Search

CN-121999701-A - ESD protection method, electronic equipment, readable storage medium and chip

CN121999701ACN 121999701 ACN121999701 ACN 121999701ACN-121999701-A

Abstract

The application relates to the technical field of electronic equipment, and provides an ESD protection method, electronic equipment, a readable storage medium and a chip, the method can solve the problem that in the prior art, electrostatic discharge can generate electrostatic interference on certain devices of a circuit board in the display screen, so that the devices are in an abnormal working state, and the display screen is abnormal. The method is applied to electronic equipment, the electronic equipment comprises a processor and a first device, the processor is connected with the first device, the difference value between the working frequency of the first device and the frequency of electrostatic discharge is in a first range, the processor is configured to determine the operation state of the first device, the operation state comprises a normal operation state and an abnormal operation state, and the first device is subjected to ESD soft reset under the condition that the first device is in the abnormal operation state.

Inventors

  • LI TAO
  • HE CAIFU
  • TANG WEI
  • WANG WEI
  • HUANG FEI

Assignees

  • 华为技术有限公司

Dates

Publication Date
20260508
Application Date
20241107

Claims (13)

  1. 1. An ESD protection method for an electronic device, the electronic device comprising a processor and a first device, the processor being coupled to the first device and a difference between an operating frequency of the first device and a frequency of electrostatic discharge being in a first range, the processor being configured to: determining an operation state of the first device, wherein the operation state comprises a normal operation state and an abnormal operation state; and under the condition that the first device is in an abnormal operation state, carrying out ESD soft reset on the first device.
  2. 2. The method of claim 1, wherein the determining the operational state of the first device comprises: Acquiring an operation state parameter of the first device; Determining that the first device is in a normal operating state when the operating state parameter is within a rated operating parameter range of the first device; And determining that the first device is in an abnormal operation state under the condition that the operation state parameter is not in the rated operation parameter range of the first device.
  3. 3. The method of claim 2, wherein the operating state parameter is within the first device rated operating parameter range, comprising: the operating voltage of the first device is within a nominal operating voltage range, and/or, The operating current of the first device is in a nominal operating current range and/or, The operating frequency of the first device is in a nominal operating frequency range and/or, The operating speed of the first device is in a nominal operating speed range.
  4. 4. A method according to any one of claims 1 to 3, wherein the electronic device includes a display screen, and the determining the operation state of the first device further includes: When the display screen displays abnormality, determining that the first device is in an abnormal operation state, wherein the display abnormality comprises a black screen, a flower screen, a horizontal stripe or a flicker of the display screen, and/or, And when the display screen is abnormal in operation, determining that the first device is in an abnormal operation state, wherein the abnormal operation comprises that the display screen enters a BIST mode or a red, green and blue query mode.
  5. 5. The method of any one of claims 1-4, wherein the operating frequency of the first device is any value between 10mhz and 10 ghz.
  6. 6. The method according to any one of claims 1-5, wherein, when the first device is in an abnormal operation state, performing ESD soft reset on the first device includes: And under the condition that the duration of the first device in the abnormal operation state is greater than a time threshold value, carrying out ESD soft reset on the first device.
  7. 7. The method of any of claims 1-6, wherein the first device comprises an SOC, PMIC, source IC, or Tcon IC.
  8. 8. The method of any of claims 1-7, wherein the electronic device further comprises a second component coupled to the processor and the first component, the determining the operational state of the first component comprising: acquiring operation state parameters of the second device and the first device; and determining that the first device is in an abnormal operation state under the condition that the operation state parameter of the second device is in the rated operation parameter range of the second device and the operation state parameter of the first device is not in the rated operation parameter range of the first device.
  9. 9. The method of any of claims 1-7, wherein the electronic device further comprises a third device and a fourth device, the third device, the fourth device being coupled to the processor and the first device, and the first device controlling signal transmissions of the third device and the fourth device, the determining the operating state of the first device comprising: acquiring operation state parameters of the third device and the fourth device; And determining that the first device is in an abnormal operation state under the condition that the operation state parameter of the third device is not in the rated operation parameter range of the third device or the operation state parameter of the fourth device is not in the rated operation parameter range of the fourth device.
  10. 10. An electronic device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, the processor implementing the method of any one of claims 1 to 9 when executing the computer program.
  11. 11. A computer readable storage medium, characterized in that the computer readable storage medium stores a computer program which, when executed by a processor, implements the method according to any one of claims 1-9.
  12. 12. A chip comprising a processor and a memory, wherein the memory has stored therein a computer program which, when executed by the processor, implements the method of any of claims 1-9.
  13. 13. A computer program product comprising computer programs/instructions which, when executed by a processor/electronic device, implement the method of any of claims 1-9.

Description

ESD protection method, electronic equipment, readable storage medium and chip Technical Field The present application relates to the field of electronic devices, and in particular, to an ESD protection method, an electronic device, a readable storage medium, and a chip. Background Currently, in some scenes (for example, a user scene or a test scene), an electrostatic discharge (electro STATIC DISCHARGE, ESD) generates an instantaneous high voltage, which easily generates electrostatic interference to some devices of a circuit board in a display screen, so that the devices are in an abnormal working state, and thus the display screen displays an abnormality. Disclosure of Invention The application provides an ESD protection method, electronic equipment, a readable storage medium and a chip, which are used for solving the problem that in the prior art, electrostatic discharge can generate electrostatic interference on certain devices of a circuit board in a display screen, so that the devices are in an abnormal working state, and the display screen is abnormal. In order to achieve the above purpose, the application adopts the following technical scheme: In a first aspect, an ESD protection method is provided and applied to an electronic device, where the electronic device includes a processor and a first device, the processor is connected to the first device, and a difference between an operating frequency of the first device and a frequency of electrostatic discharge is in a first range, and the processor is configured to determine an operating state of the first device, where the operating state includes a normal operating state and an abnormal operating state, and perform ESD soft reset on the first device if the first device is in the abnormal operating state. According to the method provided by the embodiment of the application, the electronic equipment can carry out ESD soft reset on the first device through the processor under the condition that the first device is in the abnormal running state so as to enable the first device to recover to the normal working state, thereby solving the problem that the display screen is abnormal due to the abnormal working state of the device caused by electrostatic interference. In addition, according to the method provided by the embodiment of the application, the running state of the first device is determined by the electronic equipment through the processor, the process is independent of the integration of the first device, and when the first device is an immature device, the method can also be used for carrying out electrostatic protection, so that the immature device with a simple structure and low cost can also be widely applied. In some embodiments, determining the operating state of the first device includes obtaining an operating state parameter of the first device, determining that the first device is in a normal operating state if the operating state parameter is within a rated operating parameter range of the first device, and determining that the first device is in an abnormal operating state if the operating state parameter is not within the rated operating parameter range of the first device. In this embodiment, the processor may determine the current operation state of the first device through the operation state parameter of the first device, so that a process of autonomously reporting a request for resetting under the condition of abnormal operation of the first device is saved, and the method is applicable to devices with weaker antistatic capability. In some embodiments, the operating state parameter is within a range of operating parameters rated for the first device, including an operating voltage of the first device being within a range of rated operating voltages, and/or an operating current of the first device being within a range of rated operating currents, and/or an operating frequency of the first device being within a range of rated operating frequencies, and/or an operating speed of the first device being within a range of rated operating speeds. Optionally, the operating state parameters may also include an operating temperature, an output signal, and the like. In some embodiments, the electronic device includes a display screen, determines an operational state of the first device, and further includes determining that the first device is in an abnormal operational state when the display screen is displaying an anomaly, the display anomaly including a display screen blackout, a flowscreen, a landscape-portrait stripe, or a blinking, and/or determining that the first device is in an abnormal operational state when the display screen is operating an anomaly, the operational anomaly including the display screen entering a BIST mode or a red-green-blue inquiry mode. The first device may be an SOC, PMIC, source IC, or Tcon IC, among others. In general, the display screen is black, which may be caused by the abnormal working state of the PMI