CN-121995274-A - Capacitive self-healing short circuit detection method and system based on high-energy pulse cleaning

CN121995274ACN 121995274 ACN121995274 ACN 121995274ACN-121995274-A

Abstract

The invention discloses a capacitor self-healing short circuit detection method and system based on high-energy pulse cleaning, which relates to the technical field of electrical testing, and the invention firstly adopts environmental simulation excitation with stress level lower than rated working condition to replace the traditional high-voltage electrical stress test, thereby avoiding potential damage to an intact capacitor in the detection process, solving the inherent contradiction between detection sensitivity and product safety for a long time, realizing nondestructive detection, the method can safely carry out deep quality screening on the precision capacitor subjected to secondary packaging, and then constructs a multidimensional feature vector capable of comprehensively representing the defect state through synchronous acquisition and deep fusion analysis of electric, acoustic and thermal multisource response signals, thereby improving the accuracy and reliability of defect identification, integrating precise diagnosis and targeted repair into a closed-loop self-healing system, and realizing full-process automation from problem discovery to problem solution.

Inventors

PAN DENG
SU XIUJUAN
LIU PING
YANG YANG

Assignees

珠海华冠电容器股份有限公司

Dates

Publication Date: 20260508
Application Date: 20260313

Claims (10)

1. The capacitive self-healing short circuit detection method based on high-energy pulse cleaning is characterized by comprising the following steps of: S1, applying environment simulation excitation to a capacitor to be tested based on acquired environment test parameters so as to induce potential defects in the capacitor to be tested to generate characteristic response; S2, synchronously collecting multi-source response signals of the capacitor to be tested in the process of applying the environment simulation excitation, and fusing the multi-source response signals to generate a defect activity characteristic vector; s3, judging whether a self-healing hidden short circuit point exists or not based on the defect activity characteristic vector, and generating defect positioning information and an activity level; S4, generating a target repair energy parameter based on the defect positioning information and the activity level in response to judging that the self-healable hidden short-circuit point exists, and directly executing S7 to generate a final state of the capacitor to be tested if the self-healable hidden short-circuit point is judged; s5, injecting targeted repair energy into a target area of the capacitor to be detected according to the targeted repair energy parameters so as to eliminate the hidden short-circuit point; S6, after the target repair energy is injected, performing self-healing verification test on the capacitor to be tested to generate a verification result; and S7, based on the verification result, judging the final state of the capacitor to be tested.
2. The method for detecting a self-healing short circuit of a capacitor based on high-energy pulse cleaning according to claim 1, wherein before the synchronously collecting the multi-source response signals of the capacitor to be tested, the method further comprises: arranging an acoustic wave sensor array on the surface of the resin packaging layer of the capacitor to be tested, and acquiring the acoustic response signals; arranging a thermal infrared imager around the capacitor to be tested for collecting the thermal response signal; and performing synchronous triggering calibration on the acoustic wave sensor array, the thermal infrared imager and the electronic measurement unit to ensure the time stamp synchronization of the multi-source response signals.
3. The method for detecting the self-healing short circuit of the capacitor based on the high-energy pulse cleaning according to claim 1, wherein the environment test parameters comprise an initial temperature, a final temperature, a temperature change rate and a cycle number, and the environment simulation excitation comprises: controlling the temperature of the environment where the capacitor to be tested is located to circularly change between the initial temperature and the final temperature according to the temperature change rate so as to form a thermal vibration environment; and continuously applying a preset first voltage to the capacitor to be tested in a thermal vibration environment, and simultaneously applying high-energy pulses to the capacitor to be tested instantaneously through a pulse generating module, and applying the high-energy pulses once in a circulating way.
4. The method of claim 1, wherein the multi-source response signal comprises an electrical response signal, an acoustic response signal, and a thermal response signal, and wherein the fusing the multi-source response signal to generate the defect activity feature vector comprises: analyzing the electrical response signal, and extracting a first feature set; processing the acoustic response signal, and extracting a second feature set; analyzing the thermal response signal, and extracting a third feature set; and performing association alignment on the first feature set, the second feature set and the third feature set in a time dimension to generate the defect activity feature vector, wherein the defect activity feature vector is used for representing a multi-physical field coupling response mode of the potential defect.
5. The method for detecting a self-healing short circuit of a capacitor based on high-energy pulse cleaning according to claim 4, wherein the determining whether a self-healing hidden short circuit point exists based on the defect activity feature vector, and generating defect positioning information and an activity level comprises: Inputting the defect activity feature vector into a defect judging model to calculate the probability that the defect activity feature vector belongs to each defect category, thereby obtaining defect classification probability distribution; judging whether the self-healable hidden short-circuit points exist or not based on the defect classification probability distribution, and generating a defect judgment conclusion; analyzing temperature difference abnormal point position information contained in the third feature set in the defect activity feature vector to generate defect positioning information in response to the defect judging conclusion that a self-healing hidden short-circuit point exists; And calculating and generating the activity level by combining the numerical values of the first characteristic set and the second characteristic set in the defect activity characteristic vector.
6. The method for detecting the self-healing short circuit of the capacitor based on the high-energy pulse cleaning according to claim 5, wherein the target repair energy parameters comprise frequency, amplitude, duration and waveform of energy injection, and the generating the target repair energy parameters comprises: Acquiring electrical parameters of the capacitor to be tested; Determining a reference amplitude and duration of the energy injection based on the activity level and a reference amplitude and duration map based on the activity level; Selecting a specific frequency range by combining the electrical parameters of the capacitor to be detected and the estimated resistance characteristic of the recessive short circuit point; and determining the waveform of the energy injection according to a preset waveform rule based on the reference amplitude, the total duration and the specific frequency range so as to form the targeted repair energy parameter.
7. The method for detecting a self-healing short circuit of a capacitor based on high-energy pulse cleaning of claim 1, wherein the injecting the targeted repair energy comprises: maintaining a temperature condition in the environment simulation excitation so as to enable a resin packaging layer of the capacitor to be tested to be in a heat preservation state; Generating a low-frequency signal or a pulse direct current signal according to the targeted repair energy parameter and applying the low-frequency signal or the pulse direct current signal to the capacitor to be detected; and utilizing the heat capacity and low heat conduction characteristics of the resin packaging layer to locally limit and accumulate the Joule heat generated by the targeted repair energy, and simultaneously utilizing the heat conduction path of the electrolyte in the capacitor to be tested to carry out cooperative heat management so as to realize local fusing or oxidation insulation of the hidden short-circuit point metal bridge.
8. The method for self-healing short circuit detection of capacitor based on high-energy pulse cleaning according to claim 1, wherein the self-healing verification test of the capacitor to be tested comprises: acquiring a group of baseline signals of the capacitor to be tested in a reference environment state before the environment simulation excitation is carried out; Cancelling the environment simulation excitation and the targeted repair energy to restore the capacitor to be tested to the reference environment state; Collecting a group of verification signals of the capacitor to be tested in the reference environment state; comparing the verification signal with the baseline signal to generate the verification result.
9. The method for self-healing short detection of a capacitor based on high energy pulse cleaning of claim 8, further comprising, after said generating a verification result: Responding to the verification result as self-healing failure, and acquiring the current defect activity feature vector; Storing the verification result of the self-healing failure and the current defect activity feature vector into a sample database as a learning sample; And calibrating a judging threshold value of the defect judging model by utilizing accumulated data in the sample database regularly, judging that the hidden short-circuit point is evolved into a hard short-circuit point which can not be self-healed based on the verification result of the self-healing failure, and directly updating the final state of the capacitor to be tested.
10. A system for performing the high energy pulse cleaning based capacitive self-healing short detection method of any one of claims 1-9, comprising: the environment simulation module is used for generating and applying the environment simulation excitation; The multi-source signal acquisition module is used for synchronously acquiring the multi-source response signals; The signal processing and fusing module is used for receiving the multi-source response signals and generating the defect activity characteristic vector; The intelligent judging module is used for receiving the defect activity characteristic vector and generating the defect positioning information and the activity level; The target energy generation and control module is used for generating and injecting the target repair energy according to the defect positioning information and the activity level; And the central control and verification module is used for coordinating and controlling the modules and executing the self-healing verification test to judge the final state.

Description

Capacitive self-healing short circuit detection method and system based on high-energy pulse cleaning Technical Field The invention relates to the technical field of electrical testing, in particular to a capacitor self-healing short circuit detection method and system based on high-energy pulse cleaning. Background The aluminum electrolytic capacitor is used as a key electronic component, and is widely applied to power supply filtering, energy storage and coupling circuits of various electronic devices because of the advantages of large capacity per unit volume, relatively low cost and the like. In order to improve environmental tolerance and prolong service life of the product, especially in some high reliability applications, a process of injecting resin for secondary packaging after the mounting of the seat plate is completed is often adopted to enhance sealability and slow down evaporation of the internal electrolyte. The strict quality detection of the finally packaged capacitor, especially the investigation of whether the hidden danger of micro short circuit exists in the capacitor, is an important link for ensuring the performance and the reliability of the capacitor. In the prior art, for example, CN119129409A, CN115032567B and CN116930619a related patent application related to fault detection of capacitor, it can be seen that in the prior art, the detection method for the short circuit fault of the capacitor mainly includes a direct current resistance test, an insulation resistance test, a withstand voltage test, and the like. The direct current resistance test mainly judges whether a hard short circuit with low impedance exists or not by measuring the resistance value between two poles of a capacitor, but the sensitivity of detecting a tiny short circuit point with high impedance or instantaneous is insufficient. The insulation resistance and withstand voltage test judges the insulation performance by applying a high direct current voltage to the capacitor and observing the leakage current or whether breakdown occurs. In addition, there have been some attempts to remove small defects using pulsed energy, i.e., applying a pulse of energy to a capacitor that may have a short circuit, in an attempt to ablate or vaporize the short circuit point. However, the prior art approaches described above have significant technical drawbacks. Firstly, the high-voltage testing method has a certain destructiveness, and the applied strong electric field can cause irreversible damage to the intact dielectric oxide film, and even can expand an originally repairable micro defect into a permanent hard short circuit, so that accidental injury and rejection of good products are caused. Secondly, most of these methods can only provide a qualified or unqualified binary judgment result, cannot carry out fine diagnosis on the nature, position and severity of the defect, and lacks the capability of providing guiding information for subsequent process improvement or repair. For the pulse cleaning method, the application of energy is often non-targeted, the energy control difficulty is high, the cleaning failure can be caused by insufficient energy, the surrounding normal structure can be damaged due to excessive energy, the process is lack of effective monitoring and verification, and the reliability is difficult to guarantee. Disclosure of Invention Aiming at the technical defects, the invention aims to provide a capacitor self-healing short circuit detection method and system based on high-energy pulse cleaning, and the nondestructive detection and targeted self-healing repair of a hidden short circuit point can be realized by adopting the technical means of environment simulation excitation and multi-source signal fusion analysis. In order to solve the technical problems, the invention adopts the following technical scheme that the first aspect of the invention provides a capacitor self-healing short circuit detection method based on high-energy pulse cleaning, S1, environmental simulation excitation is applied to a capacitor to be tested based on acquired environmental test parameters so as to induce potential defects inside the capacitor to be tested to generate characteristic response. S2, synchronously collecting multi-source response signals of the capacitor to be tested in the process of applying the environment simulation excitation, and fusing the multi-source response signals to generate a defect activity characteristic vector. And S3, judging whether a self-healing hidden short circuit point exists or not based on the defect activity characteristic vector, and generating defect positioning information and an activity level. S4, generating a target repair energy parameter based on the defect positioning information and the activity level in response to judging that the self-healable hidden short-circuit point exists, and directly executing S7 to generate a final state of the capacitor to be tested if the self-heal