CN-121997859-A - Verification method for digital circuit design of large-area array infrared image sensor

CN121997859ACN 121997859 ACN121997859 ACN 121997859ACN-121997859-A

Abstract

The invention discloses a verification method of a large-area array infrared image sensor digital circuit design, which comprises the steps of analyzing design characteristics of the digital circuit to be verified to obtain an analysis result, classifying all modules in the digital circuit design to obtain a plurality of modules to be built, modeling the input and output of the modules to be built and functions according to the analysis result to form a plurality of universal verification modules, connecting the plurality of universal verification modules with the digital circuit to be verified according to connection requirements to establish a complete circuit to form a verification platform, executing simulation based on the verification platform to obtain a simulation result, and optimizing the digital circuit design according to the simulation result. The effect of quick, accurate location design problem has been realized.

Inventors

ZHANG RUIMENG
ZHANG XU
CHENG GANLIN
FAN BEN
YAO YAO

Assignees

北京空间机电研究所

Dates

Publication Date: 20260508
Application Date: 20251210

Claims (7)

1. The verification method of the digital circuit design of the large-area array infrared image sensor is characterized by comprising the following steps of: analyzing the design characteristics of the digital circuit to be verified to obtain an analysis result; classifying the modules in the digital circuit design to obtain a plurality of modules to be modeled; modeling the input and output and the functions of the module to be modeled according to the analysis result to form a plurality of universal verification modules; Connecting a plurality of universal verification modules with the digital circuit to be verified according to the connection requirement, and establishing a complete circuit to form a verification platform; based on the verification platform, performing simulation to obtain a simulation result; and optimizing the digital circuit design according to the simulation result.
2. The method for verifying the digital circuit design of the large-area array infrared image sensor according to claim 1, wherein the analysis of the digital circuit design features is performed to obtain analysis results, specifically: The method comprises the steps of sorting the image scale, the image mode type, the windowing mode, the time sequence signal type and the special functional characteristics of the digital circuit design to obtain a characteristic list; According to the feature list, comparing and analyzing the function similarity points and the difference points of the digital circuit design and most of verified large area array infrared image sensors to obtain design characteristics; and quantifying and parameterizing the design characteristics to obtain an analysis result.
3. The method for verifying the digital circuit design of the large-area-array infrared image sensor according to claim 1, wherein the general verification module comprises a register configuration unit verification module, a readout circuit timing generation unit verification module, a data processing unit verification module and a special function module verification module; the register configuration unit verification module is used for verifying the validity of the read-write functions of all configuration registers of the large-area array infrared image sensor and the accuracy of the refreshing time; The reading circuit time sequence generation unit verification module is used for verifying whether the reading circuit of the large area array infrared image sensor can normally output and control time sequence signals required by the image sensor in different modes; The data processing unit verification module is used for verifying whether the data processing unit circuit of the large-area array infrared image sensor can realize the expected image processing effect, and whether the output image data is complete and accurate; The special function module verification module is used for verifying whether other circuit modules with special functions of the large-area array infrared image sensor can realize the design expected functions and work normally.
4. A method of verifying a digital circuit design of a large area array infrared image sensor as defined in claim 3, wherein the register configuration unit modeling module comprises: The communication protocol excitation generation module is used for configuring a common communication protocol, generating an excitation input signal and outputting the excitation input signal to the module to be verified; the refresh control synchronous signal generating module is used for randomly generating configuration addresses, data and refresh time and sending the configuration addresses, the data and the refresh time to the configuration unit reference module; The configuration unit reference module establishes different types of register reference models according to the refreshing time, generates expected register configuration results at different times and sends the register configuration results to the comparison verification module; And the comparison verification module is used for automatically comparing the refreshing time with the configuration value according to the expected register configuration result and the actual simulated register configuration result, positioning the registers with inconsistent comparison results and generating a register configuration problem report.
5. A method of verifying a digital circuit design of a large area array infrared image sensor as defined in claim 3, wherein the readout circuit timing generation unit verification module comprises: the excitation generation module is used for distributing different types of time sequence signal control modes to each control signal, distributing different boundary conditions according to the types of the time sequence signal control modes and generating excitation signals according to the time sequence signal control modes and the boundary conditions; The time sequence generation unit reference module is used for establishing a reference model in a classified manner according to a time sequence signal control mode to generate an expected result; And the comparison and verification module is used for sampling and outputting a time sequence simulation result generated by inputting the excitation signal into the module to be verified in a high-frequency sampling mode and an expected result of the reference model, realizing automatic comparison and verification and generating a time sequence problem positioning report.
6. A method of verifying a digital circuit design of a large area array infrared image sensor as defined in claim 3, wherein the data processing unit verification module comprises: The automatic image data excitation generating module has the functions of image scale and image feature configuration, generates image data excitation and outputs the image data excitation to the module to be verified; the data processing unit reference module is used for configuring the array scale, the image mode and the output channel number, generating a reference image signal and sending the reference image signal to the report generating module; The system comprises a report generating module, a verification module, a reference image signal generating module, a pixel output module and a pixel output module, wherein the report generating module is used for sampling simulation result image data output by the verification module by using a clock signal and outputting serial image data, comparing the serial image data with the reference image signal to generate a verification report, the verification report comprises problems and data positions, and positioning rows and columns where the pixel output problems are located according to the problems and the data positions and given image specifications.
7. The method for verifying the digital circuit design of the large-area array infrared image sensor according to claim 1, wherein the simulation is performed based on a verification platform to obtain a simulation result, specifically: according to the design target of the digital circuit of the large-area array infrared image sensor, a verification plan and a verification target are formulated, and verification points are extracted and analyzed; According to the verification plan, building a simulation verification platform from bottom to top by the sub-modules, and covering all verification points; operating a simulation verification platform by using a simulation tool, applying excitation to the image sensor digital circuit design, and recording a response; and comparing the response of the tested design with the expected result, checking whether the tested design achieves the expected design target, and analyzing the simulation coverage rate to finally obtain the simulation result.

Description

Verification method for digital circuit design of large-area array infrared image sensor Technical Field The invention relates to a verification method for digital circuit design of a large-area array infrared image sensor, and belongs to the technical field of digital circuit design verification of image sensors. Background The large-area array infrared image sensor has the characteristics of larger visual field, higher spatial resolution and the like, and has wide application in various fields of aerospace, aerospace detection, security monitoring and the like, such as near-earth asteroid monitoring, astronomical observation, satellite remote sensing and the like. The readout digital circuit has the following characteristics: 1) The digital circuit needs to process the data volume of several Gb per second under high resolution, the high-speed data transmission (such as LVDS interface) has strict requirements on time convergence and signal integrity; 2) The image modes are more, namely multiple working modes such as high-gain switching, low-gain switching, windowing imaging, test number and the like are required to be supported; 3) The circuit has complex functions of outputting various readout time sequences, adjusting time sequence edges and the like; 4) The infrared image sensor usually needs to refrigerate when working, thus has the capability of stable and normal working under the low-temperature environment, and can keep the performance of the image sensor almost unaffected; 5) The radiation resistance is good, in aerospace application, the problems that the irradiation environment is severe in the universe, the single event effect, the total dose effect and the like of a digital circuit are easy to be induced by high-energy particles in the universe are needed to be solved, and the special reading circuit design can effectively prevent faults such as circuit function failure and the like caused by the cosmic radiation. Because the large-area array infrared image sensor is mainly used in low-temperature, long-time and continuous working situations, higher requirements are put forward on the effectiveness and reliability of digital circuit functions and even the service life, and particularly, in aerospace application, the image sensor works in a universe extreme environment for a long time, and once the circuit fails under serious test, the maintenance difficulty and the cost are extremely high, so that a more scientific and reliable digital circuit verification method is needed, and full and accurate simulation verification is carried out on various working conditions to ensure long-term stable and normal operation of the image sensor circuit. The traditional chip digital circuit verification mainly comprises the steps of decomposing design characteristic points, analyzing verification points, making verification plans, writing incentives according to the plans, observing whether design output meets expectations or not and the like. When the digital circuit simulation verification of the large-area array infrared image sensor is carried out by adopting the means, a plurality of problems often exist. On one hand, the traditional verification means are difficult to cover various possible data conditions in a whole range due to large data quantity and high speed, verification dead zones appear, and the situations of missing problems and the like easily appear when comparing and verifying output results are faced with a large amount of image data. On the other hand, aiming at circuits with multiple modes and complex functions, the traditional verification method generally lacks the characteristics of systemization, universality, portability and the like, so that the verification efficiency is low, different projects are difficult to multiplex, and the design progress is influenced. The above-mentioned drawbacks may lead to prolonged and late design and development cycles of the digital circuit, and more importantly, may introduce potential design defects, resulting in cost loss. Disclosure of Invention The technical solution of the invention is to overcome the defects of the prior art, provide a verification method for digital circuit design of a large-area array infrared image sensor, and realize the effect of rapid and accurate positioning design. The technical scheme of the invention is as follows: the invention discloses a verification method for digital circuit design of a large area array infrared image sensor, which comprises the following steps: analyzing the design characteristics of the digital circuit to be verified to obtain an analysis result; classifying the modules in the digital circuit design to obtain a plurality of modules to be modeled; modeling the input and output and the functions of the module to be modeled according to the analysis result to form a plurality of universal verification modules; Connecting a plurality of universal verification modules with the digital circuit to be