CN-122001466-A - PIN-FET test system

Abstract

The application provides a PIN-FET test system, which comprises a light source, a modulation assembly, a signal generator and a plurality of electric signal collectors, wherein the modulation assembly comprises an intensity modulator, the light source is used for emitting continuous optical signals, the signal generator is connected with the intensity modulator in a signal mode, the signal generator is used for emitting frequency sweeping signals capable of modulating the continuous optical signals to the intensity modulator, the intensity modulator is used for modulating the continuous optical signals to obtain first modulated optical signals or modulating the frequency sweeping signals and the continuous optical signals to obtain second modulated optical signals carrying frequency sweeping information, the modulation assembly further comprises an attenuator and a coupler, the PIN-FET to be tested is used for outputting electric signals according to the first modulated optical signals or the second modulated optical signals, and the electric signal collectors are used for receiving the electric signals so that the electric signal collectors can generate corresponding original parameters according to the electric signals to generate test results based on the original parameters.

Inventors

• CUI HONGLIANG
• ZHANG DECHUAN
• ZHOU CHEN

Assignees

• 武汉海飞通光电子科技有限公司

Dates

Publication Date

20260508

Application Date

20251230

Claims (10)

1. 1. The PIN-FET test system is characterized by comprising a light source, a modulation assembly, a signal generator and a plurality of electric signal collectors, wherein the modulation assembly comprises an intensity modulator; The light source is used for emitting continuous light signals; the signal generator is in signal connection with the intensity modulator and is used for sending a frequency-adjustable sweep frequency signal to the intensity modulator; The intensity modulator is used for modulating the continuous optical signal to obtain a first modulated optical signal, or modulating the sweep frequency signal and the continuous optical signal to obtain a second modulated optical signal carrying sweep frequency information; The modulation component further comprises an attenuator and a coupler, so that the first modulated optical signal or the second modulated optical signal sequentially passes through the attenuator and the coupler and then is input to a PIN-FET to be tested, and the PIN-FET to be tested is used for outputting an electric signal according to the first modulated optical signal or the second modulated optical signal; the plurality of electric signal collectors are used for receiving the electric signals, so that the electric signal collectors generate corresponding original parameters according to the electric signals, and test results are generated based on the original parameters.
2. 2. The system of claim 1, further comprising a first dc voltage; the first direct voltage is used to provide a bias voltage to the intensity modulator.
3. 3. The system of claim 1, further comprising an optical power meter for monitoring optical signal power of the first modulated optical signal or the second modulated optical signal.
4. 4. The system of claim 3, further comprising a 3dB analysis module configured to: Controlling the signal generator to send a first sweep frequency signal to the intensity modulator, wherein the frequency of the first sweep frequency signal continuously changes in a first preset interval in time sequence; Acquiring a first voltage peak value of the electric signal according to the electric signal collector; obtaining a first functional relation diagram according to the first voltage peak value and the first frequency of the corresponding first sweep frequency signal; and obtaining a first frequency corresponding to the first voltage peak value which is a first specified value according to the first functional relation diagram, wherein the first frequency is used as a 3dB bandwidth.
5. 5. The system of claim 4, wherein the 3dB analysis module is further configured to: Controlling the signal generator to send a second sweep frequency signal to the intensity modulator, wherein the frequency of the second sweep frequency signal continuously changes in a second preset interval in time sequence, and the first preset interval is a subset of the second preset interval; Acquiring a second voltage peak-to-peak value of the electric signal according to the electric signal collector When two continuous second voltage peaks and peaks in time sequence are smaller than a second specified value, second frequencies of the second sweep signals corresponding to the two continuous second voltage peaks and peaks are obtained to be used as the maximum value and the minimum value of the first preset interval, wherein the second specified value is larger than the first specified value, and the difference value between the second specified value and the first specified value is a specified difference value.
6. 6. The system of claim 3, further comprising a linear responsiveness module configured to: The attenuator is controlled to be reduced to a preset attenuation amount from the maximum attenuation amount, and data points corresponding to each attenuation amount are collected, wherein the data points comprise the optical signal power and the direct current voltage, and the direct current voltage is the original parameter; Based on all the data points, a second functional relation diagram for representing the corresponding relation between the direct-current voltage and the optical signal power is obtained; and obtaining the slope of the direct current voltage in the second functional relation diagram when the direct current voltage is in a preset voltage range so as to obtain linear responsivity.
7. 7. The system of claim 6, further comprising a linear saturated power module configured to: Calculating to obtain ideal output voltages corresponding to all the test optical powers based on the linear responsivity and the non-light voltage of the PIN-FET to be tested; according to the electric signal collector, collecting the actual direct current voltage corresponding to the test light power; obtaining maximum voltage deviation according to the difference value between the ideal output voltage corresponding to each test optical power and the actual direct current voltage; And obtaining a maximum bias voltage duty ratio according to the maximum voltage deviation, wherein when the maximum bias voltage duty ratio is the specified duty ratio, the corresponding test optical power is linear saturated power.
8. 8. The system of claim 7, further comprising a linear minimum optical power module configured to: Obtaining the minimum voltage deviation according to the difference value between the ideal output voltage corresponding to each test optical power and the actual direct-current voltage; and obtaining a minimum bias duty ratio according to the minimum voltage deviation, wherein when the minimum bias duty ratio is the specified duty ratio, the corresponding test optical power is the linear minimum optical power.
9. 9. The system of claim 1, further comprising a second dc voltage for providing a bias voltage to the PIN-FET under test.
10. 10. The system of claim 1, wherein the plurality of electrical signal collectors includes an oscilloscope, a multimeter, and a noisy millivoltmeter, and an electrical switch is disposed between the plurality of electrical signal collectors and the PIN-FET under test, the electrical switch being configured to switch a path between the PIN-FET under test and any of the electrical signal collectors to communicate the PIN-FET under test with the oscilloscope, multimeter, or noisy millivoltmeter.

Description

PIN-FET test system Technical Field The invention relates to the technical field of optics, in particular to a PIN-FET test system. Background The conventional test scheme has the defects that test links are required to be frequently switched manually in the test process, circuit cables and optical path connectors are repeatedly plugged and unplugged, the operation is tedious and time-consuming, the frequent plugging operation can cause loss on connecting wires and equipment connecting ports, the ageing of components is accelerated, even damage is caused, the service life of equipment is influenced, the pre-completed optical path calibration and circuit matching state is damaged during each link switching, the stability of test results is insufficient, the consistency is poor, the real performance of a device cannot be accurately reflected, meanwhile, the whole process depends on manual operation and misoperation easily occurs, the test process is possibly interfered, the data validity is possibly influenced, accidental damage is possibly caused to precision test equipment, and the key problem of limiting the test efficiency and reliability is solved. Disclosure of Invention Therefore, an objective of the embodiments of the present application is to provide a PIN-FET test system, which can improve the problems of damage to the connection wire and the device connector, poor consistency, and time and effort for manual plugging. In order to achieve the technical purpose, the application adopts the following technical scheme: In a first aspect, an embodiment of the present application provides a PIN-FET test system, including a light source, a modulation assembly, a signal generator, and a plurality of electrical signal collectors, where the modulation assembly includes an intensity modulator; The light source is used for emitting continuous light signals; the signal generator is in signal connection with the intensity modulator and is used for sending a frequency-adjustable sweep frequency signal to the intensity modulator; The intensity modulator is used for modulating the continuous optical signal to obtain a first modulated optical signal, or modulating the sweep frequency signal and the continuous optical signal to obtain a second modulated optical signal carrying sweep frequency information; The modulation component further comprises an attenuator and a coupler, so that the first modulated optical signal or the second modulated optical signal sequentially passes through the attenuator and the coupler and then is input to a PIN-FET to be tested, and the PIN-FET to be tested is used for outputting an electric signal according to the first modulated optical signal or the second modulated optical signal; the plurality of electric signal collectors are used for receiving the electric signals, so that the electric signal collectors generate corresponding original parameters according to the electric signals, and test results are generated based on the original parameters. Further, the system also includes a first direct voltage; the first direct voltage is used to provide a bias voltage to the intensity modulator. Further, the system also includes an optical power meter for monitoring optical signal power of the first modulated optical signal or the second modulated optical signal. Further, the system also includes a 3dB analysis module configured to: Controlling the signal generator to send a first sweep frequency signal to the intensity modulator, wherein the frequency of the first sweep frequency signal continuously changes in a first preset interval in time sequence; Acquiring a first voltage peak value of the electric signal according to the electric signal collector; obtaining a first functional relation diagram according to the first voltage peak value and the first frequency of the corresponding first sweep frequency signal; and obtaining a first frequency corresponding to the first voltage peak value which is a first specified value according to the first functional relation diagram, wherein the first frequency is used as a 3dB bandwidth. Further, the 3dB analysis module is further configured to: Controlling the signal generator to send a second sweep frequency signal to the intensity modulator, wherein the frequency of the second sweep frequency signal continuously changes in a second preset interval in time sequence, and the first preset interval is a subset of the second preset interval; Acquiring a second voltage peak-to-peak value of the electric signal according to the electric signal collector When two continuous second voltage peaks and peaks in time sequence are smaller than a second specified value, second frequencies of the second sweep signals corresponding to the two continuous second voltage peaks and peaks are obtained to be used as the maximum value and the minimum value of the first preset interval, wherein the second specified value is larger than the first specified value, and the di