the top surface of the positioning rod and the bearing surface of the auxiliary step, the bearing surface of the auxiliary step is positioned between the bearing surface of the main step and the bottom surface of the positioning rod, a first height can be defined between the top surface of the positioning rod and the bearing surface of the main step, a second height can be defined between the bearing surface of the main step and the bearing surface of the auxiliary step, a third height can be defined between the bearing surface of the auxiliary step and the bottom surface of the positioning rod, and the third height is greater than or equal to twice the sum of the first height and the second height.
  3. 3. The jig tray for integrated circuit carrier testing of claim 2, wherein in the width axis, the primary step has a first width and the secondary step has a second width, the second width being greater than or equal to three times the first width.
  4. 4. The fixture disk for integrated circuit carrier testing of claim 2, wherein the first height is less than or equal to a thickness of the carrier.
  5. 5. The jig tray for testing the integrated circuit carrier board of claim 1, wherein the base comprises a body and two width axial guides, the two width axial guides are arranged on the body at a distance apart and extend along the width axial direction, the slidable positioning rod comprises a first end and a second end, the first end and the second end are respectively arranged on the two width axial guides, and the slidable positioning rod slides along the width axial direction through the guidance of the two width axial guides when in the slidable state.
  6. 6. The jig tray for testing integrated circuit carrier boards of claim 5, wherein each of the width axial guides comprises a guide groove extending along the width axial direction, the guide groove comprises a guide part and a receiving part, the first end part and the second end part of the slidable positioning rod are respectively provided with a through hole, the first end part and the second end part are respectively provided with a bolt penetrating through the through hole, and a nut screwed to the bolt, the bolt penetrates through the guide part of the guide groove, and the nut is arranged in the receiving part of the guide groove and can be mutually locked with the bolt so that the slidable positioning rod is fixed on the width axial guide.
  7. 7. The jig tray for testing integrated circuit carrier boards of claim 1, wherein when the carrier board is clamped and fixed by the two positioning rods, the upper surface of the carrier board is flush with or higher than the top surfaces of the two positioning rods.
  8. 8. The jig tray for testing integrated circuit carrier boards of claim 1, wherein each of the positioning bars comprises a first end, a second end, and a stop portion connected to the first end for stopping the carrier board by the stop portions of the two positioning bars, and further comprising a length axial positioning member disposed between the two positioning bars, the length axial positioning member being capable of axially adjusting a position along the length for abutting the carrier board between the first end and the second end of the two positioning bars.
  9. 9. The jig tray for testing the integrated circuit carrier board of claim 8, further comprising a length axial guide member disposed between the two positioning rods, wherein the length axial guide member comprises a guide groove extending along the length axial direction, wherein the guide groove comprises a guide portion and a receiving portion, wherein the length axial guide member comprises a bolt, and wherein the bolt passes through the guide portion of the guide groove, and wherein the nut is disposed in the receiving portion of the guide groove and is capable of being mutually locked with the bolt to be fixed to the length axial guide member.
  10. 10. The jig tray for testing integrated circuit carrier boards of claim 1, wherein at least one of said two positioning bars comprises another one of said main steps stepped down from another edge of said top surface, and at least one of the clamping surfaces of said two main steps comprised by said positioning bar is formed of said elastic buffer material.
  11. 11. A test system for testing an integrated circuit carrier board is characterized in that the test system comprises: A carrying platform; the jig tray of claim 1, disposed on the carrier for holding the carrier, and The probe device comprises a probe seat and a probe arranged on the probe seat and used for testing the carrier plate clamped by the jig plate.
  12. 12. The test system for integrated circuit carrier testing of claim 11, wherein: The positioning rods of the jig plate further comprise auxiliary steps which are downwards formed in a step shape from the bearing surfaces of the main steps, the auxiliary steps comprise bearing surfaces facing upwards, the bearing surfaces of the main steps are located between the top surfaces of the positioning rods and the bearing surfaces of the auxiliary steps in the height axial direction, and the height defined between the top surfaces of the positioning rods and the bearing surfaces of the main steps along the height axial direction is smaller than or equal to the thickness of the carrier plate.
  13. 13. The test system for integrated circuit carrier testing of claim 11, wherein: The vertical distance between the tip of the probe and the bottom surface of the probe seat can be defined along the height axial direction, and the height defined along the height axial direction between the top surface of each positioning rod and the bearing surface of the main step is less than half of the vertical distance.
  14. 14. A locating lever for integrated circuit carrier board test can define mutually perpendicular's length axial, width axial and height axial, the locating lever is followed length axial extension is rectangular, its characterized in that: the positioning rod comprises a top surface and a bottom surface which face two opposite directions of the height axial direction respectively, and two main steps which are formed in a step shape downwards from two opposite edges of the top surface respectively, wherein each main step comprises a clamping surface adjacent to the top surface and a bearing surface adjacent to the clamping surface, the clamping surface of each main step is used for clamping the carrier plate together with the other positioning rod, and at least one of the clamping surfaces of the two main steps is formed by an elastic buffer material.
  15. 15. The locating lever for integrated circuit carrier testing of claim 14, wherein: The positioning rod further comprises two auxiliary steps which are downwards formed from the bearing surfaces of the two main steps respectively, each auxiliary step comprises an upward bearing surface, in the height axial direction, the bearing surface of each main step is positioned between the top surface of the positioning rod and the bearing surface of each auxiliary step, the bearing surface of each auxiliary step is positioned between the bearing surface of each main step and the bottom surface of the positioning rod, a first height can be defined between the top surface of the positioning rod and the bearing surface of each main step, a second height can be defined between the bearing surface of each main step and the bearing surface of each auxiliary step, and a third height can be defined between the bearing surface of each auxiliary step and the bottom surface of the positioning rod, and the third height is more than or equal to twice of the sum of the first height and the second height.
  16. 16. The locating lever for integrated circuit carrier testing of claim 15, wherein: In the width axial direction, each of the main steps has a first width, and each of the sub steps has a second width that is greater than or equal to three times the first width.
  17. 17. The locating lever for integrated circuit carrier testing of claim 15, wherein: The first height is less than or equal to the thickness of the carrier plate.

Description

Jig plate for testing integrated circuit carrier plate, testing system and positioning rod Technical Field The present invention relates to testing of integrated circuit (INTEGRATED CIRCUIT; abbreviated as IC) carrier boards, and more particularly, to a jig tray, a testing system and a positioning rod for testing of integrated circuit carrier boards. Background The IC carrier board is a key part in the packaging process, and has the main functions of being used as a carrier for carrying the IC and being arranged on a printed circuit board (printed circuit board; PCB for short), and the internal circuit of the IC carrier board is electrically connected between the IC and the PCB, so that signals are transmitted between the IC and the PCB, and the IC carrier board has the functions of protecting the circuit, fixing the circuit, guiding and dispersing waste heat and the like. Before the IC is mounted on the IC carrier, the IC carrier needs to be tested to confirm whether the internal circuit of the IC carrier is good or bad, so how to fix the IC carrier, especially how to fix the IC carrier with different sizes or fix multiple IC carriers at the same time, so as to facilitate handling and testing to improve the flexibility of testing, which is a problem to be solved by the industry. Disclosure of Invention One aspect of the present invention is to provide a jig tray for testing integrated circuit carrier boards, which can adapt and fix multiple sizes of IC carrier boards and/or multiple IC carrier boards to improve the testing flexibility. To this end, one aspect of the invention provides a jig tray for testing an integrated circuit carrier, adapted to hold a carrier, the carrier comprising an upper surface and a lower surface, the lower surface comprising a test contact area and a non-test contact area, the jig tray comprising a base defining a length axis, a width axis and a height axis perpendicular to each other, and two positioning rods extending axially along the length axis and disposed on the base, at least one of the two positioning rods being a slidable positioning rod, the slidable positioning rod being capable of shifting between a slidable state and a fixed state, the slidable positioning rod being capable of axially sliding along the width with respect to the base in the slidable state to adapt to the width of the carrier, the slidable positioning rod being fixed to the base in the fixed state to clamp the carrier by the two positioning rods, wherein each positioning rod comprises a top surface facing the height axis and a step-like surface, respectively, the two positioning rods being formed from the top surface and the bottom surface and the step-like surface, the two main surfaces being adjacent to the two main surfaces being formed by the two main surfaces, the two main surfaces being in contact with each other, the two main surfaces being in contact surface contact with the two main surfaces being formed with the same, the main surface being in contact surface being in the shape, and a gap is formed between the two positioning rods, the gap extends along the length axial direction and is positioned between the test contact area of the lower surface of the carrier plate and the base. Therefore, the two positioning rods can be both slidable positioning rods, or only one of the two positioning rods is the slidable positioning rod, and the other positioning rod is fixed on the base and cannot slide. The relative positions of the two positioning rods can be adjusted by axially sliding the two positioning rods along the width relative to the base in the sliding state, so that the distance between the clamping surfaces of the main steps of the two positioning rods is changed to adapt to the width of the carrier plate to be clamped, and the sliding positioning rods are converted into the fixed state when the adjustment is completed, so that the positions of the sliding positioning rods can be fixed, and the carrier plate is firmly fixed on the jig plate to facilitate the subsequent test. In other words, the jig tray of the invention can clamp carrier plates with different sizes by adjusting the distance between the two positioning rods, and a plurality of carrier plates with the same size can be aligned on the main steps of the two positioning rods along the length direction without electric interference. Even if the carrier plates with the same size have manufacturing tolerance, the clamping surface formed by the elastic buffer material can absorb the dimensional tolerance of the carrier plates, so that a plurality of carrier plates with slightly different sizes due to the manufacturing tolerance can be firmly clamped by the two positioning rods. In addition, the upper surface and the lower surface of the carrier plate are provided with contacts, when the carrier plate is tested, the test probes will contact the contacts on the upper surface to press the carrier plate, at this time, the bearing sur