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CN-121996477-A - Interface assembly for testing and testing system

CN121996477ACN 121996477 ACN121996477 ACN 121996477ACN-121996477-A

Abstract

The invention discloses an interface component and a test system for testing, wherein the interface component comprises a DP clamp and a transfer interface, the transfer interface is used for connecting equipment to be tested and the DP clamp, the DP clamp is used for being connected with detection equipment, the transfer interface comprises a Type-C male head and a DP female head, a designated pin end of the Type-C male head is directly connected with a designated pin end of the DP female head, and the transfer interface is used for allowing communication with the detection equipment according to a protocol configured by the equipment to be tested when the detection equipment is connected with the equipment to be tested through the DP clamp and the transfer interface. By utilizing the interface component provided by the invention, the equipment to be tested can understand the communication protocol of the detection equipment, and further when the detection equipment is connected with the equipment to be tested through the interface component, preset test items can be automatically executed.

Inventors

  • WANG JIANBO

Assignees

  • 北京罗克维尔斯科技有限公司

Dates

Publication Date
20260508
Application Date
20241105

Claims (10)

  1. 1. An interface assembly for testing, comprising a DP clamp and a swivel interface; the switching port is used for connecting the equipment to be tested and the DP clamp, and the DP clamp is used for connecting with the detection equipment; The adapter comprises a Type-C male head and a DP female head, wherein the appointed pin end of the Type-C male head is directly connected with the appointed pin end of the DP female head; The switching port is used for allowing the detection equipment to communicate with the detection equipment according to a protocol configured by the equipment to be tested when the detection equipment is connected with the equipment to be tested through the DP clamp and the switching port.
  2. 2. The interface assembly of claim 1, wherein a first high-speed differential signal positive terminal, a first high-speed differential signal negative terminal, a second high-speed differential signal positive terminal, a second high-speed differential signal negative terminal, a third high-speed differential signal positive terminal, a third high-speed differential signal negative terminal, a fourth high-speed differential signal positive terminal, a fourth high-speed differential signal negative terminal of the Type-C male head are respectively connected with a first channel signal positive terminal, a first channel signal negative terminal, a second channel signal positive terminal, a second channel signal negative terminal, a third channel signal positive terminal, a third channel signal negative terminal, a fourth channel signal positive terminal, a fourth channel signal negative terminal of the DP female head; The first SUB end and the second SUB end of the Type-C male head are respectively connected with the accessory channel signal positive end and the accessory channel signal negative end of the DP female head; the first channel configuration end of the Type-C male head is connected with the hot plug detection end of the DP female head; The first configuration end, the second configuration end and the DP_PWR end of the DP mother head are grounded.
  3. 3. The interface assembly of claim 2, wherein the Type-C male and DP female heads are disposed on a PCB board, the Type-C male and DP female heads being connected by a trace on the PCB board.
  4. 4. An interface assembly according to any one of claims 1 to 3, wherein the switch is for DP1.4 physical layer conformance testing of a device under test.
  5. 5. A test system comprising the interface assembly of any one of claims 1 to 4.
  6. 6. The test system of claim 5, further comprising an oscilloscope, wherein the adapter port in the interface assembly is for connecting a device under test and a DP clamp, the DP clamp being for connecting with the oscilloscope.
  7. 7. The test system of claim 6, wherein the DP clamp comprises an SMA interface for connecting to the oscilloscope.
  8. 8. The test system of claim 6, wherein the device under test is configured to store a test code.
  9. 9. The test system of claim 6, wherein the device under test is configured to support a DP1.4 protocol.
  10. 10. The test system of claim 6, wherein the device to be tested comprises an on-board device of a new energy automobile.

Description

Interface assembly for testing and testing system Technical Field Embodiments of the present invention relate to testing technologies, and in particular, to an interface component for testing and a testing system. Background With the development of new energy automobiles, the DP screen-throwing function of the automobile cabin has become standard configuration, and users can use USB Type-C cable to connect VR glasses or other mobile devices with DP interface and capable of displaying to watch the video content of the automobile driving screen through the interface. The vehicle-mounted systems or devices such as automobile cabins and the like need to be subjected to physical layer consistency testing, at present, two types of clamps are adopted for testing, one Type of the clamps is a Type-C interface, the other Type of the clamps is a standard DP interface, and a proper testing clamp is selected and used according to the Type of the interface of the DUT (Device Under Test, tested device). The SOC used by the DUT must support the DP Alt Mode protocol when using the Type-C interface clamp, and the SOC used by the DUT must support the DP1.4 standard protocol when using the standard DP clamp. For cost consideration, SOC suppliers of the vehicle machine do not support all protocols contained in the DP Alt Mode, but only support standard DP1.4 protocols, so that when a Type-C clamp is used for directly connecting DUT tests, the DUT cannot send specific test patterns to an oscilloscope according to the DP Alt Mode protocol requirements to automatically complete the DP1.4 physical layer consistency test. The interface Type of the DUT DP signal transmission is Type-C, but only a test fixture of a standard DP interface can be used for testing, and the interface Type is different and cannot be connected, so that the DP1.4 physical layer consistency test is challenged. Disclosure of Invention The invention provides an interface component for testing and a testing system, which aim to solve the problems that equipment to be tested only supports a standard DP1.4 protocol, the Type of an interface of DP signal transmission of the equipment to be tested is Type-C, but the equipment to be tested can only be tested by using a testing fixture of a standard DP interface, and when the equipment to be tested is directly connected by using the Type-C fixture for testing, the equipment to be tested cannot send out a specific testing code pattern according to a DP Alt Mode protocol so as to complete automatic testing. In a first aspect, an embodiment of the present invention provides an interface assembly for testing, including a DP clamp and a transfer interface; the switching port is used for connecting the equipment to be tested and the DP clamp, and the DP clamp is used for connecting with the detection equipment; The adapter comprises a Type-C male head and a DP female head, wherein the appointed pin end of the Type-C male head is directly connected with the appointed pin end of the DP female head; The switching port is used for allowing the detection equipment to communicate with the detection equipment according to a protocol configured by the equipment to be tested when the detection equipment is connected with the equipment to be tested through the DP clamp and the switching port. Optionally, the first high-speed differential signal positive end, the first high-speed differential signal negative end, the second high-speed differential signal positive end, the second high-speed differential signal negative end, the third high-speed differential signal positive end, the third high-speed differential signal negative end, the fourth high-speed differential signal positive end and the fourth high-speed differential signal negative end of the Type-C male head are respectively connected with the first channel signal positive end, the first channel signal negative end, the second channel signal positive end, the second channel signal negative end, the third channel signal positive end, the third channel signal negative end, the fourth channel signal positive end and the fourth channel signal negative end of the DP female head; The first SUB end and the second SUB end of the Type-C male head are respectively connected with the accessory channel signal positive end and the accessory channel signal negative end of the DP female head; the first channel configuration end of the Type-C male head is connected with the hot plug detection end of the DP female head; The first configuration end, the second configuration end and the DP_PWR end of the DP mother head are grounded. Optionally, the male head of Type-C, the female head of DP set up on the PCB board, the male head of Type-C and the female head of DP pass through walk the line on the PCB board and be connected. Optionally, the switching port is used for DP1.4 physical layer consistency test of the device to be tested. In a second aspect, an embodiment of the present invention furthe