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CN-121999848-A - UFS device testing method, electronic device and computer readable storage medium

CN121999848ACN 121999848 ACN121999848 ACN 121999848ACN-121999848-A

Abstract

The embodiment of the invention provides a UFS device testing method, electronic equipment and a computer readable storage medium. The method comprises the steps of responding to VCC jitter area information sent by a UFS test host, selecting a target jitter area from the UFS storage equipment, writing cold data of a first preset capacity interval threshold value into the target jitter area of the UFS storage equipment based on the UFS test host, selecting a target scene from preset test scenes and selecting a target VCC jitter type from a preset VCC jitter type set when the cold data reaches a second preset capacity interval threshold value, and carrying out test verification processing on the UFS storage equipment according to the target scene and the target VCC jitter type. According to the scheme of the embodiment of the invention, accurate and reasonable VCC jitter test processing can be carried out on the UFS equipment, so that the UFS equipment can safely and stably operate in the follow-up process.

Inventors

  • CHEN HUATAO
  • TAO ZHI
  • SONG WEIJIE
  • CHEN HUAIDAO
  • LAI NAI

Assignees

  • 珠海妙存科技有限公司

Dates

Publication Date
20260508
Application Date
20251219

Claims (10)

  1. The UFS equipment testing method is characterized by being applied to a UFS equipment system, wherein the UFS equipment system comprises a UFS testing host end and a UFS storage equipment end, the UFS testing host end is connected with the UFS storage equipment end, and the method comprises the following steps: Responding to VCC jitter area information sent by the UFS test host end, and selecting a target jitter area from the UFS storage equipment end; cold data of a first preset capacity interval threshold value is written into the target jitter area of the UFS storage equipment end in advance based on the UFS test host end; selecting a target scene from preset test scenes and selecting a target VCC jitter type from a preset VCC jitter type set under the condition that the cold data reaches a second preset capacity interval threshold; And carrying out test and verification processing on the UFS storage equipment end according to the target scene and the target VCC jitter type.
  2. 2. The UFS device testing method of claim 1, wherein the target jitter area includes a single-layer unit SLC area and a three-layer unit TLC area, the first preset capacity interval threshold includes a first preset capacity threshold and a second preset capacity threshold, the first preset capacity threshold and the second preset capacity threshold are different, and the writing of cold data of the first preset capacity threshold into the target jitter area of the UFS storage device based on the UFS test host side includes any one of the following: Writing the cold data of the first preset capacity threshold value into the SLC area of the UFS storage equipment end in advance based on the UFS test host end; And writing the cold data of the second preset capacity threshold value into the TLC area of the UFS storage equipment side in advance based on the UFS test host side.
  3. 3. The UFS device testing method of claim 1, wherein the performing test verification processing on the UFS storage device side according to the target scenario and the target VCC jitter type includes: in the process of writing data into the target jitter area of the UFS storage device end, performing VCC jitter test processing on the UFS storage device end according to the target VCC jitter type; in the process of initiating synchronous caching by the UFS test host, performing VCC jitter test processing on the UFS storage equipment according to the target VCC jitter type; In the process of initiating power-down notification by the UFS test host, performing VCC jitter test processing on the UFS storage equipment according to the target VCC jitter type; and in the process that the UFS storage device end passively writes data into an internal flash memory chip, performing VCC jitter test processing on the UFS storage device end according to the target VCC jitter type.
  4. 4. The UFS device testing method of claim 3, wherein performing VCC jitter testing processing on the UFS storage device according to the target VCC jitter type includes: After the UFS storage device terminal generates VCC jitter corresponding to the target VCC jitter type, re-performing power-on initialization processing on the UFS storage device terminal; Judging whether the UFS storage device end is dead or not, and judging whether the data of the UFS storage device end meets the requirement or not.
  5. 5. The UFS device testing method of claim 4, wherein the determining whether the data of the UFS storage device meets the requirements comprises: and judging that the data of the UFS storage equipment end meets the requirement under the condition that the error data in the UFS storage equipment end is not greater than a preset equipment capacity threshold value and the error data is not distributed intermittently.
  6. 6. The UFS device testing method of claim 1, wherein the selecting the target VCC jitter type from the set of preset VCC jitter types includes any one of the following: Selecting a specified VCC jitter type from a plurality of VCC jitter types in the VCC jitter type set as the target VCC jitter type; selecting any one VCC jitter type from a plurality of VCC jitter types in the VCC jitter type set as the target VCC jitter type; And sequentially selecting one VCC jitter type from a plurality of VCC jitter types in the VCC jitter type set as the target VCC jitter type.
  7. 7. The UFS device testing method of claim 1, wherein before the target jitter area is selected from the UFS storage device side in response to VCC jitter area information sent by the UFS test host side, the method further comprises: And controlling the UFS storage equipment end to be in the environment of a first preset temperature interval or in the environment of a second preset temperature interval, wherein the first preset temperature interval and the second preset temperature interval are different.
  8. 8. The UFS device testing method of claim 4, wherein the determining whether the UFS storage device is dead comprises: And the UFS storage device end cannot effectively respond to the command sent by the UFS test host end in a specified time interval, and the UFS storage device end is judged to be in a dead halt state.
  9. 9. An electronic device, comprising: A memory, a processor and a computer program stored on the memory and executable on the processor, which processor, when executing the computer program, implements the UFS device testing method of any one of claims 1 to 8.
  10. 10. A computer readable storage medium storing computer executable instructions which, when executed by a control processor, implement the UFS device testing method of any one of claims 1 to 8.

Description

UFS device testing method, electronic device and computer readable storage medium Technical Field The present invention relates to the field of memory testing technologies, and in particular, to a UFS device testing method, an electronic device, and a computer-readable storage medium. Background Along with the continuous development of science and technology and the continuous popularization of markets, the application scenes of the universal flash memory (Universal Flash Storage, UFS) are more and more, the data reliability and the equipment stability are focused on by each manufacturer, and under extreme scenes, the UFS equipment is abnormal, for example, VCC jitter occurs in the use process, so that data errors or equipment downtime can be caused. However, in the normal use process of the UFS device, when VCC jitter occurs and the waveform of the jitter cannot be predicted, and thus accurate and reasonable test processing cannot be performed on the UFS device. Disclosure of Invention The present invention aims to solve at least one of the technical problems existing in the prior art. Therefore, the invention provides the UFS equipment testing method, which can accurately and reasonably carry out VCC jitter testing treatment on the UFS equipment so that the UFS equipment can safely and stably run in the follow-up process. The invention also provides an electronic device applying the UFS device testing method. The invention also provides a computer readable storage medium applying the UFS equipment testing method. According to an embodiment of the first aspect of the present invention, a UFS device testing method is applied to a UFS device system, where the UFS device system includes a UFS test host end and a UFS storage device end, and the UFS test host end is connected to the UFS storage device end, and the method includes: Responding to VCC jitter area information sent by the UFS test host end, and selecting a target jitter area from the UFS storage equipment end; cold data of a first preset capacity interval threshold value is written into the target jitter area of the UFS storage equipment end in advance based on the UFS test host end; selecting a target scene from preset test scenes and selecting a target VCC jitter type from a preset VCC jitter type set under the condition that the cold data reaches a second preset capacity interval threshold; And carrying out test and verification processing on the UFS storage equipment end according to the target scene and the target VCC jitter type. According to some embodiments of the present invention, the target jitter area includes a single-layer unit SLC area and a three-layer unit TLC area, the first preset capacity interval threshold includes a first preset capacity threshold and a second preset capacity threshold, the first preset capacity threshold and the second preset capacity threshold are different, and the writing of cold data of the first preset capacity threshold into the target jitter area of the UFS storage device based on the UFS test host side includes any one of the following: Writing the cold data of the first preset capacity threshold value into the SLC area of the UFS storage equipment end in advance based on the UFS test host end; And writing the cold data of the second preset capacity threshold value into the TLC area of the UFS storage equipment side in advance based on the UFS test host side. According to some embodiments of the present invention, the performing test and verification processing on the UFS storage device according to the target scenario and the target VCC jitter type includes: in the process of writing data into the target jitter area of the UFS storage device end, performing VCC jitter test processing on the UFS storage device end according to the target VCC jitter type; in the process of initiating synchronous caching by the UFS test host, performing VCC jitter test processing on the UFS storage equipment according to the target VCC jitter type; In the process of initiating power-down notification by the UFS test host, performing VCC jitter test processing on the UFS storage equipment according to the target VCC jitter type; and in the process that the UFS storage device end passively writes data into an internal flash memory chip, performing VCC jitter test processing on the UFS storage device end according to the target VCC jitter type. According to some embodiments of the present invention, the performing VCC jitter test processing on the UFS storage device according to the target VCC jitter type includes: After the UFS storage device terminal generates VCC jitter corresponding to the target VCC jitter type, re-performing power-on initialization processing on the UFS storage device terminal; Judging whether the UFS storage device end is dead or not, and judging whether the data of the UFS storage device end meets the requirement or not. According to some embodiments of the invention, the determining whether the dat